Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
03/1998
03/26/1998WO1998012668A1 Test method and test apparatus using pattern matching
03/26/1998WO1998012525A1 Fiber optic sensor having a multicore optical fiber and an associated sensing method
03/26/1998WO1998012503A1 Calibrating cameras used in alignment of wheels
03/26/1998WO1998012502A1 Device for imaging object to be inspected and device for inspecting semiconductor package
03/26/1998WO1998012501A1 Method and device for 3d measurement
03/26/1998DE19739250A1 Optical recording method for arbitrary, three-dimensional object surface e.g. vase
03/26/1998DE19639999A1 Verfahren und Vorrichtung für die 3D-Messung Method and device for the 3D measurement
03/26/1998DE19639213A1 Shearing-Speckle pattern interferometry for oscillating object
03/26/1998CA2266071A1 Calibrating cameras used in alignment of wheels
03/25/1998EP0831464A1 Apparatus for optical differential measurement of glide height above a magnetic disk
03/25/1998EP0831298A2 Wave-surface aberration-measuring apparatus and methods
03/25/1998EP0831297A1 Optical apparatus for inspecting laser texture
03/25/1998EP0831296A1 Optical apparatus for rapid defect analysis
03/25/1998EP0831295A1 Optical differential profile measurement apparatus and process
03/25/1998EP0831224A2 Sensor arrangement for rapid cylinder identification in an internal combustion engine
03/25/1998EP0830587A1 Device for use in the optical investigation of surfaces
03/25/1998EP0830566A1 Light beam range finder
03/25/1998EP0830565A1 Distance measuring confocal microscope
03/25/1998EP0830564A1 Spectral bio-imaging methods for biological research, medical diagnostics and therapy
03/25/1998CN1177096A Method for measuring diameter of horizontal tank
03/24/1998US5732166 High temperature-resistant optical sensing apparatus and method of making
03/24/1998US5732163 Angular alignment of structures using moire patterns
03/24/1998US5731876 Method and apparatus for on-line determination of the thickness of a multilayer film using a partially reflecting roller and low coherence reflectometry
03/24/1998US5731870 Intelligent sensor method and apparatus for an optical wheel alignment machine
03/24/1998US5731582 Surface sensor device
03/24/1998US5729895 Process for compensating for the position of a camera in a chip mount system and process for mounting chips using the compensation method
03/19/1998WO1998011450A1 Vectorial photosensor
03/19/1998WO1998011405A1 Measuring device primarily for use with vehicles
03/19/1998WO1998011404A1 Method for increasing the significance of tridimensional measuring of objects
03/19/1998WO1998011403A1 Three-dimensional object measurement process and device
03/19/1998WO1998001720A3 Position detection system for an object with at least five degrees of freedom
03/19/1998DE19638758A1 Verfahren und Vorrichtung zur dreidimensionalen Vermessung von Objekten Method and apparatus for three-dimensional measurement of objects
03/19/1998DE19638727A1 Verfahren zur Erhöhung der Signifikanz der dreidimensionalen Vermessung von Objekten A method of increasing the significance of the three-dimensional measurement of objects
03/18/1998EP0829701A1 Method and system for geometry measurement
03/18/1998EP0829700A2 Method and apparatus for determination of the thickness of a multilayer film using a partially reflecting roller and low coherence reflectometry
03/18/1998EP0829699A2 Method and system for measuring three-dimensional displacement
03/18/1998EP0829231A2 Three-dimensional shape measuring apparatus
03/18/1998EP0829171A1 Stereoscopic autofocusing, rangefinding and videometry
03/18/1998EP0828991A1 Method and device for aligning the shaft of a rotating machine
03/18/1998EP0828990A1 Dimensioning system
03/18/1998EP0786071A4 On-axis mask and wafer alignment system
03/18/1998EP0727038A4 Devices and methods for detection of an analyte based upon light interference
03/18/1998EP0657018B1 Contactless inner coating measuring device and method for cast iron pipes
03/18/1998CN1176378A Three-dimensional shape measuring apparatus
03/17/1998US5729622 Automatic inspection system for contactlessly measuring an offset of a central feature of an object
03/17/1998US5729475 Optical system for accurate monitoring of the position and orientation of an object
03/17/1998US5729348 Fluorescence dot area meter
03/17/1998US5729346 Method and apparatus for testing automatic insertion state of electronic component in printed circuit board
03/17/1998US5729345 Apparatus and method for determining distortion of a welded member
03/17/1998US5729344 Method and apparatus for forming an optical surface by optical etching
