Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2010
12/22/2010CN101201387B Compensation for voltage drop in automatic test equi0pment
12/22/2010CN101119119B Method and apparatus for detecting open circuit fault of transmitter
12/22/2010CN101088133B Method and device for the secure operation of a switching device
12/22/2010CN101054751B Method for detecting faucet of electronic jacquard machine and detection device using the same
12/22/2010CN101027568B Dynamic line rating system with real-time tracking of conductor creep to establish the maximum allowable conductor loading as limited by clearance
12/21/2010US7856582 Techniques for logic built-in self-test diagnostics of integrated circuit devices
12/21/2010US7856581 Methods and apparatuses for external test methodology and initialization of input-output circuits
12/21/2010US7856580 Testing mobile wireless devices during device production
12/21/2010US7856578 Strobe technique for test of digital signal timing
12/21/2010US7856427 System and method for suspending transactions being executed on databases
12/21/2010US7856332 Real time system for monitoring the commonality, sensitivity, and repeatability of test probes
12/21/2010US7855978 Method of displaying nodes and links
12/21/2010US7855976 Method and apparatus for reporting CQI in a wireless communication system
12/21/2010US7855975 Response time estimation for intermittently-available nodes
12/21/2010US7855973 Apparatus, methods and computer program products for transmission of data over an adjustable synchronous radio channel
12/21/2010US7855971 Interface device and topology formation method
12/21/2010US7855969 Selective test point for high speed SERDES cores in semiconductor design
12/21/2010US7855968 Alarm indication and suppression (AIS) mechanism in an ethernet OAM network
12/21/2010US7855961 Method for controlling the establishment of a connection in an optical network
12/21/2010US7855959 Fast common overhead services acquisition for MediaFLO
12/21/2010US7855958 Determining priority of bearer channels in a wireless telecommunications network
12/21/2010US7855955 Method for managing frames in a global-area communications network, corresponding computer-readable storage medium and tunnel endpoint
12/21/2010US7855950 Congruent forwarding paths for unicast and multicast traffic
12/21/2010US7855949 Method and apparatus for bundling signaling messages for scaling communication networks
12/21/2010US7855572 Semiconductor integrated circuit device operating frequency determining apparatus, determining method and computer-readable information recording medium
12/21/2010US7855571 Testing circuit board for preventing tested chip positions from being wrongly positioned
12/21/2010US7855570 Semiconductor device for performing mount test in response to internal test mode signals
12/21/2010US7855569 Wafer holder for wafer prober and wafer prober equipped with the same
12/21/2010US7855568 Probe apparatus with mechanism for achieving a predetermined contact load
12/21/2010US7855567 Electronic device testing system and method
12/21/2010US7855563 Robust cable connectivity test receiver for high-speed data receiver
12/21/2010US7855562 Dual sensor system having fault detection capability
12/21/2010US7855561 Test circuit
12/21/2010US7855549 Integrated process condition sensing wafer and data analysis system
12/21/2010US7855544 AC low current probe card
12/21/2010US7855088 Method for manufacturing integrated circuits by guardbanding die regions
12/18/2010CA2708116A1 Integrated circuit analysis systems and methods
12/16/2010WO2010144524A2 System and method for communicating notice to limit degradation within a battery pack
12/16/2010WO2010144401A2 System and method for controlling output of a battery pack
12/16/2010WO2010144399A2 System and method for a battery pack output contactor
12/16/2010WO2010144396A2 System and method for controlling output of a battery pack
12/16/2010WO2010144023A1 Charging duration determination
12/16/2010WO2010143995A1 High-voltage insulation condition indicator
12/16/2010WO2010143932A1 Test apparatus with electrostatic discharge capability
12/16/2010WO2010143881A2 Bank structure of fpga board for semiconductor verification
12/16/2010WO2010143876A2 Stacked fpga board for semiconductor verification
12/16/2010WO2010143670A1 Charge control device and method for secondary battery module
12/16/2010WO2010143534A1 Connection diagnostic device for ground fault detector
12/16/2010WO2010143233A1 Ic socket for batch processing system using ic tray
12/16/2010WO2010143042A1 System for welding, wire drive system and method of switching the source of electrical power with wire feeder having automatic configuration of power supply
