Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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10/28/2009 | CN101567475A Lithium battery/battery pack measuring and protecting method based on current subsection detecting technique |
10/28/2009 | CN101567474A Method for performing batch repair of waste lithium ion battery of mobile telephone |
10/28/2009 | CN101567362A Integrated circuit packages, semiconductor devices and testing methods thereof |
10/28/2009 | CN101567327A Buffer sorting device for bare wafer testing machine platform and machine platform |
10/28/2009 | CN101567160A GIP type liquid crystal display panel and detecting method thereof |
10/28/2009 | CN101566974A System on a chip and starting method thereof |
10/28/2009 | CN101566836A Automatic power-off device |
10/28/2009 | CN101566675A Flash light working condition monitoring method and device thereof |
10/28/2009 | CN101566674A Radio-frequency power supply testing device |
10/28/2009 | CN101566673A Brush wear monitor |
10/28/2009 | CN101566672A Fall-down experimental method of simulating power grid |
10/28/2009 | CN101566671A Comprehensive relay test stand for simulating operating environments of railways and subways |
10/28/2009 | CN101566670A High-voltage switch tester |
10/28/2009 | CN101566669A Semiconductor integrated circuit device and device and method for reliability test thereof |
10/28/2009 | CN101566668A Test handler, method for unloading packaged chips, method for transferring test trays |
10/28/2009 | CN101566667A MOS component testing method |
10/28/2009 | CN101566666A Automatic voltage testing system |
10/28/2009 | CN101566665A Plane cable fault locator based on time domain reflection |
10/28/2009 | CN101566664A PCB-type traveling wave sensor |
10/28/2009 | CN101566663A Method for positioning voltage drop source of power distribution system |
10/28/2009 | CN101566662A Electromagnetic appliance test system |
10/28/2009 | CN101566661A Electricity quality online monitoring system based on transparent transmission technology |
10/28/2009 | CN101566660A Method and device for measuring electric hysteresis loop and strain loop of ferroelectric material simultaneously |
10/28/2009 | CN101566659A Multi-section process data acquisition system based on industrial standards |
10/28/2009 | CN101566658A Transient detection circuit |
10/28/2009 | CN101566657A Method and system for online metering and real-time monitoring of electric transmission line |
10/28/2009 | CN101566656A System and method for automatic detection |
10/28/2009 | CN101566655A Tester of microcomputer relay protector |
10/28/2009 | CN101566654A Refrigerator fault character and digit display method |
10/28/2009 | CN101566653A Hexadecimal refrigerator fault display method |
10/28/2009 | CN101566652A Comprehensive tester of current-voltage transformation ratio polarity |
10/28/2009 | CN101566650A Heat loss self-compensating terminal type water load microwave high power meter |
10/28/2009 | CN101566529A Refrigerator self detection method |
10/28/2009 | CN101566509A Replaceable improved electronic thermometer structure |
10/28/2009 | CN101565128A Device and method for monitoring state of pull switches for conveyer belt system |
10/28/2009 | CN100555867C Operation mode setting circuit |
10/28/2009 | CN100555835C Correction method for position signal phase error of brushless DC motor without position sensor |
10/28/2009 | CN100555594C Contactor having contact electrodes formed by laser processing |
10/28/2009 | CN100555520C Method for detecting aluminum film electrode fault and repairing broken line, and detector |
10/28/2009 | CN100555447C Semiconductor storage device control method |
10/28/2009 | CN100555259C Integrated circuit having multiple modes of operation |
10/28/2009 | CN100555218C Apparatus and method for improving emulation speed of high-level languages in on-chip emulation systems |
10/28/2009 | CN100555198C Method for calibrating handset touch panel coordinates as well as cover plate |
10/28/2009 | CN100555029C Aging room used for the last module of LCD screen |
10/28/2009 | CN100554990C Method and device for judging deterioration of accumulator |
10/28/2009 | CN100554989C Testing of circuits with multiple clock domains |
10/28/2009 | CN100554988C Device and method for detecting stress migration properties |
10/28/2009 | CN100554987C Timing generator and semiconductor testing device |
10/28/2009 | CN100554986C Device and method for JTAG test |
10/28/2009 | CN100554985C North direction interface data integrity verification method |
