Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
03/1998
03/03/1998US5724136 For providing a measurement of motion of a moving stage
03/03/1998US5724134 Calibration standard for optical gap measuring tools
03/03/1998US5724130 Technique for the measurement and calibration of angular position
03/03/1998US5724129 Method for determining vehicle wheel alignments
03/03/1998US5724128 Apparatus and method for determining vehicle wheel alignment measurements from three dimensional wheel positions and orientations
03/03/1998US5723869 Two-dimensional inspection system
03/03/1998US5723858 Position encoder with fault indicator
03/03/1998US5723857 Method and apparatus for detecting cracks and strains on structures using optical fibers and Bragg gratings
03/03/1998US5723855 System for remotely controlling a movable object
03/03/1998US5723793 Methods and apparatus for measuring stress and strain characteristics of microscopic specimens
03/03/1998US5722406 Device for carrying out optical measurements in turbid media
03/03/1998US5722398 Apparatus for measuring concentration of hemoglobin and method for the same
02/1998
02/26/1998WO1998008219A1 Phase-controlled evanescent field systems and methods
02/26/1998WO1998008112A1 3d ultrasound recording device
02/26/1998WO1998008079A1 Device for optical capture of a parameter of a longitudinally moving thread-shaped body
02/26/1998WO1998008053A1 Stereocamera for photogrammetry
02/26/1998WO1998008049A1 Contact wire measuring device
02/26/1998WO1998008048A1 Topographical cornea mapping for corneal vision correction
02/26/1998DE19727402A1 System for determining fluctuations in refractive index of gas or air
02/26/1998DE19720160A1 Procedure for determining contour of 3-dimensional surface
02/26/1998DE19634336A1 Geometric parameters measuring system for circular saw blade
02/26/1998DE19632763A1 Measurement head for monitoring development of photoresist
02/25/1998EP0825433A2 Fluoresence dot area meter
02/25/1998EP0825415A2 Apparatus and related methods for obtaining tire profiles
02/25/1998EP0824995A1 Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
02/25/1998CN1174607A System and method for electronically displaying yarn qualities
02/25/1998CN1174428A Laser aid
02/24/1998US5721618 Apparatus for measuring the dimensions of large objects
02/24/1998US5721611 Photogrammetric camera, in particular for photogrammetric measurements of technical objects
02/24/1998US5721533 Cable deployment monitoring arrangement
02/19/1998WO1998007118A1 Detection system
02/19/1998WO1998007012A1 Five-axis/six-axis laser measuring system
02/19/1998WO1998007003A1 Flatness investigation
02/19/1998WO1998007002A1 Improved thickness monitoring
02/19/1998WO1998007001A1 Apparatus and method for making accurate three-dimensional size measurements of inaccessible objects
02/19/1998WO1998007000A1 Method and device for the measuring of the overlap width of a lap joint where two work pieces lie flat upon each other
02/19/1998WO1998006999A1 Method and device for measuring the thickness of an insulating coating
02/19/1998DE19633686A1 Distances and-or spatial coordinates measuring device for moving objects
02/19/1998DE19632539A1 Hard disc substrate for quality inspection and testing apparatus
02/19/1998DE19626140A1 Method for setting up and measuring metal cutting tools
02/19/1998CA2263530A1 Apparatus and method for making accurate three-dimensional size measurements of inaccessible objects
02/19/1998CA2263347A1 Method and device for measuring the thickness of an insulating coating
02/18/1998EP0824215A2 Distance measuring apparatus employing a modulated light source and phase shift detection
02/18/1998CN1173632A Laser axial centering instrument
02/17/1998US5719952 Inspection system for cross-sectional imaging
02/17/1998US5719678 Volumetric measurement of a parcel using a CCD line scanner and height sensor
02/17/1998US5719677 Dark field, photon tunneling imaging systems and methods for measuring flying height of read/write heads
02/17/1998US5719676 Diffraction management for grazing incidence interferometer
02/17/1998US5719669 Lens parameter measurement using optical sectioning
02/17/1998US5719668 Lens-meter for measuring optical characteristics of optical lens
02/17/1998US5719570 Optical encoder based fader design
02/17/1998US5719495 Apparatus for semiconductor device fabrication diagnosis and prognosis
02/17/1998US5718512 High-temperature probe
02/17/1998US5718054 Device for displaying a center point of a laser beam in a vertical-degree measuring system
