Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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11/18/2009 | CN100561245C Input and output board testing system and method |
11/18/2009 | CN100561244C Method and system for analyzing circuit performance characteristic |
11/18/2009 | CN100561243C Method for measuring semiconductor device inside chip thermocontact area |
11/18/2009 | CN100561242C Receiving card recognizing method and correlated communication equipment |
11/18/2009 | CN100561241C Photoelectric detector frequency-amplitude characteristic test method for optical fiber peg-top |
11/18/2009 | CN100561240C Magnetic-field-measuring device |
11/18/2009 | CN100561239C Automatic connecting tester |
11/18/2009 | CN100561238C Method and device for power frequency inference source live line measurement for mutual inductance line zero-sequence impedance parameter |
11/18/2009 | CN100561233C Fixing mechanism of probe card, fixing method of probe card and probe card |
11/17/2009 | US7620897 Network based system which provides a database of measurement solutions |
11/17/2009 | US7620883 Techniques for mitigating, detecting, and correcting single event upset effects |
11/17/2009 | US7620869 Semiconductor integrated circuit and BIST circuit design method |
11/17/2009 | US7620868 Method for detecting a malfunction in a state machine |
11/17/2009 | US7620867 IP core design supporting user-added scan register option |
11/17/2009 | US7620866 Test access architecture and method of testing a module in an electronic circuit |
11/17/2009 | US7620865 Scan string segmentation for digital test compression |
11/17/2009 | US7620864 Method and apparatus for controlling access to and/or exit from a portion of scan chain |
11/17/2009 | US7620863 Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits |
11/17/2009 | US7620862 Method of and system for testing an integrated circuit |
11/17/2009 | US7620861 Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels |
11/17/2009 | US7620858 Fabric-based high speed serial crossbar switch for ATE |
11/17/2009 | US7620515 Integrated circuit with bit error test capability |
11/17/2009 | US7619993 Efficient probabilistic duplicate packet detector in computer networks |
11/17/2009 | US7619987 Node device |
11/17/2009 | US7619982 Active probe path management |
11/17/2009 | US7619981 Apparatus, system, and method for identifying network mis-cabling |
11/17/2009 | US7619980 System operable to transmit and receive messages |
11/17/2009 | US7619979 Fault isolation in a network |
11/17/2009 | US7619977 Net-centric coordination channel (NCC) |
11/17/2009 | US7619976 Data transmission method and data transmission apparatus |
11/17/2009 | US7619975 Generalized auto media selector |
11/17/2009 | US7619974 Frame traffic balancing across trunk groups |
11/17/2009 | US7619973 Dynamic traffic bandwidth management system and method for a communication network |
11/17/2009 | US7619968 Apparatus and method for efficient TDMA bandwidth allocation for TCP/IP satellite-based networks |
11/17/2009 | US7619967 Method for protection of ethernet traffic in optical ring networks |
11/17/2009 | US7619966 Hybrid virtual private LAN extensions |
11/17/2009 | US7619965 Storage network management server, storage network managing method, storage network managing program, and storage network management system |
11/17/2009 | US7619436 Display substrate and apparatus and method for testing display panel having the same |
11/17/2009 | US7619435 Method and system for derivation of breakdown voltage for MOS integrated circuit devices |
11/17/2009 | US7619434 System for multiple layer printed circuit board misregistration testing |
11/17/2009 | US7619433 Test circuit for a semiconductor integrated circuit |
11/17/2009 | US7619432 Tandem handler system and method for reduced index time |
11/17/2009 | US7619431 High sensitivity magnetic built-in current sensor |
11/17/2009 | US7619430 Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes |
11/17/2009 | US7619429 Integrated probe module for LCD panel light inspection |
11/17/2009 | US7619428 Wafer level burn-in and electrical test system and method |
11/17/2009 | US7619427 Temperature control device and temperature control method |
11/17/2009 | US7619426 Performance board and cover member |
11/17/2009 | US7619425 Electrical connecting apparatus |
11/17/2009 | US7619424 Probe needle, method for manufacturing the probe needle and method for constructing a three-dimensional structure |
11/17/2009 | US7619418 Magnetic flowmeter output verification |
11/17/2009 | US7619417 Battery monitoring system |
11/17/2009 | US7619404 System and method for testing integrated circuit timing margins |
11/17/2009 | US7619390 Battery cell voltage and impedance measuring circuit |
