Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2010
11/17/2010CN101359036B Method for measuring state of charge of battery
11/17/2010CN101359027B Large capacitance leakage measuring set
11/17/2010CN101339214B Accumulator internal resistance measurement method
11/17/2010CN101285868B Differential pressure type multifunctional vacuum oil immersion equipment
11/17/2010CN101271141B Fault travelling wave network locating method based on travelling wave time difference
11/17/2010CN101261297B Electric power transformer windings parameter on-line real-time identification device and method
11/17/2010CN101187679B Current measuring circuit for two phase electromotor
11/17/2010CN101154800B Device for detecting trouble electric arc
11/17/2010CN101059547B Diagnostic signal processor
11/17/2010CN101038306B Device for online monitoring and overcurrent limiting power transformer iron core grounding current
11/16/2010US7836372 Memory controller with loopback test interface
11/16/2010US7836371 On-chip service processor
11/16/2010US7836370 Scan test circuit, semiconductor integrated circuit and scan enable signal time control circuit
11/16/2010US7836369 Device and method for configuring input/output pads
11/16/2010US7836368 Dynamically reconfigurable shared scan-in test architecture
11/16/2010US7836367 Dynamically reconfigurable shared scan-in test architecture
11/16/2010US7836366 Defect localization based on defective cell diagnosis
11/16/2010US7836365 System and method for testing a circuit
11/16/2010US7836363 DVI link with circuit and method for test
11/16/2010US7836321 Portable battery driven apparatus
11/16/2010US7836315 Method and system for monitoring module power information in a communication device
11/16/2010US7836208 Dedicated redundant links in a communicaton system
11/16/2010US7835881 System, method, and computer program product for testing and re-testing integrated circuits
11/16/2010US7835876 Electrostatic discharge monitoring and manufacturing process control system
11/16/2010US7835390 Network traffic identification by waveform analysis
11/16/2010US7835363 Method and system to provide blade server load balancing using spare link bandwidth
11/16/2010US7835350 Prioritizing data transmissions using the number of associated origin addresses
11/16/2010US7835290 Method for measuring end-to-end delay in asynchronous packet transfer network, and asynchronous packet transmitter and receiver
11/16/2010US7835287 Mobile station, downstream transmission rate control method, and downstream transmission rate control program
11/16/2010US7835286 Dynamic multi-objective grid resources access
11/16/2010US7835284 Method and apparatus for routing data in an inter-nodal communications lattice of a massively parallel computer system by routing through transporter nodes
11/16/2010US7835283 Method and system for managing quality of service by feeding information into the packet network
11/16/2010US7835282 Dynamic throttling of priority service calls
11/16/2010US7835280 Methods and systems for managing variable delays in packet transmission
11/16/2010US7835274 Wideband provisioning
11/16/2010US7835273 Method for transmitting data in mobile ad hoc network and network apparatus using the same
11/16/2010US7835271 Signaling protocol for p-cycle restoration
11/16/2010US7835270 Method for managing virtual router redundancy protocol backup groups
11/16/2010US7835268 Optical termination system
11/16/2010US7835266 Node apparatus and maintenance and operation supporting device
11/16/2010US7834651 Power supply circuit
11/16/2010US7834650 Method and apparatus for testing liquid crystal display using probe unit reduced the number of connecter pads
11/16/2010US7834649 Method and apparatus for statistical CMOS device characterization
11/16/2010US7834648 Controlling temperature in a semiconductor device
11/16/2010US7834647 Alignment features in a probing device
11/16/2010US7834642 Testing apparatus and method which adjusts a phase difference between rising and falling signals output from a DUT
11/16/2010US7834640 System and method for testing electrical connection
11/16/2010US7834639 Jitter injection circuit, pattern generator, test apparatus, and electronic device
11/16/2010US7834638 Differential transmission circuit, disk array apparatus, and output signal setting method
11/16/2010US7834637 Method and apparatus for generalized AC and DC arc fault detection and protection
11/16/2010US7834636 Methods and apparatus to facilitate ground fault detection with a single coil
