Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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11/10/2009 | US7617428 Circuits and associated methods for improved debug and test of an application integrated circuit |
11/10/2009 | US7617427 Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures |
11/10/2009 | US7617288 Method for transmitting data in the access area |
11/10/2009 | US7616665 Method and system for monitoring the health of wireless telecommunication networks |
11/10/2009 | US7616607 Data preservation |
11/10/2009 | US7616585 Preventing network micro-congestion using send pacing based on end-to-end bandwidth |
11/10/2009 | US7616582 System and method for selecting data providers |
11/10/2009 | US7616580 Adaptive clock method and system |
11/10/2009 | US7616576 Method and apparatus for path selection in telecommunication networks |
11/10/2009 | US7616570 Arrangement and method relating to traffic control |
11/10/2009 | US7616567 Shaping apparatus, communication node and flow control method for controlling bandwidth of variable length frames |
11/10/2009 | US7616558 Reduction of the transport capacity of a virtual concatenation group |
11/10/2009 | US7616023 Method of detecting a malfunction of an encoder for a vehicle drive system |
11/10/2009 | US7616022 Circuit and method for detecting skew of transistors in a semiconductor device |
11/10/2009 | US7616021 Method and device for determining an operational lifetime of an integrated circuit device |
11/10/2009 | US7616020 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device |
11/10/2009 | US7616019 Low profile electronic assembly test fixtures |
11/10/2009 | US7616018 Integrated circuit probing apparatus having a temperature-adjusting mechanism |
11/10/2009 | US7616017 Probe station thermal chuck with shielding for capacitive current |
11/10/2009 | US7616016 Probe card assembly and kit |
11/10/2009 | US7616015 Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same |
11/10/2009 | US7616014 Pulsed I-V measurement method and apparatus |
11/10/2009 | US7616006 Method and system for electrolyzer diagnosis based on curve fitting analysis and efficiency optimization |
11/10/2009 | US7616005 Corrective device protection |
11/10/2009 | US7616004 Backplane tester and method of use |
11/10/2009 | US7616003 Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and power supply system |
11/10/2009 | US7616002 Battery management system and apparatus with anomaly reporting |
11/10/2009 | US7615992 Apparatus and method for detecting electronic device testing socket |
11/10/2009 | US7615990 Loadboard enhancements for automated test equipment |
11/10/2009 | US7615985 Probe for measuring characteristics of an excitation current of a plasma, and associated plasma reactor |
11/10/2009 | US7615967 Method and apparatus of estimating state of health of battery |
11/06/2009 | CA2664577A1 A method of prioritizing anomalies in a buried linear conductor |
11/05/2009 | WO2009135111A2 Fault detection for battery chargers |
11/05/2009 | WO2009134832A2 Automated voltage analysis in an electrical system using contextual data |
11/05/2009 | WO2009134472A1 System and method for monitoring a power source of an implantable medical device |
11/05/2009 | WO2009133663A1 Probe card |
11/05/2009 | WO2009133262A1 System for smart management of an electrochemical battery |
11/05/2009 | WO2009132403A1 Automated method for controlling and testing products |
11/05/2009 | WO2009096675A3 Carrier board transfer system for handler that supports testing of electronic devices and method for transferring carrier board in chamber of handler |
11/05/2009 | WO2007122546A3 Method and device for monitoring the condition of halogen bulbs in vehicle headlights |
11/05/2009 | US20090276668 Scan driver |
11/05/2009 | US20090276175 Automatic selective retest for multi-site testers |
11/05/2009 | US20090276172 Internal state estimating device for secondary battery and method for estimating internal state of secondary battery |
11/05/2009 | US20090276170 Automated voltage analysis in an electrical system using contextual data |
11/05/2009 | US20090274051 Dynamic Switch Contact Protection |
11/05/2009 | US20090273872 Fault detection for battery chargers |
11/05/2009 | US20090273720 Display Apparatus, and Methods for Inspecting and Manufacturing the Same, and Methods for Inspecting and Manufacturing Display Panel |
11/05/2009 | US20090273550 Display Having A Transistor-Degradation Circuit |
11/05/2009 | US20090273360 SYSTEM FOR ISOLATING A SHORT-CIRCUITED INTEGRATED CIRCUIT (IC) FROM OTHER ICs ON A SEMICONDUCTOR WAFER |
