Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2010
12/02/2010US20100304506 Laser irradiation method and method for manufacturing semiconductor device using the same
12/02/2010US20100304505 Processing method and storage medium
12/02/2010US20100304504 Process and apparatus for fabricating magnetic device
12/02/2010US20100304313 Process Solutions Containing Surfactants
12/02/2010US20100304312 Cleaning liquid used in photolithography and a method for treating substrate therewith
12/02/2010US20100304301 Negative resist composition and patterning process using the same
12/02/2010US20100304300 Photosensitive composition and pattern-forming method using the photosensitive composition
12/02/2010US20100304281 Exposure mask and method for manufacturing same and method for manufacturing semiconductor device
12/02/2010US20100304280 Method of forming a template, and method of manufacturing a semiconductor device using the template
12/02/2010US20100303405 Optical module and method for manufacturing same
12/02/2010US20100302855 Memory device and methods for fabricating and operating the same
12/02/2010US20100302854 Area-Efficient Electrically Erasable Programmable Memory Cell
12/02/2010US20100302845 Memory device and methods for fabricating and operating the same
12/02/2010US20100302842 Semiconductor memory device, manufacturing method thereof, data processing system, and data processing device
12/02/2010US20100302838 Read disturb-free SMT reference cell scheme
12/02/2010US20100302836 Nonvolatile memory cell comprising a diode and a resistance-switching material
12/02/2010US20100302810 Voltage converters with integrated low power leaker device and associated methods
12/02/2010US20100302790 Led luminaire and method for fabricating the same
12/02/2010US20100302741 Power semiconductor module featuring resiliently supported substrates and method for fabricating a power semiconductor module
12/02/2010US20100302740 Methods of cooling semiconductor dies
12/02/2010US20100302609 Mems device having reduced deformations
12/02/2010US20100302519 Lithographic apparatus and device manufacturing method
12/02/2010US20100302492 Liquid crystal display device and method for manufacturing the same
12/02/2010US20100302474 Source driver, method for manufacturing same, and liquid crystal module
12/02/2010US20100302414 Apparatus and method of processing substrate containing mark and method of manufacturing device
12/02/2010US20100302360 Defect correcting method and defect correcting device for an electronic circuit pattern
12/02/2010US20100301564 Balancing pressure to improve a fluid seal
12/02/2010US20100301497 Dicing tape-integrated film for semiconductor back surface
12/02/2010US20100301496 Structure and Method for Power Field Effect Transistor
12/02/2010US20100301495 Semiconductor device and method for manufacturing same
12/02/2010US20100301494 Re-establishing a hydrophobic surface of sensitive low-k dielectrics in microstructure devices
12/02/2010US20100301493 Packaged electronic devices havng die attach regions with selective thin dielectric layer
12/02/2010US20100301491 High yield and high throughput method for the manufacture of integrated circuit devices of improved integrity, performance and reliability
12/02/2010US20100301490 Profiled contact for semiconductor device
12/02/2010US20100301489 Microstructure device including a metallization structure with self-aligned air gaps formed based on a sacrificial material
12/02/2010US20100301487 Improvements in or relating to integrated circuit reliability
12/02/2010US20100301486 High-aspect ratio contact element with superior shape in a semiconductor device for improving liner deposition
12/02/2010US20100301485 Electronic device, conductive composition, metal filling apparatus, and electronic device manufacturing method
12/02/2010US20100301483 Light-blocking layer sequence having one or more metal layers for an integrated circuit and method for the production of the layer sequence
12/02/2010US20100301482 Sram bit cell with self-aligned bidirectional local interconnects
12/02/2010US20100301479 Devices containing silver compositions deposited by micro-deposition direct writing silver conductor lines
12/02/2010US20100301478 Substrate Having a Coating Comprising Copper and Method for the Production Thereof by Means of Atomic Layer Deposition
12/02/2010US20100301476 Stacked package and method for forming stacked package
12/02/2010US20100301475 Forming Semiconductor Chip Connections
12/02/2010US20100301474 Semiconductor Device Package Structure and Method for the Same
12/02/2010US20100301473 Component built-in wiring board and manufacturing method of component built-in wiring board
12/02/2010US20100301472 Electronic component and manufacturing method thereof
12/02/2010US20100301471 Low-resistance electrode design
12/02/2010US20100301470 Stud bumps as local heat sinks during transient power operations
12/02/2010US20100301469 Integrated circuit packaging system with interposer interconnections and method of manufacture thereof
