Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/1990
06/05/1990US4931353 Structure and method for selectively producing a conductive region on a substrate
06/05/1990US4931323 Thick film copper conductor patterning by laser
06/05/1990US4931307 Method of correcting defect of patterned article
06/05/1990US4931149 Fixture and a method for plating contact bumps for integrated circuits
06/05/1990US4931144 Self-aligned nonnested sloped via
06/05/1990US4931137 Submicron dimensions; anisotropic deposition
06/05/1990US4931136 Method and apparatus for manufacturing a metal contact with overhanging edges
06/05/1990US4931135 Etching method and etching apparatus
06/05/1990US4931103 Tricholine phosphate surface treating agent
06/05/1990US4931020 IC package positioning device in IC socket for IC carrier
06/05/1990US4930901 Method of and apparatus for modulating a laser beam
06/05/1990US4930634 Carrier for flat panel displays
06/05/1990US4930216 Process for preparing integrated circuit dies for mounting
06/05/1990EP0382714A4 Process for manufacturing plastic pin grid arrays and the product produced thereby.
06/05/1990EP0357606A4 Low stress heat sinking for semiconductors.
06/05/1990CA1270070A1 Fabrication of semiconductor devices utilizing patterned metal layers
06/05/1990CA1270069A1 Probe card with reconfigurable circuitry
06/05/1990CA1269950A1 Glow-discharge decomposition apparatus
05/1990
05/31/1990WO1990006041A1 Method of and apparatus for drawing thick-film
05/31/1990WO1990006026A1 Universal micro circuit for telecommunication applications
05/31/1990WO1990005994A1 Dry-etching method
05/31/1990WO1990005993A1 High performance sub-micron p-channel transistor with germanium implant
05/31/1990WO1990005990A1 Large-area uniform electron source
05/31/1990WO1990005600A1 Die set for the formation of cavities for metal packages to house electronic devices
05/31/1990WO1989010007A3 Buried junction infrared photodetectors
05/31/1990DE3938956A1 Verfahren zur plasmaablagerung von mehreren schichten aus amorphem material mit variabler zusammensetzung Method for plasma deposition of several layers of amorphous material with variable composition
05/31/1990DE3840410A1 Integratable capacitor structure
05/31/1990DE3840228A1 Semiconductor component for bump assembly
05/31/1990DE3840226A1 Method for producing self-aligned metallisations for FET
05/31/1990CA2003137A1 Method for selectively depositing refractory metal on semiconductor substrates
05/30/1990EP0370935A2 Method of forming conductive lines and studs
05/30/1990EP0370919A2 Method for evaluation of transition region of silicon epitaxial wafer
05/30/1990EP0370912A1 Laser micro-beam intervention machine for thin layer objects, in particular for etching or chemically depositing matter in the presence of a reactive gas
05/30/1990EP0370834A2 Semiconductor device, and method of manufacture
05/30/1990EP0370809A2 Thin-film soi mosfet and method of manufacturing thereof
05/30/1990EP0370776A2 Method of fabricating ink jet printheads
05/30/1990EP0370775A2 Method of manufacturing semiconductor device
05/30/1990EP0370769A2 Method of manufacturing a multiple-core complex material
05/30/1990EP0370745A2 Low-cost high-performance semiconductor chip package
05/30/1990EP0370742A1 Stacked leadframe assembly
05/30/1990EP0370738A1 Solder bumped leadframe
05/30/1990EP0370702A1 Apparatus comprising a high vacuum chamber
05/30/1990EP0370564A1 Method for packing a measured quantity, of thermosetting resin intended for encapsulating a component, packing obtained using this method, method for operating a mould and mould for carrying out this method
05/30/1990EP0370511A2 Method of fabricating a photoplate
05/30/1990EP0370486A2 Method for high temperature reaction process
05/30/1990EP0370462A2 Semiconductor treatment apparatus
05/30/1990EP0370428A2 Process for manufacturing gate electrodes
05/30/1990EP0370416A2 Novel architecture for a flash erase EPROM memory
05/30/1990EP0370403A2 Semiconductor having the coupled quantum box array structure
05/30/1990EP0370387A2 Superconducting material
