| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 12/21/2005 | CN1232799C Adjusting device with optical regulating device having reflector |
| 12/21/2005 | CN1232798C Linear movement reference device of cylindricity instrument with laser penetrance and reflection monitoring compensation |
| 12/20/2005 | US6977782 Object lens producing device and producing method |
| 12/20/2005 | US6977775 Method and apparatus for crystallizing semiconductor with laser beams |
| 12/20/2005 | US6977732 Miniature three-dimensional contour scanner |
| 12/20/2005 | US6977651 3-d model providing device |
| 12/20/2005 | US6977631 Optical scanning system with variable focus lens |
| 12/20/2005 | US6977368 Method for measuring position and position measuring device for carrying out said method |
| 12/20/2005 | CA2391024C A track maintenance machine and a method of detecting a track position |
| 12/20/2005 | CA2321841C Luminescent brittle coating in strain analysis |
| 12/15/2005 | WO2005119592A1 Method for characterizing a digital imaging system |
| 12/15/2005 | WO2005119226A1 Apparatus and method for inspecting semiconductor wafer |
| 12/15/2005 | WO2005119172A1 Method and apparatus for inspecting front surface shape |
| 12/15/2005 | WO2005119171A1 Device for measuring surface deformations |
| 12/15/2005 | WO2005119170A2 Shape roughness measurement in optical metrology |
| 12/15/2005 | WO2005119169A2 Beam profile complex reflectance system and method for thin film and critical dimension measurements |
| 12/15/2005 | WO2005118428A1 Diameter measuring device |
| 12/15/2005 | WO2005091837A3 Apparatus and method for determining orientation parameters of an elongate object |
| 12/15/2005 | WO2005017489A3 Film mapping system |
| 12/15/2005 | US20050277029 Microstructured pattern inspection method |
| 12/15/2005 | US20050276513 Method for characterizing a digital imaging system |
| 12/15/2005 | US20050276463 Visual inspection method and visual inspection apparatus |
| 12/15/2005 | US20050275957 Imaging system and method employing off-axis illumination of an illumination modulator |
| 12/15/2005 | US20050275850 Shape roughness measurement in optical metrology |
| 12/15/2005 | US20050275848 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry |
| 12/15/2005 | US20050275841 Alignment marker and lithographic apparatus and device manufacturing method using the same |
| 12/15/2005 | US20050275840 Optical position assessment apparatus and method |
| 12/15/2005 | US20050275834 Method and apparatus for locating objects |
| 12/15/2005 | US20050275833 Method and apparatus for detecting and characterizing an object |
| 12/15/2005 | US20050275831 Method and apparatus for visual detection and inspection of objects |
| 12/15/2005 | US20050275803 Stage apparatus and vision measuring apparatus |
| 12/15/2005 | US20050274913 Object data input apparatus and object reconstruction apparatus |
| 12/15/2005 | US20050274909 Level sensor for lithographic apparatus |
| 12/15/2005 | US20050274901 System for scatterometric measurements and applications |
| 12/15/2005 | DE10357062B4 System zur Messung der Verkippung von strukturierten Oberflächen System for measuring the tilt of structured surfaces |
| 12/15/2005 | DE10346850B4 Verfahren zum Ermitteln einer Eigenschaft einer strukturierten Schicht A method for determining a property of a structured layer |
| 12/15/2005 | DE102005011344A1 Sensorvorrichtung Sensor device |
| 12/15/2005 | DE102004026275A1 Test body length measurement system has internal pressure of compensation body adjustable by feeding gas in or out of compensation body independently of vacuum in measurement body to reduce required drive forces |
| 12/15/2005 | DE102004025999A1 Three-dimensional eye position detector for laser eye operation, has sensor for detecting reference object in two translatory directions, and distances of scanning points |
| 12/15/2005 | DE102004025490A1 Optical measurement of reflective or transparent objects using laser, by applying e.g. condensate film that can be removed without contact |
| 12/15/2005 | DE102004025252A1 Articulated vehicle coupling angle determining device, determines angles of incidence and/or spacing between signals reflected back from surface of second vehicle part |
| 12/15/2005 | DE102004025210A1 Optical analog distance sensor, has light intensity at optical receiver dependent on reflector position |
| 12/15/2005 | DE102004024785A1 Verfahren zur Vermessung topographischer Strukturen auf Bauelementen Method for measuring topographic structures on components |
| 12/15/2005 | DE102004024378A1 Scannender Messroboter Scan finished measuring robot |
| 12/15/2005 | DE102004024095A1 Beleuchtungsvorrichtung und bildgebendes medizinisches Untersuchungsgerät mit einer derartigen Beleuchtungsvorrichtung Lighting apparatus and imaging medical examination apparatus comprising an illumination device |
| 12/15/2005 | DE102004023739A1 Messgerät und Verfahren zum Betreiben eines Messgeräts zur optischen Inspektion eines Objekts Meter and method for operating a measuring device for optical inspection of an object |
| 12/15/2005 | DE102004022579A1 Method for establishing the residual length of the consumable electrode in a process oven has an optical transmission and receiving unit measuring reflected signals |
| 12/15/2005 | CA2566589A1 Diameter measuring device |
