Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/2005
08/25/2005WO2005077135A2 Method and appartus for high speed thickness mapping of patterned thin films
08/25/2005US20050186483 Method for determining a map, device manufacturing method, and lithographic apparatus
08/25/2005US20050185197 Optical scatterometry method of sidewall spacer analysis
08/25/2005US20050185196 Optical displacement sensor, and external force detecting device
08/25/2005US20050185195 Positional measurement system and lens for positional measurement
08/25/2005US20050185194 Identification and labeling of beam images of a structured beam matrix
08/25/2005US20050185193 System and method of using a side-mounted interferometer to acquire position information
08/25/2005US20050185182 Retroreflector covered by window
08/25/2005US20050185181 Optical device and inspection module
08/25/2005US20050185172 Surface inspection apparatus and method thereof
08/25/2005US20050185049 Camera calibration device and method, and computer system
08/25/2005US20050184301 Multiple ranging apparatus
08/25/2005US20050184259 Object detection apparatus for a vehicle
08/25/2005US20050183282 Method and apparatus for measuring depth of holes formed on a specimen
08/25/2005DE10392754T5 Interferometrisches optisches System und Verfahren, die eine optische Pfadlänge und einen Fokus bzw. Brennpunkt liefern, die gleichzeitig abgetastet werden Interferometric optical system and method which provide an optical path length and a focus or focal point, which are sampled at the same time
08/25/2005DE102004006258A1 Method for approximation of two measuring processes of tapering structure widths on substrate for obtaining mutually comparable values
08/25/2005DE102004001085A1 Appliance to soften water has a container filled with an ion/cation exchange resin, with a salt chamber for resin regeneration, and a sensor to give continuous information on the resin condition
08/25/2005CA2556103A1 Surface shape measurement apparatus and method
08/24/2005EP1566654A2 Device in a vehicle for measuring light
08/24/2005EP1565290A1 Method for fastening a tool within a tool chuck
08/24/2005EP1242786B1 Method for determining three-dimensional surface coordinates
08/24/2005EP1086382B1 Measuring and compensating for warp in the inspection of printed circuit board assemblies
08/24/2005CN2720407Y Five-lever mechanism measuring device for profile curve of railway rail section
08/24/2005CN2720406Y Optical-fiber grating or optical strain transducing head and strain measuring system
08/24/2005CN1659695A Wafer pre-alignment apparatus and method
08/24/2005CN1659574A Selection of wavelengths for integrated circuit optical metrology
08/24/2005CN1659419A Franking system and method
08/24/2005CN1659418A Camera corrector
08/24/2005CN1658290A Method and arrangement for removing noise and measurements of head-media spacing modulation for digital recording
08/24/2005CN1658229A Optical sensing apparatus to navigate position and a navigation method thereof
08/24/2005CN1657947A Optical movement information detector, movement information detection system, electronic equipment and encoder
08/24/2005CN1657873A 光学式测定装置及光学式测定方法 An optical measurement apparatus and an optical measuring method
08/24/2005CN1657872A Rotary scanning measuring apparatus
08/24/2005CN1657871A Dynamic measuring device and method for position posture of space motion object
08/24/2005CN1657870A Object device with hydrophily optical emission window
08/24/2005CN1657869A Positional measurement system and lens for positional measurement
08/24/2005CN1657868A Quick calibrating method for line structure optical sensor based on coplanar calibrated reference
08/24/2005CN1657867A Object detection device with operation monitoring function
08/24/2005CN1657865A System and method of using a side-mounted interferometer to acquire position information
08/24/2005CN1216273C Method for calibrating structure optical vision sensor
08/24/2005CN1216272C Method and apparatus for measuring wall thickness of plastic container
08/23/2005US6934406 Image processing apparatus, image processing method, and recording medium recorded with image processing program to process image taking into consideration difference in image pickup condition using AAM
08/23/2005US6934089 Objective lens system
08/23/2005US6934040 Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
08/23/2005US6934036 Configuration measuring apparatus and method
08/23/2005US6934035 System and method for measuring optical distance
08/23/2005US6934027 Interferometric measuring device
08/23/2005US6934025 Thin film optical measurement system and method with calibrating ellipsometer
08/23/2005US6934019 Confocal wafer-inspection system
08/23/2005US6934018 Tire inspection apparatus and method
08/23/2005US6934013 Compressed symbology strain gage
08/23/2005US6934011 Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements
08/23/2005US6933492 Optical position transducer
08/23/2005US6932864 Method and apparatus for measuring the position of a phase interface during crystal growth
08/23/2005US6931971 Laser-based jaw setting device