10/28/2009 | CN100554984C Voltage monitor and electric power storage device using same |
10/28/2009 | CN100554983C Broad band ultra high frequency local discharge signal and graphics generator |
10/28/2009 | CN100554982C Method for determining abnormity of open circuit test in high voltage DC circuit by using voltage difference |
10/28/2009 | CN100554981C Electric power transformer insulated on-line monitoring sensor mounting device |
10/28/2009 | CN100554980C Method for supporting fault functional unit of identifying technological apparatus |
10/28/2009 | CN100554974C Method and device for detecting semiconductor assembly and its drive control circuit |
10/28/2009 | CN100554916C Method for testing digital products and special equipment thereof |
10/27/2009 | US7610539 Method and apparatus for testing logic circuit designs |
10/27/2009 | US7610538 Test apparatus and performance board for diagnosis |
10/27/2009 | US7610537 Method and apparatus for testing multi-core microprocessors |
10/27/2009 | US7610536 Select and enable leads connecting IC taps and embedded controller |
10/27/2009 | US7610535 Boundary scan connector test method capable of fully utilizing test I/O modules |
10/27/2009 | US7610534 Determining a length of the instruction register of an unidentified device on a scan chain |
10/27/2009 | US7610533 Semiconductor integrated circuit and method for testing the same |
10/27/2009 | US7610532 Serializer/de-serializer bus controller interface |
10/27/2009 | US7610531 Modifying a test pattern to control power supply noise |
10/27/2009 | US7610530 Test data generator, test system and method thereof |
10/27/2009 | US7610529 Testing mobile wireless devices during device production |
10/27/2009 | US7610528 Configuring flash memory |
10/27/2009 | US7610527 Test output compaction with improved blocking of unknown values |
10/27/2009 | US7610526 On-chip circuitry for bus validation |
10/27/2009 | US7610522 Compliance of master-slave modes for low-level debug of serial links |
10/27/2009 | US7610520 Digital data signal testing using arbitrary test signal |
10/27/2009 | US7609641 System and method for providing a congestion-aware routing metric for selecting a route between nodes in a multihopping communication network |
10/27/2009 | US7609640 Methods and applications for avoiding slow-start restart in transmission control protocol network communications |
10/27/2009 | US7609639 Negative acknowledgment (NAK) suppression |
10/27/2009 | US7609624 Method and apparatus for pre-provisioning networks to support fast restoration with minimum overbuild |
10/27/2009 | US7609621 Automatic protection network switching |
10/27/2009 | US7609620 Method and apparatus using multiprotocol label switching (MPLS) label distribution protocol (LDP) to establish label switching paths (LSPS) for directed forwarding |
10/27/2009 | US7609617 BGP hitless upgrade approaches |
10/27/2009 | US7609095 System and method for maintaining device operation during clock signal adjustments |
10/27/2009 | US7609082 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
10/27/2009 | US7609081 Testing system and method for testing an electronic device |
10/27/2009 | US7609080 Voltage fault detection and protection |
10/27/2009 | US7609079 Probeless DC testing of CMOS I/O circuits |
10/27/2009 | US7609078 Contact alignment verification/adjustment fixture |
10/27/2009 | US7609077 Differential signal probe with integral balun |
10/27/2009 | US7609072 Processing tantalum capacitors on assembled PWAs to yield low failure rate |
10/27/2009 | US7609070 Manufacturing method and controlling method of electronic device |
10/27/2009 | US7609069 Method to detect shorted solenoid coils |
10/27/2009 | US7609068 System and method for particulate sensor diagnostic |
10/27/2009 | US7609053 Wafer testing system integrated with RFID techniques and thesting method thereof |
10/27/2009 | US7609052 Contact pusher, contact arm, and electronic device handling apparatus |
10/27/2009 | US7609049 Accurate scan-mode voltage detection circuit |
10/27/2009 | US7609048 Probe microscope and measuring method using probe microscope |
10/27/2009 | US7608468 Apparatus and methods for determining overlay and uses of same |
10/27/2009 | US7607931 Test socket adjustable to solid state image pickup devices of different sizes |
10/27/2009 | US7607827 Temperature detection device, temperature detection method, and computer-readable computer program product containing temperature detection program |
10/27/2009 | US7607411 Vehicular power supply apparatus |
10/27/2009 | US7607213 Method of making a device for measuring deformation |