| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 11/29/2005 | US6969836 Space carving for measurement of high-curvature areas on a mechanical part |
| 11/29/2005 | US6968625 Device and method for alignment of components |
| 11/24/2005 | WO2005111540A1 Tire projection-and-recess figure examining method and tire projection-and-recess figure examining device |
| 11/24/2005 | WO2005111538A1 Optical inspection of surfaces open to different directions in a piece of material |
| 11/24/2005 | WO2005111537A1 Monitoring device for rotating body |
| 11/24/2005 | WO2005111536A1 Method and device for hyperacute detection of an essentially rectilinear contrast edge and system for fine following and fixing of said contrast edge |
| 11/24/2005 | US20050261870 Penetration-depth-determining device |
| 11/24/2005 | US20050261864 Automated quality assurance method and apparatus and method of conducting business |
| 11/24/2005 | US20050261849 Image calibration method, image calibration processing device, and image calibration processing terminal |
| 11/24/2005 | US20050259874 Apparatus, method, and program for assisting in selection of pattern element for pattern matching |
| 11/24/2005 | US20050259863 Repetitive inspection system with intelligent tools |
| 11/24/2005 | US20050259859 Method and Apparatus for Characterizing a Surface, and Method and Apparatus for Determining a Shape Anomaly of a Surface |
| 11/24/2005 | US20050259274 Method and apparatus for measuring displacement |
| 11/24/2005 | US20050259272 Method of wafer height mapping |
| 11/24/2005 | US20050259271 Assembly and method for the optical-tactile measurement of a structure |
| 11/24/2005 | US20050259268 Heterodyne laser interferometer for measuring wafer stage translation |
| 11/24/2005 | US20050259267 Speckle sizing and sensor dimensions in optical positioning device |
| 11/24/2005 | US20050259266 Optical lens system and position measurement system using the same |
| 11/24/2005 | US20050259265 Methods and systems for determining optical properties using low-coherence interference signals |
| 11/24/2005 | US20050259263 Apparatus for photoelectric measurement of an original |
| 11/24/2005 | US20050259257 Position detecting device and position detecting method |
| 11/24/2005 | US20050259245 Device and method for inspecting an object |
| 11/24/2005 | US20050259235 Exposure apparatus, maintenance method therefor, semiconductor device manufacturing method, and semiconductor manufacturing factory |
| 11/24/2005 | US20050258345 Optical position sensing device including interlaced groups of photosensitive elements |
| 11/24/2005 | US20050258344 Optical reflection sensor |
| 11/24/2005 | US20050257627 Optical displacement sensor and external force detecting device |
| 11/24/2005 | DE19944354B4 Verfahren und Vorrichtung zur Vermessung von spiegelnden oder transparenten Prüflingen Method and apparatus for measurement of reflective or transparent specimens |
| 11/24/2005 | DE19835282B4 Meßvorrichtung zur Bestimmung der Stärke von Fahrleitungen und zur Erfassung von Fahrleitungsbauelementen Measuring device for determining the strength of overhead lines and for the detection of catenary components |
| 11/24/2005 | DE10361792B4 Vorrichtung zur Messung der Schichtdicke und der Krümmung von mindestens teilweise reflektierenden Oberflächen von Schichten und deren Verwendung Device for measuring the film thickness and the curvature of at least partially reflective surfaces of layers and their use |
| 11/24/2005 | DE10341585B4 Verfahren und Vorrichtung zur Belastungsprüfung an einer Stützkonstruktion eines Behälters Method and apparatus for load test of a supporting structure of a container |
| 11/24/2005 | DE102005019269A1 Vorrichtung zur Erkennung eines vorhergehenden Fahrzeugs An apparatus for recognizing a preceding vehicle |
| 11/24/2005 | DE102004023322A1 Lage- und Positionsvermessung von Objekten mittels Bildverarbeitungsverfahren Attitude and position measurement of objects using image processing method |
| 11/24/2005 | DE102004023033A1 Vorrichtung und Verfahren zur Vermessung von Bauteilen Apparatus and method for measurement of components |
| 11/24/2005 | DE102004021447A1 Adhesive application inspection unit moves along fillet and triangulates distance using modulated laser light |
| 11/24/2005 | DE102004020059A1 Measuring device, for discontinuous absolute measurement of displacements, has fiber interferometer and determines displacement based on measured reflected light |
| 11/24/2005 | CA2566893A1 Optical inspection of surfaces open to different directions in a piece of material |
| 11/24/2005 | CA2563584A1 Method and device for hyperacute detection of an essentially rectilinear contrast edge and system for fine following and fixing of said contrast edge |
| 11/23/2005 | EP1598775A1 Image processing device, method, and program |
| 11/23/2005 | EP1598636A1 Method for measuring lengths and areas on threedimensional surfaces having arbitrary curvature |
| 11/23/2005 | EP1597539A1 Method and optical system for measuring the topography of a test object |
| 11/23/2005 | EP1597538A2 Method for the contactless measurement of an object |
| 11/23/2005 | EP1597537A1 Quality control method for two-dimensional matrix codes on metallic workpieces, using an image processing device |
| 11/23/2005 | EP1597536A2 Interferometric measuring device |
| 11/23/2005 | EP1379832B1 Length sensor |
| 11/23/2005 | EP1240258B1 Coating with optical taggent |
| 11/23/2005 | EP1218689B1 Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source |
| 11/23/2005 | EP1135669B1 Integrated system for line-of-sight stabilization and auto-alignment of off-gimbal passive and active electro-optical sensors |
| 11/23/2005 | EP1021699B1 Determining the location of a separation in a deformable structure ( tyre ) |
