Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2010
11/23/2010US7840133 Method and system for hybrid protection in optical networks
11/23/2010US7839899 Method and system of updating routing information in a communications network
11/23/2010US7839796 Monitor for multi-protocol label switching (MPLS) networks
11/23/2010US7839792 Time-correlated, simultaneous measurement and analysis of network signals from multiple communication networks
11/23/2010US7839791 Systems and methods for network routing
11/23/2010US7839786 Method and apparatus for routing data in an inter-nodal communications lattice of a massively parallel computer system by semi-randomly varying routing policies for different packets
11/23/2010US7839778 System and method for adaptive flow control
11/23/2010US7839777 Method, system, and apparatus for accelerating resolution of network congestion
11/23/2010US7839776 Detecting a reverse rate indicator channel
11/23/2010US7839774 Data processing circuit wherein data processing units communicate via a network
11/23/2010US7839772 Line redundant device and method
11/23/2010US7839771 Backhaul failover method and system for a wireless network
11/23/2010US7839770 Branch element for operation in a communication network, network and method for operating the branch element
11/23/2010US7839769 Method for the organization of network nodes in a packet-switched network
11/23/2010US7839767 Path reroute in a computer network
11/23/2010US7839766 Method and system for long haul optical transport for applications sensitive to data flow interruption
11/23/2010US7839479 Thin film transistor array substrate comprising a first insulating layer completely covering the dummy testing pad, display using the same, and fabrication method thereof
11/23/2010US7839282 Capacitance probe for detection of anomalies in non-metallic plastic pipe
11/23/2010US7839160 Stress programming of transistors
11/23/2010US7839159 ZQ calibration circuit and a semiconductor device including a ZQ calibration circuit
11/23/2010US7839158 Method of detecting abnormality in burn-in apparatus
11/23/2010US7839157 Surface mount testing system
11/23/2010US7839156 Method for detecting tip position of probe, alignment method, apparatus for detecting tip position of probe and probe apparatus
11/23/2010US7839155 Methods and apparatus to analyze on-chip controlled integrated circuits
11/23/2010US7839151 Solid electrolytic capacitor inspection device and inspection method
11/23/2010US7839150 Detecting device for detecting electrical connection between pads of a package substrate
11/23/2010US7839139 Pusher block
11/23/2010US7839138 Adjustable force electrical contactor
11/23/2010US7839136 System and method for testing radio frequency (RF) shielding defects
11/23/2010US7839135 System for and method of analyzing printed board carrying chassis, printed board carrying chassis structure, program, and recording medium
11/23/2010US7839133 Remote continuity and cable identifier and polarity checker system and method
11/23/2010US7838310 Tunable alignment geometry
11/23/2010US7837383 Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing
11/23/2010CA2577639C Surge protector life cycle monitor system and method
11/18/2010WO2010132714A1 Systems and methods for a phase locked loop built in self test
11/18/2010WO2010132303A1 Method for determining extent and type of capacity fade
11/18/2010WO2010131261A2 Method for validation and introduction of one or more features in an electrically powered system
11/18/2010WO2010131160A1 Driver for analysing condition of, and supplying healing voltage to, an oled device
11/18/2010WO2010130671A1 Partial discharge detection device capable of determining the external or internal origin of a partial discharge, and associated method
11/18/2010WO2010130068A1 Apparatus and method for testing number of turns on coil
11/18/2010WO2010102019A8 Method and apparatus for system testing using scan chain decomposition
11/18/2010WO2010099964A3 Method and apparatus for measurement of ohmic shunts in thin film modules with the voc-ilit technique
11/18/2010US20100293426 Systems and methods for a phase locked loop built in self test
11/18/2010US20100293425 Parametric scan register, digital circuit and method for testing a digital circuit using such register
11/18/2010US20100293424 Semiconductor integrated circuit, information processing apparatus and method, and program
11/18/2010US20100293423 Method and apparatus for virtual in-circuit emulation
11/18/2010US20100293422 Method And System For Scan Chain Diagnosis
11/18/2010US20100293421 Low depth programmable priority encoders
11/18/2010US20100292942 Embedded algorithms for vehicular batteries
11/18/2010US20100290164 Methods and appratus for ground fault circuit interrupt detection using a single transformer
11/18/2010US20100289551 Increased reliability in the processing of digital signals
11/18/2010US20100289519 Circuit for detecting faulty diode
11/18/2010US20100289518 Circuit and method for detecting faulty diode
