| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/01/2009 | US7627901 Systems and methods for improved media access control |
| 12/01/2009 | US7627799 Panel driving circuit that generates panel test pattern and panel test method thereof |
| 12/01/2009 | US7627798 Systems and methods for circuit testing using LBIST |
| 12/01/2009 | US7627797 Test access port |
| 12/01/2009 | US7627796 Testing method for permanent electrical removal of an integrated circuit output |
| 12/01/2009 | US7627795 Pipelined data processor with deterministic signature generation |
| 12/01/2009 | US7627794 Apparatus and method for discrete test access control of multiple cores |
| 12/01/2009 | US7627790 Apparatus for jitter testing an IC |
| 12/01/2009 | US7627695 Network-based system for configuring a programmable hardware element in a system using hardware configuration programs generated based on a user specification |
| 12/01/2009 | US7627462 Hardware simulation using a test scenario manager |
| 12/01/2009 | US7627445 Apparatus for testing a device with a high frequency signal |
| 12/01/2009 | US7627405 Prognostic for loss of high-voltage isolation |
| 12/01/2009 | US7627400 Method and device for detecting electric arc phenomenon on at least one electric cable |
| 12/01/2009 | US7626990 Packet counters and packet adders for traffic profiling in a multiprocessor router |
| 12/01/2009 | US7626941 Method and apparatus for analyzing proposed service features in a communication network |
| 12/01/2009 | US7626938 Local area network switch using control plane packet mirroring to support multiple network traffic analysis devices |
| 12/01/2009 | US7626937 System and method for network connection detection |
| 12/01/2009 | US7626935 Data bus with client-aborted message handling method |
| 12/01/2009 | US7626924 Transmission device and label allocation method |
| 12/01/2009 | US7626414 Multiple testing bars for testing liquid crystal display and method thereof |
| 12/01/2009 | US7626413 Parallel testing of semiconductor devices using a dividing voltage supply unit |
| 12/01/2009 | US7626412 Adaptive test time reduction for wafer-level testing |
| 12/01/2009 | US7626411 Semiconductor device, semiconductor integrated circuit and bump resistance measurement method |
| 12/01/2009 | US7626410 Apparatus for testing a semiconductor device |
| 12/01/2009 | US7626409 Frequency specific closed loop feedback control of integrated circuits |
| 12/01/2009 | US7626407 Miniature fluid-cooled heat sink with integral heater |
| 12/01/2009 | US7626406 Probing method, probe apparatus and storage medium |
| 12/01/2009 | US7626405 Suspension system and adjustment mechanism for an integrated chip and method |
| 12/01/2009 | US7626404 Replaceable probe apparatus for probing semiconductor wafer |
| 12/01/2009 | US7626403 Photosensor testing device with built-in light source and tester provided with said device |
| 12/01/2009 | US7626402 Semiconductor device and method of measuring sheet resistance of lower layer conductive pattern thereof |
| 12/01/2009 | US7626399 Broken lead detection |
| 12/01/2009 | US7626398 System for isolating faults between electrical equipment |
| 12/01/2009 | US7626397 High current capable circuit testing closer apparatus and method |
| 12/01/2009 | US7626396 Systems and methods for electrical leakage detection and compensation |
| 12/01/2009 | US7626379 Probe station having multiple enclosures |
| 12/01/2009 | US7626364 Secondary battery replacement method |
| 12/01/2009 | US7625779 Method of manufacturing a semiconductor device including a semiconductor chip having an inclined surface |
| 12/01/2009 | CA2480942C Method for conducting radiated performance tests of a wireless device |
| 12/01/2009 | CA2448536C Back-up power system |
| 11/26/2009 | WO2009143243A1 High temperature ceramic die package and dut board socket |
| 11/26/2009 | WO2009143237A1 Enhancement of detection of defects on display panels using front lighting |
| 11/26/2009 | WO2009141907A1 Wafer unit for testing and testing system |
| 11/26/2009 | WO2009141849A1 Pattern generator |
| 11/26/2009 | WO2009141848A1 Pattern generator and memory testing device using the same |
| 11/26/2009 | WO2009141402A1 Method for manufacturing and testing an integrated electronic circuit |
| 11/26/2009 | WO2009122352A3 Glitch monitor and circuit |
| 11/26/2009 | WO2009116735A3 Semiconductor device test system, test handler, and test head, interface block for semiconductor device tester, method for classifying tested semiconductor device and method for supporting semiconductor device test |
| 11/26/2009 | WO2009114463A3 System and method for well test design, interpretation and test objectives verification |