| 12/14/2005 | EP1605312A1 Radiation system, lithographic apparatus and device manufacturing method |
| 12/14/2005 | EP1605311A2 Illumination device with light mixer for homogenisation of radiation distributions |
| 12/14/2005 | EP1605228A2 Stage apparatus and vision measuring apparatus |
| 12/14/2005 | EP1604193A2 Optical inspection system, illumination apparatus and method for imaging specular objects based on illumination gradients |
| 12/14/2005 | EP1604191A1 A method and apparatus for determining one or more physical properties of a rolled smoking article or filter rod |
| 12/14/2005 | EP1604169A2 Characterizing and profiling complex surface structures using scanning interferometry |
| 12/14/2005 | EP1604168A2 Profiling complex surface structures using scanning interferometry |
| 12/14/2005 | EP1603620A2 Determining the geometry and dimensions of a three-dimensional object |
| 12/14/2005 | EP1603415A1 Improvements in or relating to machine vision equipmet |
| 12/14/2005 | EP0727038B1 Devices and methods for detection of an analyte based upon light interference |
| 12/14/2005 | CN2746365Y Side bend detection mechanism of ice-cream stick automatic detection and selection machine |
| 12/14/2005 | CN2746364Y Thickness detection mechanism of ice-cream stick automatic detection and selection machine |
| 12/14/2005 | CN1707363A Radiation system, lithographic apparatus, device manufacturing method and device manufactured thereby |
| 12/14/2005 | CN1707248A Stage apparatus and vision measuring apparatus |
| 12/14/2005 | CN1707220A Screw-thread steel three-parameter on-line measuring system |
| 12/14/2005 | CN1231749C System and method for analyzing curvature and stress information of plate structure |
| 12/14/2005 | CN1231743C Optical grating wedge plate and corner measuring device using same |
| 12/14/2005 | CN1231742C Mechanical system apparatus for axle bush thickness automatic checking-sorting machine |
| 12/14/2005 | CN1231741C Method of assisting sample inclination error adjustment |
| 12/14/2005 | CN1231334C Workpiece regulating method for cutting machine |
| 12/13/2005 | US6975960 Method for evaluating wafer configuration, wafer, and wafer sorting method |
| 12/13/2005 | US6975410 Measuring device |
| 12/13/2005 | US6975409 Illumination device; and coordinate measuring instrument having an illumination device |
| 12/13/2005 | US6975408 Reflection scale and displacement measurement apparatus using the same |
| 12/13/2005 | US6975407 Method of wafer height mapping |
| 12/13/2005 | US6975405 Method and apparatus for measuring flatness and/or relative angle between top and bottom surfaces of a chip |
| 12/13/2005 | US6975389 Deflection angle measuring device, optical signal switching system, information recording and replaying system, deflection angle measuring method, and optical signal switching method |
| 12/13/2005 | US6975326 Image processing apparatus |
| 12/13/2005 | US6974964 Method and apparatus for three-dimensional surface scanning and measurement of a moving object |
| 12/13/2005 | US6974947 Apparatus and method for sensing rotation based on multiple sets of movement data |
| 12/13/2005 | US6973739 Rigger-spread measuring instruments |
| 12/13/2005 | US6973734 Method for providing sensory feedback to the operator of a portable measurement machine |
| 12/08/2005 | WO2005116601A2 Method and apparatus for detecting pressure distribution in fluids |
| 12/08/2005 | WO2005116579A1 Inspection of wood surface roughness |
| 12/08/2005 | WO2005116578A2 Shape measurement method |
| 12/08/2005 | WO2005116577A1 Method of adjusting imaging optical system, imaging device, positional deviation detecting device, mark identifying device and edge position detectinc device |
| 12/08/2005 | WO2005115700A1 Method for robot-assisted measurement of measurable objects |
| 12/08/2005 | WO2005115689A1 Substrate peripheral portion measuring device and method, substrate peripheral portion polishing apparatus and method, and substrate rinsing apparatus and method |
| 12/08/2005 | WO2005088242A3 Method and scanning arrangement for the contactless scanning of three-dimensional objects and device for holding the objects |
| 12/08/2005 | WO2005059823A3 Systems and methods for detecting defects in printed solder paste |
| 12/08/2005 | US20050271954 Alignment mark, alignment apparatus and method, exposure apparatus, and device manufacturing method |
| 12/08/2005 | US20050271264 Three-dimensional image measuring apparatus and method |
| 12/08/2005 | US20050271263 Method of detecting projecting adherend and method for producing super plug using that method |
| 12/08/2005 | US20050271262 Method and apparatus for inspecting a mura defect, and method of manufacturing a photomask |
| 12/08/2005 | US20050270545 Three-dimensional measurement system |
| 12/08/2005 | US20050270532 Laser line generating device |
| 12/08/2005 | US20050270522 Surface inspection apparatus |
| 12/08/2005 | US20050270511 Radiation system, lithographic apparatus, device manufacturing method and device manufactured thereby |
| 12/08/2005 | US20050270496 Projector with a device for measuring angle of inclination |
| 12/08/2005 | US20050270375 Camera calibrating apparatus and method |
| 12/08/2005 | US20050269531 Apparatus for detecting light-transmissive sheet-like body |
| 12/08/2005 | US20050268707 Non-contact method and system for tire analysis |