Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2009
10/13/2009US7602718 Packet transmission control apparatus, mobile node, control node, packet communication method, and packet communication system
10/13/2009US7602716 Load sharing on DOCSIS
10/13/2009US7602715 Scheduling system and scheduling method for the same
10/13/2009US7602713 Data switch and a method for broadcast packet queue estimation
10/13/2009US7602712 Switch method and apparatus with cut-through routing for use in a communications network
10/13/2009US7602710 Controlling time-sensitive data in a packet-based network
10/13/2009US7602707 Quality of service differentiation in wireless networks
10/13/2009US7602706 Inter-ring protection for shared packet rings
10/13/2009US7602705 Dual-homing layer 2 switch
10/13/2009US7602704 System and method for providing fault tolerant IP services
10/13/2009US7602702 Fast reroute of traffic associated with a point to multi-point network tunnel
10/13/2009US7602699 Protection method and system for equipment in a network element
10/13/2009US7602644 Memory devices with page buffer having dual registers and method of using the same
10/13/2009US7602363 Array substrate having increased inspection efficiency and display apparatus having the same
10/13/2009US7602206 Method of forming a transistor diagnostic circuit
10/13/2009US7602205 Electromigration tester for high capacity and high current
10/13/2009US7602204 Probe card manufacturing method including sensing probe and the probe card, probe card inspection system
10/13/2009US7602203 Probe and probe card
10/13/2009US7602202 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same
10/13/2009US7602201 High temperature ceramic socket configured to test packaged semiconductor devices
10/13/2009US7602200 Probe for electrical test comprising a positioning mark and probe assembly
10/13/2009US7602199 Mini-prober for TFT-LCD testing
10/13/2009US7602198 Accuracy enhancing mechanism and method for current measuring apparatus
10/13/2009US7602197 High current electron beam inspection
10/13/2009US7602192 Passive station power distribution for cable reduction
10/13/2009US7602172 Test apparatus having multiple head boards at one handler and its test method
10/13/2009US7602171 System for testing memory modules using a rotating-type module mounting portion
10/13/2009US7601559 Apparatus and method for identifying proper orientation and electrical conductivity between a semiconductor device and a socket or contactor
10/13/2009US7601555 Wafer inspection system and method thereof
10/13/2009CA2529602C Method and apparatus for control channel scheduling in a packet data communication system
10/08/2009WO2009124230A2 Three-phase faulted circuit indicator
10/08/2009WO2009123845A1 Programmable gain trans-impedance amplifier overload recovery circuit
10/08/2009WO2009123831A2 Constrained random simulation coverage closure guided by a cover property
10/08/2009WO2009123040A1 Solar cell manufacturing method, solar cell manufacturing device, and solar cell
10/08/2009WO2009123039A1 Solar cell manufacturing method and solar cell manufacturing device
10/08/2009WO2009122991A1 Secondary cell system
10/08/2009WO2009122701A1 Test module, test device, and test method
10/08/2009WO2009122700A1 Test device and test method
10/08/2009WO2009122699A1 Test module, test device, and test method
10/08/2009WO2009122635A1 Test circuit for semiconductor integrated circuit
10/08/2009WO2009122352A2 Glitch monitor and circuit
10/08/2009WO2009122315A1 Integrated circuit with test arrangement, integrated circuit arrangement and text method
10/08/2009WO2009122070A1 Device for modeling a solar panel for use in space
10/08/2009WO2009121814A1 Circuit arrangement for operating at least two electric loads of a household appliance and corresponding method
10/08/2009WO2009121794A1 Method and device for monitoring the operating state of a battery
10/08/2009WO2009121774A1 Determining degraded insulating ability in an inductively operating element
10/08/2009WO2009121382A1 Method and arrangement for generating an error signal
10/08/2009WO2009094324A3 Sensor for measuring moisture and salinity
10/08/2009US20090254788 Techniques for Logic Built-In Self-Test Diagnostics of Integrated Circuit Devices
10/08/2009US20090254787 Shift-frequency scaling
10/08/2009US20090254786 Accurately Identifying Failing Scan Bits In Compression Environments