| 11/23/2005 | EP0981051B1 Optical probe for proximity field measurements |
| 11/23/2005 | CN1701213A Stereo camera supporting apparatus, stereo camera supporting method, calibration detection apparatus, calibration correction apparatus, and stereo camera system |
| 11/23/2005 | CN1699919A Curved surface measuring apparatus |
| 11/23/2005 | CN1699918A Method for acquiring depth variance of microstructure by binary optics |
| 11/23/2005 | CN1699917A Apparatus, method, and program for assisting in selection of pattern element for pattern matching |
| 11/23/2005 | CN1699916A System and method for excluding extraneous features from image inspection operations |
| 11/23/2005 | CN1699915A Inspection method, inspection device and manufacturing method for display panel |
| 11/23/2005 | CN1699914A Heterodyne laser interferometer for measuring wafer stage translation |
| 11/23/2005 | CN1699910A Device for determining penetration depth |
| 11/23/2005 | CN1228829C Identifying method of mark on semiconductor device |
| 11/23/2005 | CN1228606C Method and appts. for defining position of edge surface of piled objects |
| 11/23/2005 | CN1228605C System and method for reducing add up system error in picture related system |
| 11/22/2005 | US6968282 Self-calibrating, multi-camera machine vision measuring system |
| 11/22/2005 | US6968080 Method and apparatus for generating part programs for use in image-measuring instruments, and image-measuring instrument and method of displaying measured results therefrom |
| 11/22/2005 | US6967726 Means for in-place automated calibration of optically-based thickness sensor |
| 11/22/2005 | US6966816 Integrated endpoint detection system with optical and eddy current monitoring |
| 11/17/2005 | WO2005109263A1 Process and system for analysing deformations in motor vehicles |
| 11/17/2005 | WO2005108919A1 Measuring device provided with a probe-tip |
| 11/17/2005 | WO2005108918A2 Methods and apparatus for determining three dimensional configurations |
| 11/17/2005 | WO2005108917A2 Device and method for optical precision measurement |
| 11/17/2005 | WO2005108916A1 Co-ordinate measuring device and method for measuring structures using a co-ordinate measuring device |
| 11/17/2005 | WO2005108915A1 Device and method for a combined interferometry and image-based determination of geometry, especially for use in microsystems technology |
| 11/17/2005 | WO2005108911A1 Measurement of form of spherical and near-spherical optical surfaces |
| 11/17/2005 | WO2005108020A1 Robot-controlled optical measurement array, and method and auxiliary mechanism for calibrating said measurement array |
| 11/17/2005 | WO2005108005A1 Measuring instrument and method to determine the position of a point on the edge of a plate-shaped object |
| 11/17/2005 | US20050256687 Generation of a library of periodic grating diffraction signals |
| 11/17/2005 | US20050256636 Driving lane recognizer and driving lane recognizing method |
| 11/17/2005 | US20050255610 Semiconductor wafer shape evaluating method and shape evaluating device |
| 11/17/2005 | US20050254700 Apparatus and method for detecting hole area |
| 11/17/2005 | US20050254699 Apparatus and method for detecting defect and apparatus and method for extracting wire area |
| 11/17/2005 | US20050254695 Finger identification apparatus |
| 11/17/2005 | US20050254378 Method and device for optical form measurement and/or estimation |
| 11/17/2005 | US20050254256 Illumination device and medical imaging and examination device having an illumination device |
| 11/17/2005 | US20050254068 Measuring instrument and method for operating a measuring instrument for optical inspection of an object |
| 11/17/2005 | US20050254066 Three-dimensional measuring instrument |
| 11/17/2005 | US20050254065 Method and apparatus for detecting surface characteristics on a mask blank |
| 11/17/2005 | US20050254051 Method of polishing thin film formed on substrate |
| 11/17/2005 | US20050254044 Survey system |
| 11/17/2005 | US20050254043 Survey system |
| 11/17/2005 | US20050254042 Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements |
| 11/17/2005 | US20050253871 Information processing method and system |
| 11/17/2005 | US20050253051 Monitoring device for rotating body |
| 11/17/2005 | US20050253050 Micro piezo-optic composite transducers and fabrication methods |
| 11/17/2005 | DE10328412B4 Verfahren zur interferometrischen Bestimmmung optischer Ebenenabstände mit Subnanometer-Genauigkeit Method for interferometric optical Bestimmmung plane distances with accuracy Subnanometer |
| 11/17/2005 | DE102004021368A1 Driver drowsiness detection optical three dimensional object recording sensor unit images and times reemitted light from switched laser beams |
| 11/17/2005 | DE102004020849A1 Fiber optic instrument measuring layer thicknesses of e.g. photo-lacquer on semiconductor wafer, limits measurement channel by selectable restriction of measurement zone |
| 11/17/2005 | DE102004020657A1 Verfahren zum Bilden eines Strukturgrößen-Messwertes A method of forming a structure size measuring value |
| 11/17/2005 | DE102004020242A1 Clean room filter leak proofing procedure uses hand moved test aerosol sensor with position monitored by laser or rope coordinate measurement system |
| 11/17/2005 | DE102004018213A1 Supply line for an industrial robot has a number of cables and pipes within a hose sleeve and an optical fiber sensor held in a loose envelope within the hose sleeve so that deformation presses it against the side of the envelope |
| 11/16/2005 | EP1596375A2 Mirror angle measurement and servo control apparatus for holographic digital data storage system |
| 11/16/2005 | EP1596330A2 Estimating position and orientation of markers in digital images |
| 11/16/2005 | EP1596322A2 Driving lane recognizer and driving lane recognizing method |