Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2010
12/14/2010US7853839 Method and apparatus for verifying the correctness of FTAP data packets received on the FLO waveform
12/14/2010US7853836 Semiconductor integrated circuit
12/14/2010US7853801 System and method for providing authenticated encryption in GPON network
12/14/2010US7853640 Key distribution
12/14/2010US7853633 System and method for generating random permutations of elements
12/14/2010US7853430 Semiconductor device, and test circuit and test method for testing semiconductor device
12/14/2010US7853425 Parallel testing in a per-pin hardware architecture platform
12/14/2010US7853345 Offset determination method for measurement system matching
12/14/2010US7852974 Plural circuit selection using role reversing control inputs
12/14/2010US7852785 Sampling and analyzing packets in a network
12/14/2010US7852782 Method of creating a split terminal between a base terminal and equipments connected in series
12/14/2010US7852770 Method and apparatus for interaction among resource reservation protocol nodes
12/14/2010US7852767 Methods and apparatus for routing in a network
12/14/2010US7852764 Relay transmission device and relay transmission method
12/14/2010US7852758 Route control method of label switch path
12/14/2010US7852757 Status based data flow control for chip systems
12/14/2010US7852755 Device and method for maintaining a telephone call during power failures in an IP network
12/14/2010US7852754 Method and apparatus for managing faults in a ring network
12/14/2010US7852749 Methods and systems for routing telecommunications
12/14/2010US7852748 Method and system for providing voice QoS during network failure
12/14/2010US7852116 IC output signal path with switch, bus holder, and buffer
12/14/2010US7852107 Single event upset mitigation
12/14/2010US7852105 Winding diagnostic system and method
12/14/2010US7852104 Liquid crystal display device and testing method thereof
12/14/2010US7852103 Implementing at-speed Wafer Final Test (WFT) with complete chip coverage
12/14/2010US7852102 Method and apparatus for inspecting semiconductor device
12/14/2010US7852101 Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus
12/14/2010US7852100 Parallel scan distributors and collectors and process of testing integrated circuits
12/14/2010US7852099 Frequency trimming for internal oscillator for test-time reduction
12/14/2010US7852098 On-die heating circuit and control loop for rapid heating of the die
12/14/2010US7852097 Methods and apparatuses for improved positioning in a probing system
12/14/2010US7852096 Spring-loaded, removable test fixture for circuit board testers
12/14/2010US7852095 Device and method for electrical contacting semiconductor devices for testing
12/14/2010US7852094 Sharing resources in a system for testing semiconductor devices
12/14/2010US7852093 Eliminating inline positional errors for four-point resistance measurement
12/14/2010US7852090 Apparatus, system and methods for ground current detection
12/14/2010US7852065 Testing apparatus for testing electronic system with 4-wires resistive touch panel and the method therefor
12/14/2010US7851758 Portable multi-function inspection systems and methods
12/14/2010US7851237 Semiconductor device test structures and methods
12/14/2010US7851235 Test element group for monitoring leakage current in semiconductor device and method of manufacturing the same
12/14/2010US7849581 Nanopore electrode, nanopore membrane, methods of preparation and surface modification, and use thereof
12/14/2010CA2592666C Fuel cell diagnostic apparatus and diagnostic method
12/14/2010CA2566086C Combined battery and smart card
12/14/2010CA2359281C Detection circuitry for surgical handpiece system
12/09/2010WO2010141337A2 Adaptive signature detection
12/09/2010WO2010141316A1 Compliant printed circuit wafer probe diagnostic tool
12/09/2010WO2010141313A1 Compliant printed circuit socket diagnostic tool
12/09/2010WO2010141264A1 Compliant wafer level probe assembly
12/09/2010WO2010140945A1 Passive selt
12/09/2010WO2010140643A1 Test unit and test system
12/09/2010WO2010140344A1 Test device
12/09/2010WO2010140318A1 Electronic device and noise current measuring method
12/09/2010WO2010140235A1 Grouped cells state of charge calculation device, grouped cells state of charge calculation method, program, and grouped cells soc display device
