Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2011
01/19/2011CN101949983A High-temperature life test chamber
01/19/2011CN101949982A Super capacitor detection and control circuit system
01/19/2011CN101949971A Method for selecting low-voltage storage battery
01/19/2011CN101949965A Electric current sensor
01/19/2011CN101949961A Direct current offset probe card for radio frequency test
01/19/2011CN101949960A High-voltage discharge experiment box
01/19/2011CN101949958A Anti-winding on-off test pen
01/19/2011CN101949807A External insulation natural dirt accumulation testing method for high-voltage power transmission line
01/19/2011CN101702792B Cell parameter transmission device for pure electric bus
01/19/2011CN101625373B Device and method for judging and detecting signals of rotational speed sensor
01/19/2011CN101603981B Single-battery voltage measurement circuit of multi-section serial battery pack system for automobile
01/19/2011CN101576606B Testing device of vehicle glass lifting high-current microswitch
01/19/2011CN101566650B Heat loss self-compensating terminal type water load microwave high power meter
01/19/2011CN101557106B Method for computing the reliability of UHVDC transmission system
01/19/2011CN101515014B Analog device of control cabinet matched with detection switch apparatus
01/19/2011CN101493491B Substation ground network defect synthesis diagnosis method and diagnosis system thereof
01/19/2011CN101424723B Optimizing method based on four-needle flying-needle test path
01/19/2011CN101369003B Electric motor stator scanning detection apparatus
01/19/2011CN101354426B Device and method for simulating load for xenon discharge lamp electric ballast test
01/19/2011CN101308191B Diode electrical characteristics test system
01/19/2011CN101258415B Electronic parts tester
01/19/2011CN101226226B Method for searching channel number of on-line tester
01/19/2011CN101191748B High temperature superconduction magnetic levitation or electric machine quasi-static force test device
01/19/2011CN101154609B Apparatus and method for testing conductive bumps
01/19/2011CN101099085B A method and apparatus for increasing the operating frequency of a system for testing electronic devices
01/19/2011CN101055985B Battery pack for electric hand-held power tool
01/19/2011CN101036060B A method of designing a probe card apparatus with desired compliance characteristics
01/19/2011CN101023366B A method of monitoring line faults in a medium voltage network
01/18/2011US7873891 Programmable voltage divider
01/18/2011US7873890 Techniques for performing a Logic Built-In Self-Test in an integrated circuit device
01/18/2011US7873889 JTAG bus communication method and apparatus
01/18/2011US7873887 Burn-in test circuit, burn-in test method, burn-in test apparatus, and a burn-in test pattern generation program product
01/18/2011US7873886 PC-connectivity for on-chip memory
01/18/2011US7873885 SSD test systems and methods
01/18/2011US7873884 Wireless embedded test signal generation
01/18/2011US7873766 Integrated systems testing
01/18/2011US7872982 Implementing an error log analysis model to facilitate faster problem isolation and repair
01/18/2011US7872981 Rate selection for eigensteering in a MIMO communication system
01/18/2011US7872978 Obtaining parameters for minimizing an error event probability
01/18/2011US7872976 System and method for multi-protocol label switching network tuning
01/18/2011US7872968 Priority based bandwidth allocation within real-time and non-real time traffic streams
01/18/2011US7872965 Network resource teaming providing resource redundancy and transmit/receive load-balancing through a plurality of redundant port trunks
01/18/2011US7872964 File transmission terminal
01/18/2011US7872490 Semiconductor integrated circuit and method for testing the same
01/18/2011US7872489 Radiation induced fault analysis
01/18/2011US7872488 Tester for testing semiconductor device
01/18/2011US7872487 Semiconductor wafer having a multitude of sensor elements and method for measuring sensor elements on a semiconductor wafer
01/18/2011US7872486 Wing-shaped support members for enhancing semiconductor probes and methods to form the same
