Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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03/08/2006 | EP1632746A1 Method of determining physical parameters of an optical layer or a layer system |
03/08/2006 | EP1166090B8 Device for rapidly measuring angle-dependent diffraction effects on finely structured surfaces |
03/08/2006 | EP0963540B1 System and method for laser ultrasonic bond integrity evaluation |
03/08/2006 | EP0870188B8 Variable spot-size scanning apparatus |
03/08/2006 | EP0835460B1 Improved optical ranging camera |
03/08/2006 | CN2763776Y Film thickness monitoring controller |
03/08/2006 | CN2763775Y Monocular votary laser scanning measuring head |
03/08/2006 | CN1743836A Safety inspection system for roll-on/roll-off transport vehicle |
03/08/2006 | CN1743812A Optical fiber micro-bending displacement sensor |
03/08/2006 | CN1743807A Rotary laser apparatus |
03/08/2006 | CN1743800A Micro angular displacement measuring device based on linear array charge-coupled device |
03/08/2006 | CN1743799A Ring grating automatic receiving device |
03/08/2006 | CN1743798A Optical disk detecting device |
03/08/2006 | CN1743797A T-shape guide linear laser detecting instrument |
03/08/2006 | CN1743796A Method and device for measuring double refraction single-shaft crystal wave plate thickness |
03/08/2006 | CN1743795A Optical fiber grating displacement sensor |
03/08/2006 | CN1743794A Projector for detecting plane displaying board and projecting method realized by same |
03/08/2006 | CN1743793A Holographic phase difference amplifying restructuring device based on sagnac interferometer |
03/08/2006 | CN1244796C Recording media identification and recorder |
03/08/2006 | CN1244795C Collimator detecting device |
03/07/2006 | US7010457 Apparatus and method for producing a numeric display corresponding to the volume of a selected segment of an item |
03/07/2006 | US7010447 Method for inspecting defect and system therefor |
03/07/2006 | US7009718 Grating pattern projection apparatus using liquid crystal grating |
03/07/2006 | US7009717 Optical probe for scanning the features of an object and methods therefor |
03/07/2006 | US7009715 Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed |
03/07/2006 | US7009714 Method of dry etching a sample and dry etching system |
03/07/2006 | US7009713 Optical position measuring system using an interference pattern |
03/07/2006 | US7009704 Overlay error detection |
03/07/2006 | US7009696 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
03/07/2006 | US7009690 Three-dimensional measurement device and three-dimensional measurement method |
03/07/2006 | US7009197 Apparatus for measuring gap between mask and substrate using laser displacement sensor, and method thereof |
03/07/2006 | US7008802 Method and apparatus to correct water drift |
03/07/2006 | US7008756 Method of fabricating an X/Y alignment vernier |
03/07/2006 | US7008518 sputter coating system of a coating station and a monitoring station;a sputtering target with a detector positioned for measuring the beams reflected during thin film is deposition |
03/07/2006 | US7008386 Foot orthotic |
03/07/2006 | US7007554 Displacement sensor |
03/07/2006 | US7007398 Device for measuring length |
03/07/2006 | US7007395 Wheel alignment system for single track vehicles |
03/03/2006 | CA2517397A1 Methods and apparatuses for the exact determination of an angle of rotation |
03/02/2006 | WO2006023612A2 Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers |
03/02/2006 | WO2006022184A1 Camera calibration device and camera calibration method |
03/02/2006 | WO2006021205A1 Device and method for determining the form of a surface topology of an object to be measured |
03/02/2006 | WO2006004733B1 Sensing system for monitoring the structural health of composite structures |
03/02/2006 | US20060044571 Wafer edge structure measurement method |
03/02/2006 | US20060044570 Laser-based position measuring device |
03/02/2006 | US20060044569 Apparatus for measuring optical properties of tested optical system using interference |
03/02/2006 | US20060044568 Method and apparatus for measuring alignment of layers in photolithographic processes |
03/02/2006 | US20060044567 Interferometer for measuring virtual contact surfaces |
03/02/2006 | US20060044553 Apparatus and methods for automatically measuring a curl of an optical sheet |
03/02/2006 | US20060043275 Device and method for measuring surfaces on the internal walls of cylinders, using confocal microscopes |
03/02/2006 | US20060042104 Measurement device |
03/02/2006 | DE202005018753U1 Measuring device for inspecting geometric quality of railed vehicle`s wheel sets, has profile sensor to measure concentricity deviation of center section of shaft and another sensor to measure concentricity deviation of side piece of shaft |
