Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2011
02/01/2011US7881194 Method for pacing multi-rate time sensitive traffic on ethernet and bridge connected networks
02/01/2011US7881193 Network system
02/01/2011US7881191 Method and apparatus for downlink multi-channel packet combined scheduling in mobile communication system
02/01/2011US7881188 Methods, systems, and computer program products for implementing link redundancy in a media gateway
02/01/2011US7880763 Semiconductor device and manufacturing method therefor
02/01/2011US7880495 Display device and test probe for testing display device
02/01/2011US7880494 Accurate capacitance measurement for ultra large scale integrated circuits
02/01/2011US7880493 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device
02/01/2011US7880492 Integrated circuits with programmable well biasing
02/01/2011US7880491 Multilayer semiconductor device
02/01/2011US7880490 Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same
02/01/2011US7880489 Printing of redistribution traces on electronic component
02/01/2011US7880488 Universal current leakage testing adapter
02/01/2011US7880487 Test lead probe with retractable insulative sleeve
02/01/2011US7880486 Method and apparatus for increasing operating frequency of a system for testing electronic devices
02/01/2011US7880484 Method and apparatus for estimating the condition of a coating on an underground pipeline
02/01/2011US7880476 Method to and apparatus for detecting and locating a fault in an electrical conductor wire
02/01/2011US7880475 Type A USB receptacle with plug detection
02/01/2011US7880474 Distributed network repeater system
02/01/2011US7880473 Non-invasive monitoring and diagnosis of electric machines by measuring external flux density
02/01/2011US7880470 Switching circuit, signal output device and test apparatus
02/01/2011US7880461 System for transferring test trays and a handler having same
02/01/2011US7880460 Hardware in the loop motor simulation
02/01/2011US7879732 Thin film etching method and semiconductor device fabrication using same
02/01/2011US7879627 Overlay marks and methods of manufacturing such marks
01/2011
01/27/2011WO2011011013A1 Active pin connection monitoring system and method
01/27/2011WO2011010975A1 Battery voltage indicator comprising lamp and connected to battery terminals
01/27/2011WO2011010412A1 Test apparatus
01/27/2011WO2011010410A1 Test apparatus, additional circuit, and board for testing
01/27/2011WO2011010409A1 Test apparatus, additional circuit, and board for testing
01/27/2011WO2011010349A1 Testing device
01/27/2011WO2011010325A1 An on-line diagnostic method for health monitoring of a transformer
01/27/2011WO2011010026A1 Method for diagnosing the operation of a device for cutting off and connecting a battery from/to the onboard power network of a motor vehicle
01/27/2011WO2011009751A1 Method for diagnosing current sensors in an induction machine during operation thereof
01/27/2011WO2011009511A1 Method for operating a vehicle and control device for a vehicle
01/27/2011WO2011009504A1 Frequency-selective measuring device and frequency-selective measuring method
01/27/2011WO2011009227A1 Systems and methods for determining battery state of charge
01/27/2011WO2010129760A3 Systems and methods for conducting emi susceptibility testing
01/27/2011WO2010115157A3 Spacer-connector and circuit board assembly
01/27/2011WO2010108011A3 Planar contact with solder
01/27/2011US20110022912 Integrated circuit with jtag port, tap linking module, and off/chip tap interface port
01/27/2011US20110022910 Arithmetic logic unit for use within a flight control system
01/27/2011US20110022909 Apparatus and method for protecting soft errors
01/27/2011US20110022908 Robust scan synthesis for protecting soft errors
01/27/2011US20110022907 FPGA Test Configuration Minimization
01/27/2011US20110022906 Method and system for test point insertion
01/27/2011US20110022338 Determining degraded insulating ability in an inductively operating element
01/27/2011US20110020015 Electronic apparatus, image forming apparatus, and connection confirmation method for connectors
01/27/2011US20110019724 Phy control module for a multi-pair gigabit transceiver
01/27/2011US20110019569 Monitor for multi-protocol label switching (mpls) networks
01/27/2011US20110018580 Power supply apparatus, power supply unit diagnostic apparatus, and method for controlling power supply apparatus
01/27/2011US20110018579 Auxiliary power unit diagnostic tool
01/27/2011US20110018578 Methods, systems and apparatus for detecting abnormal operation of an inverter sub-module
