Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
07/2008
07/08/2008US7397074 RF field heated diodes for providing thermally assisted switching to magnetic memory elements
07/08/2008US7397073 Barrier dielectric stack for seam protection
07/08/2008US7397071 Tunnel transistor having spin-dependent transfer characteristics and non-volatile memory using the same
07/08/2008US7397070 Self-aligned transistor
07/08/2008US7397069 Semiconductor device
07/08/2008US7397067 Microdisplay packaging system
07/08/2008US7397066 Microelectronic imagers with curved image sensors and methods for manufacturing microelectronic imagers
07/08/2008US7397065 Organic electroluminescent device and fabrication methods thereof
07/08/2008US7397064 Semiconductor display device
07/08/2008US7397063 Semiconductor device
07/08/2008US7397062 Heterojunction bipolar transistor with improved current gain
07/08/2008US7397060 Pipe shaped phase change memory
07/08/2008US7396779 Electronic apparatus, silicon-on-insulator integrated circuits, and fabrication methods
07/08/2008US7396777 Method of fabricating high-k dielectric layer having reduced impurity
07/08/2008US7396767 Semiconductor structure including silicide regions and method of making same
07/08/2008US7396754 Method of making wafer level ball grid array
07/08/2008US7396748 Semiconductor device includes gate insulating film having a high dielectric constant
07/08/2008US7396736 Magnetic sensor of very high sensitivity
07/08/2008US7396730 Integrated circuit devices including an L-shaped depletion barrier layer adjacent opposite sides of a gate pattern and methods of forming the same
07/08/2008US7396726 Methods of fabricating surrounded-channel transistors with directionally etched gate or insulator formation regions
07/08/2008US7396715 Semiconductor device and manufacturing method of the same
07/08/2008US7396712 Thin film processing method and thin processing apparatus
07/08/2008US7396709 Semiconductor device and method for manufacturing the same
07/08/2008US7396707 Fabrication method of a semiconductor device
07/08/2008US7396695 Wire structure, a thin film transistor substrate of using the wire structure and a method of manufacturing the same
07/03/2008WO2008079775A1 A semiconductor memory comprising dual charge storage nodes and methods for its fabrication
07/03/2008WO2008079684A2 Electron blocking layers for electronic devices
07/03/2008WO2008079114A1 Thermal diodic devices and methods for manufacturing same
07/03/2008WO2008079078A1 Elevated led and method of producing such
07/03/2008WO2008079077A2 Nanoelectronic structure and method of producing such
07/03/2008WO2008079076A1 Led with upstanding nanowire structure and method of producing such
07/03/2008WO2008078770A1 Mechanical quantity sensor and method for manufacturing the same
07/03/2008WO2008078652A1 Dielectric element and method for producing the dielectric element
07/03/2008WO2008078651A1 Gas treatment apparatus, gas treatment method and storage medium
07/03/2008WO2008078637A1 Pattern forming method and method for manufacturing semiconductor device
07/03/2008WO2008078516A1 Apparatus for manufacturing silicon oxide thin film and method for forming the silicon oxide thin film
07/03/2008WO2008078363A1 Process for producing semiconductor device and semiconductor device
07/03/2008WO2008057438A3 Power switching semiconductor devices including rectifying junction-shunts
07/03/2008WO2008038236A3 A multi-transistor based non-volatile memory cell with dual threshold voltage
07/03/2008WO2008008581A3 An electronics package with an integrated circuit device having post wafer fabrication integrated passive components
07/03/2008WO2007109658A3 Shared metallic source/drain cmos circuits and methods thereof
07/03/2008WO2007106422A3 Shielded gate trench(sgt) mosfet cells implemented with a schottky source contact
07/03/2008WO2007082200A3 Semiconductor structure including trench capacitor and trench resistor
07/03/2008WO2007079372A3 An oxygen enhanced metastable silicon germanium film layer
07/03/2008WO2007070808A3 Multi-bit-per-cell nvm structures and architecture
07/03/2008WO2006059300A3 Insulated gate field effect transistors
07/03/2008US20080161464 hexachlorodisiloxane, 1,6-bis/trichlorosilyl/hexane, 1,6-bis/trimethoxysilyl/hexane or 1,6-bis/triacetoxysilyl/hexane crosslinked uv radiation cured polymeric ( polystyrene, polyvinylphenol, styrene-vinyphenol copolymer, polysiloxane, polymethyl methacrylate etc) dielectric thin-film; high capacitance
07/03/2008US20080160732 Method for the Production of a Buried Stop Zone in a Semiconductor Component and Semiconductor Component Comprising a Buried Stop Zone
07/03/2008US20080160711 Contactless flash memory array
07/03/2008US20080160684 Method of fabricating multi-gate transistor and multi-gate transistor fabricated thereby