11/05/2009 | US20090273357 Contact for electrical test of electronic devices, method for manufacturing the same, and probe assembly |
11/05/2009 | US20090273351 Electronic element testing and supporting apparatus |
11/05/2009 | US20090273350 Systems and Methods for Detecting Wire Breaks |
11/05/2009 | US20090273337 Electric field sensor with electrode interleaving vibration |
11/05/2009 | US20090273336 Upgradable Test Set |
11/05/2009 | US20090273315 Method and apparatus for battery pre-check at system power-on |
11/05/2009 | DE102008020929A1 Defective circuit-breaker diagnosing device for converter of e.g. hybrid vehicle, has voltage evaluation unit comparing voltage potentials lying at respective inputs, where one of inputs is connected with output of voltage source |
11/05/2009 | CA2723142A1 Fault detection for battery chargers |
11/04/2009 | EP2113780A1 Squirrel-cage asynchronous motor and fault-detection method therefor |
11/04/2009 | EP2113779A1 Testable integrated circuit and integrated circuit test method |
11/04/2009 | EP2113778A1 System and method for determining location of phase-to-phase fault or three-phase fault |
11/04/2009 | EP2113087A1 System, computer program product and method for testing a logic circuit |
11/04/2009 | EP2113086A2 Traffic routing |
11/04/2009 | EP2113085A1 Arc recovery without over-voltage plasma chamber power supplies using a shunt switch |
11/04/2009 | EP1986935B1 Apparatus for checking an electrical printed circuit board having a conductor track |
11/04/2009 | EP1261022B1 Apparatus for detecting defect in device and method of detecting defect |
11/04/2009 | CN201341170Y Household security protection device for dealing the power failure or telephone circuit abnormal situation |
11/04/2009 | CN201341028Y Mobile power supply |
11/04/2009 | CN201340453Y Novel heavy-current detection tool |
11/04/2009 | CN201340452Y Detecting device of voltage and internal resistance of batteries |
11/04/2009 | CN201340451Y Novel automatic testing tool for square lithium batteries |
11/04/2009 | CN201340450Y Novel motor loading sampling circuit |
11/04/2009 | CN201340449Y Solar cell detector of improved mobile light source vehicle |
11/04/2009 | CN201340448Y Aging circuit arrangement for switch triode |
11/04/2009 | CN201340447Y Electric power equipment abnormal heating defect grade recognition apparatus |
11/04/2009 | CN201340446Y Handheld vehicle station performance index detection device |
11/04/2009 | CN201340445Y Automatic testing system for electronic products |
11/04/2009 | CN201340441Y Composite insulator leakage current sensor |
11/04/2009 | CN201340432Y Support for production, development and testing of universal electronic product |
11/04/2009 | CN201340431Y Aging board used in mounting type packaged semiconductor power device |
11/04/2009 | CN101573592A Compensating for harmonic distortion in an instrument channel |
11/03/2009 | US7613990 Method and system for a multi-channel add-compare-select unit |
11/03/2009 | US7613974 Fault detection method and apparatus |
11/03/2009 | US7613973 Method for providing bitwise constraints for test generation |
11/03/2009 | US7613972 Semiconductor integrated circuit, and designing method and testing method thereof |
11/03/2009 | US7613971 Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit |
11/03/2009 | US7613970 TAP domain selection circuit with AUXI/O1 or TDI lead |
11/03/2009 | US7613969 Method and system for clock skew independent scan register chains |
11/03/2009 | US7613968 Device and method for JTAG test |
11/03/2009 | US7613967 Inversion of scan clock for scan cells |
11/03/2009 | US7613966 Hyperjtag system including debug probe, on-chip instrumentation, and protocol |
11/03/2009 | US7613965 Apparatus and method for high-speed SAS link protocol testing |
11/03/2009 | US7613964 Relay device and corresponding method |
11/03/2009 | US7613963 Wireless method and apparatus for testing armament circuits |
11/03/2009 | US7613960 Semiconductor device test apparatus and method |
11/03/2009 | US7613934 Method and apparatus for monitoring the power state of computer system |
11/03/2009 | US7613788 Apparatus and method for data transmission |
11/03/2009 | US7613591 Remote test facility with wireless interface to local facilities |
11/03/2009 | US7613577 Onboard battery monitoring apparatus and method for correcting offset value of current sensor thereof |
11/03/2009 | US7613163 Method for transmission of digital information packets in a data network |
11/03/2009 | US7613127 Verifying packets received over a physical link |