Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2009
07/15/2009CN100514751C Device probing using a matching device
07/15/2009CN100514123C System for detecting image quality of luminous device
07/15/2009CN100514082C Battery remaining power calculating method, battery remaining power calculating device, and battery remaining power calculating program
07/15/2009CN100514081C System-on-chip (SOC) having built-in-self-test circuits and a self-test method of the SOC
07/15/2009CN100514080C Semiconductor test apparatus
07/15/2009CN100514079C Semiconductor device including fuse and method for testing the same capable of suppressing erroneous determination
07/15/2009CN100514078C General latch structure of single phase plug type power detector
07/15/2009CN100514077C Device for detecting connection state of audio-visual apparatus and external apparatus
07/15/2009CN100514076C Integrated circuit with test pad structure and method of testing
07/15/2009CN100514075C DC electric filed detection method of insulator for high-voltage DC transmission line
07/15/2009CN100514074C Ultracapacitor useful life prediction
07/14/2009US7562350 Processing system and method using recomposable software
07/14/2009US7562318 Test structure for automatic dynamic negative-bias temperature instability testing
07/14/2009US7562276 Apparatus and method for testing and debugging an integrated circuit
07/14/2009US7562275 Tri-level test mode terminal in limited terminal environment
07/14/2009US7562274 User data driven test control software application the requires no software maintenance
07/14/2009US7562273 Register file cell with soft error detection and circuits and methods using the cell
07/14/2009US7562272 Apparatus and method for using eFuses to store PLL configuration data
07/14/2009US7562271 Memory system topologies including a buffer device and an integrated circuit memory device
07/14/2009US7562269 Semiconductor storage device
07/14/2009US7562267 Methods and apparatus for testing a memory
07/14/2009US7562266 Method and device for verifying timing in a semiconductor integrated circuit
07/14/2009US7562256 Semiconductor memory device for build-in fault diagnosis
07/14/2009US7562170 Programmable extended compression mask for dynamic trace
07/14/2009US7561980 Transmission medium testing apparatus and method
07/14/2009US7561532 Method and device for designing a data network
07/14/2009US7561525 Wireless communication system, wireless communication apparatus, wireless communication method, and computer program
07/14/2009US7561517 Passive route control of data networks
07/14/2009US7561516 Packet relaying method and device
07/14/2009US7561515 Role-based network traffic-flow rate control
07/14/2009US7561433 Apparatus and method for a clip device for coupling a heat sink plate system with a burn-in board system
07/14/2009US7561022 System and method for validating radio frequency identification tags
07/14/2009US7560951 Characterization array circuit
07/14/2009US7560950 Packaging reliability superchips
07/14/2009US7560949 Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test
07/14/2009US7560948 Circuit for minimizing or eliminating pulse anomalies in human body model electrostatic discharge tests
07/14/2009US7560947 Pin electronics driver
07/14/2009US7560946 Method of acceptance for semiconductor devices
07/14/2009US7560945 Integrated circuit failure prediction
07/14/2009US7560944 Differential measurement probe having a ground clip system for the probing tips
07/14/2009US7560943 Alignment features in a probing device
07/14/2009US7560941 Method and system for compensating thermally induced motion of probe cards
07/14/2009US7560940 Method and installation for analyzing an integrated circuit
07/14/2009US7560939 Electrical defect detection using pre-charge and sense scanning with prescribed delays
07/14/2009US7560936 Method and apparatus for ground bounce and power supply bounce detection
07/14/2009US7560935 Ground-fault resistance measurement circuit and ground-fault detection circuit
07/14/2009US7560803 Method for fabricating semiconductor device and apparatus for fabricating the same
07/14/2009US7560801 Rewiring substrate strip with several semiconductor component positions
07/14/2009US7560293 Evaluation method using a TEG, a method of manufacturing a semiconductor device having the TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program
07/14/2009US7560292 Voltage contrast monitor for integrated circuit defects
07/14/2009US7559139 Method for manufacturing a probe unit
07/14/2009CA2464323C Directional element to determine faults on ungrounded power systems
07/14/2009CA2450841C Method and device for determining sideband ratios of superconducting mixers using comb generator
07/09/2009WO2009086020A2 Method and apparatus for managing test result data generated by a semiconductor test system