10/08/2009US20090254300 System and method for determining position or speed of a commutated DC motor with error correction
10/08/2009US20090254297 Arrangement and Method for Determining an Electrical Feature
10/08/2009US20090254296 Circuit testing apparatus
10/08/2009US20090254290 Method for estimating remaining capacity of battery
10/08/2009US20090252160 Programmable Management IO Pads for an Integrated Circuit
10/08/2009US20090252045 Network system
10/08/2009US20090252041 Optimized statistics processing in integrated DPI service-oriented router deployments
10/08/2009US20090252037 QUALITY OF SERVICE FOR iSCSI
10/08/2009US20090251308 Three-phase faulted circuit indicator
10/08/2009US20090251170 Semiconductor device with its test time reduced and a test method therefor
10/08/2009US20090251167 Array-Based Early Threshold Voltage Recovery Characterization Measurement
10/08/2009US20090251166 Ball grid array connection monitoring system and method
10/08/2009US20090251165 Method for continuity test of integrated circuit
10/08/2009US20090251163 Alignment method, tip position detecting device and probe apparatus
10/08/2009US20090251162 Wireless Test Cassette
10/08/2009US20090251161 Module for Test Device for Testing Circuit Boards
10/08/2009US20090251160 Semiconductor integrated circuit wafer, semiconductor integrated circuit chip, and method of testing semiconductor integrated circuit wafer
10/08/2009US20090251159 Device and method for analyzing defects, particularly for items made of plastics
10/08/2009US20090251153 Mimo tester
10/08/2009US20090251152 Method and device for monitoring and/or determining the condition of a measuring probe
10/08/2009US20090251149 Battery tester
10/08/2009US20090251148 Protective Device with End-Of-Life Indication Before Power Denial
10/08/2009US20090251147 Apparatus for testing performance of car audio system
10/08/2009US20090251135 Method for Evaluating Soi Wafer
10/08/2009US20090251123 Self-Referencing Voltage Regulator
10/08/2009US20090251011 Medium Voltage Circuit Breaker With Capacitor Bank Supervisor
10/08/2009US20090249868 Starter Zero Current Test Apparatus and Method
10/08/2009DE112007002970T5 Prüfvorrichtung und Vorrichtungsschnittstelle Tester and device interface
10/08/2009DE112007002963T5 Programm, Aufzeichnungsmedium, Prüfvorrichtung und Diagnoseverfahren Program, recording medium, Tester and diagnostic procedures
10/08/2009DE112007002944T5 Mustergesteuerte Vollgeschwindigkeits-ATE-Vergleichsfähigkeit für determinierte und nichtdeterminierte IC-Daten Pattern-driven full-speed ATE comparison capability for deterministic and non deterministic IC data
10/08/2009DE102009002064A1 Diagnosevorrichtung für ein Fahrzeug Diagnostic device for a vehicle
10/08/2009DE102008015916A1 Verfahren und Vorrichtung zum Testen und Kalibrieren von elektronischen Halbleiterbauelementen, die Schall in elektrische Signale umwandeln Method and device for testing and calibration of electronic semiconductor devices that convert sound into electrical signals
10/08/2009DE102008015910A1 Verfahren zur Überprüfung der Funktionsfähigkeit einer Schalteinheit A method for checking the operation of a switching unit
10/08/2009CA2720136A1 Secondary battery system
10/08/2009CA2719760A1 Determining degraded insulating ability in an inductively operating element
10/08/2009CA2719516A1 Three-phase faulted circuit indicator
10/07/2009EP2107589A1 Switching device for grounding an inverter
10/07/2009EP2107386A2 Battery tester
10/07/2009EP2107385A1 State estimating device for secondary battery
10/07/2009EP2107384A1 Determining degraded insulating ability in an inductively operating element
10/07/2009EP2107383A1 Method for determining the total radiated sensitivity in reception of a mobile telecommunication device by radiofrequency signals
10/07/2009EP2106555A2 Method for s/tem sample analysis
10/07/2009EP2106554A1 Second surface metallization
10/07/2009EP2083278A9 Method and apparatus for determining location of phase-to-phase fault
10/07/2009EP1523820B1 A fault-tolerant broadcast router
10/07/2009EP1242885B1 Continuous application and decompression of test patterns to a circuit-under-test
10/07/2009CN201323702Y Zero-resistance replacement circuit and mobile terminal utilizing same
10/07/2009CN201323472Y 配电变压器监控装置 Distribution transformer monitoring device
10/07/2009CN201323170Y Contact protection tool for molded case circuit breaker in magnetic test
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