11/16/2010US7834634 Low-power switch state detection circuit and method and mobile telephone incorporating the same
11/16/2010US7834633 Monitoring a protective device arranged upstream of a switching device
11/16/2010US7834615 Bist DDR memory interface circuit and method for self-testing the same using phase relationship between a data signal and a data strobe signal
11/16/2010US7834607 Voltage generator with current limiting and semiconductor testing device
11/16/2010US7834573 Winding fault detection system
11/16/2010US7833807 Method of manufacturing semiconductor laser for communication, semiconductor laser for communication and optical transmission module
11/16/2010US7832648 Semiconductor device and an information management system therefor
11/16/2010US7832091 Method for manufacturing conductive contact holder
11/16/2010CA2596748C Method and apparatus for power management in an electronic device
11/16/2010CA2366861C Compositions and methods for helper-free production of recombinant adeno-associated viruses
11/16/2010CA2357683C Method for adjusting a transmission characteristic of an electronic circuit
11/11/2010WO2010129825A1 System and method for charging and discharging a li-ion battery
11/11/2010WO2010129760A2 Systems and methods for conducting emi susceptibility testing
11/11/2010WO2010129688A1 Separate test electronics and blower modules in an apparatus for testing an integrated circuit
11/11/2010WO2010129627A2 Non-contact testing of printed electronics
11/11/2010WO2010128791A2 Voltage balancing device for battery cell
11/11/2010WO2010128069A1 Wiring testing device
11/11/2010WO2009111559A3 Combinatorial stochastic logic
11/11/2010WO2008143897A9 Transmission line pulse testing with reflection control
11/11/2010US20100287524 Metastability effects simulation for a circuit description
11/11/2010US20100287432 Method and apparatus for generating test patterns for use in at-speed testing
11/11/2010US20100287431 Reduced signaling interface method and apparatus
11/11/2010US20100287430 Multiple-capture dft system to reduce peak capture power during self-test or scan test
11/11/2010US20100287429 Test pattern generating method , device , and program
11/11/2010US20100287428 System and method for testing a circuit
11/11/2010US20100286938 Battery pack control apparatus
11/11/2010US20100286936 Method for determining and assembling characteristic variables of an electrical power supply
11/11/2010US20100286838 Islanding detection in an electrical power delivery system
11/11/2010US20100283858 Test device, display device, and method for checking a validity of display signals
11/11/2010US20100283501 Testing method for optical touch panel and array tester
11/11/2010US20100283500 Method of error detection when controlling a rotating field motor
11/11/2010US20100283499 Non-contact testing of printed electronics
11/11/2010US20100283498 Full grid cassette for a parallel tester for testing a non-componented printed circuit board, spring contact pin for such a full grid cassette and adapter for a parallel tester for testing a non-componented printed circuit board
11/11/2010US20100283497 Semiconductor testing device, semiconductor device, and testing method
11/11/2010US20100283496 Transmission-modulated photoconductive decay measurement system
11/11/2010US20100283495 Probe substrate and probe card having the same
11/11/2010US20100283494 Probe tile for probing semiconductor wafer
11/11/2010US20100283493 Charge eliminating apparatus and method, and program storage medium
11/11/2010US20100283479 Method of detecting faults on an electrical power line
11/11/2010US20100283478 Connector conduction check apparatus
11/11/2010US20100283477 Assembly for detecting electric discontinuity between an electric contact and an electrically conducting member mounted in the detection circuit
11/11/2010US20100283476 Testing System and Testing Method
11/11/2010US20100283475 Separate test electronics and blower modules in an apparatus for testing an integrated circuit
11/11/2010US20100283474 Test circuit and optical pickup device
11/11/2010US20100283452 Apparatus and Method for Measuring Real Time Clock Accuracy in an Electric Meter
11/11/2010US20100283451 Optically measuring electric field intensities
11/11/2010US20100283450 Particle detection
11/11/2010US20100283156 Semiconductor device
11/11/2010US20100281685 Electrode winding apparatus and electrode winding method (as amended)
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