| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 08/04/2009 | US7571400 Chip design verifying and chip testing apparatus and method |
| 08/04/2009 | US7571367 Built-in self diagnosis device for a random access memory and method of diagnosing a random access |
| 08/04/2009 | US7571366 Sequential signals selecting mode and stopping transfers of interface adaptor |
| 08/04/2009 | US7571365 Wafer scale testing using a 2 signal JTAG interface |
| 08/04/2009 | US7571364 Selectable JTAG or trace access with data store and output |
| 08/04/2009 | US7571363 Parametric measurement of high-speed I/O systems |
| 08/04/2009 | US7571264 Computer system for load balance, and method and program for setting path |
| 08/04/2009 | US7571068 Module, electronic device and evaluation tool |
| 08/04/2009 | US7570876 Method and system for loading substrate supports into a substrate holder |
| 08/04/2009 | US7570701 Multi-pair gigabit ethernet transceiver |
| 08/04/2009 | US7570599 Adaptively applying a target noise margin to a digital subscriber line (DSL) loop for DSL data rate establishment |
| 08/04/2009 | US7570593 Interference-resilient joint MAC and routing scheme for wireless ad-hoc networks |
| 08/04/2009 | US7570592 Data transfer device for executing the process discarding error frame |
| 08/04/2009 | US7570591 Method and apparatus for negotiating link speed and configuration |
| 08/04/2009 | US7570581 Dynamic reduction of route reconvergence time |
| 08/04/2009 | US7570076 Segmented programmable capacitor array for improved density and reduced leakage |
| 08/04/2009 | US7570074 Electronic overload relay for mains-fed induction motors |
| 08/04/2009 | US7570073 System for testing power supply performance |
| 08/04/2009 | US7570072 Display device including test circuit and electronic apparatus having the display device |
| 08/04/2009 | US7570071 Impedance calibration for source series terminated serial link transmitter |
| 08/04/2009 | US7570069 Resilient contact probes |
| 08/04/2009 | US7570062 Method of actuating a test function of an electrical switching apparatus and electrical switching apparatus employing the same |
| 08/04/2009 | US7570061 Cantilever control device |
| 08/04/2009 | US7570043 Switches bidirectionally connecting external lead to PLL voltage tune line |
| 08/04/2009 | US7570004 System and method for detecting a motor shorting relay failure |
| 08/04/2009 | US7569403 Pattern evaluation method, manufacturing method of semiconductor device, correction method of mask pattern and manufacturing method of exposure mask |
| 07/30/2009 | WO2009094324A2 Sensor for measuring moisture and salinity |
| 07/30/2009 | WO2009094151A1 Method and apparatus for testing afci device for series arc detection |
| 07/30/2009 | WO2009093999A1 Battery end of life determination |
| 07/30/2009 | WO2009093414A1 Multilayer packaging structure |
| 07/30/2009 | WO2009093323A1 Electronic component testing method and electronic component testing device |
| 07/30/2009 | WO2009093293A1 Testing apparatus |
| 07/30/2009 | WO2009093281A1 Memory testing device and testing method |
| 07/30/2009 | WO2009093094A1 A method for compensating signal distortion in an emitting payload |
| 07/30/2009 | WO2009092694A1 Module for a parallel tester for testing of circuit boards |
| 07/30/2009 | WO2009092398A1 Method and fault locator for determining a fault location value |
| 07/30/2009 | WO2009092226A1 Malfunction detecting method and device for differential signal |
| 07/30/2009 | WO2009012834A3 Method for synchronizing a plurality of measuring channel assemblies and/or measuring devices, and appropriate measuring device |
| 07/30/2009 | US20090193307 Scan chain modification for reduced leakage |
| 07/30/2009 | US20090193306 Apparatus and method for controlling dynamic modification of a scan path |
| 07/30/2009 | US20090193305 Test mode soft reset circuitry and methods |
| 07/30/2009 | US20090193304 Apparatus and Method for Isolating Portions of a Scan Path of a System-on-Chip |
| 07/30/2009 | US20090193303 Test access mechanism for multi-core processor or other integrated circuit |
| 07/30/2009 | US20090193144 Method and systems for resource bundling in a communications network |
| 07/30/2009 | US20090192754 Systems and methods for test time outlier detection and correction in integrated circuit testing |
| 07/30/2009 | US20090192753 Apparatus and method for testing electronic systems |
| 07/30/2009 | US20090192750 Parallel testing system with shared golden calibration table and method thereof |
| 07/30/2009 | US20090192743 Sampling estimating method, sampling inspection estimating apparatus, and computer readable medium storing sampling inspection estimating program |
| 07/30/2009 | US20090192737 Method for estimating life status of lithium battery |
| 07/30/2009 | US20090192735 Failure prediction apparatus and failure prediction method |
| 07/30/2009 | US20090190484 Directional topology discovery for downhole networks |
| 07/30/2009 | US20090190478 System and method for restoration in a multimedia ip network |
| 07/30/2009 | US20090190474 Bandwidth-aware multicast load balancing on a multi-interface host |
| 07/30/2009 | US20090190467 System and method for managing fault in a multi protocol label switching system |
| 07/30/2009 | US20090190417 Semiconductor integrated circuit device and method of testing same |
| 07/30/2009 | US20090189745 Semiconductor device, method of manufacturing thereof, signal transmission/reception method using such semiconductor device, and tester apparatus |
| 07/30/2009 | US20090189632 Test board used for a reliability test and reliability test method |
| 07/30/2009 | US20090189631 Movement apparatus and electronic device test apparatus |