08/23/2005US6931748 Riser and tubular inspection systems
08/23/2005US6931740 Line generating device
08/23/2005US6931738 Device and procedure for aligning of components
08/23/2005US6931737 Laser level device
08/23/2005US6931736 Method of and apparatus for the inspection of vehicle wheel alignment
08/23/2005US6931710 Manufacturing of micro-objects such as miniature diamond tool tips
08/23/2005CA2308630C Device for referencing a system of coordinates
08/18/2005WO2005076321A1 Exposure apparatus and method of producing device
08/18/2005WO2005076214A1 Method and system for image processing for profiling with uncoded structured light
08/18/2005WO2005076198A1 Device for measuring 3d shape using irregular pattern and method for the same
08/18/2005WO2005076146A1 Method and system for monitoring component consumption
08/18/2005WO2005075936A1 Method for determining the position of an object in a space
08/18/2005WO2005074789A1 Short-coherence interferometric measurement of length on the eye
08/18/2005WO2005045361A3 Scanning interferometry for thin film thickness and surface measurements
08/18/2005WO2005036601A3 Wafer characteristics via reflectomeytry and wafer processing apparatus and method
08/18/2005US20050182594 Microdevice processing systems and methods
08/18/2005US20050180623 Method and apparatus for scanning three-dimensional objects
08/18/2005US20050180606 Optical sensing apparatus to navigate position and a navigation method thereof
08/18/2005US20050179910 System and method for measuring thin film thickness variations and for compensating for the variations
08/18/2005US20050179909 Lithographic apparatus, device manufacturing method, and method for determining z-displacement
08/18/2005US20050179908 Optical movement information detector, movement information detection system, electronic equipment and encoder
08/18/2005US20050179890 Self-compensating laser tracker
08/18/2005US20050179883 System for automated focus measuring of a lithography tool
08/18/2005US20050179801 Camera corrector
08/18/2005US20050179460 Method and apparatus for testing semiconductor device chip wafer
08/18/2005US20050178944 Method for optically detecting deviations of an image plane of an imaging system from the surface of a substrate
08/18/2005US20050178015 Method and device for measuring wheel alignment of car
08/18/2005DE202004005191U1 Object`s surface area measuring device, has fluid fiber optic cable guiding light from light source, and light mixer with micro lens unit provided in measurement unit and provided between end of cable and image lenses
08/18/2005DE10356829B3 Measurement standard for calibrating interferometric systems has opaque layer with surface roughness in atomic range, at least one structure of defined geometry with at least one edge; layer is joined to transmissive substrate
08/18/2005DE102005002994A1 Koordinatenversatz-Einstellsystem und Koordinatenversatz-Einstellverfahren Coordinate offset adjustment system and coordinate offset adjustment
08/18/2005DE102004004193A1 Verfahren und Vorrichtung zur Winkeljustage eines Sensors in einem Kraftfahrzeug Method and device for angle adjustment of a sensor in a motor vehicle
08/18/2005DE102004004012A1 Vorrichtung zur Erleichterung der Einstellung der Dicke einer Produktbahn Device to facilitate the adjustment of the thickness of a product web
08/18/2005DE102004003850A1 Verfahren zur Erkennung von Markierungen auf einer Fahrbahn A method for detection of markings on a roadway
08/18/2005DE102004003686A1 Device for motor vehicle for measuring light has one or two sensor elements suitable for determining surface angle of light source and one sensor element suitable for determining elevation angle of light source
08/18/2005DE102004002103A1 Measurement and adjusting unit for determining and varying the alignment of a tool, e.g. a drill bit used with a machine tool, whereby a computer is used to superimpose images recorded from different angles of the tool
08/18/2005DE10118514B4 Verfahren zur Arbeitspunktstabilisierung bei berührungsloser 3D- Positionserkennung eines zu vermessenden Objektes mittels Digitalkameras Method for operating point stabilization in non-contact 3D position detection of an object to be measured by means of digital cameras
08/18/2005CA2554781A1 Method and system for image processing for profiling with uncoded structured light
08/18/2005CA2553960A1 Processing pose data derived from the pose of an elongate object
08/17/2005EP1564703A1 Vehicle driving assist system
08/17/2005EP1563332A1 Method for improving the signal-to-noise ratio in confocal microscopes with multi-pinhole filtering
08/17/2005EP1563251A2 Device and method for measuring surfaces on the internal walls of cylinders, using confocal microscopes
08/17/2005EP1563249A1 A coordinate measuring device and a method for measuring the position of an object
08/17/2005EP1563248A1 A coordinate measuring device with a vibration damping system
08/17/2005EP1562711A1 Apparatus and method for simultaneously coating and measuring parts
08/17/2005EP1244367B1 Procede pour l'identification et la classification anthropomorphique a usage militaire et civil