11/18/2010US20100289517 Built off testing apparatus
11/18/2010US20100289516 Malfunction determining apparatus and malfunction determining method for charging system
11/18/2010US20100289515 Probe for a socket, socket for a semiconductor integrated circuit and electronic device
11/18/2010US20100289514 Inspection apparatus
11/18/2010US20100289513 Test socket assembly having heat dissipation module
11/18/2010US20100289512 Probes with offset arm and suspension structure
11/18/2010US20100289511 Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
11/18/2010US20100289500 Substrate structure
11/18/2010US20100289499 Monitoring device for monitoring a terminal of a terminal component
11/18/2010US20100289497 Multi-Cell Power System Controller
11/18/2010DE202010011752U1 Funktionstestsystem für elektronische Baugruppen Functional test system for electronic assemblies
11/18/2010DE102010010042A1 System und Verfahren zum Detektieren eines Isolationsverlusts während des Betriebes eines AC-Motors System and method for detecting an insulation loss during the operation of an AC motor
11/18/2010DE102009021627A1 Method for testing plug-in connector with respect to short-circuits and failures, involves measuring and evaluating undesirable parasite coupling capacitance between contact pins of device under test
11/18/2010DE102009021036A1 Verfahren zur Gasanalyse an Laststufenschaltern A method for gas analysis on load tap changers
11/18/2010DE102009020528A1 Vorrichtung und Verfahren zur Untersuchung einer Drahtbeschichtung Apparatus and method for testing a wire coating
11/18/2010DE102009015718A1 Testsystem und Verfahren zum Verringern der Schäden in Saatschichten in Metallisierungssystem von Halbleiterbauelementen Test system and method for reducing the damage to seed layers in metallization of semiconductor components
11/18/2010DE102009003055A1 Method for determining pale-light characteristics of solar cell and solar module, involves correcting preset value for obtaining current-voltage characteristics and/or characteristic parameters for lighting intensity
11/18/2010DE102009002859A1 Verfahren und Vorrichtung zur Diagnose eines Stellgebers Method and apparatus for diagnosis of a positioning element
11/18/2010DE102007022690B4 Zentriervorrichtung für elektronische Bauelemente Centering device for electronic components
11/18/2010DE102006020045B4 Zwischenstecker und Verfahren zur Herstellung eines Zwischensteckers Between the plug and method for producing an intermediate connector
11/18/2010CA2761096A1 Partial discharge detection device capable of determining the external or internal origin of a partial discharge, and associated method
11/17/2010EP2251703A1 Circuit apparatus including removable bond pad extension
11/17/2010EP2251702A1 Cabling test device
11/17/2010EP2251179A1 Device for inspecting a wire coating
11/17/2010EP2250513A1 Estimating remaining battery service life in an implantable medical device
11/17/2010EP2250512A1 Secondary battery remaining capacity estimating apparatus
11/17/2010EP2250511A1 Electromagnetic interference sensor device and method and computer program
11/17/2010EP2250510A2 Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested
11/17/2010EP1984995B1 Method for identifying an earth fault in a resonant-earthed three-phase power transmission system, or a three-phase power transmission system which is isolated from earth potential
11/17/2010EP1078431B1 Mimic high pass filter in a protective relay
11/17/2010EP0873503B1 Method and apparatus relating to test equipment with humidification capability
11/17/2010CN201639921U Bulk LED feeder
11/17/2010CN201639796U Solution heating device in fuel cell test system
11/17/2010CN201639509U Signal collector based on solar energy power supply system and solar energy power supply system
11/17/2010CN201639353U Safety device for testing discharge capacity of accumulator battery without off line
11/17/2010CN201639336U Distributed type full-online storage battery charge-discharge testing equipment
11/17/2010CN201639335U Charger capable of displaying charging parameters
11/17/2010CN201639327U Lithium battery voltage control device and testing system utilizing same
11/17/2010CN201639294U Physical model of single-tower joint-use double-circuit electric transmission line
11/17/2010CN201639098U Intelligent perception socket for energy consumption monitoring system based on Internet of things
11/17/2010CN201639040U Electric connector for low-voltage circuit breaker test
11/17/2010CN201638623U Variable resistor for rectifying effect testing circuit
11/17/2010CN201638439U Full-metering simulation device
11/17/2010CN201638340U Fire prevention pre-alarm device for machine room of base station
11/17/2010CN201638339U Residual current type electrical fire monitor
11/17/2010CN201638036U Controller for radar power-supply module testing and communication based on GPIB interface
11/17/2010CN201637840U Working life reminder of illuminating lamp