Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
01/2006
01/11/2006CN1719191A Measuring instrument for space curve type long distance fine pipe internal surface shape and its detecting method
01/11/2006CN1719190A Non contact detecting system of automobile full car size
01/11/2006CN1236293C Infra red sensor component part and refrigerator having said infra red sensor
01/11/2006CN1236279C Flatness detecting method and detecting instrument thereby
01/11/2006CN1236278C Method for inspecting of parallelism for optic axis and mounting basal plane
01/11/2006CN1236277C Overall calibrating method for multi-vision sensor detecting system
01/10/2006US6985619 Distance correcting apparatus of surroundings monitoring system and vanishing point correcting apparatus thereof
01/10/2006US6985605 Phase unwrapping method for fringe image analysis
01/10/2006US6985240 Method and apparatus for retrieving information about an object of interest to an observer
01/10/2006US6985239 Position-sensing device for 3-D profilometers
01/10/2006US6985238 Non-contact measurement system for large airfoils
01/10/2006US6985237 Method for determining layer thickness ranges
01/10/2006US6985236 Position measurement system
01/10/2006US6985229 Overlay metrology using scatterometry profiling
01/10/2006US6985228 Multiple beam ellipsometer
01/10/2006US6985221 Method and apparatus for measuring wall thickness of plastic container
01/10/2006US6985214 Method and apparatus for enhancing visualization of mechanical stress
01/10/2006US6985213 Method and apparatus for measuring material property
01/10/2006US6985212 Laser perimeter awareness system
01/10/2006US6985183 Method for exploring viewpoint and focal length of camera
01/10/2006US6985175 Camera calibration device and method, and computer system
01/10/2006US6985075 Obstacle detection apparatus and method
01/10/2006US6984838 Surface position detection apparatus and method, and exposure apparatus and device manufacturing method using the exposure apparatus
01/10/2006US6984825 Portable coating weight reader
01/10/2006US6984814 Optical sensing circuit with voltage to current converter for pointing device
01/10/2006US6983549 Method to accurately measure small angular differences between surfaces
01/07/2006CA2473296A1 Simultaneous 3d and graylevel scanning
01/05/2006WO2006001757A1 Measurement probe for use in coordinate measurng machines
01/05/2006WO2006001756A1 Measurement probe for use in coordinate measuring machines
01/05/2006WO2006001712A2 Non-destructive testing of materials
01/05/2006WO2006001127A1 Hardened concrete bubble measuring method and bubble measuring instrument
01/05/2006WO2006000552A1 Scanner system and method for registering surfaces
01/05/2006US20060004547 Method and system for predictive physiological gating of radiation therapy
01/05/2006US20060004280 Placement information estimating method and information processing device
01/05/2006US20060002789 Method and an apparatus for determining the clearance between a turbine casing and the tip of a moving turbine blade
01/05/2006US20060002605 Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
01/05/2006US20060001889 Positioning apparatus and photolithography apparatus including the same
01/05/2006US20060001879 Alignment system and lithographic apparatus equipped with such an alignment system
01/05/2006US20060001878 Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate
01/05/2006US20060001863 Optical fiber measuring module
01/05/2006US20060001760 Apparatus and method for object shape detection
01/05/2006US20060001739 Method and apparatus for colour imaging a three-dimensional structure
01/05/2006DE19736986B4 Verfahren und Vorrichtung zum Messen der Genauigkeit der Einstellung des Winkels eines Tisches einer Werkzeugmaschine Method and apparatus for measuring the accuracy of the adjustment of the angle of a table of a machine tool
01/05/2006DE10241057B4 Optische Messvorrichtung Optical measuring device
01/05/2006DE102004032933B3 Rotationally symmetric alignment mark centre determination procedure for semiconductor wafer mask aligners
01/05/2006DE102004029552A1 Verfahren zur Sichtbarmachung und Messung von Verformungen von schwingenden Objekten mittels einer Kombination einer synchronisierten, stroboskopischen Bildaufzeichnung mit Bildkorrelationsverfahren A method for visualization and measurement of deformations of vibrating objects using a combination of a synchronized stroboscopic imaging with image correlation method
01/05/2006DE102004028191A1 Optical arrangement, for quantitative measurement of optical axis position of optoelectronic sensor system, with which diffraction image is created and compared with reference image to enable adjustments to be made
01/05/2006DE102004027627A1 Motor vehicle e.g. land vehicle, or vehicle parts evaluation documenting apparatus, has two cameras for taking two sets of images, respectively, and synchronization device for temporal synchronization of image sets
01/05/2006DE10063899B4 Optisches Winkelmeßsystem Optical angle measuring
01/05/2006CA2571716A1 Scanner system and method for registering surfaces
01/04/2006EP1612509A1 Optical profilometer