07/09/2009WO2009085771A1 System and method for determining the point of hydration and proper time to apply potential to a glucose sensor
07/09/2009WO2009085710A2 System for testing an integrated circuit of a device and its method of use
07/09/2009WO2009084735A1 Inspection pin protection structure of conduction check apparatus
07/09/2009WO2009084734A1 Connector conduction check apparatus
07/09/2009WO2009084686A1 Portable electronic device and method for controlling the same
07/09/2009WO2009084685A1 Mobile electronic device and method for controlling the same
07/09/2009WO2009084684A1 Mobile electronic device and method for controlling the same
07/09/2009WO2009084547A1 Probe card
07/09/2009WO2009084424A1 Semiconductor testing device, semiconductor device, and testing method
07/09/2009WO2009084396A1 Delay monitor circuit and delay monitor method
07/09/2009WO2009084108A1 Semiconductor test apparatus
07/09/2009WO2009082783A1 Electrode fault detection
07/09/2009US20090177936 Direct logic diagnostics with signature-based fault dictionaries
07/09/2009US20090177935 Scan chain cell with delay testing capability
07/09/2009US20090177934 Apparatus for testing embedded memory read paths
07/09/2009US20090177933 Decompressor/prpg for applying pseudo-random and deterministic test patterns
07/09/2009US20090177420 Detection, localization and interpretation of partial discharge
07/09/2009US20090176406 Coaxial cable to printed circuit board interface module
07/09/2009US20090175790 Cardiac arrhythmia treatment methods and biological pacemaker
07/09/2009US20090175071 Phase change memory dynamic resistance test and manufacturing methods
07/09/2009US20090174529 Self-calbrating rfid transponder
07/09/2009US20090174427 Burn-in-board architecture and integrated circuit device transfer method
07/09/2009US20090174426 Semiconductor Device with Fault Detection Function
07/09/2009US20090174425 Test circuit for a semiconductor integrated circuit
07/09/2009US20090174424 Apparatus for testing semiconductor device package and multilevel pusher thereof
07/09/2009US20090174423 Bond Reinforcement Layer for Probe Test Cards
07/09/2009US20090174422 Probe Card and Manufacturing Method Thereof
07/09/2009US20090174421 Vertical Probe and Methods of Fabricating and Bonding the Same
07/09/2009US20090174420 Test apparatus, probe card, and test method
07/09/2009US20090174414 Testing system for electricity safety and a testing method therefor
07/09/2009US20090174413 Method and Apparatus to Verify the Proper Connection of Loads before Applying Full DC Power
07/09/2009US20090174410 Method and apparatus for controlling battery
07/09/2009US20090173476 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
07/09/2009DE60320171T2 Verfahren zum Detektieren von Fehlern in elektronischen Bauteilen, basierend auf Ruhestrom-Messungen A method of detecting faults in electronic components, based upon quiescent current measurements
07/09/2009DE19915398B4 Verfahren zum Einstellen von Verzögerungszeiten einer Mehrzahl von Anschlusskarten in einem IC-Testgerät The method of setting delay times of a plurality of line-card in an IC tester
07/09/2009DE102008062647A1 Integrierte Schaltung und Verfahren zum Betreiben einer integrierten Schaltung Integrated circuit and method for operating an integrated circuit
07/09/2009DE102008003458A1 Electric current determining device for energy storage i.e. battery, of motor vehicle, has sensor resistor electrical conductively connected with cable through contact surface that is oriented parallel to cable longitudinal direction
07/09/2009DE102008003338A1 Electric current determining device for use in cable i.e. earth cable, has cable provided with cable insulation, where cable insulation is formed such that cable insulation partially encloses measuring element and/or electronic system
07/09/2009DE102004015023B4 Augendiagramm-Analysator und Verfahren zum Ermitteln von Zeit-Spannungs-Meßpunkten für die Augendiagramm-Analyse Eye diagram analyzer and method for determining time-voltage measurement points for the eye diagram analysis
07/09/2009DE10196310B4 Vorrichtung und Verfahren zum Verifizieren eines Chip-Designs und zum Testen eines Chips Apparatus and method for verifying a chip design and testing of a chip
07/09/2009CA2706930A1 System and method for determining the point of hydration and proper time to apply potential to a glucose sensor
07/08/2009EP2077612A2 System and method for suppressing DC link voltage buildup due to generator armature reaction
07/08/2009EP2077588A2 Monitoring unit for photovoltaic modules
07/08/2009EP1943534B1 Analog ic having test arrangement and test method for such an ic
07/08/2009EP1875256B1 Testable electronic circuit
07/08/2009EP1861726B1 Method and apparatus for generalized arc fault detection