Patents
Patents for G03F - Photomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices; Materials therefor; Originals therefor; Apparatus specially adapted therefor (531)
02/2008
02/20/2008CN100370360C Silicate-contg. alkaline compositions for cleaning microelectronic substrates
02/12/2008US7329483 First phase of carbon dioxide, second phase of polyol and water, optional surfactant in one or both phases; positive tone lithography; preferential removal of light-field regions used to form patterned regions on microelectronic substrates
02/07/2008US20080030704 Environmental system including a transport region for an immersion lithography apparatus
01/2008
01/10/2008US20080006305 Resist, Barc and Gap Fill Material Stripping Chemical and Method
01/09/2008EP1597627A4 Dissolution rate modifiers for photoresist compositions
01/03/2008US20080001162 Process for Structuring at Least One Layer as Well as Electrical Component with Structures From the Layer
12/2007
12/26/2007CN101095082A Dissolution rate modifiers for photoresist compositions
12/19/2007CN101091225A Laser-based termination of passive electronic components
12/04/2007US7304318 System and method for maskless lithography using an array of sources and an array of focusing elements
12/04/2007US7304190 Photoresist compositions comprising diamondoid derivatives
11/2007
11/27/2007US7301607 Wafer table for immersion lithography
11/15/2007US20070266364 Method and System for Context-Specific Mask Writing
11/08/2007US20070258062 Environmental system including a transport region for an immersion lithography apparatus
11/06/2007US7292313 Apparatus and method for providing fluid for immersion lithography
11/01/2007US20070252962 Environmental system including a transport region for an immersion lithography apparatus
11/01/2007US20070252961 Environmental system including a transport region for an immersion lithography apparatus
10/2007
10/31/2007CN100345677C Methods and systems for providing an image on an organic product
10/17/2007CN101055431A Image forming method and apparatus
10/10/2007EP1652003A4 Wafer table for immersion lithography
10/04/2007US20070233419 Method and System for Context-Specific Mask Inspection
09/2007
09/18/2007US7270533 System for creating a turbulent flow of fluid between a mold and a substrate
09/06/2007US20070206264 Image Forming Method and Apparatus
09/05/2007EP1695138A4 Liquid crystal cell that resists degradation from exposure to radiation
08/2007
08/23/2007US20070195303 Apparatus and method for providing fluid for immersion lithography
08/22/2007EP1532484A4 Lithographic printing with polarized light
08/02/2007US20070178014 Device and method for microcontact printing
07/2007
07/31/2007US7251017 Environmental system including a transport region for an immersion lithography apparatus
07/24/2007US7249342 Method and system for context-specific mask writing
07/11/2007CN1997878A Method for correcting critical dimension variations in photomasks
07/05/2007US20070154848 Low pH Development Solutions for Chemically Amplified Photoresists
06/2007
06/28/2007WO2004111726A3 Novel photosensitive resin compositions
06/26/2007US7235347 Low pH development solutions for chemically amplified photoresists
06/21/2007US20070139631 Environmental system including a transport region for an immersion lithography apparatus
06/20/2007EP1664925A4 Imprint lithography templates having alignment marks
06/12/2007US7231628 Method and system for context-specific mask inspection
05/2007
05/31/2007US20070123052 Process sequence for photoresist stripping and cleaning of photomasks for integrated circuit manufacturing
05/10/2007WO2005045521A3 Laser-based termination of passive electronic components
05/09/2007EP1690135A4 Resist, barc and gap fill material stripping chemical and method
05/09/2007EP1556896A4 Anti-reflective compositions comprising triazine compounds
05/08/2007US7215409 Image forming method and apparatus
04/2007
04/26/2007US20070089993 Electrochemical printer head for use in electrolytically depositing material onto substrate, the printing head comprising a plurality of electrodes, a lead connector, an electric power source, and a high electrical resistance means for controlling distribution of electrolyte to electrode channels
04/19/2007WO2005047974A3 Measurement and compensation of errors in interferometers
04/11/2007CN1947232A Method for structuring at least one layer and electric component with structures from said layer
04/05/2007US20070076182 Wafer table for immersion lithography
03/2007
03/28/2007CN1938412A Resist, BARC and gap fill material stripping chemical and method
03/22/2007US20070065729 shading elements attenuate light passing through the regions, so as to compensate for the critical dimensio (CD) variations on the wafer and hence provide and improved CD tolerance wafer; computer program uses a reference calibration list to determine the parameters of the shading elements
03/07/2007CN1303474C Optical proximity correction for phase shifting photolithographic masks
02/2007
02/27/2007US7184109 Liquid crystal cell that resists degradation from exposure to radiation