01/04/2006EP1611618A1 Light receiving device with controllable sensitivity and spatial information detecting apparatus using the same
01/04/2006EP1611447A1 System and method for in-situ monitor and control of film thickness and trench depth
01/04/2006EP1611438A1 A method and apparatus for inspecting a tubular
01/04/2006EP1611430A1 A scatterometer and a method for observing a surface
01/04/2006EP1127244B1 Inspection system for flanged bolts
01/04/2006EP0960318B1 Method for measuring and quantifying surface defects on a test surface
01/04/2006CN2750287Y Large range nano detection optical system
01/04/2006CN1715870A Phase object scan imaging method and its treating device
01/04/2006CN1715861A Wear gauge and method of use
01/04/2006CN1715832A Method for measuring single side polishing substrate epitaxial film thickness and optical parameter
01/04/2006CN1715831A Dynamic detecting method for glass tube wall thickness and light path system
01/04/2006CN1715830A Amplifying camera equipment and metering checkout equipment
01/04/2006CN1715829A Surveying instrument
01/04/2006CN1235052C Method measuring movement of material sheet and optical sensor for carrying out said method
01/04/2006CN1235041C Monitoring electronic component holders
01/04/2006CN1235020C Position measuring device
01/04/2006CN1235014C Semiconductor laser mounting aligning and correcting method
01/04/2006CN1235013C Vacuum laser dam deformation measuring method
01/03/2006US6982797 comprises separate/rotatable magazines containing crystal resonators and test glasses; thermal stability; moisture resistance; abrasion resistance
01/03/2006US6982793 Method and apparatus for using an alignment target with designed in offset
01/03/2006US6982791 Scatterometry to simultaneously measure critical dimensions and film properties
01/03/2006US6982786 Reticle and optical characteristic measuring method
01/03/2006US6982419 Probe with hollow waveguide and method for producing the same
01/03/2006US6981579 Dynamic damper
12/2005
12/29/2005WO2005124834A1 Best focus detecting method, exposure method and exposure equipment
12/29/2005WO2005124832A1 Exposure system
12/29/2005WO2005124687A1 Method for marker tracking in optical motion capture system, optical motion capture method, and system
12/29/2005WO2005124276A2 Method for the measurement of objects with the aid of a camera, and calibration means
12/29/2005WO2005124274A2 Calibrating method, measuring method, optical measuring device and operating method for a transmitter arrangement
12/29/2005WO2005043600A3 Azimuthal scanning of a structure formed on a semiconductor wafer
12/29/2005US20050287929 Integrated endpoint detection system with optical and eddy current monitoring
12/29/2005US20050286060 Method and apparatus for mapping a position of a capillary tool tip using a prism
12/29/2005US20050286059 Attitude and position measurement of objects using image processing processes
12/29/2005US20050286058 Method and apparatus for measuring the curvature of reflective surfaces
12/29/2005US20050286052 Elongated features for improved alignment process integration
12/29/2005US20050286051 Overlay targets with isolated, critical-dimension features and apparatus to measure overlay
12/29/2005US20050286050 Real-time through lens image measurement system and method
12/29/2005US20050285026 Linear encoder
12/29/2005US20050285024 Distance measurement sensor
12/29/2005US20050284232 Sensing system for monitoring the structural health of composite structures
12/29/2005US20050284207 Wear gauge and method of use
12/29/2005DE4338223B4 System zur Erfassung von Fehlern in einer Lackierung System for detecting defects in a coating
12/29/2005DE202005015485U1 Multiple-edged tool`s e.g. knife head, cutting edges measuring device, has image recording device for recording image of cutting edges of multiple-edged tool, and memory unit provided for automatic storage of images
12/29/2005DE202005012194U1 Position and distance detection device has component in light path between light source and sensor movable relative to source and/or sensor that varies light property of light detected by sensor depending on its relative movement
12/29/2005DE19882191B4 Interferenzmessung absoluter Abmessungen von zylindrischen Oberflächen bei streifendem Einfall Interference measurement of absolute dimensions of cylindrical surfaces at grazing incidence
12/29/2005DE19608632B4 Vorrichtung zur Bestimmung der Topographie einer Oberfläche und Verfahren zu Bestimmen der Topographie einer Oberfläche Apparatus for determining the topography of a surface, and methods for determining the topography of a surface
12/29/2005DE10335644B3 Mikroskopiesystem Microscopy System
12/29/2005DE102005018787A1 Messung der Form kugelförmiger und fast kugelförmiger optischer Oberflächen Measurement of the shape of spherical and nearly spherical optical surfaces
12/29/2005DE102004022341A1 Vorrichtung und Verfahren zur kombinierten interferometrischen und abbildungsbasierten Geometrieerfassung insbesondere in der Mikrosystemtechnik Apparatus and method for combined interferometric and abstract geometry-based detection especially in microsystem technology