07/03/2008US20080160643 Magnetic Random Access Memory Cells Having Split Subdigit Lines Having Cladding Layers Thereon and Methods of Fabricating the Same
07/03/2008US20080160312 Synthesis is interrupted and a free end of each of the carbon nanotubes is supported from a second substrate; separate synthesis sites from first substrate and resume the synthesis to lengthen nanotubes; interface between synthesis site and nanotube has continuous unoccluded, free access to reactant gas
07/03/2008US20080158995 Flash EEPROM System
07/03/2008US20080158931 Apparatus and methods for optically-coupled memory systems
07/03/2008US20080158481 Sensor, thin film transistor array panel, and display panel including the sensor
07/03/2008US20080157391 RF semiconductor devices and methods for fabricating the same
07/03/2008US20080157293 Semiconductor device and fabrication method thereof
07/03/2008US20080157292 High-stress liners for semiconductor fabrication
07/03/2008US20080157284 Guard ring extension to prevent reliability failures
07/03/2008US20080157283 Template for three-dimensional thin-film solar cell manufacturing and methods of use
07/03/2008US20080157282 attaching a metal to the penetrating pit or the penetrating crack of a free-standing substrate of a nitride semiconductor, the metal being adapted to be nitrided, and nitriding the metal to form a nitride that seals the penetrating pit or the penetrating crack
07/03/2008US20080157281 Ultra-low drain-source resistance power MOSFET
07/03/2008US20080157280 Bjt and method for fabricating the same
07/03/2008US20080157279 Semiconductor device and method of manufacturing the same
07/03/2008US20080157278 Semiconductor device and method for fabricating the same
07/03/2008US20080157277 Mim capacitor
07/03/2008US20080157276 Semiconductor capacitor and manufacturing method
07/03/2008US20080157274 Individual sub-assembly containing a ceramic interposer, silicon voltage regulator, and array capacitor
07/03/2008US20080157273 Integrated electronic circuit chip comprising an inductor
07/03/2008US20080157272 Planar Inductor And Method Of Manufacturing It
07/03/2008US20080157270 Metal to Metal Low-K Antifuse
07/03/2008US20080157269 Reversible electric fuse and antifuse structures for semiconductor devices
07/03/2008US20080157267 Stacked Printed Devices on a Carrier Substrate
07/03/2008US20080157264 Shallow trench isolation devices and methods
07/03/2008US20080157259 Semiconductor device, method of controlling the same, and method of manufacturing the same
07/03/2008US20080157258 Method of forming silicided gates using buried metal layers
07/03/2008US20080157257 Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same
07/03/2008US20080157237 Switching device and method of fabricating the same
07/03/2008US20080157236 Differential pressure sensing device and fabricating method therefor
07/03/2008US20080157235 Controlled buckling structures in semiconductor interconnects and nanomembranes for stretchable electronics
07/03/2008US20080157234 Semiconductor device and method of manufacturing the same
07/03/2008US20080157233 Method for fabricating a semiconductor device
07/03/2008US20080157232 Semiconductor device and method of fabricating the same, and nand gate circuit using the semiconductor device
07/03/2008US20080157231 Gate structure
07/03/2008US20080157230 Semiconductor Device and Method of Fabricating the Same
07/03/2008US20080157229 Semiconductor Device and Fabricating Method Thereof
07/03/2008US20080157228 Structure and method for dual work function metal gate electrodes by control of interface dipoles
07/03/2008US20080157225 SRAM and logic transistors with variable height multi-gate transistor architecture
07/03/2008US20080157224 Tuned tensile stress low resistivity slot contact structure for n-type transistor performance enhancement
07/03/2008US20080157220 Semiconductor Device and Manufacturing Method Thereof
07/03/2008US20080157218 Semiconductor device and method of fabricating the same, and nor gate circuit using the semiconductor device
07/03/2008US20080157217 Semiconductor component and method of manufacture
07/03/2008US20080157210 High-linearity and high-power CMOS structure and manufacturing method for the same
07/03/2008US20080157208 Stressed barrier plug slot contact structure for transistor performance enhancement
07/03/2008US20080157207 Tri-gate device with conformal pvd workfunction metal on its three-dimensional body and fabrication method thereof
07/03/2008US20080157206 Semiconductor device and manufacturing method of the same
07/03/2008US20080157205 Semiconductor device with gate structure and method for fabricating the semiconductor device
07/03/2008US20080157203 Semiconductor device having edmos transistor and method for manufacturing the same
07/03/2008US20080157200 Stress liner surrounded facetless embedded stressor mosfet
07/03/2008US20080157199 Dielectric extension to mitigate short channel effects