12/16/2010WO2010142270A1 Nondestructive analytical method for determining the quality of a thin-film solar cell using photoluminescence spectroscopy
12/16/2010US20100318866 Test compression in a jtag daisy-chain environment
12/16/2010US20100318865 Signal processing apparatus including built-in self test device and method for testing thereby
12/16/2010US20100318864 Fault location estimation device, fault location estimation method, and program
12/16/2010US20100318863 Parallel and serial access to test compression architectures
12/16/2010US20100318862 Scan test circuit, and method and program for designing same
12/16/2010US20100318848 Establishing a connection between a testing and/or debugging interface and a connector
12/16/2010US20100318314 Polymorphic automatic test systems and methods
12/16/2010US20100318313 Measurement methodology and array structure for statistical stress and test of reliabilty structures
12/16/2010US20100315696 Analog interferometric modulator
12/16/2010US20100315116 Testing method for a semiconductor integrated circuit device, semiconductor integrated circuit device and testing system
12/16/2010US20100315115 Method of characterizing a semiconductor device and semiconductor device
12/16/2010US20100315114 Semiconductor device with test structure and semiconductor device test method
12/16/2010US20100315113 Handler for electronic components, in particular ic's, comprising circulating units, the temperature of which can be controlled
12/16/2010US20100315112 Socket adapter for testing singulated ics with wafer level probe card
12/16/2010US20100315111 Single support structure probe group with staggered mounting pattern
12/16/2010US20100315110 Hermeticity testing
12/16/2010US20100315109 Burn-in system for electronic devices
12/16/2010US20100315095 Current transformer and electrical monitoring system
12/16/2010US20100315094 Overlay key, method of forming the overlay key and method of measuring overlay accuracy using the overlay key
12/16/2010US20100315093 power measurement with a signal generator
12/16/2010US20100315092 Fault prediction in electronic transmission networks
12/16/2010US20100315091 Detecting a Short Circuit in an Inductive Load Current Path
12/16/2010US20100315089 System and method for battery charger self test and diagnostic means
12/16/2010US20100315037 Resistor testing circuit and battery charger including resistor testing circuit
12/16/2010US20100314163 Method for assuring counterbore depth of vias on printed circuit boards and printed circuit boards made accordingly
12/16/2010DE112006001998B4 Timing-Generator und Halbleitertestgerät Timing generator and semiconductor test equipment
12/16/2010DE102010019984A1 Ladezustandsmarkierer für Batteriesysteme Ladezustandsmarkierer for battery systems
12/16/2010DE102010011669A1 Verfahren und Vorrichtungen zum Testen der Integrität von elektrischen Systemen Methods and apparatus for testing the integrity of electrical systems
12/16/2010DE102009023713A1 Vorrichtung zur Prüfung von Geräten der Hochspannungstechnik Apparatus for testing devices of high voltage engineering
12/15/2010EP2260556A1 Method and arrangement for generating an error signal
12/15/2010EP2260534A1 Photonic crystal electrical property indicator
12/15/2010EP2260421A2 Combinational stochastic logic
12/15/2010EP2260314A1 Equipment for logging and transmitting measured values of physical quantities, and measurement sensor for such equipment
12/15/2010EP2260313A1 Method and device for monitoring the operating state of a battery
12/15/2010EP2260312A2 Arc fault root-cause finder system and method
12/15/2010EP2260311A1 Method and apparatus for mobility agent recovery
12/15/2010EP2260282A2 System and method for measuring battery internal resistance
12/15/2010EP1927004B1 Scan testing methods
12/15/2010EP1588571B1 Method and apparatus for evaluating and optimizing a signaling system
12/15/2010EP1558940B1 Device and method of monitoring the starting capability of a vehicles starter battery
12/15/2010CN201674257U Distributed full-online storage battery discharge testing equipment
12/15/2010CN201674256U Full-on-line storage battery pack discharge test equipment
12/15/2010CN201674239U Lead-acid battery capacity testing, charging and repairing system
12/15/2010CN201674213U Control circuit of switch type power supply
12/15/2010CN201674162U Electric power maintenance helicopter
12/15/2010CN201674097U 电连接器 The electrical connector
12/15/2010CN201673576U Alarm and emergency switching-off device of electric motor car battery system
12/15/2010CN201673247U Power supply aging tester
12/15/2010CN201673246U Power failure diagnosing and processing device
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