| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 02/23/2006 | US20060040555 Electrical connector having structures for preventing deflected-insertion |
| 02/23/2006 | US20060039011 Method and apparatus for manufacturing semiconductor device |
| 02/23/2006 | US20060039010 Multi-axis integration system and method |
| 02/23/2006 | US20060039008 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method |
| 02/23/2006 | US20060038986 Method of reviewing detected defects |
| 02/23/2006 | US20060038985 Apparatus for optically analyzing products such as fruit having bilateral imaging devices |
| 02/23/2006 | US20060038984 System for detecting anomalies and/or features of a surface |
| 02/23/2006 | US20060038114 Method and apparatus for detecting objects using structured light patterns |
| 02/23/2006 | DE20221476U1 Automatic regulation of focus and lighting and optical sensing of edge position for precision optical measurement involves determining weighted sum of individual auxiliary parameters |
| 02/23/2006 | DE202005014964U1 Box for pressure testing instruments and camera inspection equipment used in channels and pipelines, includes camera controller, pressure test controller and computer with ancillaries |
| 02/23/2006 | DE19920206B4 Verfahren zum Ausmessen von Näpfchen A method for gauging wells |
| 02/23/2006 | DE10258248B4 System zur interferometrischen Passeprüfung System for interferometric testing Passe |
| 02/23/2006 | DE10234626B4 Sicherheitsbauteile aus Stahl für die Hebe-,Zurr-,Förder -und Gewinnungstechnik Security steel components for the lifting, lashing, conveyor -and recovery technique |
| 02/23/2006 | DE102005037348A1 Ein Maschinensichtanalysesystem und -verfahren A machine vision analysis system and method |
| 02/23/2006 | DE102004054508A1 Camera-based object examination method, for detecting contraction e.g. in pressed part, involves arranging object and light sources, so that distribution of vector projection on object surface and defect circumference forms right angle |
| 02/23/2006 | DE102004039740A1 Verfahren und Vorrichtung zu Abstandsbestimmung und Objektbestimmung Method and apparatus for distance determination and object determination |
| 02/23/2006 | DE102004039410A1 Verfahren und Vorrichtung zur Regelung eines automatischen Bearbeitungsprozesses Method and apparatus for controlling an automatic machining process |
| 02/23/2006 | DE102004039088A1 Illuminating system for generating a linear/striped linear light on an object causes beams of linear light to run along a plane for the incidence of light towards the object |
| 02/22/2006 | EP1628141A1 Method of triangulation with laser-diodes and a mono-camera for determining distance in stop-and-go applications for motor vehicles |
| 02/22/2006 | EP1627202A1 Surface profiling apparatus |
| 02/22/2006 | EP1454148B1 Flow measuring device and method |
| 02/22/2006 | EP1157253B1 Specimen topography reconstruction |
| 02/22/2006 | CN1739003A Reconstruction of a surface topography |
| 02/22/2006 | CN1737547A Apparatus for optically analyzing products such as fruit having bilateral imaging devices |
| 02/22/2006 | CN1737494A Surface profile analytical method for object needing measure |
| 02/22/2006 | CN1737493A Double optical fiber coupling contact type micro measuring force aiming sensor |
| 02/22/2006 | CN1243412C Phase difference adjusting device and method, sensing apparatus employing the same |
| 02/22/2006 | CN1243215C Non-contact fluid thickness detection system and method thereof |
| 02/22/2006 | CN1243214C Urban underground miniature pipe depth measuring transducer based on CCD photosensitive elements |
| 02/21/2006 | US7003428 Method and system for thread tolerance checking |
| 02/21/2006 | US7003200 PM fiber alignment |
| 02/21/2006 | US7003161 Systems and methods for boundary detection in images |
| 02/21/2006 | US7003137 Target recognition apparatus |
| 02/21/2006 | US7002699 Identification and labeling of beam images of a structured beam matrix |
| 02/21/2006 | US7002698 Semiconductor processing apparatus having lift and tilt mechanism |
| 02/21/2006 | US7002694 Interferometer system and method for recording an interferogram using weighted averaging over multiple frequencies, and method for providing and manufacturing an object having a target surface |
| 02/21/2006 | US7002693 Thickness measurement method and apparatus |
| 02/21/2006 | US7002689 Optically-based method and apparatus for detecting and characterizing surface pits in a metal film during chemical mechanical polish |
| 02/21/2006 | US7002676 Appearance inspection apparatus and the method of inspecting the same |
| 02/21/2006 | US7002672 Optical fiber strain sensor device and strain detection method |
| 02/21/2006 | US7002667 Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby |
| 02/21/2006 | US7002555 Display comprising touch panel |
| 02/21/2006 | US7001376 Methods and systems for laser calibration and eye tracker camera alignment |
| 02/21/2006 | US7001375 Method and apparatus for determining characteristics of a laser beam spot |
| 02/21/2006 | US7001024 Image input apparatus using projected light |
