Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
03/2006
03/08/2006EP1632746A1 Method of determining physical parameters of an optical layer or a layer system
03/08/2006EP1166090B8 Device for rapidly measuring angle-dependent diffraction effects on finely structured surfaces
03/08/2006EP0963540B1 System and method for laser ultrasonic bond integrity evaluation
03/08/2006EP0870188B8 Variable spot-size scanning apparatus
03/08/2006EP0835460B1 Improved optical ranging camera
03/08/2006CN2763776Y Film thickness monitoring controller
03/08/2006CN2763775Y Monocular votary laser scanning measuring head
03/08/2006CN1743836A Safety inspection system for roll-on/roll-off transport vehicle
03/08/2006CN1743812A Optical fiber micro-bending displacement sensor
03/08/2006CN1743807A Rotary laser apparatus
03/08/2006CN1743800A Micro angular displacement measuring device based on linear array charge-coupled device
03/08/2006CN1743799A Ring grating automatic receiving device
03/08/2006CN1743798A Optical disk detecting device
03/08/2006CN1743797A T-shape guide linear laser detecting instrument
03/08/2006CN1743796A Method and device for measuring double refraction single-shaft crystal wave plate thickness
03/08/2006CN1743795A Optical fiber grating displacement sensor
03/08/2006CN1743794A Projector for detecting plane displaying board and projecting method realized by same
03/08/2006CN1743793A Holographic phase difference amplifying restructuring device based on sagnac interferometer
03/08/2006CN1244796C Recording media identification and recorder
03/08/2006CN1244795C Collimator detecting device
03/07/2006US7010457 Apparatus and method for producing a numeric display corresponding to the volume of a selected segment of an item
03/07/2006US7010447 Method for inspecting defect and system therefor
03/07/2006US7009718 Grating pattern projection apparatus using liquid crystal grating
03/07/2006US7009717 Optical probe for scanning the features of an object and methods therefor
03/07/2006US7009715 Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed
03/07/2006US7009714 Method of dry etching a sample and dry etching system
03/07/2006US7009713 Optical position measuring system using an interference pattern
03/07/2006US7009704 Overlay error detection
03/07/2006US7009696 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool
03/07/2006US7009690 Three-dimensional measurement device and three-dimensional measurement method
03/07/2006US7009197 Apparatus for measuring gap between mask and substrate using laser displacement sensor, and method thereof
03/07/2006US7008802 Method and apparatus to correct water drift
03/07/2006US7008756 Method of fabricating an X/Y alignment vernier
03/07/2006US7008518 sputter coating system of a coating station and a monitoring station;a sputtering target with a detector positioned for measuring the beams reflected during thin film is deposition
03/07/2006US7008386 Foot orthotic
03/07/2006US7007554 Displacement sensor
03/07/2006US7007398 Device for measuring length
03/07/2006US7007395 Wheel alignment system for single track vehicles
03/03/2006CA2517397A1 Methods and apparatuses for the exact determination of an angle of rotation
03/02/2006WO2006023612A2 Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers
03/02/2006WO2006022184A1 Camera calibration device and camera calibration method
03/02/2006WO2006021205A1 Device and method for determining the form of a surface topology of an object to be measured
03/02/2006WO2006004733B1 Sensing system for monitoring the structural health of composite structures
03/02/2006US20060044571 Wafer edge structure measurement method
03/02/2006US20060044570 Laser-based position measuring device
03/02/2006US20060044569 Apparatus for measuring optical properties of tested optical system using interference
03/02/2006US20060044568 Method and apparatus for measuring alignment of layers in photolithographic processes
03/02/2006US20060044567 Interferometer for measuring virtual contact surfaces
03/02/2006US20060044553 Apparatus and methods for automatically measuring a curl of an optical sheet
03/02/2006US20060043275 Device and method for measuring surfaces on the internal walls of cylinders, using confocal microscopes
03/02/2006US20060042104 Measurement device
03/02/2006DE202005018753U1 Measuring device for inspecting geometric quality of railed vehicle`s wheel sets, has profile sensor to measure concentricity deviation of center section of shaft and another sensor to measure concentricity deviation of side piece of shaft