02/08/2007US20070031585 Providing an image on an organic product
02/07/2007CN1910517A Adaptive real time control of a reticle/mask system
01/2007
01/30/2007US7169253 Process sequence for photoresist stripping and/or cleaning of photomasks for integrated circuit manufacturing
01/25/2007US20070022402 High transport rates of hormones delivered across cell membranes, facilitating more efficient delivery of drugs and diagnostic agents by using a viscous fluid comprising a polysaccharide a form of hydrogel, lipogel or sols; drug delivery to mucous membranes; gastrointesinal systems
01/11/2007WO2005043241A3 Method for simultaneous patterning of features with nanometer scale gaps
01/10/2007CN1894621A Liquid crystal cell that resists degradation from exposure to radiation
01/03/2007EP1738404A2 Method for structuring at least one layer and electric component with structures from said layer
01/03/2007EP1671184A4 Photoresist compositions comprising diamondoid derivatives
12/2006
12/19/2006US7150622 Systems for magnification and distortion correction for imprint lithography processes
12/13/2006EP1730595A2 Method involving a mask or a reticle
12/07/2006US20060275708 Custom polarization, such as a combination of radial and tangential polarization; Forbidden pitch is avoided; patterning the polarized beam of radiation; projecting the patterned beam of radiation onto a target portion of the wafer
11/2006
11/29/2006CN1871556A Imprint lithography templates having alignment marks
11/29/2006CN1871555A Forming partial-depth features in polymer film
11/29/2006CN1871550A Low-activation energy silicon-containing resist system
11/29/2006CN1871103A Systems for magnification and distortion correction for imprint lithography processes
11/09/2006WO2004074933A3 Dissolution rate modifiers for photoresist compositions
11/08/2006CN1859959A Single phase fluid imprint lithography method
10/2006
10/31/2006US7129011 polybenzoxazoles; latent crosslinker; relief images
10/26/2006US20060237881 imprinting a mold having a protrusion against a substrate having a resist layer such that the protrusion engages the resist layer
10/19/2006WO2005057281A3 Resist, barc and gap fill material stripping chemical and method
10/19/2006US20060234155 Radiation-sensitive compositions comprising oxazole derivatives and imageable elements based thereon
10/18/2006EP1711542A2 Directly photodefinable polymer compositions and methods thereof
10/11/2006CN1846174A Photomask and method for maintaining optical properties of the same
10/10/2006US7120895 Evaluating design pattern on photolithographicmask; generating simulated image on wafer using a pixel-based bitmap; computers, data processing
10/10/2006US7119893 Determination of center of focus by parameter variability analysis
10/10/2006US7118833 Forming partial-depth features in polymer film
10/05/2006DE112004002064T5 Abschluss von passiven elektronischen Bauteilen auf Laserbasis Degree of passive electronic components, laser-based
10/04/2006EP1446283A4 Providing an image on an organic product
10/03/2006US7117478 System and method for lithography simulation
10/03/2006US7117477 System and method for lithography simulation
09/2006
09/26/2006US7114145 System and method for lithography simulation
09/19/2006US7111277 System and method for lithography simulation
09/14/2006WO2005029178A3 A system and method for the direct imaging of color filters
09/13/2006CN1832846A Imprint lithography with improved monitoring and control and apparatus therefor
08/2006
08/30/2006EP1695138A2 Liquid crystal cell that resists degradation from exposure to radiation
08/16/2006EP1690135A2 Resist, barc and gap fill material stripping chemical and method
08/15/2006US7090964 custom polarization, such as a combination of radial and tangential polarization; Forbidden pitch is avoided
08/15/2006US7090716 Single phase fluid imprint lithography method
08/15/2006US7089860 Providing customized text and imagery on organic products
08/09/2006EP1687877A2 Laser thin film poly-silicon annealing system
08/02/2006EP1614009B1 Masking arrangement and method for producing integrated circuit arrangements
08/01/2006US7084984 Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology
07/2006
07/26/2006EP1682340A2 Dispense geometry and conductive template to achieve high-speed filling and throughput
07/19/2006EP1680711A2 Novel photosensitive resin compositions
07/13/2006WO2005033798A3 Electrochemical micromanufacturing system and method
07/13/2006US20060152697 Apparatus and method for providing fluid for immersion lithography
07/12/2006EP1678556A2 Low-activation energy silicon-containing resist system
07/12/2006EP1550002B1 Photomask assembly incorporating a porous frame and method for making it
07/06/2006WO2005006076A3 Systems for magnification and distortion correction for imprint lithography processes
07/05/2006CN1799004A Applications of semiconductor nano-sized particles for photolithography
06/2006
06/29/2006US20060141371 Method for making a photomask assembly incorporating a porous frame
06/22/2006WO2005038524A3 Novel photosensitive resin compositions
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