| 02/21/2006 | US7000326 Apparatus and method for maintaining wheel alignment sensor runout compensation |
| 02/21/2006 | CA2305107C Method of measuring a body region |
| 02/16/2006 | WO2006016071A1 Measuring apparatus for controlling painted bodywork parts, provided with an anti-deterioration device |
| 02/16/2006 | WO2006016065A1 Method and station for controlling paint work of motor vehicle bodywork parts |
| 02/16/2006 | WO2006015917A1 Method for measuring surfaces using an interferometric system |
| 02/16/2006 | WO2006015459A1 Device for measuring or orienting objects such as fruits and the like |
| 02/16/2006 | WO2006000552A8 Scanner system and method for registering surfaces |
| 02/16/2006 | WO2005086714A3 Grazing incidence relays |
| 02/16/2006 | WO2005065022A3 Optical apparatus for measuring tooling position within a seaming machine |
| 02/16/2006 | WO2005029139A3 A light-force sensor and method for measuring axial optical-trap forces from changes in light momentum along an optic axis |
| 02/16/2006 | US20060035395 Process endpoint detection method using broadband reflectometry |
| 02/16/2006 | US20060034548 Apparatus and method for scanning an object |
| 02/16/2006 | US20060034490 Image recognition method and apparatus |
| 02/16/2006 | US20060034488 Displacement sensor having a display data output |
| 02/16/2006 | US20060033935 Laser sheet generator |
| 02/16/2006 | US20060033929 Phase measuring method and apparatus for multi-frequency interferometry |
| 02/16/2006 | US20060033925 Interferometric measuring device |
| 02/16/2006 | US20060033917 Calibration wafer for a stepper |
| 02/16/2006 | US20060033916 Selection method, exposure method, selection unit, exposure apparatus, and device manufacturing method |
| 02/16/2006 | US20060033915 Method of assembling reticle module |
| 02/16/2006 | US20060033914 Multiple beam ellipsometer |
| 02/16/2006 | US20060033055 Surface position detection apparatus and method, and exposure apparatus and device manufacturing method using the exposure apparatus |
| 02/16/2006 | DE19804050B4 Vorrichtung zur optischen Distanzmessung Device for optical distance measurement |
| 02/16/2006 | DE102005034881A1 Verfahren zum Positionieren einer Trennlinie eines Wafers A method for positioning a parting line of a wafer |
| 02/16/2006 | DE102004035102A1 3 D object measurement projector has real or virtual point light sources with separate spectral intensity distributions strip modulated by cylindrical lens |
| 02/16/2006 | DE10135766B4 Verfahren zum Erfassen eines transparenten Gegenstandes und Detektoreinrichtung A method of detecting a transparent object and detecting means |
| 02/15/2006 | EP1625350A1 Coded-light dual-view profile scanner |
| 02/15/2006 | EP1624795A2 Method and arrangement for measuring the front section of the eye |
| 02/15/2006 | EP1506073B1 Broken tool detector |
| 02/15/2006 | EP1244950B1 High rate optical correlator implemented on a substrate |
| 02/15/2006 | EP1095247B1 Method for determining direction-dependent properties of paint lacquers |
| 02/15/2006 | EP0941450B1 Measuring device for use with vehicles |
| 02/15/2006 | CN2758702Y On-line measuring system for diameter of uranium dioxide core block |
| 02/15/2006 | CN2758701Y Three-light beam guiding measuring system for push bench |
| 02/15/2006 | CN1735896A System and method for bump height measurement |
| 02/15/2006 | CN1735788A Structured light projector |
| 02/15/2006 | CN1735787A System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques |
| 02/15/2006 | CN1734501A Method and apparatus for removing uneven brightness in an image |
| 02/15/2006 | CN1734287A Absolute distance measuring device |
| 02/15/2006 | CN1734231A Self-calibrating, multi-camera machine vision measuring system |
| 02/15/2006 | CN1734230A Instruments for analyzing binding assays based on attenuation of light by thin films |
| 02/15/2006 | CN1734229A Microsize admeasuring apparatus |
| 02/15/2006 | CN1734228A Machine vision analysis system and method |
| 02/15/2006 | CN1242245C Emission light source device for optical coder |
| 02/15/2006 | CN1242242C Reflective rotation angle detecting device and rotating disk thereof |
| 02/15/2006 | CN1242241C 纳米检测光学系统 Nano-detecting optical system |
| 02/14/2006 | US6999893 Position detecting device and position detecting method |
| 02/14/2006 | US6999618 Object extraction device, object extraction method, and recording media for storing an object extraction program |
| 02/14/2006 | US6999205 Image projection systems |
| 02/14/2006 | US6999184 Electronic component mounting apparatus and electronic component mounting method |
| 02/14/2006 | US6999183 Detection system for nanometer scale topographic measurements of reflective surfaces |
| 02/14/2006 | US6999182 Method and system for characterizing aspheric surfaces of optical elements |
| 02/14/2006 | US6999181 Advanced signal processing technique for translating fringe line disturbances into sample height at a particular position above an interferometer's sample stage |
| 02/14/2006 | US6999180 Optical film topography and thickness measurement |
| 02/14/2006 | US6999178 Spatial-heterodyne interferometry for reflection and transmission (SHIRT) measurements |