03/02/2006DE102004041950A1 Optische Positionsmesseinrichtung An optical encoder
03/02/2006DE102004040345A1 Checking abutment region of bonded fiber material webs laid on backing, by measuring distance to surface and evaluating to determine if overlap or gap is present
03/02/2006DE102004040164A1 Vorrichtung zur Erfassung von Strukturen, wie Profilierungen oder Prägungen an Körpern von Flaschen oder dergl. Behälter Device for detecting structures, such as profiles or stampings on bodies of bottles or the like. Container
03/01/2006EP1630857A1 Position information measuring method and device, and exposure method and system
03/01/2006EP1630520A2 Apparatus and method of heterodyne interferometry for imaging
03/01/2006EP1630519A1 Modular apparatus for systems performing 3-D virtual reconstruction of surfaces of objects, as well as system comprising a plurality of such apparatuses
03/01/2006EP1629304A2 A modular non-contact measurement device for quickly and accurately obtaining dimensional measurement data
03/01/2006EP1629254A1 Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics
03/01/2006EP1546645B1 Interferometric measuring device
03/01/2006EP1157307B1 Photoresist dispense method by compensation for substrate reflectivity
03/01/2006EP0886790B1 Telecentric 3d camera and method
03/01/2006CN1742294A Methods and apparatus for making images including depth information
03/01/2006CN1742193A Calibration certification for wheel alignment equipment
03/01/2006CN1742192A Optical sensing device
03/01/2006CN1742191A Optical sensing device
03/01/2006CN1741727A Nozzle position correcting method for electronic device mounting appararus
03/01/2006CN1740849A Producing method of optical device, positioning master, optical device and projector
03/01/2006CN1740743A Anode horizontal height-finding system with radio comparing base as platform
03/01/2006CN1740742A Optical grating photoelectric self-collimator
03/01/2006CN1740741A Calibrating method for visual non-contact measuring head
03/01/2006CN1740740A Method for detecting size of assembly
03/01/2006CN1740739A Fast colourful three-dimensional chart pasting method based on linear structural laser passive scanning
03/01/2006CN1740738A Inner three-directional moire interferometer
03/01/2006CN1244022C 曝光装置 Exposure device
03/01/2006CN1243970C Scanning head and outer inspection method and apparatus capable of using said scanning head
03/01/2006CN1243952C Position phase-difference enlarger of combined interferometer
03/01/2006CN1243951C Interferometer equipment and measurement method in interferometer
02/2006
02/28/2006US7006952 3-D model providing device
02/28/2006US7006681 Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings
02/28/2006US7006237 Laser beam positioning device for laser processing equipment
02/28/2006US7006236 Method and apparatus for approximating depth of an object's placement onto a monitored region with applications to virtual interface devices
02/28/2006US7006235 Methods and systems for determining overlay and flatness of a specimen
02/28/2006US7006233 Method of detecting a distortion on a surface
02/28/2006US7006227 Apparatus for the in situ alignment of a mask and a semiconductor wafer
02/28/2006US7006226 Alignment method, alignment apparatus, exposure apparatus using the same, and device manufactured by using the same
02/28/2006US7006225 Alignment mark, alignment apparatus and method, exposure apparatus, and device manufacturing method
02/28/2006US7006222 Concurrent measurement and cleaning of thin films on silicon-on-insulator (SOI)
02/28/2006US7006210 Glare-directed imaging
02/28/2006US7006142 Three-dimensional image capturing device
02/28/2006US7006132 Aperture coded camera for three dimensional imaging
02/28/2006US7006086 Method and apparatus for accurate alignment of images in digital imaging systems by matching points in the images corresponding to scene elements
02/28/2006US7005661 Optical object identification apparatus, and printing apparatus and object classification apparatus using same
02/28/2006US7005630 Energy-modulating fiber grating sensor
02/28/2006US7004329 Classifying station with dynamic decision zone
02/23/2006WO2006019070A1 Method of measuring length of band-form member and device therefor
02/23/2006WO2006018539A1 Simple or global optical-fibre-based shock sensor and method of designing and producing one such sensor
02/23/2006WO2006017974A1 Fiber greating or fiber strain sensor head and strain measurement system thereof
02/23/2006US20060041333 Robot