01/27/2011US20110018577 Test circuit, wafer, measuring apparatus, measuring method, device manufacturing method and display apparatus
01/27/2011US20110018576 Method and device for testing semiconductor
01/27/2011US20110018575 Method and system for assessing reliability of integrated circuit
01/27/2011US20110018574 Reconfigurable connections for stacked semiconductor devices
01/27/2011US20110018573 Semiconductor Device, A Method of Manufacturing A Semiconductor Device and A Testing Method of the Same
01/27/2011US20110018572 Semiconductor device test system
01/27/2011US20110018571 Chip on glass type lcd device and inspecting method of the same
01/27/2011US20110018570 Self-cleaning package testing socket
01/27/2011US20110018569 Test apparatus of semiconductor device and method thereof
01/27/2011US20110018568 Semiconductor test equipment with concentric pogo towers
01/27/2011US20110018566 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures
01/27/2011US20110018565 Dielectric breakdown lifetime enhancement using alternating current (ac) capacitance
01/27/2011US20110018564 Wafer prober for semiconductor inspection and inspection method
01/27/2011US20110018551 Method and device for determining degradation state of electrical storage device in hybrid construction equipment
01/27/2011US20110018550 Integrated circuit with test arrangement, integrated circuit arrangement and text method
01/27/2011US20110018549 Test apparatus, additional circuit and test board
01/27/2011US20110018548 Printed circuit board test assisting apparatus, printed circuit board test assisting method, and computer-readable information recording medium
01/27/2011US20110018547 Test Instruments For Pulse TDR, Step TDR and Tranmission Anaylsis
01/27/2011US20110018142 Active matrix substrate, display device, method for inspecting active matrix substrate, and method for inspecting display device
01/27/2011DE10343346B4 Verfahren zum Prüfen einer elektrischen Schaltung und Einrichtung zur Durchführung des Verfahrens A method of testing an electrical circuit and means for carrying out the method
01/27/2011DE102009034242A1 Method for testing controller utilized for controlling e.g. brake lamp of lorry, involves automatically operating regulator to determine whether controller properly operates or not upon detected output signal
01/26/2011EP2278752A1 Device and method for testing a chip on which a cryptographic procedure is implemented
01/26/2011EP2278682A1 Secondary battery device
01/26/2011EP2278428A2 Diagnostic system for protecting a tap-changer
01/26/2011EP2278349A2 Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method
01/26/2011EP2278348A2 Optical Information Device, Optical Storage Medium, Optical Storage Medium Inspection Device, and Optical Storage Inspection Method
01/26/2011EP2278347A2 Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method
01/26/2011EP2277056A1 Method for manufacturing and testing an integrated electronic circuit
01/26/2011EP2146214B1 Packaged die heater
01/26/2011EP1611447B1 Method for in-situ monitor and control of film thickness and trench depth
01/26/2011CN201726586U Flexible printed circuit board capable of preventing same from being missing from procedures of circuit detection
01/26/2011CN201726200U Low-voltage phase line grounding remote alarm for 10-20kV transformer
01/26/2011CN201726066U Hardware structure of airborne system of power line patrol-inspection helicopter
01/26/2011CN201725987U Leakage protection socket with sound and light alarm
01/26/2011CN201725880U Electric connector for convenient test and locking ring thereof
01/26/2011CN201725371U Door control system with remote maintenance function
01/26/2011CN201725034U Gun position terminal, gun position system and gun with gun position terminal
01/26/2011CN201725024U Test device of automatic timing turning on and off of LED street lamp
01/26/2011CN201725023U Novel storage battery online detection device
01/26/2011CN201725022U Air-tightness testing device for sealed valve-regulated lead-acid battery
01/26/2011CN201725021U Detector for multi-string lithium ion battery protective plate
01/26/2011CN201725020U Durability simulation testing instrument for motor load
01/26/2011CN201725019U Service life detector for thermal protector
01/26/2011CN201725018U Vacuum circuit breaker detection device
01/26/2011CN201725017U Quick detecting instrument for mold plate detecting switches
01/26/2011CN201725016U Protection device full-interface testing device based on simulated field and wave recording
01/26/2011CN201725015U Relay test tool