Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2009
09/16/2009CN201311463Y Resistive current tester of high-current zinc oxide arrester
09/16/2009CN201311462Y Three-phase common-box type voltage transformator tester
09/16/2009CN201311461Y Grid-connection photovoltaic data detecting system
09/16/2009CN101535827A Apparatus and method for determination of the state-of-charge of a battery when the battery is not in equilibrium
09/16/2009CN101535826A Second surface metallization
09/16/2009CN101535825A Test tray for test handler
09/16/2009CN101535824A Side-docking type test handler and apparatus for transferring test tray for same
09/16/2009CN101535823A Attachment of an electrical element to an electronic device using a conductive material
09/16/2009CN101535822A Method and apparatus for providing active compliance in a probe card assembly
09/16/2009CN101534001A Method for detecting distribution network short circuit fault and restoring power supply in non-broken-down section
09/16/2009CN101533955A Precise testing deployment device of antenna spatial angle identified by wireless radio frequency
09/16/2009CN101533424A Gate replacing method for easing aging of integrated circuit and reducing leakage power consumption
09/16/2009CN101533279A System to support testing of electronic devices, temperature control unit for the system, and method for controlling internal temperature of chamber of the system
09/16/2009CN101533074A Electric energy feedback type electronic load with multi-channel wide voltage input
09/16/2009CN101533073A Method for maximum net power calculation for fuel cell system based on polarization curve estimation
09/16/2009CN101533072A Intelligent battery current detection circuit of dual integrator based on flow work timing
09/16/2009CN101533071A Global nonlinear inductance test method of switched reluctance motor
09/16/2009CN101533070A Line voltage zero-cross detection device of integrated starting motor
09/16/2009CN101533069A Combined scanning unit of integrated circuit
09/16/2009CN101533068A Analog-circuit fault diagnosis method based on DAGSVC
09/16/2009CN101533067A A method, device and system to realize trip point location in the integrated circuit card
09/16/2009CN101533066A Simulative testing device with a controllable interruption time
09/16/2009CN101533065A HGC integrated circuit tester
09/16/2009CN101533064A Longevity diagnostic device of power conversion apparatus
09/16/2009CN101533063A IC heating device
09/16/2009CN101533062A Power cable on-line insulated monitoring method based on traveling wave electric amount measurement
09/16/2009CN101533061A Large power transmission network fault locating method based on sparse PMU configuration
09/16/2009CN101533060A Power system fault pre-alarming method based on traveling wave electric amount measurement
09/16/2009CN101533059A Device for detecting abnormity of zero line and ground wire of leakage protection device
09/16/2009CN101533058A Power abnormal failure data analyzing device and diagnosing method
09/16/2009CN101533057A Device and method for testing circuit conductivity
09/16/2009CN101533056A A detecting mechanism for display
09/16/2009CN101533055A Wireless acquisition terminal based on solar energy and RF technology
09/16/2009CN101533054A Battery casing insulation detection device
09/16/2009CN101533053A Load simulation and detection device of static reactive power compensation testing platform
09/16/2009CN101533052A Testing system and method for PWM fan electrical performance
09/16/2009CN101533051A Digital converters and electronic products having the same
09/16/2009CN101533043A Test system for vehicle quiescent current
09/16/2009CN101533042A Method for monitoring resistive current of non-voltage reference quantity detection lightning arrester
09/16/2009CN101533036A Probe supporting device
09/16/2009CN100541646C Calibration circuit of a semiconductor memory device and method of operation the same
09/16/2009CN100541472C Admission control system for home video servers
09/16/2009CN100541442C A high performance serial bus testing method
09/16/2009CN100541220C 数据压缩 Data Compression
09/16/2009CN100541219C Method and system for selectively masking test responses
09/16/2009CN100541218C Method and structure to develop a test program for semiconductor integrated circuits
09/16/2009CN100541217C Test architecture and method
09/16/2009CN100541216C Pretreatment integrated circuit for integrated circuit testing
