Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2011
01/12/2011CN101943736A High voltage interlock strategy
01/12/2011CN101943735A Integrated test method for a line
01/12/2011CN101943734A Method for automatically detecting terminals in batch based on IEC62056 protocol
01/12/2011CN101943733A Primary power supply scrambler
01/12/2011CN101943732A Frequency converter test platform
01/12/2011CN101943731A Element test system and method
01/12/2011CN101943730A Idling time testing circuit and modulation circuit applied to inductive load
01/12/2011CN101943729A Circuit for quickly detecting power sources and glitches on ground with low power consumption
01/12/2011CN101943728A Detection circuit capable of preventing attack of power supply burrs
01/12/2011CN101943727A Online detection device of surge protector
01/12/2011CN101943726A Online detection device of surge protective device
01/12/2011CN101943725A Online detection device of SPD (Surge Protective Device)
01/12/2011CN101943724A Online detection device of surge protective device
01/12/2011CN101943723A Online detection device of surge protector
01/12/2011CN101943722A On-line detecting device for surge protector
01/12/2011CN101943721A Method for fast measuring imprinting effect of ferroelectric film
01/12/2011CN101943720A Fault diagnosis processing method of capacitor
01/12/2011CN101943717A Test apparatus and method for measuring common-mode capacitance
01/12/2011CN101943710A Test probe of laminated semiconductor chip
01/12/2011CN101943709A Probe card, test method and test equipment
01/12/2011CN101943708A Automatic tester
01/12/2011CN101941433A Cruising control system for increasing cruising range of pure electric vehicle
01/12/2011CN101699235B Analysis and test system and test method for junction temperature of semiconductor lamp
01/12/2011CN101581625B Detection machine station with optical feedback device
01/12/2011CN101566663B Method for positioning voltage drop source of power distribution system
01/12/2011CN101545952B Test method and test platform for performance of wind-photovoltaic-hydrogen comprehensive energy power generating system
01/12/2011CN101533062B Power cable on-line insulated monitoring method based on traveling wave electric amount measurement
01/12/2011CN101520491B Testing method and device for short-circuit and over-voltage protection of switch power supply output
01/12/2011CN101487871B Detection system for monitoring bridge arm conducting state in commutating device
01/12/2011CN101477174B Complex load behavior simulation and performance test apparatus for servo system
01/12/2011CN101476974B Vacuum fluorescent display luminous efficiency computing method
01/12/2011CN101452061B UPS steady state test method
01/12/2011CN101452060B UPS dynamic test method
01/12/2011CN101452059B Impulse voltage endurance test method
01/12/2011CN101452025B Suspension joint type high voltage and high current synchronization measuring method and device
01/12/2011CN101452012B Method for acquiring signal state
01/12/2011CN101361246B System, method, and article of manufacture for determining an estimated combined battery state-parameter vector
01/12/2011CN101359613B Tft array detection device
01/12/2011CN101359105B Method for detecting electrical property of conductivity lead wire of glass substrate of liquid crystal display
01/12/2011CN101354415B Cable test terminal and test method thereof
01/12/2011CN101345020B Method for confirming brightness characteristic of vacuum fluorescent display
01/12/2011CN101324651B Mobile on-site impact pressure-proof test apparatus and method of 750 V voltage grading GIS equipment
01/12/2011CN101303387B Direct current injection type route selecting positioning system and method thereof
01/12/2011CN101299538B Cable-aerial mixed line fault travelling wave ranging method
01/12/2011CN101246193B Method of transferring test trays in a handler
01/12/2011CN101153883B Method for data access of surge protector and monitoring system of surge protector
01/12/2011CN101135719B Electric machine load simulate mechanism
01/12/2011CN101036063B Test device, test method for detecting electronic device with FET
01/11/2011US7870519 Method for determining features associated with fails of integrated circuits
01/11/2011US7870455 System-on-chip with master/slave debug interface
01/11/2011US7870454 Structure for system for and method of performing high speed memory diagnostics via built-in-self-test
01/11/2011US7870453 Circuit arrangement and method of testing an application circuit provided in said circuit arrangement
01/11/2011US7870452 Scan testing methods
01/11/2011US7870451 Automatable scan partitioning for low power using external control
01/11/2011US7870450 High speed double data rate JTAG interface
01/11/2011US7870449 IC testing methods and apparatus
01/11/2011US7870448 In system diagnostics through scan matrix
01/11/2011US7870447 Method and system for carrying out a process on an integrated circuit
01/11/2011US7869915 Method and apparatus for validating processors using seed and key tests
01/11/2011US7869382 Network management assisted discovery
01/11/2011US7869377 Method for estimating a subjective quality of a signal
01/11/2011US7869367 Methods and systems for checking expected network traffic
01/11/2011US7869364 SIP server overload detection and control
01/11/2011US7869361 Managing hierarchically organized subscriber profiles
01/11/2011US7869359 Method and system for controlling data traffic in a network
01/11/2011US7869351 Communication techniques and generic layer 3 automatic switching protection
01/11/2011US7869346 Methods and apparatus for cluster licensing in wireless switch architecture
01/11/2011US7869326 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method
01/11/2011US7869221 Apparatus for non-conductively interconnecting integrated circuits
01/11/2011US7868644 Apparatus and method for inspecting liquid crystal display
01/11/2011US7868643 Proportional regulation for optimized current sensor performance
01/11/2011US7868642 Socket for connecting ball-grid-array integrated circuit device to test circuit
01/11/2011US7868641 Semiconductor device
01/11/2011US7868640 Array-based early threshold voltage recovery characterization measurement
01/11/2011US7868639 Methods and apparatus for integrated circuit loopback testing
01/11/2011US7868638 System and method for measuring negative bias thermal instability with a ring oscillator
01/11/2011US7868637 System and method for automated detection of singular faults in diode or'd power bus circuits
01/11/2011US7868636 Probe card and method for fabricating the same
01/11/2011US7868635 Probe
01/11/2011US7868634 Probe or measuring head with illumination of the contact region
01/11/2011US7868633 Modular liquid cooled burn in system
01/11/2011US7868632 Composite motion probing
01/11/2011US7868631 Solar cell testing apparatus
01/11/2011US7868630 Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same
01/11/2011US7868627 Method and a device for measuring dielectric characteristics of material bodies
01/11/2011US7868625 Slot interposer probe
01/11/2011US7868624 Method and system for correcting the feedback from electrical measurement converters to a device under test
01/11/2011US7868623 Detection circuit, physical quantity measurement circuit, physical quantity measurement device, and electronic instrument
01/11/2011US7868622 Circuit for detecting power supply voltage drop
01/11/2011US7868621 Power line communication based aircraft power distribution system with real time wiring integrity monitoring capability
01/11/2011US7868619 Method and arrangement for monitoring connections of switch intended for activating safety function
01/11/2011US7868608 Detecting open ground connections in surface mount connectors
01/11/2011US7868474 Method and structures for indexing dice
01/11/2011US7868463 High performance sub-system design and assembly
01/11/2011US7868454 High performance sub-system design and assembly
01/11/2011US7867790 Substrate of probe card and method for regenerating thereof
01/11/2011US7866784 Diagnostic probe assembly for printhead integrated circuitry
01/06/2011WO2011002709A1 Compliant printed circuit semiconductor tester interface
01/06/2011WO2011002651A1 Monitoring of time-varying defect classification performance
01/06/2011WO2011002621A1 Computer memory test structure