12/09/2010WO2010140233A1 Battery state of charge calculation device
12/09/2010WO2010140230A1 Battery state of charge calculation device
12/09/2010WO2010140190A1 Comparative decision circuit and test device using same
12/09/2010WO2010140055A1 Impedance-based current sensor
12/09/2010WO2010140044A1 Control apparatus for vehicle
12/09/2010WO2010139968A1 High frequency measurement apparatus and method with load pull
12/09/2010WO2010139382A1 Device for testing high-voltage equipment
12/09/2010WO2010139364A1 Device and method for monitoring a photovoltaic system
12/09/2010WO2010139358A1 Current measurement in switched mode power supply
12/09/2010WO2010121075A3 Detecting faults in a wiring harness
12/09/2010WO2010108011A8 Planar contact with solder
12/09/2010WO2010096171A3 Test access component for automatic testing of circuit assemblies
12/09/2010US20100313092 Technique for initializing data and instructions for core functional pattern generation in multi-core processor
12/09/2010US20100313090 Scanning-capable latch device, scan chain device, and scanning method with latch circuits
12/09/2010US20100313089 Scan Test Application Through High-Speed Serial Input/Outputs
12/09/2010US20100313088 Using zero-bit scan as a control event
12/09/2010US20100313087 Device testing architecture, method and system
12/09/2010US20100312744 System for battery prognostics
12/09/2010US20100312733 System and method for estimating long term characteristics of battery
12/09/2010US20100312517 Test Method Using Memory Programmed with Tests and Protocol To Communicate between Device Under Test and Tester
12/09/2010US20100312516 Protocol aware digital channel apparatus
12/09/2010US20100312515 Test apparatus, performance board and calibration board
12/09/2010US20100312506 Distance-to-fault measurement system capable of measuring complex reflection coefficients
12/09/2010US20100312505 Short-circuit recognition method for an electric network
12/09/2010US20100309963 Multi-pair gigabit ethernet transceiver having adaptive disabling of circuit elements
12/09/2010US20100309778 Use of 1:1 protection state machine for load sharing and alternative protection schemes
12/09/2010US20100309591 Impedance-based current sensor
12/09/2010US20100308857 Method and electric circuit for testing a power producer or a power consumer that can be connected to an electric power grid
12/09/2010US20100308856 Test apparatus and test method
12/09/2010US20100308855 Probe card for testing integrated circuits
12/09/2010US20100308854 Probe card substrate with bonded via
12/09/2010US20100308853 Method and apparatus for the prevention of untested or improperly tested printed circuit boards from being used in a fire pump control system
12/09/2010US20100308852 Shielded antenna for system test of a non-contact voltage detector
12/09/2010US20100308851 Testing device and method for determining a common mode signal of an electrical telecommunication
12/09/2010US20100308840 Method and device to detect failure of a magnetic resonance gradient coil by monitoring a supply cable thereof
12/09/2010US20100308839 Electronic device identifying method
12/09/2010US20100308838 Electronic apparatus transmitting and receiving signal through single wire
12/09/2010US20100308833 Lighting unit with compensation for output frequency, and method for determining output frequency
12/09/2010DE102009049777A1 Evaluation system for photovoltaic module of photovoltaic equipment, has detector coupled with photovoltaic module, and transmission device conveying module specific information of photovoltaic modules from detector to evaluation unit
12/09/2010DE102009020473A1 Verfahren zur Fehlererkennung bei der Ansteuerung eines Drehfeldmotors Method for detecting faults in the control of a rotating-field motor
12/09/2010CA2801602A1 High frequency measurement apparatus and method with load pull
12/09/2010CA2764348A1 Impedance-based current sensor
12/09/2010CA2757943A1 Control apparatus for vehicle
12/08/2010EP2259430A1 Semiconductor integrated circuit and method of saving and recovering its internal state.
12/08/2010EP2259376A1 Secondary cell system
12/08/2010EP2259297A1 Probe wafer, probe device, and testing system
12/08/2010EP2259080A1 System and procedure for determining the loss of capacity of a battery