| 11/26/2009 | WO2009112350A3 Device for detecting the output voltage of a battery |
| 11/26/2009 | US20090292962 Integrated circuit with inter-symbol interference self-testing |
| 11/26/2009 | US20090292961 Integrated circuit communication self-testing |
| 11/26/2009 | US20090292487 Battery detection and user experience |
| 11/26/2009 | US20090291573 Probe card assembly and kit, and methods of making same |
| 11/26/2009 | US20090290497 Multi-router igp fate sharing |
| 11/26/2009 | US20090290496 Robust deframing of mac layer packet for mediaflo systems |
| 11/26/2009 | US20090290492 Method and apparatus to index network traffic meta-data |
| 11/26/2009 | US20090290483 Method of and a system for autonomously identifying which node in a two-node system has failed |
| 11/26/2009 | US20090289656 Dry-type high-voltage load system apparatus and method of preventing chain breaking and arc discharge for use therewith |
| 11/26/2009 | US20090289655 Process condition evaluation method for liquid crystal display module |
| 11/26/2009 | US20090289654 System and method for reducing temperature variation during burn in |
| 11/26/2009 | US20090289653 Inspection apparatus and method for semiconductor IC |
| 11/26/2009 | US20090289651 Probe card layout |
| 11/26/2009 | US20090289650 Probe card and method for selecting the same |
| 11/26/2009 | US20090289649 Tester with low signal attenuation |
| 11/26/2009 | US20090289647 Interconnect system |
| 11/26/2009 | US20090289646 Test probe |
| 11/26/2009 | US20090289645 Methods And Apparatus For Multi-Modal Wafer Testing |
| 11/26/2009 | US20090289644 Apparatus and method for testing keyboard of mobile phone |
| 11/26/2009 | US20090289636 Electrical overstress and transient latch-up pulse generation system, circuit, and method |
| 11/26/2009 | US20090289635 Battery tester |
| 11/26/2009 | US20090289145 Electromechanical actuating assembly |
| 11/26/2009 | DE112007003200T5 Kompensation für die harmonische Verzerrung eines Instrumentenkanals Compensation for the harmonic distortion of an instrument channel |
| 11/26/2009 | DE102008024527A1 Verfahren und Vorrichtung zur Überwachung eines Drehwinkelaufnehmers Method and apparatus for monitoring a rotational angle sensor |
| 11/26/2009 | DE102008023640A1 Prüfhalter für Mikrochip Test holder for microchip |
| 11/25/2009 | EP2124288A1 Secondary battery control system and hybrid vehicle equipped with same |
| 11/25/2009 | EP2122836A1 Self-test structure and method of testing a digital interface |
| 11/25/2009 | EP2122795A1 Device and method for detecting faulted phases in a multi-phase electrical network |
| 11/25/2009 | EP2122517A1 Moment-based method and system for evaluation of the reliability of a metal layer in an integrated circuit |
| 11/25/2009 | EP2122466A2 Low power scan testing techniques and apparatus |
| 11/25/2009 | EP2122380A2 Method and system to measure series-connected cell voltages using a flying capacitor |
| 11/25/2009 | EP2122379A1 Method for determining the discharge end threshold of a rechargeable battery |
| 11/25/2009 | EP2122378A1 Circuitry to prevent peak power problems during scan shift |
| 11/25/2009 | EP2122377A1 Testing integrated circuits on a wafer using a cartridge with pneumatic locking of the wafer on a probe card |
| 11/25/2009 | EP2122376A2 Contacting station for testing test samples under thermal conditions |
| 11/25/2009 | EP2122375A1 Test device for testing test samples under thermal conditions |
| 11/25/2009 | EP2122374A1 Distortion measurement imaging system |
| 11/25/2009 | EP2122372A1 Rf circuit analysis |
| 11/25/2009 | EP1857828B1 Method of displaying remaining battery power, and electronic apparatus |
| 11/25/2009 | EP1590678B1 Boundary scan circuit with integrated sensor for sensing physical operating parameters |
| 11/25/2009 | EP1119882B1 Method and apparatus for measuring complex impedance of cells and batteries |
| 11/25/2009 | CN201352378Y Base station power facility anti-theft system |
| 11/25/2009 | CN201352257Y Battery cell detector |
| 11/25/2009 | CN201352256Y Electric quantity display device for electric automobile |
| 11/25/2009 | CN201352255Y Battery analyzer |
| 11/25/2009 | CN201352254Y Motor load simulator |
| 11/25/2009 | CN201352253Y Testing box for electrical protection tests |
| 11/25/2009 | CN201352252Y Analog experiment machine frame for GW27/ZCW1 isolating switch |
| 11/25/2009 | CN201352251Y Impact test device of high voltage direct current (HVDC) power transmission converter valve |
| 11/25/2009 | CN201352250Y Discharge device for detecting cable fault based on secondary pulse process |