Patents
Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133)
09/2007
09/20/2007US20070217248 Standby circuitry for fuse cell
09/20/2007US20070217247 Shared sense amplifier for fuse cell
09/20/2007US20070217246 Semiconductor memory device
09/20/2007DE10218272B4 Programmierbarer Festwertspeicher, Speicherzelle hierfür und zugehöriges Verfahren zum Schreiben/Lesen von Daten Programmable read-only memory, this memory cell and associated method for writing / reading data
09/19/2007CN101038791A 半导体存储装置 The semiconductor memory device
09/18/2007US7272067 Electrically-programmable integrated circuit antifuses
09/18/2007US7271988 Method and system to protect electrical fuses
09/13/2007WO2007103648A2 Read-only memory using linear passive elements
09/13/2007US20070211511 Read-only memory using linear passive elements
09/12/2007CN100337246C Electromagnetic transponder with a programmable code
09/11/2007US7269081 Program circuit of semiconductor
09/11/2007US7269065 Nonvolatile semiconductor storage apparatus and readout method
09/11/2007US7269047 Memory transistor gate oxide stress release and improved reliability
09/11/2007US7268044 Non-volatile electromechanical field effect devices and circuits using same and methods of forming same
09/06/2007US20070206401 Electrical fuse device with dummy cells for ESD protection
09/06/2007US20070206400 Write protection for computer long-term memory devices with write-once read-many blocking
09/06/2007DE102007006340A1 Elektrische Sicherungsschaltung Electrical fuse circuit
09/05/2007CN101031979A Method and apparatus for programming and reading codes on an array of fuses
09/04/2007US7266025 Semiconductor integrated circuit
09/04/2007US7266017 Method for selective erasing and parallel programming/verifying of cell blocks in a flash EEprom system
09/04/2007US7265000 Vertically stacked field programmable nonvolatile memory and method of fabrication
08/2007
08/30/2007US20070201293 Testing method for permanent electrical removal of an integrated circuit output
08/30/2007US20070201259 Method and Apparatus for Programming and Reading Codes on an Array of Fuses
08/30/2007US20070201257 Layout techniques for read-only memory and the like
08/29/2007CN100334734C Semiconductor storage unit and semiconductor memory
08/28/2007US7263027 Integrated circuit chip having non-volatile on-chip memories for providing programmable functions and features
08/28/2007US7263022 No-precharge FAMOS cell and latch circuit in a memory device
08/23/2007US20070195629 System and method for increasing reliability of electrical fuse programming
08/23/2007US20070195606 Nonvolatile semiconductor memory device and method of rewriting data thereof
08/23/2007US20070195576 Organic compound having functional groups different in elimination reactivity at both terminals, organic thin film, organic device and method of producing the same
08/23/2007US20070195574 Semiconductor memory device and control method thereof
08/21/2007US7260012 Fuse latch circuit
08/16/2007WO2007027607A3 Random access electrically programmable-e-fuse rom
08/16/2007US20070190722 Method to form upward pointing p-i-n diodes having large and uniform current
08/16/2007US20070189055 Semiconductor integrated circuit and IC card system
08/16/2007US20070189054 Setting method of chip initial state
08/16/2007US20070189053 Electrical fuse device based on a phase-change memory element and corresponding programming method
08/16/2007US20070189051 Semiconductor integrated circuit and IC card system
08/14/2007US7257745 Array self repair using built-in self test techniques
08/14/2007US7257044 Semiconductor integrated circuit
08/14/2007US7257012 Nonvolatile semiconductor memory device using irreversible storage elements
08/09/2007WO2007090089A2 Electrically programmable fuse bit
08/09/2007US20070185656 Computer systems and methods for identifying surrogate markers
08/09/2007US20070183245 Voltage reset circuits for a semiconductor memory device using option fuse circuit and methods of resetting the same
08/09/2007US20070183244 Electric fuse circuit providing margin read function
08/09/2007US20070183217 Nonvolatile semiconductor memory device and method of rewriting data thereof
08/09/2007US20070183181 Electrically programmable fuse bit
08/09/2007US20070183180 Option circuits and option methods of semiconductor chips
08/08/2007CN1331153C Write pulse limitation for one-write-many-read memory device
08/07/2007US7254080 Fuse circuit and electronic circuit
08/07/2007US7254079 Electrical fuse circuit
08/07/2007US7254070 Semiconductor memory device with redundancy circuit
08/02/2007US20070177416 Semiconductor storage device and method of fabricating the same