02/17/1998CA2010845C Connection testing system of conductor ends in a connector and automatic connection facility equipped with said system
02/12/1998WO1998006066A1 System and method for modeling a three-dimensional object
02/12/1998WO1998005926A1 Automatic collimation method and automatic collimation apparatus
02/12/1998WO1998005924A1 Device for ascertaining misalignments of two shafts arranged one behind the other
02/12/1998WO1998005923A1 Triangulation-based 3d imaging and processing method and system
02/12/1998WO1998005922A1 Calibration method
02/12/1998WO1998005921A1 Method of determining the wall thickness of a turbine blade and device for carrying out this method
02/12/1998WO1998005515A1 Device for optically controlling by means of a camera a mark stamped on a workpiece by means of a type wheel
02/12/1998DE19634881C1 Optical test arrangement for production quality control
02/11/1998EP0823309A1 Method and apparatus for controlling flatness of polished semiconductor wafers
02/11/1998EP0823037A1 Method and system for triangulation-based, 3-d imaging utilizing an angled scanning beam of radiant energy
02/11/1998EP0823036A1 Intelligent vehicle highway system sensor and method
02/11/1998CN2274337Y Photoelectric self-collimator
02/11/1998CN1172944A Method and device for detecting vehicle wheel base difference
02/11/1998CN1172869A Non-distorting video camera for use with system for controlling growth of silicon crystal
02/10/1998US5717491 Process and device for determining the center-line of a curvature
02/10/1998US5717490 Method for identifying order skipping in spectroreflective film measurement equipment
02/10/1998US5717488 Apparatus for measuring displacement using first and second detecting means for measuring linear and rotary motion
02/10/1998US5717485 Foreign substance inspection apparatus
02/10/1998US5717484 Position detecting system
02/10/1998US5717217 Method for determining thickness, degree of cure and other properties of a polymeric coating
02/10/1998US5717216 Thickness gauging using ultraviolet light absorption
02/10/1998US5716169 Process and device for adjusting reamers and the like
02/10/1998US5715843 Method of and apparatus for measuring the diameters of rod-shaped articles of the tobacco processing industry
02/10/1998US5715609 Stationary shaft alignment apparatus
02/05/1998WO1998005157A2 High accuracy calibration for 3d scanning and measuring systems
02/05/1998WO1998005066A2 Methods and apparatus for the in-process detection and measurement of thin film layers
02/05/1998WO1998004997A1 Method and apparatus for identifying characters on a plurality of silicon wafers
02/05/1998WO1998004882A1 Split optics arrangement for vision inspection/sorter module
02/05/1998WO1998004881A1 System and method for determining spatial coordinates
02/05/1998DE19733890A1 Optical interferometry method for measuring objects
02/05/1998DE19731854A1 Skala zur Erfassung der Position eines sich bewegenden Objekts sowie eine diese Skala verwendende Vorrichtung Scale for detecting the position of a moving object and a device using this scale
02/05/1998DE19631506A1 Vorrichtung zur optischen Kontrolle einer mit einem Typenrad in ein Werkstück eingebrachten Prägemarkierung mittels einer Kamera Apparatus for optical control an introduced with a daisy wheel into a workpiece embossed mark by a camera
02/05/1998DE19631205A1 Non-contact determination of geometries of three dimensional objects
02/04/1998EP0822436A2 Method for determining measurement-point position data and device for measuring the magnification of an optical beam path
02/04/1998EP0822390A1 Surface roughness measuring apparatus and method
02/04/1998EP0822389A2 Procedure and device to determine and to verify the contour of a rim
02/04/1998EP0822388A2 Method for calibrating an apparatus to measure a moving film, and a device for executing the method
02/04/1998EP0822029A1 Method of screw hole recognition
02/04/1998EP0821908A1 Eye detection system
02/04/1998EP0821780A1 Plane object two-dimensional measurement process and system
02/04/1998EP0821779A1 Device comprising diffuse foreground illumination for detecting an electronic component, and component-mounting machine provided with such a detection device
02/04/1998EP0670993B1 Method and apparatus for measuring by ellipsometry the temperature of an object, particularly semiconductor
02/04/1998CN1172532A Electro-optical measuring device for absolute distances
02/04/1998CN1172527A Coordinate detecting system, method therefor and game system
02/04/1998CN1172248A Optical gauge