03/17/1998US5729343 Film thickness measurement apparatus with tilting stage and method of operation
03/17/1998US5729340 Bottle inspection machine
03/17/1998US5729337 Inclination detecting apparatus
03/17/1998US5727880 Method and apparatus for measuring temperature using infrared techniques
03/13/1998CA2212080A1 Triple modulation experiment for a fourier transform spectrometer
03/12/1998WO1998010373A1 Position-sensing unit and multidimensional pointer comprising one or more such units
03/12/1998WO1998010296A1 Optical fiber probe and its manufacturing method
03/12/1998WO1998010268A1 Glass master surface inspector
03/12/1998WO1998010255A1 Method and device for determining the phase- and/or amplitude data of an electromagnetic wave
03/12/1998WO1998010244A1 Method and device for determining the spatial coordinates of objects
03/12/1998WO1998010243A1 Optical imaging method and device
03/12/1998WO1998010242A1 Fiber optic grating transverse strain sensor system
03/12/1998WO1998009789A1 System and method for controlling the size of material banks in calenders, mills, and feed mills
03/12/1998DE19726094A1 Image processing method for detecting defects on surface of object
03/12/1998DE19637682A1 Verfahren zur Bestimmung der räumlichen Koordinaten von Gegenständen und/oder deren zeitlicher Änderung und Vorrichtung zur Anwendung dieses Verfahrens Method for determining the spatial coordinates of objects and / or their temporal variation and device for applying this method
03/12/1998DE19635072A1 Method for measuring roughness of semiconductor or other surface
03/12/1998CA2264095A1 System and method for controlling the size of material banks in calenders, mills, and feed mills
03/12/1998CA2258640A1 Fiber optic grating transverse strain sensor system
03/11/1998EP0828138A2 Device for examining surfaces
03/11/1998EP0828137A2 Device for examining surfaces
03/11/1998EP0304460B2 Method of and apparatus for calibration of machines
03/11/1998CN1175687A Method and apparatus for following and inspecting edge or border
03/11/1998CN1175683A Control method for laser measurement of tube thickness of picture tube
03/11/1998CN1175682A Charge coupler direct subdivided raster displacement transducer and method for carrying out same
03/10/1998US5726907 Biaxial non-contacting strain measurement using machine vision
03/10/1998US5726754 Variable-speed scanning for interferometric measurements
03/10/1998US5726705 Surface defect inspection apparatus
03/10/1998US5726366 Device for measuring dimensions of workpieces
03/10/1998US5724743 Method and apparatus for determining the alignment of motor vehicle wheels
03/10/1998US5724722 Component handling device
03/05/1998WO1998009136A1 Photoelectric displacement detector
03/05/1998WO1998009134A1 Method and apparatus for generating a three-dimensional topographical image of a microscopic specimen
03/05/1998WO1998005066A3 Methods and apparatus for the in-process detection and measurement of thin film layers
03/05/1998DE19736588A1 Opto-electronic distance measuring unit with beam transmitted from measuring unit head, e.g. for CCD camera
03/05/1998DE19729380A1 Physical dimensions determining method for person represented by stored image from monitoring camera
03/05/1998DE19636354A1 Verfahren und Vorrichtung zur Durchführung von optischen Aufnahmen A method and apparatus for carrying out optical pick up
03/04/1998EP0827193A2 Polishing endpoint determination method and apparatus
03/04/1998EP0827002A2 Method of determining position data and device for measuring the magnification of an optical beam path
03/04/1998EP0826948A2 Connector with a steering angle sensor and column structure using the same
03/04/1998EP0826944A1 Method of measuring positions of optical transmission members
03/04/1998EP0801723A4 Opto-mechanical instrument to measure linear distances
03/04/1998EP0659265B1 Spatial positioning system
03/04/1998CN1175305A Method and device for continuous monitoring of dynamic loads
03/03/1998US5724447 Image processing apparatus
03/03/1998US5724150 Method and apparatus for measuring a position of webs or sheets
03/03/1998US5724145 Optical film thickness measurement method, film formation method, and semiconductor laser fabrication method
03/03/1998US5724144 Process monitoring and thickness measurement from the back side of a semiconductor body
03/03/1998US5724140 Method and apparatus for determining the quality of flat glass sheet
03/03/1998US5724139 Dark field, photon tunneling imaging probes
03/03/1998US5724137 Fringe pattern discriminator for interferometer using diffraction gratings