08/02/2007US20070176234 Semiconductor device
08/01/2007EP1814124A1 Assembly with mechanically inaccessible or not easily accessible switching and method for switching the operating mode an assembly
08/01/2007EP1812893A1 Semiconductor device and driving method of the same
08/01/2007EP1450259B1 Flash memory
07/2007
07/31/2007US7251712 Semiconductor memory device
07/31/2007US7251181 Techniques for storing accurate operating current values
07/31/2007US7251152 Memory circuit having memory cells which have a resistance memory element
07/31/2007US7251150 Radiation-hardened programmable device
07/31/2007US7250646 TFT mask ROM and method for making same
07/26/2007US20070171760 Apparatus and method for trimming static delay of a synchronizing circuit
07/26/2007US20070171692 Semiconductor integrated circuit device
07/26/2007US20070171691 Semiconductor device with electrically broken fuse and its manufacture method
07/26/2007DE10335385B9 ROM-Speicherzelle und -Baustein sowie Entwurfsverfahren hierfür ROM memory cell and building block design and method therefor
07/26/2007DE102007003421A1 Masken-ROM und zugehöriges Datenschutzverfahren Mask ROM and related privacy practices
07/25/2007EP1811564A1 Electrical fuse device based on a phase-change memory element and corresponding programming method
07/24/2007US7248518 Self-timed memory device providing adequate charging time for selected heaviest loading row
07/19/2007US20070168774 Method for error test, recordation and repair
07/19/2007US20070165465 Repair i/o fuse circuit of semiconductor memory device
07/19/2007US20070165443 Memory-enhanced image sensor
07/19/2007US20070165442 Nonvolatile semiconductor memory device
07/19/2007US20070165441 High speed otp sensing scheme
07/19/2007DE102006001729A1 Baugruppe mit mechanisch unzugänglicher oder schwer zugänglicher Schaltung sowie Verfahren zur Umschaltung des Betriebszustandes einer Baugruppe Assembly with mechanically inaccessible or difficult to access circuit and method for switching the operating state of a module
07/18/2007CN1327451C Programmable address logic for diode-based solid memory
07/17/2007US7245546 Reduced area, reduced programming voltage CMOS efuse-based scannable non-volatile memory bitcell
07/17/2007US7245532 Nonvolatile semiconductor memory device which stores multi-value information
07/12/2007WO2007079159A2 Distributed programmed memory cell overwrite protection
07/12/2007US20070159868 Nonvolatile memory device
07/12/2007US20070159867 Memory device, memory circuit and semiconductor integrated circuit having variable resistance
07/12/2007DE102006001504A1 Identifikations-Datenträger, Lese-Vorrichtung, Identifikations-System und Verfahren zum Herstellen eines Identifikations-Datenträgers Identification data carrier, reading device, an identification system and method for producing a data carrier identification
07/12/2007DE10159882B4 Verfahren und Schaltungsanordnung zum Programmieren einer Fuse einer integrierten Schaltung Method and circuit for programming a fuse of an integrated circuit
07/10/2007US7242614 Rewriteable electronic fuses
07/10/2007US7242610 Ultraviolet erasable semiconductor memory device
07/10/2007US7242603 Method of operating a complementary bit resistance memory sensor
07/05/2007US20070153609 One-time programmable memory and method of burning data of the same
07/05/2007US20070153608 Distributed programmed memory cell overwrite protection
07/04/2007EP1803129A2 Fuse memory cell comprising a diode, the diode serving as the fuse element
07/04/2007CN1993770A Reduced area, reduced programming voltage cmos efuse-based scannable non-volatile memory bitcell
07/04/2007CN1993769A Writable memory
07/04/2007CN1993768A Programmable semi-fusible link read only memory and method of margin testing same
07/04/2007CN1992297A Method of executing an electrical function on integrated circuit and structure of integrated circuit
07/04/2007CN1992085A Fuse trimming circuit and method of operation
07/04/2007CN1992084A Nonvolatile memory and writing method thereof, and semiconductor device
07/03/2007US7239563 Semiconductor device for outputting data read from a read only storage device
07/03/2007US7238607 Method to minimize formation of recess at surface planarized by chemical mechanical planarization
06/2007
06/28/2007US20070147102 Memory with resistance memory cell and evaluation circuit
06/27/2007EP1800323A2 LOW VOLTAGE PROGRAMMABLE eFUSE WITH DIFFERENTIAL SENSING SCHEME
06/27/2007EP1085332B1 Semiconductor integrated circuit, liquid crystal apparatus, electronic apparatus and method for adjusting semiconductor integrated circuit
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