01/18/2011US7872485 System and method for use in functional failure analysis by induced stimulus
01/18/2011US7872484 Chip pin test apparatus
01/18/2011US7872483 Circuit board having bypass pad
01/18/2011US7872482 High density interconnect system having rapid fabrication cycle
01/18/2011US7872481 Low glitch multiple form C summing node switcher
01/18/2011US7872479 Leak testing and leak localization arrangement for leak testing and leak localization for flat roofs or the like
01/18/2011US7872478 Method and adaptive distance protection relay for power transmission lines
01/18/2011US7872468 Optically measuring electric field intensities
01/18/2011US7872464 Hand held arc fault testing system
01/18/2011US7872374 Battery communication system
01/18/2011US7872239 Electrostatic lens assembly
01/18/2011US7871831 Method for connecting flip chip components
01/13/2011WO2011005541A2 On-line time domain reflectometer system
01/13/2011WO2011005534A2 Charged capacitor warning system and method
01/13/2011WO2011005152A1 Battery discharge measurement device and method
01/13/2011WO2011004996A2 Method for manufacturing an intermediary member, and intermediary member manufactured by the method
01/13/2011WO2011004788A1 Cell pack, semiconductor device, portable apparatus, and full charge reporting method
01/13/2011WO2011004749A1 Mobile device, battery pack, notification method, and notification program
01/13/2011WO2011004550A1 Circuit for counting number of cycles, battery pack, and battery system
01/13/2011WO2011004536A1 Electromagnetic field measuring device, electromagnetic field measuring method used for the measuring device, and non-transitory computer-readable medium in which electromagnetic field measurement control program is stored
01/13/2011WO2011004506A1 Nail puncture test equipment having temperature measurement function
01/13/2011WO2011004249A2 Secondary battery temperature-estimating apparatus
01/13/2011WO2011004058A1 Method and arrangement for improved controllability of fuel cell stacks
01/13/2011WO2011004057A1 Method and arrangement for improved controllability of parallel coupled fuel cells
01/13/2011WO2011003917A1 Monitoring the effective age of electronic components or assemblies
01/13/2011WO2011003799A1 Device for safely testing batteries
01/13/2011WO2011003472A1 Method and apparatus for harmonic detection
01/13/2011WO2011003347A1 Measureing device and measuring method for continuous physical quantity
01/13/2011WO2010120622A3 Battery management system
01/13/2011WO2010117565A3 Automated test equipment employing test signal transmission channel with embedded series isolation resistors
01/13/2011WO2010111590A3 System and method for improved testing of electronic devices
01/13/2011WO2010111293A3 Battery life estimation
01/13/2011WO2010108089A3 Display device for measurement tool
01/13/2011WO2010105238A3 General purpose protocol engine
01/13/2011WO2010101909A3 Metering system and method of operation
01/13/2011US20110010596 Testable circuit with input/output cell for standard cell library
01/13/2011US20110010595 Optimized jtag interface
01/13/2011US20110010594 Interface to full and reduce pin jtag devices
01/13/2011US20110010593 Scan architecture for full custom blocks
01/13/2011US20110010126 High voltage interlock strategy
01/13/2011US20110010117 Apparatus for nbti prediction
01/13/2011US20110010116 Induction motor parameter identification
01/13/2011US20110009735 Cardiac diagnostics using wall motion and perfusion cardiac mri imaging and systems for cardiac diagnostics
01/13/2011US20110007441 Method and circuit for short-circuit and over-current protection in a discharge lamp system
01/13/2011US20110006802 High sensitivity differential current transformer for insulation health monitoring
01/13/2011US20110006801 Circuit Arrangement for Overtemperature Detection
01/13/2011US20110006800 System for testing an integrated circuit of a device and its method of use
01/13/2011US20110006799 Method for manufacturing probe supporting plate, computer storage medium and probe supporting plate
01/13/2011US20110006798 Probe card cassette and probe card
01/13/2011US20110006797 Probe card and test equipment
01/13/2011US20110006796 Probe retention arrangement
01/13/2011US20110006795 Contact probe device