Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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09/06/2005 | US6941002 Fingerprint reading device and method thereof |
09/06/2005 | US6940664 Document imaging system |
09/06/2005 | US6940611 Imaging a three-dimensional structure by confocal focussing an array of light beams |
09/06/2005 | US6940609 Method and system for measuring the topography of a sample |
09/06/2005 | US6940608 Method and apparatus for surface configuration measurement |
09/06/2005 | US6940605 Method for measuring interference and apparatus for measuring interference |
09/06/2005 | US6940604 Thin-film inspection method and device |
09/06/2005 | US6940585 Evaluation mask, focus measuring method and aberration measuring method |
09/06/2005 | US6940584 Exposure apparatus, maintenance method therefor, semiconductor device manufacturing method, and semiconductor manufacturing factory |
09/06/2005 | US6940062 Optical fiber curvature sensor for measuring body motion and its adhesive method |
09/06/2005 | US6938353 Adjustable probe |
09/03/2005 | CA2499118A1 Angle-measuring device |
09/01/2005 | WO2005080916A1 Device and method for determining spatial co-ordinates of an object |
09/01/2005 | WO2005080915A1 Three-dimensional shape detection device and image pick up device |
09/01/2005 | WO2005080914A1 Shape measurement device and method thereof |
09/01/2005 | WO2005079498A2 Continuously varying offset mark and methods of determining overlay |
09/01/2005 | WO2005079194A2 Optical beam translation device and method utilizing a pivoting optical fiber |
09/01/2005 | US20050192775 Biometric quality control process |
09/01/2005 | US20050192770 Biometric quality control process |
09/01/2005 | US20050190988 Passive positioning sensors |
09/01/2005 | US20050190680 Method of aligning optical system using a hologram and apparatus therefor |
09/01/2005 | US20050190381 Method and apparatus for controlling a calibration cycle or a metrology tool |
09/01/2005 | US20050190379 Jump takeoff position indicator system |
09/01/2005 | US20050190375 Stage apparatus and control method therefor |
09/01/2005 | US20050190374 Optical image measuring apparatus |
09/01/2005 | US20050190371 Low-coherence inferometric device for light-optical scanning of an object |
09/01/2005 | US20050190361 Apparatus for surface inspection and method and apparatus for inspecting substrate |
09/01/2005 | US20050190343 Projector, range finding method, and recording medium on which range finding method is recorded |
09/01/2005 | US20050190157 Data input device and method for detecting an off-surface condition by a laser speckle size characteristic |
09/01/2005 | US20050189657 Electronic component products and method of manufacturing electronic component products |
09/01/2005 | US20050189502 Alignment systems and methods for lithographic systems |
09/01/2005 | US20050189489 Method for matching two measurement methods for measuring structure widths on a substrate |
09/01/2005 | US20050189479 Detecting device for detecting the rotation of a motor rotor |
09/01/2005 | US20050188804 Linkage device for linear positioning apparatus |
09/01/2005 | US20050188753 Method of adjusting straight ahead traveling capability of vehicle |
09/01/2005 | US20050188557 Apparatus for providing sensory feedback to the operator of a portable measurement machine |
09/01/2005 | DE10393244T5 Interferometrisches Verfahren für ellipsometrische, reflektometrische und streulichtanalytische Messungen, einschließlich der Charakterisierung von Dünnfilmstrukturen Interferometric method for ellipsometric, reflectometric and scattering light analytical measurements, including the characterization of thin film structures |
09/01/2005 | DE10393243T5 Messung und Fehlerausgleichung bei Interferometern Measurement and error evaluation equation with interferometers |
09/01/2005 | DE10315608B4 Optischer Sensor sowie Verfahren zur Herstellung eines optischen Sensors Optical sensor and methods of making an optical sensor |
09/01/2005 | DE102005005608A1 Distance detector for vehicle, has light guide unit which directs laser beam on polygon mirror side while angle adjustment of reflective mirror is performed at the time of monitoring preceding vehicle |
09/01/2005 | DE102004063572A1 Verwendung von Zielbildern, um eine Lage einer Stufe zu Bestimmen Use of target images to a location of a stage to determine |
09/01/2005 | DE102004059132A1 Object detection device, e.g. for detecting obstacles or vehicles in front of a vehicle, has a light emission window that has a hydrophilic outer layer to prevent water droplet formation |
09/01/2005 | DE102004005380A1 Verfahren zur Bestimmung der Lage eines Objekts im Raum A method for determining the position of an object in space |
08/31/2005 | EP1569447A1 Projector, range finding method, and recording medium on which range finding method is recorded |
08/31/2005 | EP1569178A2 Image inputting device |