05/30/1990EP0370364A1 Voltage reference circuit with linearized temperature behavior
05/30/1990EP0370323A2 High resolution image compression methods and apparatus
05/30/1990EP0370322A2 Method and apparatus for alignment of images
05/30/1990EP0370311A2 Chemical vapor deposition system and reactant delivery section therefor
05/30/1990EP0370308A2 Non-volatile semiconductor memory device having, at the prestage of an address decoder, a level shifter for generating a program voltage
05/30/1990EP0370188A1 Transport device and vacuum chamber with such a device and process for loading and unloading a processing chamber
05/30/1990EP0370186A1 Process for axially adjusting the life time of carriers
05/29/1990US4930105 Nonvolatile semiconductor memory device with a double gate structure
05/29/1990US4930086 Method and apparatus for sequential product processing with limited product bar code reading
05/29/1990US4930037 Input voltage protection system
05/29/1990US4930001 Alloy bonded indium bumps and methods of processing same
05/29/1990US4930000 Terminal assembly for an integrated semiconductor circuit
05/29/1990US4929999 Combination of a support and a semiconductor body and method of manufacturing such a combination
05/29/1990US4929998 Integrated circuit having plural capacitances of different values
05/29/1990US4929996 Trench bipolar transistor
05/29/1990US4929995 Selective integrated circuit interconnection
05/29/1990US4929992 MOS transistor construction with self aligned silicided contacts to gate, source, and drain regions
05/29/1990US4929990 Semiconductor memory device
05/29/1990US4929989 MOS type semiconductor device potential stabilizing circuit with series MOS capacitors
05/29/1990US4929988 Non-volatile semiconductor memory device and method of the manufacture thereof
05/29/1990US4929987 Method for setting the threshold voltage of a power mosfet
05/29/1990US4929985 Compound semiconductor device
05/29/1990US4929984 Semiconductors
05/29/1990US4929840 Wafer rotation control for an ion implanter
05/29/1990US4929839 Focused ion beam column
05/29/1990US4929572 Dopant of arsenic, method for the preparation thereof and method for doping of semiconductor therewith
05/29/1990US4929570 Selective epitaxy BiCMOS process
05/29/1990US4929568 Method of isolating a top gate of a MESFET and the resulting device
05/29/1990US4929567 Method of manufacturing a self-aligned GaAs MESFET with T type tungsten gate
05/29/1990US4929566 Method of making dielectrically isolated integrated circuits using oxygen implantation and expitaxial growth
05/29/1990US4929565 Semiconductors
05/29/1990US4929563 Method of manufacturing semiconductor device with overvoltage self-protection
05/29/1990US4929516 Multilayer, metallic buffers, stress relieving
05/29/1990US4929489 Method of making and using selective conductive regions in diamond layers
05/29/1990US4929301 Ethanolamine, piperidine, water, pyrocatechol, hydrogen peroxide
05/29/1990US4929300 Light emitting diodes
05/29/1990US4929139 Passive electrostatic vacuum particle collector
05/29/1990US4929081 System for detecting defects in a regularly arranged pattern such as an integrated circuit or the like
05/29/1990US4928871 Apparatus and method of controlled feed of a bonding wire to the "wedge" of a bonding head
05/29/1990US4928838 Trimming process by a laser beam
05/29/1990US4928821 Spring tension holding means
05/29/1990US4928626 Reactant gas injection for IC processing
05/29/1990US4928512 Die set for the formation of cavities for metal packages to house electronic devices
05/29/1990US4928438 Wafer processing film
05/29/1990CA2004075A1 High density semiconductor structure and method of making the same
05/29/1990CA2004073A1 Method of forming a nonsilicon semiconductor on insulator structure
05/29/1990CA2003138A1 Method of forming a thin silicon layer on an insulator
05/29/1990CA1269764A1 Method of fabricating a junction field effect transistor
05/29/1990CA1269763A1 Integrated circuit package having coaxial pins
05/29/1990CA1269762A1 Method and arrangement for the examination of electrically active impurities of semiconductor materials or structures