Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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09/28/2005 | EP1579172A1 Device for determining the wheel and/or axle geometry of motor vehicles |
09/28/2005 | EP1579171A1 Laser digitizer system for dental applications |
09/28/2005 | EP1579170A2 Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum |
09/28/2005 | EP1579169A1 Measuring device and measuring method for pins, in particular plug pins |
09/28/2005 | EP1238244B1 Automatic contrast focussing with three optical paths |
09/28/2005 | EP1173749B1 Image editing for preparing a texture analysis |
09/28/2005 | CN2729642Y Parameter memory apparatus of photoelectric detector |
09/28/2005 | CN2729641Y Measuring system for deformation of ship |
09/28/2005 | CN1675711A Method and device for measuring angle of torsion of suspension for magnetic disk |
09/28/2005 | CN1675651A TFT sensor having improved imaging surface |
09/28/2005 | CN1675518A Process endpoint detection method using broadband reflectometry |
09/28/2005 | CN1675517A Method for controlling a recess etch process |
09/28/2005 | CN1675516A Method for in-situ monitoring of patterned substrate processing using reflectometry |
09/28/2005 | CN1675515A Common-path frequency-scanning interferometer |
09/28/2005 | CN1674729A Method and apparatus for measuring thickness of deposited film and method and apparatus for forming material layer |
09/28/2005 | CN1673860A Exposure device and positioning method |
09/28/2005 | CN1673856A Device and method for detecting inclination of screen, and projection apparatus |
09/28/2005 | CN1673794A Object lens producing device and producing method |
09/28/2005 | CN1673683A Equipment for imaging linear optical sign |
09/28/2005 | CN1673672A Micro-corner interferometer |
09/28/2005 | CN1673671A Orientation analysis meter |
09/28/2005 | CN1673670A Apparatus and method for measuring surface outline of measured object |
09/28/2005 | CN1673669A Method for measuring slender article, especiallynon-round cross section size of cable |
09/28/2005 | CN1673668A Method and apparatus for measuring electronic beam radius by laser |
09/28/2005 | CN1673667A Inspection apparatus |
09/28/2005 | CN1673666A Micro-structural 3D information obtaining method based on phase shifting interference image sequence analysis |
09/28/2005 | CN1220864C Dynamic change detecting method and apparatus, and ultrasonic diagnosing apparatus |
09/28/2005 | CN1220859C Fibre-optical beam displacement transducer |
09/27/2005 | US6950780 Database interpolation method for optical measurement of diffractive microstructures |
09/27/2005 | US6950775 Coordinate measuring system and field-of-view indicators therefor |
09/27/2005 | US6950550 Tracing technique and recording media of object motion |
09/27/2005 | US6950549 Visual inspection method and visual inspection apparatus |
09/27/2005 | US6950547 Web inspection method and device |
09/27/2005 | US6950546 Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar |
09/27/2005 | US6950195 Interference measuring device |
09/27/2005 | US6950193 System for monitoring substrate conditions |
09/27/2005 | US6950191 Method of extracting circular region from fringe image |
09/27/2005 | US6950188 Wafer alignment system using parallel imaging detection |
09/27/2005 | US6950186 Polarization analyzing method |
09/27/2005 | US6950179 Shape measuring apparatus, shape measuring method, and aligning method |
09/27/2005 | US6950120 Camera layout for acquiring images used in panoramic synthesis |
09/27/2005 | US6949844 High-speed precision positioning apparatus |
09/27/2005 | US6949755 Position detection apparatus, position detection method, exposure apparatus, device manufacturing method, and substrate |
09/27/2005 | US6948825 Illumination device and method for illuminating an object |
09/27/2005 | US6948252 Light projecting goniometer |
09/22/2005 | WO2005088962A1 Tracking device and motion capture device |
09/22/2005 | WO2005088686A1 Step measuring method and apparatus, and exposure method and apparatus |
09/22/2005 | WO2005088252A1 Method for determination of stand attributes and a computer program for performing the method |
09/22/2005 | WO2005088244A1 Plane detector, plane detecting method, and robot apparatus with plane detector |
09/22/2005 | WO2005088243A1 Three-dimensional shape measuring system and three-dimensional shape measuring method |
09/22/2005 | WO2005088242A2 Method and scanning arrangement for the contactless scanning of three-dimensional objects and device for holding the objects |
09/22/2005 | WO2005088241A1 Low-coherence interferometric method and appliance for scanning surfaces in a light-optical manner |
09/22/2005 | WO2005088238A1 Sensing head for a coordinate measuring device |
09/22/2005 | WO2005087460A1 Apparatus, method and system for detecting the width and position of adhesives applied to a substrate |
09/22/2005 | WO2005086714A2 Grazing incidence relays |
