Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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07/15/2009 | CN100514751C Device probing using a matching device |
07/15/2009 | CN100514123C System for detecting image quality of luminous device |
07/15/2009 | CN100514082C Battery remaining power calculating method, battery remaining power calculating device, and battery remaining power calculating program |
07/15/2009 | CN100514081C System-on-chip (SOC) having built-in-self-test circuits and a self-test method of the SOC |
07/15/2009 | CN100514080C Semiconductor test apparatus |
07/15/2009 | CN100514079C Semiconductor device including fuse and method for testing the same capable of suppressing erroneous determination |
07/15/2009 | CN100514078C General latch structure of single phase plug type power detector |
07/15/2009 | CN100514077C Device for detecting connection state of audio-visual apparatus and external apparatus |
07/15/2009 | CN100514076C Integrated circuit with test pad structure and method of testing |
07/15/2009 | CN100514075C DC electric filed detection method of insulator for high-voltage DC transmission line |
07/15/2009 | CN100514074C Ultracapacitor useful life prediction |
07/14/2009 | US7562350 Processing system and method using recomposable software |
07/14/2009 | US7562318 Test structure for automatic dynamic negative-bias temperature instability testing |
07/14/2009 | US7562276 Apparatus and method for testing and debugging an integrated circuit |
07/14/2009 | US7562275 Tri-level test mode terminal in limited terminal environment |
07/14/2009 | US7562274 User data driven test control software application the requires no software maintenance |
07/14/2009 | US7562273 Register file cell with soft error detection and circuits and methods using the cell |
07/14/2009 | US7562272 Apparatus and method for using eFuses to store PLL configuration data |
07/14/2009 | US7562271 Memory system topologies including a buffer device and an integrated circuit memory device |
07/14/2009 | US7562269 Semiconductor storage device |
07/14/2009 | US7562267 Methods and apparatus for testing a memory |
07/14/2009 | US7562266 Method and device for verifying timing in a semiconductor integrated circuit |
07/14/2009 | US7562256 Semiconductor memory device for build-in fault diagnosis |
07/14/2009 | US7562170 Programmable extended compression mask for dynamic trace |
07/14/2009 | US7561980 Transmission medium testing apparatus and method |
07/14/2009 | US7561532 Method and device for designing a data network |
07/14/2009 | US7561525 Wireless communication system, wireless communication apparatus, wireless communication method, and computer program |
07/14/2009 | US7561517 Passive route control of data networks |
07/14/2009 | US7561516 Packet relaying method and device |
07/14/2009 | US7561515 Role-based network traffic-flow rate control |
07/14/2009 | US7561433 Apparatus and method for a clip device for coupling a heat sink plate system with a burn-in board system |
07/14/2009 | US7561022 System and method for validating radio frequency identification tags |
07/14/2009 | US7560951 Characterization array circuit |
07/14/2009 | US7560950 Packaging reliability superchips |
07/14/2009 | US7560949 Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test |
07/14/2009 | US7560948 Circuit for minimizing or eliminating pulse anomalies in human body model electrostatic discharge tests |
07/14/2009 | US7560947 Pin electronics driver |
07/14/2009 | US7560946 Method of acceptance for semiconductor devices |
07/14/2009 | US7560945 Integrated circuit failure prediction |
07/14/2009 | US7560944 Differential measurement probe having a ground clip system for the probing tips |
07/14/2009 | US7560943 Alignment features in a probing device |
07/14/2009 | US7560941 Method and system for compensating thermally induced motion of probe cards |
07/14/2009 | US7560940 Method and installation for analyzing an integrated circuit |
07/14/2009 | US7560939 Electrical defect detection using pre-charge and sense scanning with prescribed delays |
07/14/2009 | US7560936 Method and apparatus for ground bounce and power supply bounce detection |
07/14/2009 | US7560935 Ground-fault resistance measurement circuit and ground-fault detection circuit |
07/14/2009 | US7560803 Method for fabricating semiconductor device and apparatus for fabricating the same |
07/14/2009 | US7560801 Rewiring substrate strip with several semiconductor component positions |
07/14/2009 | US7560293 Evaluation method using a TEG, a method of manufacturing a semiconductor device having the TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program |
07/14/2009 | US7560292 Voltage contrast monitor for integrated circuit defects |
07/14/2009 | US7559139 Method for manufacturing a probe unit |
07/14/2009 | CA2464323C Directional element to determine faults on ungrounded power systems |
07/14/2009 | CA2450841C Method and device for determining sideband ratios of superconducting mixers using comb generator |