12/02/2010US20100301468 Semiconductor device and method of manufacturing the same
12/02/2010US20100301467 Wirebond structures
12/02/2010US20100301464 Asterisk pad
12/02/2010US20100301463 Reduced soft error rate through metal fill and placement
12/02/2010US20100301462 Method and apparatus providing air-gap insulation between adjacent conductors using nanoparticles
12/02/2010US20100301461 Reliable interconnection
12/02/2010US20100301460 Semiconductor device having a filled trench structure and methods for fabricating the same
12/02/2010US20100301459 Method for manufacturing a semiconductor device and a semiconductor device
12/02/2010US20100301458 Alignment Target Contrast in a Lithographic Double Patterning Process
12/02/2010US20100301456 Method for applying a structure to a semiconductor element
12/02/2010US20100301455 Method for producing a bonded substrate
12/02/2010US20100301454 Lattice matched multi-junction photovoltaic and optoelectronic devices
12/02/2010US20100301452 Integrated nano-farad capacitors and method of formation
12/02/2010US20100301450 Semiconductor Device and Method of Forming IPD Structure Using Smooth Conductive Layer and Bottom-side Conductive Layer
12/02/2010US20100301449 Methods and apparatus for forming line and pillar structures for three dimensional memory arrays using a double subtractive process and imprint lithography
12/02/2010US20100301446 In-line stacking of transistors for soft error rate hardening
12/02/2010US20100301436 Semiconductor device and method for making semiconductor device
12/02/2010US20100301435 Sensor geometry for improved package stress isolation
12/02/2010US20100301434 MEMS Devices and Methods of Manufacture Thereof
12/02/2010US20100301432 Gap control for die or layer bonding using intermediate layers
12/02/2010US20100301431 Thin semiconductor device having embedded die support and methods of making the same
12/02/2010US20100301430 Mems device and method of fabricating the same
12/02/2010US20100301429 Semiconductor device and method of manufacturing the same
12/02/2010US20100301428 Tantalum silicon oxynitride high-k dielectrics and metal gates
12/02/2010US20100301427 Work function adjustment in high-k metal gate electrode structures by selectively removing a barrier layer
12/02/2010US20100301423 Semiconductor devices with improved local matching and end resistance of rx based resistors
12/02/2010US20100301422 Semiconductor integrated circuit device
12/02/2010US20100301421 Strain enhancement in transistors comprising an embedded strain-inducing semiconductor alloy by creating a patterning non-uniformity at the bottom of the gate electrode
12/02/2010US20100301420 High-k heterostructure
12/02/2010US20100301419 Integrated circuit device with deep trench isolation regions for all inter-well and intra-well isolation and with a shared contact to a junction between adjacent device diffusion regions andan underlying floating well section
12/02/2010US20100301417 Device including high-k metal gate finfet and resistive structure and method of forming thereof
12/02/2010US20100301416 Strain transformation in biaxially strained soi substrates for performance enhancement of p-channel and n-channel transistors
12/02/2010US20100301414 High voltage nmos with low on resistance and associated methods of making
12/02/2010US20100301413 Fabrication of lateral double-diffused metal oxide semiconductor (LDMOS) devices
12/02/2010US20100301410 Semiconductor device and manufacturing method therefor
12/02/2010US20100301409 Vertical field effect transistor arrays and methods for fabrication thereof
12/02/2010US20100301408 Semiconductor device
12/02/2010US20100301407 Semiconductor device having vertical channel transistor and manufacturing method of the same
12/02/2010US20100301406 Zirconium-doped tantalum oxide films
12/02/2010US20100301405 Nonvolatile semiconductor memory device and manufacturing method thereof
12/02/2010US20100301404 Semiconductor device and production method thereof
12/02/2010US20100301403 Semiconductor device with multiple gates and doped regions and method of forming
12/02/2010US20100301401 Semiconductor device and related fabrication methods that use compressive material with a replacement gate technique
12/02/2010US20100301400 Schottky diode
12/02/2010US20100301398 Methods and apparatus for measuring analytes
12/02/2010US20100301397 Power and Ground Shield Mesh to Remove Both Capacitive and Inductive Signal Coupling Effects of Routing in Integrated Circuit Device
12/02/2010US20100301396 Monolithic Vertically Integrated Composite Group III-V and Group IV Semiconductor Device and Method for Fabricating same
12/02/2010US20100301395 Asymmetrically recessed high-power and high-gain ultra-short gate HEMT device
12/02/2010US20100301393 Field effect transistor and manufacturing method therefor
12/02/2010US20100301392 Source/Drain Re-Growth for Manufacturing III-V Based Transistors
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