09/22/2005 | WO2005067389A3 Three-dimensional video scanner |
09/22/2005 | US20050209822 Inspection method and system and production method of mounted substrate |
09/22/2005 | US20050209816 Optical metrology optimization for repetitive structures |
09/22/2005 | US20050208842 [positioning apparatus and positioning method using the same] |
09/22/2005 | US20050208698 Monitoring the deposition properties of an oled |
09/22/2005 | US20050208685 Periodic patterns and technique to control misalignment |
09/22/2005 | US20050207639 Inspection apparatus |
09/22/2005 | US20050207616 Movable barrier operator with an obstacle detector |
09/22/2005 | US20050206911 Method and apparatus for measuring thickness of thin film formed on substrate |
09/22/2005 | US20050206910 Linear displacement sensor |
09/22/2005 | US20050206908 Optical system alignment system and method with high accuracy and simple operation |
09/22/2005 | US20050206907 Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness |
09/22/2005 | US20050206906 Optical image measuring apparatus |
09/22/2005 | US20050206905 Optical displacement measurement device |
09/22/2005 | US20050206899 Manufacturing method for semiconductor device and determination method for position of semiconductor element |
09/22/2005 | US20050206898 Apparatus and method for measuring alignment accuracy, as well as method and system for manufacturing semiconductor device |
09/22/2005 | US20050206889 Optical fiber inspection device |
09/22/2005 | US20050206885 Inspecting apparatus and inspecting method |
09/22/2005 | US20050206882 Method and apparatus for measuring face angle |
09/22/2005 | US20050206877 Shape measuring apparatus, shape measuring method, and aligning method |
09/22/2005 | US20050206874 Apparatus and method for determining the range of remote point light sources |
09/22/2005 | US20050206873 Range finder and method of reducing signal noise therefrom |
09/22/2005 | US20050205672 Object detecting apparatus and irregularity detecting device for the same |
09/22/2005 | US20050205669 Information pattern discriminating apparatus |
09/22/2005 | DE19847913B4 Vorrichtung und Verfahren zur optischen Inspektion insbesondere verdeckter Lötverbindungen Apparatus and method for optically inspecting particular hidden solder joints |
09/22/2005 | DE19605255B4 Verfahren und Vorrichtung zum Betrachten von Beschaltungs- bzw. Verdrahtungsmustern in einer gedruckten Schaltungsplatte Method and apparatus for viewing Wiring and wiring patterns in a printed circuit board |
09/22/2005 | DE102004011729A1 Tastkopf für ein Koordinatenmessgerät Probe for a coordinate measuring machine |
09/22/2005 | DE102004011404A1 Messgerät zur Bestimmung der Geradheit von Wellen oder Wellentunneln Instrument for measuring the straightness of shafts or tunnels |
09/22/2005 | DE102004010754A1 Interferometrische Messanordnung Interferometric measurement arrangement |
09/22/2005 | DE102004010376A1 Inspection device for the edge regions of planar elements, especially glass plates, has a single camera with at least two separate row or matrix imaging areas and a light deflection unit allocated to each row or matrix area |
09/22/2005 | DE102004010363A1 Verfahren und Meßgerät zur Bestimmung einer örtlichen Variation des Reflektions- oder Transmissionsverhaltens über die Oberfläche einer Maske Method and device for determining a local variation of the reflection or transmission behavior over the surface of a mask |
09/22/2005 | DE102004010311A1 Vorrichtung und Verfahren zur Messung der Dicke einer transparenten Probe Apparatus and method for measuring the thickness of a transparent sample |
09/22/2005 | DE102004010114A1 Laser-based measurement equipment for positioning e.g. pipe driving machine, has computer to automatically inquire angles and lengths of machine, where angles and lengths are used for positional computation of machine |
09/22/2005 | CA2559324A1 Methods and apparatus for wavefront manipulations and improved 3-d measurements |
09/22/2005 | CA2556056A1 Method for determination of stand attributes and a computer program for performing the method |
09/21/2005 | EP1578186A2 Inspection method and system and production method of mounted substrate |
09/21/2005 | EP1577641A2 Color coded light for automated shape measurement using photogrammetry |
09/21/2005 | EP1577639A1 Optical axial displacement sensor |
09/21/2005 | EP1577638A2 Method and apparatus for object alignment |
09/21/2005 | EP1577637A1 Optical heterodyne interferometer for shape measurement |
09/21/2005 | EP1577636A1 Method and apparatus for measuring thickness of thin film formed on substrate |
09/21/2005 | EP1576422A2 Method and system for overlay measurement |
09/21/2005 | EP1576338A2 Optical method of examining reliefs on a structure |
09/21/2005 | EP1159596B1 Hand held probe for measuring tire tread wear |
09/21/2005 | EP1158267B1 Measuring quality of bandlike body with a device taking pictures, reduction of camber and undulation, rolling, deburring |