| 07/30/2009 | US20090189630 Angular spectrum tailoring in solid immersion microscopy for circuit analysis |
| 07/30/2009 | US20090189629 Semiconductor wafer having a multitude of sensor elements and method for measuring sensor elements on a semiconductor wafer |
| 07/30/2009 | US20090189628 Reworkable bonding pad layout and debug method thereof |
| 07/30/2009 | US20090189627 Methods And Apparatus For Planar Extension Of Electrical Conductors Beyond The Edges Of A Substrate |
| 07/30/2009 | US20090189625 Method and System for Continuity Testing of Conductive Interconnects |
| 07/30/2009 | US20090189624 Interposer and a probe card assembly for electrical die sorting and methods of operating and manufacturing the same |
| 07/30/2009 | US20090189623 Differential waveguide probe |
| 07/30/2009 | US20090189622 Probe For Testing Integrated Circuit Devices |
| 07/30/2009 | US20090189621 Probe device |
| 07/30/2009 | US20090189620 Compliant membrane probe |
| 07/30/2009 | US20090189616 Polymeric structures and methods for producing and monitoring polymeric structures |
| 07/30/2009 | US20090189615 Method and Apparatus For Testing AFCI Device for Series ARC Detection |
| 07/30/2009 | US20090189612 Method of actuating a test function of an electrical switching apparatus at a panel and electrical switching apparatus employing the same |
| 07/30/2009 | US20090189075 Inspection method and inspection system using charged particle beam |
| 07/30/2009 | DE19940988B4 Verfahren und Schaltung zur Überwachung eines Mantelrohrheizkörper eines Warmwasserbereiters Method and circuit for monitoring a casing pipe radiator of a water heater |
| 07/30/2009 | DE19860704B4 Verfahren zur Überprüfung zumindest eines Teils eines Halbleiterwafers mit einem Rasterelektronenmikroskop Method for checking at least a portion of a semiconductor wafer with a scanning electron microscope |
| 07/30/2009 | DE19722855B4 Prüfanordnung für vorgefertigte Muffenkörper von Hochspannungskabeln und Verfahren zur Herrichtung der Prüfanordnung Test set for prefabricated socket body of high voltage cables and procedures for the redevelopment of the test arrangement |
| 07/30/2009 | DE112007001912T5 Testsystem für Hochfrequenz-IC-Vorrichtungen und Verfahren zum Herstellen von Hochfrequenz-IC-Vorrichtungen unter Verwendung desselben The same test system for high frequency IC devices and methods for producing high frequency IC devices using |
| 07/30/2009 | DE112007001595T5 Kalibrierungsvorrichtung Calibration device |
| 07/30/2009 | DE102008006628A1 Verfahren und Vorrichtung zur automatischen Überprüfung der GNSS Signalqualität in Mautgeräten Method and apparatus for automatic verification of GNSS signal quality in toll devices |
| 07/30/2009 | DE102008006488A1 Pointer map for electrical contacting of two electronic components, particularly for contacting of two wafers, comprises two base bodies and multiple axially relocatable stored pointers, which are arranged on outer surface of base body |
| 07/30/2009 | DE102008006183A1 Vorrichtung zur Strommessung A device for current measurement |
| 07/30/2009 | DE102008006130A1 Modul für einen Paralleltester zum Prüfen von Leiterplatten Module for a parallel tester for checking of circuit boards |
| 07/30/2009 | DE102008005777A1 Non-linear over voltage arrester reliability testing device, has auxiliary voltage dependent resistor with dynamic resistance and capacitive resistance exceeding response limit of arrester and auxiliary resistor |
| 07/30/2009 | DE102008005537A1 Device for controlling test equipment for electrical circuit that has to be tested according to test routine, has consequence of test sections, and mechanism for receiving desired initialization parameter value |
| 07/30/2009 | DE102008004979A1 Quality controlling method for welded joint in wire conductor connection, involves pressing end against surface such that opening is filled by line and determining quality of connection by comparison of filling degree of opening with value |
| 07/30/2009 | DE102008004804A1 Method for recognizing error in execution of tension connection of electrical transformer, involves filtering values with filter constants |
| 07/30/2009 | DE102008004772A1 Plated-through hole and/or contact bridge testing method for radio-frequency identification antenna, involves detecting and evaluating absorption of electromagnetic reference signal caused by element |
| 07/30/2009 | DE10049029B4 Schaltung und Verfahren zur Latenzbestimmung, Pufferschaltung mit variabler Latenz und Speicherbauelement Circuit and method for determining latency, buffer circuit with variable latency and memory device |
| 07/30/2009 | CA2712919A1 Method and apparatus for testing afci device for series arc detection |
| 07/30/2009 | CA2709529A1 Battery end of life determination |
| 07/29/2009 | EP2083278A1 Method and apparatus for determining location of phase-to-phase fault |
| 07/29/2009 | EP2082249A2 Automated arc generator and method to repeatably generate electrical arcs for afci testing |
| 07/29/2009 | EP2082248A1 Apparatus for measuring impedance of trolley line and method of locating fault using the same |
| 07/29/2009 | EP2082247A1 Method and device for analysing electric cable network using pseudorandom sequences |
| 07/29/2009 | EP2082246A2 Cable fault detection |
| 07/29/2009 | EP2082245A1 Method and apparatus for staged approach transient rf detection and sensor power saving |
| 07/29/2009 | EP2082242A2 Method, apparatus, and system for detecting hot socket deterioration in an electrical meter connection |
| 07/29/2009 | EP1527646A4 System and method for retransmission of data |
| 07/29/2009 | EP1266235B1 Controllable and testable oscillator apparatus for an integrated circuit |
| 07/29/2009 | CN201281754Y Assistant checkout jig |
| 07/29/2009 | CN201281753Y Nuclear phase lever |