| Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248) |
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| 02/23/2000 | CN1245392A Method for coating through-hole side wall with thick film |
| 02/23/2000 | CN1245351A Semiconductor chip with surface covering layer |
| 02/23/2000 | CN1245349A Method for manufacturing high-density semiconductor storage device |
| 02/23/2000 | CN1245348A Method for producing material layer for composition of picture |
| 02/22/2000 | US6028990 Method and apparatus for a lateral flux capacitor |
| 02/22/2000 | US6028813 NOR type semiconductor memory device and a method for reading data stored therein |
| 02/22/2000 | US6028804 Method and apparatus for 1-T SRAM compatible memory |
| 02/22/2000 | US6028788 Flash memory device |
| 02/22/2000 | US6028784 Ferroelectric memory device having compact memory cell array |
| 02/22/2000 | US6028763 Capacitor and method for forming a capacitor |
| 02/22/2000 | US6028758 Electrostatic discharge (ESD) protection for a 5.0 volt compatible input/output (I/O) in a 2.5 volt semiconductor process |
| 02/22/2000 | US6028652 Array substrate for display device and manufacturing method thereof |
| 02/22/2000 | US6028629 Solid-state imaging device and method of manufacturing the same |
| 02/22/2000 | US6028580 Liquid crystal display device |
| 02/22/2000 | US6028474 Semiconductor integrated circuit |
| 02/22/2000 | US6028465 ESD protection circuits |
| 02/22/2000 | US6028443 Test circuit for semiconductor integrated logic circuit using tristate buffers allowing control circuit for tristate to be tested |
| 02/22/2000 | US6028361 Method of manufacturing of semiconductor device having low leakage current |
| 02/22/2000 | US6028346 Isolated trench semiconductor device |
| 02/22/2000 | US6028344 Bipolar transistor on a semiconductor-on-insulator substrate |
| 02/22/2000 | US6028342 ROM diode and a method of making the same |
| 02/22/2000 | US6028341 Latch up protection and yield improvement device for IC array |
| 02/22/2000 | US6028340 Static random access memory cell having a field region |
| 02/22/2000 | US6028338 Semiconductor integrated circuit device with electrostatic damage protection |
| 02/22/2000 | US6028336 Triple polysilicon flash EEPROM arrays having a separate erase gate for each row of floating gates, and methods of manufacturing such arrays |
| 02/22/2000 | US6028335 Semiconductor device |
| 02/22/2000 | US6028334 Semiconductor device and method of manufacturing the same |
| 02/22/2000 | US6028333 Electric device, matrix device, electro-optical display device, and semiconductor memory having thin-film transistors |
| 02/22/2000 | US6028330 CMOS sensor having a structure to reduce white pixels |
| 02/22/2000 | US6028327 Light-emitting device using an organic thin-film electroluminescent light-emitting element |
| 02/22/2000 | US6028323 Quantum well infared image conversion panel and associated methods |
| 02/22/2000 | US6028299 Linear image sensor device comprising first and second linear image sensor sections having first and second sensitivities |
| 02/22/2000 | US6027987 Method of manufacturing a crystalline semiconductor |
| 02/22/2000 | US6027983 Method of manufacturing trench isolate semiconductor integrated circuit device |
| 02/22/2000 | US6027981 Method for forming a DRAM cell with a fork-shaped capacitor |
| 02/22/2000 | US6027979 Method of forming an integrated circuit device |
| 02/22/2000 | US6027974 Nonvolatile memory |
| 02/22/2000 | US6027972 Method for producing very small structural widths on a semiconductor substrate |
| 02/22/2000 | US6027971 Methods of forming memory devices having protected gate electrodes |
| 02/22/2000 | US6027969 Capacitor structure for a dynamic random access memory cell |
| 02/22/2000 | US6027968 Forming high surface area node by selectively etching alternating layers of low doped and high doped concentration borophosphosilicate glass to form surface protrusions within via sidewalls |
| 02/22/2000 | US6027967 Method of making a fin-like stacked capacitor |
| 02/22/2000 | US6027965 Method of manufacturing an integrated circuit with MOS transistors having high breakdown voltages, and with precision resistors |
| 02/22/2000 | US6027964 Method of making an IGFET with a selectively doped gate in combination with a protected resistor |
| 02/22/2000 | US6027962 Method of manufacturing semiconductor device having bipolar transistor and field-effect transistor |
| 02/22/2000 | US6027961 CMOS semiconductor devices and method of formation |
| 02/22/2000 | US6027955 Method of making an active pixel sensor integrated with a pinned photodiode |
| 02/22/2000 | US6027953 Lateral PN arrayed digital X-ray image sensor |
| 02/22/2000 | US6027947 Partially or completely encapsulated top electrode of a ferroelectric capacitor |
| 02/22/2000 | US6027860 Method for forming a structure using redeposition of etchable layer |
| 02/22/2000 | US6027666 Fast luminescent silicon |
| 02/22/2000 | US6026964 Active pixel sensor cell and method of using |
