Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/2005
09/28/2005EP1579172A1 Device for determining the wheel and/or axle geometry of motor vehicles
09/28/2005EP1579171A1 Laser digitizer system for dental applications
09/28/2005EP1579170A2 Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum
09/28/2005EP1579169A1 Measuring device and measuring method for pins, in particular plug pins
09/28/2005EP1238244B1 Automatic contrast focussing with three optical paths
09/28/2005EP1173749B1 Image editing for preparing a texture analysis
09/28/2005CN2729642Y Parameter memory apparatus of photoelectric detector
09/28/2005CN2729641Y Measuring system for deformation of ship
09/28/2005CN1675711A Method and device for measuring angle of torsion of suspension for magnetic disk
09/28/2005CN1675651A TFT sensor having improved imaging surface
09/28/2005CN1675518A Process endpoint detection method using broadband reflectometry
09/28/2005CN1675517A Method for controlling a recess etch process
09/28/2005CN1675516A Method for in-situ monitoring of patterned substrate processing using reflectometry
09/28/2005CN1675515A Common-path frequency-scanning interferometer
09/28/2005CN1674729A Method and apparatus for measuring thickness of deposited film and method and apparatus for forming material layer
09/28/2005CN1673860A Exposure device and positioning method
09/28/2005CN1673856A Device and method for detecting inclination of screen, and projection apparatus
09/28/2005CN1673794A Object lens producing device and producing method
09/28/2005CN1673683A Equipment for imaging linear optical sign
09/28/2005CN1673672A Micro-corner interferometer
09/28/2005CN1673671A Orientation analysis meter
09/28/2005CN1673670A Apparatus and method for measuring surface outline of measured object
09/28/2005CN1673669A Method for measuring slender article, especiallynon-round cross section size of cable
09/28/2005CN1673668A Method and apparatus for measuring electronic beam radius by laser
09/28/2005CN1673667A Inspection apparatus
09/28/2005CN1673666A Micro-structural 3D information obtaining method based on phase shifting interference image sequence analysis
09/28/2005CN1220864C Dynamic change detecting method and apparatus, and ultrasonic diagnosing apparatus
09/28/2005CN1220859C Fibre-optical beam displacement transducer
09/27/2005US6950780 Database interpolation method for optical measurement of diffractive microstructures
09/27/2005US6950775 Coordinate measuring system and field-of-view indicators therefor
09/27/2005US6950550 Tracing technique and recording media of object motion
09/27/2005US6950549 Visual inspection method and visual inspection apparatus
09/27/2005US6950547 Web inspection method and device
09/27/2005US6950546 Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
09/27/2005US6950195 Interference measuring device
09/27/2005US6950193 System for monitoring substrate conditions
09/27/2005US6950191 Method of extracting circular region from fringe image
09/27/2005US6950188 Wafer alignment system using parallel imaging detection
09/27/2005US6950186 Polarization analyzing method
09/27/2005US6950179 Shape measuring apparatus, shape measuring method, and aligning method
09/27/2005US6950120 Camera layout for acquiring images used in panoramic synthesis
09/27/2005US6949844 High-speed precision positioning apparatus
09/27/2005US6949755 Position detection apparatus, position detection method, exposure apparatus, device manufacturing method, and substrate
09/27/2005US6948825 Illumination device and method for illuminating an object
09/27/2005US6948252 Light projecting goniometer
09/22/2005WO2005088962A1 Tracking device and motion capture device
09/22/2005WO2005088686A1 Step measuring method and apparatus, and exposure method and apparatus
09/22/2005WO2005088252A1 Method for determination of stand attributes and a computer program for performing the method
09/22/2005WO2005088244A1 Plane detector, plane detecting method, and robot apparatus with plane detector
09/22/2005WO2005088243A1 Three-dimensional shape measuring system and three-dimensional shape measuring method
09/22/2005WO2005088242A2 Method and scanning arrangement for the contactless scanning of three-dimensional objects and device for holding the objects
09/22/2005WO2005088241A1 Low-coherence interferometric method and appliance for scanning surfaces in a light-optical manner
09/22/2005WO2005088238A1 Sensing head for a coordinate measuring device
09/22/2005WO2005087460A1 Apparatus, method and system for detecting the width and position of adhesives applied to a substrate
09/22/2005WO2005086714A2 Grazing incidence relays
09/22/2005WO2005067389A3 Three-dimensional video scanner