03/02/2006 | DE102004041950A1 Optische Positionsmesseinrichtung An optical encoder |
03/02/2006 | DE102004040345A1 Checking abutment region of bonded fiber material webs laid on backing, by measuring distance to surface and evaluating to determine if overlap or gap is present |
03/02/2006 | DE102004040164A1 Vorrichtung zur Erfassung von Strukturen, wie Profilierungen oder Prägungen an Körpern von Flaschen oder dergl. Behälter Device for detecting structures, such as profiles or stampings on bodies of bottles or the like. Container |
03/01/2006 | EP1630857A1 Position information measuring method and device, and exposure method and system |
03/01/2006 | EP1630520A2 Apparatus and method of heterodyne interferometry for imaging |
03/01/2006 | EP1630519A1 Modular apparatus for systems performing 3-D virtual reconstruction of surfaces of objects, as well as system comprising a plurality of such apparatuses |
03/01/2006 | EP1629304A2 A modular non-contact measurement device for quickly and accurately obtaining dimensional measurement data |
03/01/2006 | EP1629254A1 Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics |
03/01/2006 | EP1546645B1 Interferometric measuring device |
03/01/2006 | EP1157307B1 Photoresist dispense method by compensation for substrate reflectivity |
03/01/2006 | EP0886790B1 Telecentric 3d camera and method |
03/01/2006 | CN1742294A Methods and apparatus for making images including depth information |
03/01/2006 | CN1742193A Calibration certification for wheel alignment equipment |
03/01/2006 | CN1742192A Optical sensing device |
03/01/2006 | CN1742191A Optical sensing device |
03/01/2006 | CN1741727A Nozzle position correcting method for electronic device mounting appararus |
03/01/2006 | CN1740849A Producing method of optical device, positioning master, optical device and projector |
03/01/2006 | CN1740743A Anode horizontal height-finding system with radio comparing base as platform |
03/01/2006 | CN1740742A Optical grating photoelectric self-collimator |
03/01/2006 | CN1740741A Calibrating method for visual non-contact measuring head |
03/01/2006 | CN1740740A Method for detecting size of assembly |
03/01/2006 | CN1740739A Fast colourful three-dimensional chart pasting method based on linear structural laser passive scanning |
03/01/2006 | CN1740738A Inner three-directional moire interferometer |
03/01/2006 | CN1244022C 曝光装置 Exposure device |
03/01/2006 | CN1243970C Scanning head and outer inspection method and apparatus capable of using said scanning head |
03/01/2006 | CN1243952C Position phase-difference enlarger of combined interferometer |
03/01/2006 | CN1243951C Interferometer equipment and measurement method in interferometer |
02/28/2006 | US7006952 3-D model providing device |
02/28/2006 | US7006681 Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings |
02/28/2006 | US7006237 Laser beam positioning device for laser processing equipment |
02/28/2006 | US7006236 Method and apparatus for approximating depth of an object's placement onto a monitored region with applications to virtual interface devices |
02/28/2006 | US7006235 Methods and systems for determining overlay and flatness of a specimen |
02/28/2006 | US7006233 Method of detecting a distortion on a surface |
02/28/2006 | US7006227 Apparatus for the in situ alignment of a mask and a semiconductor wafer |
02/28/2006 | US7006226 Alignment method, alignment apparatus, exposure apparatus using the same, and device manufactured by using the same |
02/28/2006 | US7006225 Alignment mark, alignment apparatus and method, exposure apparatus, and device manufacturing method |
02/28/2006 | US7006222 Concurrent measurement and cleaning of thin films on silicon-on-insulator (SOI) |
02/28/2006 | US7006210 Glare-directed imaging |
02/28/2006 | US7006142 Three-dimensional image capturing device |
02/28/2006 | US7006132 Aperture coded camera for three dimensional imaging |
02/28/2006 | US7006086 Method and apparatus for accurate alignment of images in digital imaging systems by matching points in the images corresponding to scene elements |
02/28/2006 | US7005661 Optical object identification apparatus, and printing apparatus and object classification apparatus using same |
02/28/2006 | US7005630 Energy-modulating fiber grating sensor |
02/28/2006 | US7004329 Classifying station with dynamic decision zone |
02/23/2006 | WO2006019070A1 Method of measuring length of band-form member and device therefor |
02/23/2006 | WO2006018539A1 Simple or global optical-fibre-based shock sensor and method of designing and producing one such sensor |
02/23/2006 | WO2006017974A1 Fiber greating or fiber strain sensor head and strain measurement system thereof |
02/23/2006 | US20060041333 Robot |