08/31/2005 | EP1569081A2 Data input device and method for detecting an off-surface condition by a laser speckle size characteristic |
08/31/2005 | EP1568985A2 Apparatus for surface inspection and method and apparatus for inspecting substrate |
08/31/2005 | EP1568981A2 Physical quantity measuring method using brillouin optical fiber sensor |
08/31/2005 | EP1568965A1 Device for implanting predetermined reference marks on a wall of a storage tank by marking with a pin. |
08/31/2005 | EP1568963A2 Interferometric apparatus for measuring shapes |
08/31/2005 | EP1568262A1 Electronic parts mounting apparatus and method |
08/31/2005 | EP1568090A2 Co-extrusion manufacturing process of thin film electrochemical cell for lithium polymer batteries and apparatus therefor |
08/31/2005 | EP1567827A1 Method and device for optical form measurement and/or estimation |
08/31/2005 | EP1567826A1 A surface profiling apparatus |
08/31/2005 | EP1567055A2 Method and system for monitoring breathing activity of a subject |
08/31/2005 | EP1456602B1 Sensor for the visual position detection (component, substrate) comprising a modular lighting device |
08/31/2005 | EP1348150B1 Lithographic manufacturing process comprising a method of measuring overlay |
08/31/2005 | EP1117974B1 Laser processing device with layer by layer removal with die depth storage for future control |
08/31/2005 | EP0983486B1 Distributed sensing system |
08/31/2005 | CN2722197Y Portable light pen three-dimensional coordinate measuring device |
08/31/2005 | CN2722196Y Device for controlling distance to watching television |
08/31/2005 | CN1662790A Device for measuring in three dimensions a topographical shape of an object |
08/31/2005 | CN1662789A Optical metrology of single features |
08/31/2005 | CN1662788A Scatterometric measurement of undercut multi-layer diffracting structures |
08/31/2005 | CN1661454A Reflection type image encoding device |
08/31/2005 | CN1661362A Print solder checker |
08/31/2005 | CN1661358A Optical image measuring apparatus |
08/31/2005 | CN1661335A Detecting device for detecting the rotation of a motor rotor |
08/31/2005 | CN1661323A Apparatus for surface inspection and method and apparatus for inspecting substrate |
08/31/2005 | CN1661322A Device for implanting predetermined reference marks on a wall of a storage tank by marking with a pin |
08/31/2005 | CN1660541A Optical measuring apparatus for measuring objects on machines and method |
08/31/2005 | CN1217154C Single-beam laser collimation/alignment measurement technology |
08/31/2005 | CN1217153C Long-range profile instrument |
08/30/2005 | US6937754 Inspection equipment |
08/30/2005 | US6937753 Automated wafer defect inspection system and a process of performing such inspection |
08/30/2005 | US6937696 Method and system for predictive physiological gating |
08/30/2005 | US6937352 Positioning device for RAM testing system |
08/30/2005 | US6937351 Non-destructive method of measuring the thickness of a semiconductor wafer |
08/30/2005 | US6937350 Apparatus and methods for optically monitoring thickness |
08/30/2005 | US6937349 Systems and methods for absolute positioning using repeated quasi-random pattern |
08/30/2005 | US6937348 Method and apparatus for generating structural pattern illumination |
08/30/2005 | US6937344 Method of measuring overlay |
08/30/2005 | US6937336 Optical alignment system for power tool |
08/30/2005 | US6937333 Apparatus for measuring film thickness formed on object, apparatus and method of measuring spectral reflectance of object, and apparatus and method of inspecting foreign material on object |
08/30/2005 | US6937329 Method for detecting and identifying defects in a laser beam weld seam |
08/30/2005 | US6937321 Distance measuring method and image input device with distance measuring function |
08/30/2005 | US6937235 Three-dimensional object surface shape modeling apparatus, method and program |
08/30/2005 | US6936819 semiconductor wafer chips; scanning electron microscope |
08/30/2005 | US6936386 for application to semiconductor wafers; comprises charge coupled camera; lithography |
08/30/2005 | US6935935 Measuring apparatus |
08/30/2005 | US6935193 Device for measuring the angle and/or the angular velocity of a rotatable body and/or the torque acting upon said body |
08/30/2005 | US6935036 Portable coordinate measurement machine |
08/30/2005 | US6935034 Laser line generating device |
08/25/2005 | WO2005078416A1 Device and method for determination of the chemical composition of solid liquid or gaseous materials |
08/25/2005 | WO2005078403A2 Device for determining the output of operational means |
08/25/2005 | WO2005078385A1 Surface shape measurement apparatus and method |
08/25/2005 | WO2005078384A1 Device for the optical analysis, including two-dimensional, of a thread or yarn |
08/25/2005 | WO2005078383A1 Confocal distance sensor |
08/25/2005 | WO2005077258A1 Eyeshot detection device using distance image sensor |
08/25/2005 | WO2005077255A1 Compact high resolution imaging apparatus |