09/16/2009CN100541215C Circuit-state analog device and system for testing apparatus functions
09/16/2009CN100541214C Device for detecting charging circuit board
09/16/2009CN100541213C Electric network fault self-adapting diagnostic method based on element correlation analysis
09/16/2009CN100541212C Electric network destabilization on-line automatic recognition method based on phasor measuring technique
09/16/2009CN100541211C Integrated circuit test apparatus and method and methods of making the apparatus
09/16/2009CN100541210C Electronic equipment sensibility testing arrangement
09/16/2009CN100541150C Measuring device, in particular a temperature measuring transducer
09/15/2009US7590912 Using a chip as a simulation engine
09/15/2009US7590911 Apparatus and method for testing and debugging an integrated circuit
09/15/2009US7590910 Tap and linking module for scan access of multiple cores with IEEE 1149.1 test access ports
09/15/2009US7590909 In-circuit testing system and method
09/15/2009US7590908 Semiconductor integrated circuit and method for testing the same
09/15/2009US7590907 Method and apparatus for soft-error immune and self-correcting latches
09/15/2009US7590906 Scan flip-flop circuit and semiconductor integrated circuit device
09/15/2009US7590905 Method and apparatus for pipelined scan compression
09/15/2009US7590904 Systems and methods for detecting a failure event in a field programmable gate array
09/15/2009US7590903 Re-configurable architecture for automated test equipment
09/15/2009US7590902 Methods and apparatuses for external delay test of input-output circuits
09/15/2009US7590901 Apparatus, system, and method for dynamic recovery and restoration from design defects in an integrated circuit
09/15/2009US7590900 Flip flop circuit & same with scan function
09/15/2009US7590770 Device-independent control of storage hardware using SCSI enclosure services
09/15/2009US7590753 Method for operating a packet based data network
09/15/2009US7590170 Method and apparatus for measuring jitter
09/15/2009US7590113 Method and apparatus for generating a reconnaissance index
09/15/2009US7590110 Balanced high-capacity switch
09/15/2009US7590070 System and method for discretionary multiplexing and compressing in a communications environment
09/15/2009US7590067 Method and apparatus for deriving allowable paths through a network with intransitivity constraints
09/15/2009US7590064 Method and system of flow control in multi-hop wireless access networks
09/15/2009US7590058 Method and apparatus for controlling the quality of service of voice and data services over variable bandwidth access networks
09/15/2009US7590055 High availability broadband connections through switching from wireline to diverse wireless network
09/15/2009US7590051 Method and apparatus for redialing a connection on a communication network
09/15/2009US7590048 Restoration and protection method and an apparatus thereof
09/15/2009US7589551 On-wafer AC stress test circuit
09/15/2009US7589550 Semiconductor device test system having reduced current leakage
09/15/2009US7589549 Driver circuit and test apparatus
09/15/2009US7589548 Design-for-test micro probe
09/15/2009US7589547 Forked probe for testing semiconductor devices
09/15/2009US7589546 Inspection apparatus and method for semiconductor IC
09/15/2009US7589545 Device for final inspection
09/15/2009US7589544 Probe test apparatus
09/15/2009US7589543 Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps
09/15/2009US7589542 Hybrid probe for testing semiconductor devices
09/15/2009US7589541 Method and apparatus for inspecting solid-state image pick-up device
09/15/2009US7589537 Device and method of monitoring ground connection of moving equipment with insulative bearing arrangement
09/15/2009US7589536 Systems and methods for determining the configuration of electronic connections
09/15/2009US7589535 Network device detection using frequency domain reflectometer
09/15/2009US7589521 Universal cover for a burn-in socket
09/15/2009US7589520 Soak profiling
09/15/2009US7589519 Electronic apparatus with driving power having different voltage levels
09/15/2009US7589518 Wafer probe station having a skirting component
09/15/2009US7589515 Method for reducing temperature-dependent error in photocurrent sensor, and photocurrent sensor device
09/15/2009US7589514 Method for accurate current sensing in power converters