11/17/2009 | US7618833 Method for pre-treating epitaxial layer, method for evaluating epitaxial layer, and apparatus for evaluating epitaxial layer |
11/17/2009 | US7618281 Interconnect assemblies and methods |
11/17/2009 | US7618074 Handling apparatus for passing electronic components, in particular ICs, to a testing apparatus |
11/17/2009 | US7617715 Reference standard for ultrasonic measurement of porosity and related method |
11/17/2009 | CA2519341C Method and system for emulating a fibre channel link over a sonet/sdh path |
11/12/2009 | WO2009137727A1 Scan cell use with reduced power consumption |
11/12/2009 | WO2009137549A1 Sensor element for a fault interrupter and load break switch |
11/12/2009 | WO2009137374A1 Systems, methods and apparatus for detecting replacement of a battery in a remote control |
11/12/2009 | WO2009136503A1 Memory test apparatus and testing method |
11/12/2009 | WO2009136428A1 Digital modulated signal test equipment and test method |
11/12/2009 | WO2009136427A1 Digital modulated signal test equipment, and digital modulator, moudlating method and semiconductor device using the same |
11/12/2009 | WO2009136222A1 Method of estimation of the state of charge of a battery |
11/12/2009 | WO2009103084A3 An intelligent fault-tolerant battery management system |
11/12/2009 | WO2009091349A3 Monitoring cells in energy storage system |
11/12/2009 | WO2009059657A3 Circuit arrangement having battery cascade |
11/12/2009 | US20090282307 Optimizing test code generation for verification environment |
11/12/2009 | US20090282306 Error detection on programmable logic resources |
11/12/2009 | US20090282303 Built in test controller with a downloadable testing program |
11/12/2009 | US20090282302 Multi-Stage Data Processor With Signal Repeater |
11/12/2009 | US20090281928 Battery management system with runtime reserve analysis |
11/12/2009 | US20090281757 Self-testing device component |
11/12/2009 | US20090281754 Method and apparatus for testing a substrate for display device |
11/12/2009 | US20090281740 Cable fault detection |
11/12/2009 | US20090280753 Method of Checking the Integrity of an Antenna Arrangement, Transmitter, Receiver and Transceiver |
11/12/2009 | US20090279441 Techniques for transmitting failure detection protocol packets |
11/12/2009 | US20090279440 Techniques for processing incoming failure detection protocol packets |
11/12/2009 | US20090279432 Intercept flow distribution and intercept load balancer |
11/12/2009 | US20090279423 Recovering from Failures Without Impact on Data Traffic in a Shared Bus Architecture |
11/12/2009 | US20090279405 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method |
11/12/2009 | US20090278926 Calibration method of electronic device test apparatus |
11/12/2009 | US20090278563 Testing apparatus for fixing and testing a LCD panel |
11/12/2009 | US20090278562 Test Device and Test Method for Semiconductor Device |
11/12/2009 | US20090278560 Circuit board test clamp |
11/12/2009 | US20090278559 Inspection device and inspection method |
11/12/2009 | US20090278550 Method for the Adjustment of a Device Under Test |
11/12/2009 | US20090278549 Delay circuit and related method |
11/12/2009 | US20090278548 Degradation determination device for heater of gas sensor and method for diagnosing the heater |
11/12/2009 | US20090278547 Ground-fault detection system for vehicles with a high-voltage power net |
11/12/2009 | US20090278546 Solar cell testing apparatus |
11/12/2009 | US20090278544 System and Method for Monitoring Displacement Within Energized Tap Changer Compartments |
11/12/2009 | US20090278525 Electronic Monitoring of the On-Board Power Supply System of a Motor Vehicle with Respect to Voltage Peaks or Voltage Drops |
11/12/2009 | DE202008017527U1 Testsockel Test Sockets |
11/12/2009 | DE112008000309T5 Verstärkungskontrollgerät, Testsignalerzeugungsmodul, Testgerät, Verstärkungskontrollverfahren, Programm und Aufnahmemedium Gain control device, test signal generation module tester, gain control method, program, and recording medium |
11/12/2009 | DE102008028980A1 System sowie Verfahren zur Diagnose des technischen Betriebszustandes eines Leistungsschalters System and method for diagnosing the technical operating state of a circuit breaker |
11/12/2009 | DE102008023761A1 Elektrisches Kontaktelement zum Berührungskontaktieren von elektrischen Prüflingen sowie entsprechende Kontaktieranordnung An electrical contact member for contacting electrical contact specimens and corresponding Kontaktieranordnung |
11/12/2009 | DE102008022873A1 Battery's buffer action determining device for electrical system of motor vehicle, has control inlets of switching elements in control connection to control unit, such that connection of load resistance is connected with measuring inlet |