09/22/2005US20050209822 Inspection method and system and production method of mounted substrate
09/22/2005US20050209816 Optical metrology optimization for repetitive structures
09/22/2005US20050208842 [positioning apparatus and positioning method using the same]
09/22/2005US20050208698 Monitoring the deposition properties of an oled
09/22/2005US20050208685 Periodic patterns and technique to control misalignment
09/22/2005US20050207639 Inspection apparatus
09/22/2005US20050207616 Movable barrier operator with an obstacle detector
09/22/2005US20050206911 Method and apparatus for measuring thickness of thin film formed on substrate
09/22/2005US20050206910 Linear displacement sensor
09/22/2005US20050206908 Optical system alignment system and method with high accuracy and simple operation
09/22/2005US20050206907 Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness
09/22/2005US20050206906 Optical image measuring apparatus
09/22/2005US20050206905 Optical displacement measurement device
09/22/2005US20050206899 Manufacturing method for semiconductor device and determination method for position of semiconductor element
09/22/2005US20050206898 Apparatus and method for measuring alignment accuracy, as well as method and system for manufacturing semiconductor device
09/22/2005US20050206889 Optical fiber inspection device
09/22/2005US20050206885 Inspecting apparatus and inspecting method
09/22/2005US20050206882 Method and apparatus for measuring face angle
09/22/2005US20050206877 Shape measuring apparatus, shape measuring method, and aligning method
09/22/2005US20050206874 Apparatus and method for determining the range of remote point light sources
09/22/2005US20050206873 Range finder and method of reducing signal noise therefrom
09/22/2005US20050205672 Object detecting apparatus and irregularity detecting device for the same
09/22/2005US20050205669 Information pattern discriminating apparatus
09/22/2005DE19847913B4 Vorrichtung und Verfahren zur optischen Inspektion insbesondere verdeckter Lötverbindungen Apparatus and method for optically inspecting particular hidden solder joints
09/22/2005DE19605255B4 Verfahren und Vorrichtung zum Betrachten von Beschaltungs- bzw. Verdrahtungsmustern in einer gedruckten Schaltungsplatte Method and apparatus for viewing Wiring and wiring patterns in a printed circuit board
09/22/2005DE102004011729A1 Tastkopf für ein Koordinatenmessgerät Probe for a coordinate measuring machine
09/22/2005DE102004011404A1 Messgerät zur Bestimmung der Geradheit von Wellen oder Wellentunneln Instrument for measuring the straightness of shafts or tunnels
09/22/2005DE102004010754A1 Interferometrische Messanordnung Interferometric measurement arrangement
09/22/2005DE102004010376A1 Inspection device for the edge regions of planar elements, especially glass plates, has a single camera with at least two separate row or matrix imaging areas and a light deflection unit allocated to each row or matrix area
09/22/2005DE102004010363A1 Verfahren und Meßgerät zur Bestimmung einer örtlichen Variation des Reflektions- oder Transmissionsverhaltens über die Oberfläche einer Maske Method and device for determining a local variation of the reflection or transmission behavior over the surface of a mask
09/22/2005DE102004010311A1 Vorrichtung und Verfahren zur Messung der Dicke einer transparenten Probe Apparatus and method for measuring the thickness of a transparent sample
09/22/2005DE102004010114A1 Laser-based measurement equipment for positioning e.g. pipe driving machine, has computer to automatically inquire angles and lengths of machine, where angles and lengths are used for positional computation of machine
09/22/2005CA2559324A1 Methods and apparatus for wavefront manipulations and improved 3-d measurements
09/22/2005CA2556056A1 Method for determination of stand attributes and a computer program for performing the method
09/21/2005EP1578186A2 Inspection method and system and production method of mounted substrate
09/21/2005EP1577641A2 Color coded light for automated shape measurement using photogrammetry
09/21/2005EP1577639A1 Optical axial displacement sensor
09/21/2005EP1577638A2 Method and apparatus for object alignment
09/21/2005EP1577637A1 Optical heterodyne interferometer for shape measurement
09/21/2005EP1577636A1 Method and apparatus for measuring thickness of thin film formed on substrate
09/21/2005EP1576422A2 Method and system for overlay measurement
09/21/2005EP1576338A2 Optical method of examining reliefs on a structure
09/21/2005EP1159596B1 Hand held probe for measuring tire tread wear
09/21/2005EP1158267B1 Measuring quality of bandlike body with a device taking pictures, reduction of camber and undulation, rolling, deburring