| 02/17/2000 | WO2000008688A1 An integrated circuit provided with esd protection means |
| 02/17/2000 | WO2000008687A1 Integrated circuit comprising fuse links which can be separated by the action of energy |
| 02/17/2000 | WO2000008682A1 Method for producing a storage cell |
| 02/17/2000 | WO2000008681A1 Misted precursor deposition apparatus and method with improved mist and mist flow |
| 02/17/2000 | WO2000008650A1 Mram array having a plurality of memory banks |
| 02/17/2000 | WO2000008649A1 Memory device using a transistor and its fabrication method |
| 02/17/2000 | WO1999063527A3 Data storage and processing apparatus, and method for fabricating the same |
| 02/17/2000 | DE19937214A1 MOST contact structure, especially a gate contact structure, is produced using an etch-stop layer to protect the gate and adjacent side wall spacer during contact opening etching |
| 02/17/2000 | DE19935947A1 Multilevel interconnection of a ferroelectric memory device formation method, produces interconnections of same material as ferroelectric capacitor electrodes |
| 02/17/2000 | DE19914231A1 Semiconductor device, especially a DRAM cell, has a hydrofluoric acid resistant side wall film on a contact hole extending through an element isolation region to a doped substrate region |
| 02/17/2000 | DE19837490A1 Method to measure two-dimensional potential distribution in CMOS semiconductor element and determine two-dimensional doping distribution, uses electron holography to measure phase of electron wave in transmission electron microscope |
| 02/17/2000 | DE19835263A1 Integrierte Schaltung mit durch Energieeinwirkung auftrennbaren elektrischen Verbindungstellen Integrated circuit with separable exposure to energy electrical joints |
| 02/16/2000 | EP0980101A2 Semiconductor integrated circuit and method for manufacturing the same |
| 02/16/2000 | EP0980100A2 Trench capacitor for integrated circuit |
| 02/16/2000 | EP0980095A1 Modular high frequency integrated circuit structure |
| 02/16/2000 | EP0980075A1 A semiconductor memory device |
| 02/16/2000 | EP0980074A1 Combined precharge and equalisation circuit |
| 02/16/2000 | CN1244733A 低压有源半导体体器件 Low body active semiconductor devices |
| 02/16/2000 | CN1244732A Semiconductor device |
| 02/16/2000 | CN1244731A Semiconductor integrated circuit and its producing method |
| 02/16/2000 | CN1244730A Semiconductor device and its producing method |
| 02/16/2000 | CN1244727A Method for forming self alignment contact |
| 02/15/2000 | US6026222 System for combinational equivalence checking |
| 02/15/2000 | US6026049 Semiconductor memory with sensing stability |
| 02/15/2000 | US6026043 Semiconductor memory device with reduced power consumption and stable operation in data holding state |
| 02/15/2000 | US6026039 Parallel test circuit for semiconductor memory |
| 02/15/2000 | US6026038 Wafer burn-in test circuit and method for testing a semiconductor memory |
| 02/15/2000 | US6026028 Hot carrier injection programming and negative gate voltage channel erase flash EEPROM structure |
| 02/15/2000 | US6026020 Data line disturbance free memory block divided flash memory and microcomputer having flash memory therein |
| 02/15/2000 | US6026019 Two square NVRAM cell |
| 02/15/2000 | US6026017 Compact nonvolatile memory |
| 02/15/2000 | US6026010 Semiconductor memory device with bit line contact areas and storage capacitor contact areas |
| 02/15/2000 | US6025748 Precharge device for semiconductor integrated circuit device |
| 02/15/2000 | US6025746 ESD protection circuits |
| 02/15/2000 | US6025740 Clock feeding circuit and method for adjusting clock skew |
| 02/15/2000 | US6025733 Semiconductor memory device |
| 02/15/2000 | US6025652 Semiconductor device and method of producing same |
| 02/15/2000 | US6025633 Multi-level transistor fabrication method having an inverted, upper level transistor which shares a gate conductor with a non-inverted, lower level transistor |
| 02/15/2000 | US6025632 Semiconductor integrated circuit with tungston silicide nitride thermal resistor |
| 02/15/2000 | US6025629 Element isolation structure of a semiconductor device to suppress reduction in threshold voltage of parasitic MOS transistor |
| 02/15/2000 | US6025628 High breakdown voltage twin well device with source/drain regions widely spaced from fox regions |
| 02/15/2000 | US6025626 Nonvolatile memory cell |
| 02/15/2000 | US6025625 Single-poly EEPROM cell structure operations and array architecture |
| 02/15/2000 | US6025624 Shared length cell for improved capacitance |
| 02/15/2000 | US6025623 Semiconductor device with high integration density and improved performance |
| 02/15/2000 | US6025621 Integrated circuit memory devices having independently biased sub-well regions therein and methods of forming same |
| 02/15/2000 | US6025620 Semiconductor device and method of producing the same |
| 02/15/2000 | US6025614 Amplifier semiconductor element, method for fabricating the same, and amplifier semiconductor device |