07/09/2009 | WO2009086020A2 Method and apparatus for managing test result data generated by a semiconductor test system |
07/09/2009 | WO2009085771A1 System and method for determining the point of hydration and proper time to apply potential to a glucose sensor |
07/09/2009 | WO2009085710A2 System for testing an integrated circuit of a device and its method of use |
07/09/2009 | WO2009084735A1 Inspection pin protection structure of conduction check apparatus |
07/09/2009 | WO2009084734A1 Connector conduction check apparatus |
07/09/2009 | WO2009084686A1 Portable electronic device and method for controlling the same |
07/09/2009 | WO2009084685A1 Mobile electronic device and method for controlling the same |
07/09/2009 | WO2009084684A1 Mobile electronic device and method for controlling the same |
07/09/2009 | WO2009084547A1 Probe card |
07/09/2009 | WO2009084424A1 Semiconductor testing device, semiconductor device, and testing method |
07/09/2009 | WO2009084396A1 Delay monitor circuit and delay monitor method |
07/09/2009 | WO2009084108A1 Semiconductor test apparatus |
07/09/2009 | WO2009082783A1 Electrode fault detection |
07/09/2009 | US20090177936 Direct logic diagnostics with signature-based fault dictionaries |
07/09/2009 | US20090177935 Scan chain cell with delay testing capability |
07/09/2009 | US20090177934 Apparatus for testing embedded memory read paths |
07/09/2009 | US20090177933 Decompressor/prpg for applying pseudo-random and deterministic test patterns |
07/09/2009 | US20090177420 Detection, localization and interpretation of partial discharge |
07/09/2009 | US20090176406 Coaxial cable to printed circuit board interface module |
07/09/2009 | US20090175790 Cardiac arrhythmia treatment methods and biological pacemaker |
07/09/2009 | US20090175071 Phase change memory dynamic resistance test and manufacturing methods |
07/09/2009 | US20090174529 Self-calbrating rfid transponder |
07/09/2009 | US20090174427 Burn-in-board architecture and integrated circuit device transfer method |
07/09/2009 | US20090174426 Semiconductor Device with Fault Detection Function |
07/09/2009 | US20090174425 Test circuit for a semiconductor integrated circuit |
07/09/2009 | US20090174424 Apparatus for testing semiconductor device package and multilevel pusher thereof |
07/09/2009 | US20090174423 Bond Reinforcement Layer for Probe Test Cards |
07/09/2009 | US20090174422 Probe Card and Manufacturing Method Thereof |
07/09/2009 | US20090174421 Vertical Probe and Methods of Fabricating and Bonding the Same |
07/09/2009 | US20090174420 Test apparatus, probe card, and test method |
07/09/2009 | US20090174414 Testing system for electricity safety and a testing method therefor |
07/09/2009 | US20090174413 Method and Apparatus to Verify the Proper Connection of Loads before Applying Full DC Power |
07/09/2009 | US20090174410 Method and apparatus for controlling battery |
07/09/2009 | US20090173476 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis |
07/09/2009 | DE60320171T2 Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen A method of detecting faults in electronic components, based upon quiescent current measurements |
07/09/2009 | DE19915398B4 Verfahren zum Einstellen von Verzögerungszeiten einer Mehrzahl von Anschlusskarten in einem IC-Testgerät The method of setting delay times of a plurality of line-card in an IC tester |
07/09/2009 | DE102008062647A1 Integrierte Schaltung und Verfahren zum Betreiben einer integrierten Schaltung Integrated circuit and method for operating an integrated circuit |
07/09/2009 | DE102008003458A1 Electric current determining device for energy storage i.e. battery, of motor vehicle, has sensor resistor electrical conductively connected with cable through contact surface that is oriented parallel to cable longitudinal direction |
07/09/2009 | DE102008003338A1 Electric current determining device for use in cable i.e. earth cable, has cable provided with cable insulation, where cable insulation is formed such that cable insulation partially encloses measuring element and/or electronic system |
07/09/2009 | DE102004015023B4 Augendiagramm-Analysator und Verfahren zum Ermitteln von Zeit-Spannungs-Meßpunkten für die Augendiagramm-Analyse Eye diagram analyzer and method for determining time-voltage measurement points for the eye diagram analysis |
07/09/2009 | DE10196310B4 Vorrichtung und Verfahren zum Verifizieren eines Chip-Designs und zum Testen eines Chips Apparatus and method for verifying a chip design and testing of a chip |
07/09/2009 | CA2706930A1 System and method for determining the point of hydration and proper time to apply potential to a glucose sensor |
07/08/2009 | EP2077612A2 System and method for suppressing DC link voltage buildup due to generator armature reaction |
07/08/2009 | EP2077588A2 Monitoring unit for photovoltaic modules |
07/08/2009 | EP1943534B1 Analog ic having test arrangement and test method for such an ic |
07/08/2009 | EP1875256B1 Testable electronic circuit |
07/08/2009 | EP1861726B1 Method and apparatus for generalized arc fault detection |