Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2010
11/03/2010CN201622333U Convenient and reliable automobile battery and generator monitor
11/03/2010CN201622332U Battery electric quantity display device
11/03/2010CN201622331U Service life testing device for electric motor of washing machine
11/03/2010CN201622330U Motor rotor testing instrument with automatic cleaning and automatic sorting device
11/03/2010CN201622329U Load detection circuit and food processor
11/03/2010CN201622328U Motor detecting table
11/03/2010CN201622327U Tester of permanent magnet synchronous motor
11/03/2010CN201622326U Electronic relay tester
11/03/2010CN201622325U Keypad testing device and television testing system
11/03/2010CN201622324U High-voltage switch gear detector
11/03/2010CN201622323U HFE parameter tester of low-power NPN triode
11/03/2010CN201622322U Comprehensive testing device for OLED photoelectric properties
11/03/2010CN201622321U Electrode plate for testing insulating property of insulation wrap
11/03/2010CN201622320U Electrical testing device for insulating safety tools
11/03/2010CN201622319U Automatic power frequency withstand voltage test control device
11/03/2010CN201622318U Voltage-endurance tester
11/03/2010CN201622317U Neutral-point grounding system malfunction monitoring and alarming device
11/03/2010CN201622316U Capacitive equipment current-leaking measuring device
11/03/2010CN201622315U Grounding detector for locomotive electric circuits
11/03/2010CN201622314U Logic line detector using single chip microcomputer to make HT1621 type stroke segment type module group
11/03/2010CN201622313U Thermal resistance full-automatic test grading device
11/03/2010CN201622312U Full automatic quartz crystal oscillator tester
11/03/2010CN201622311U Coil pressure test device
11/03/2010CN201622310U Novel fault information display processing device
11/03/2010CN201622308U Electrical signal detection device
11/03/2010CN201622288U Clamp for radio-frequency testing of semiconductor chip
11/03/2010CN201622287U Liquid crystal panel testing clamp
11/03/2010CN201622286U Solar battery attenuation test-dedicated pressing frame
11/03/2010CN201622285U Solar battery attenuation test insolation frame
11/03/2010CN201622284U Insulation testing track for automatic high-voltage tester
11/03/2010CN201622283U Device for overturning and crimping auxiliary terminal of electricity use information-collecting terminal for power consumers
11/03/2010CN201622178U Stalling tester for mowers
11/03/2010CN201622162U Self-checking device for power amplifier of vibration table
11/03/2010CN201619536U Fault diagnosis device supporting multiple protocols and OBD II automobile
11/03/2010CN1963941B Non-connected induction system of disk
11/03/2010CN1963428B Method and system for testing flexible elements
11/03/2010CN1947024B System and method for detecting link failures
11/03/2010CN1793998B Semiconductor device
11/03/2010CN101878558A 电池管理系统以及充电器 Battery management systems and chargers
11/03/2010CN101877617A Portable wireless monitor
11/03/2010CN101877495A Charging indication circuit and portable electronic device applying same
11/03/2010CN101877479A Method for comparing and judging phase of single-pole adaptive reclosure of electric transmission line
11/03/2010CN101877248A Semiconductor integrated circuit, information processing apparatus and output data diffusion method
11/03/2010CN101876690A Generator contemporary process monitoring and analyzing system
11/03/2010CN101876689A Large-scale generator set monitoring system
11/03/2010CN101876688A Detection device for an input device
11/03/2010CN101876687A Test method for back drilling depth of PCB plate
11/03/2010CN101876686A Diagnostic circuit for monitoring an analog-digital converter circuit
11/03/2010CN101876685A Circuit parameter multi-point tester
11/03/2010CN101876684A Failure detecting and protecting method of controlled silicon and device thereof
11/03/2010CN101876683A Method and system of testing a semiconductor device
11/03/2010CN101876682A Testing device
11/03/2010CN101876681A Method for detecting ground short circuit of output side of AC servo driver or low voltage inverter
11/03/2010CN101876680A Method and device for assessing protection performance of surge protection device
11/03/2010CN101876679A Testing device of a flat-plate shaped body to be tested
11/03/2010CN101876678A One sheet test device and method of testing using the same
11/03/2010CN101876677A Automatic round bridge test machine
11/03/2010CN101876676A Method and device for automatically testing household appliance
11/03/2010CN101876670A Battery monomer voltage measuring circuit and compensation method for measuring error thereof
11/03/2010CN101477180B Microcomputer direct current monitoring device
11/03/2010CN101435968B Active element array substrate
11/03/2010CN101435845B Small grounding current system double-loop wire single-phase ground fault distance measuring method
11/03/2010CN101393247B Sensing method based on multidimensional difference decoupling powerline running state parameter
11/03/2010CN101345822B Electronic apparatus
11/03/2010CN101315405B Semiconductor component test station with detachable electric property detecting system
11/03/2010CN101272048B Vehicle mounted intelligent relay
11/03/2010CN101144842B Display device definition test card and its definition measuring method
11/03/2010CN101093245B Apparatus and method for detecting battery pack voltage
11/03/2010CN101027565B Method and device for detecting electric arc phenomenon on at least one electric cable
11/02/2010US7827509 Digitally obtaining contours of fabricated polygons
11/02/2010US7827455 System and method for detecting glitches on a high-speed interface
11/02/2010US7827454 Semiconductor device
11/02/2010US7827453 Core test circuits controlling boundary and general external scan circuits
11/02/2010US7827452 Error catch RAM support using fan-out/fan-in matrix
11/02/2010US7827451 Method, system and program product for establishing decimal floating point operands for facilitating testing of decimal floating point instructions
11/02/2010US7827068 Network-based system for selecting or purchasing software products
11/02/2010US7827017 Method and system for implementing circuit simulators
11/02/2010US7826918 Transfer system and transfer method of object to be processed
11/02/2010US7826440 Quality of service in a remote telephone
11/02/2010US7826396 System and method for implementing PNRP locality
11/02/2010US7826388 Sensor interface for selectively providing analog and digital output
11/02/2010US7826381 Method and device test data streams bound to emulated devices
11/02/2010US7826380 Apparatus, system, and method for data tracking
11/02/2010US7826379 All-to-all sequenced fault detection system
11/02/2010US7826376 Detection of network problems in a computing system
11/02/2010US7826375 Data duplication for transmission over computer networks
11/02/2010US7826374 Method and apparatus for efficient transfer of data over a network
11/02/2010US7826372 Network routing process for regulating traffic through advantaged and disadvantaged nodes
11/02/2010US7826369 Subsets of the forward information base (FIB) distributed among line cards in a switching device
11/02/2010US7826363 Bandwidth estimation algorithm using internet control message protocol (ICMP) echo request
11/02/2010US7826355 Reducing overhead when setting up multiple virtual circuits using signaling protocols
11/02/2010US7826352 Meter-based hierarchical bandwidth sharing
11/02/2010US7826350 Intelligent network adaptor with adaptive direct data placement scheme
11/02/2010US7826349 Connection management mechanism
11/02/2010US7826347 Call processing device and method
11/02/2010US7826286 Semiconductor memory device with redundancy circuit
11/02/2010US7825680 Componet supplied with an analog value
11/02/2010US7825679 Dielectric film and layer testing
11/02/2010US7825678 Test pad design for reducing the effect of contact resistances
11/02/2010US7825677 Test jig for testing a packaged high frequency semiconductor device
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