Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2009
11/10/2009US7617428 Circuits and associated methods for improved debug and test of an application integrated circuit
11/10/2009US7617427 Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures
11/10/2009US7617288 Method for transmitting data in the access area
11/10/2009US7616665 Method and system for monitoring the health of wireless telecommunication networks
11/10/2009US7616607 Data preservation
11/10/2009US7616585 Preventing network micro-congestion using send pacing based on end-to-end bandwidth
11/10/2009US7616582 System and method for selecting data providers
11/10/2009US7616580 Adaptive clock method and system
11/10/2009US7616576 Method and apparatus for path selection in telecommunication networks
11/10/2009US7616570 Arrangement and method relating to traffic control
11/10/2009US7616567 Shaping apparatus, communication node and flow control method for controlling bandwidth of variable length frames
11/10/2009US7616558 Reduction of the transport capacity of a virtual concatenation group
11/10/2009US7616023 Method of detecting a malfunction of an encoder for a vehicle drive system
11/10/2009US7616022 Circuit and method for detecting skew of transistors in a semiconductor device
11/10/2009US7616021 Method and device for determining an operational lifetime of an integrated circuit device
11/10/2009US7616020 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device
11/10/2009US7616019 Low profile electronic assembly test fixtures
11/10/2009US7616018 Integrated circuit probing apparatus having a temperature-adjusting mechanism
11/10/2009US7616017 Probe station thermal chuck with shielding for capacitive current
11/10/2009US7616016 Probe card assembly and kit
11/10/2009US7616015 Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same
11/10/2009US7616014 Pulsed I-V measurement method and apparatus
11/10/2009US7616006 Method and system for electrolyzer diagnosis based on curve fitting analysis and efficiency optimization
11/10/2009US7616005 Corrective device protection
11/10/2009US7616004 Backplane tester and method of use
11/10/2009US7616003 Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and power supply system
11/10/2009US7616002 Battery management system and apparatus with anomaly reporting
11/10/2009US7615992 Apparatus and method for detecting electronic device testing socket
11/10/2009US7615990 Loadboard enhancements for automated test equipment
11/10/2009US7615985 Probe for measuring characteristics of an excitation current of a plasma, and associated plasma reactor
11/10/2009US7615967 Method and apparatus of estimating state of health of battery
11/06/2009CA2664577A1 A method of prioritizing anomalies in a buried linear conductor
11/05/2009WO2009135111A2 Fault detection for battery chargers
11/05/2009WO2009134832A2 Automated voltage analysis in an electrical system using contextual data
11/05/2009WO2009134472A1 System and method for monitoring a power source of an implantable medical device
11/05/2009WO2009133663A1 Probe card
11/05/2009WO2009133262A1 System for smart management of an electrochemical battery
11/05/2009WO2009132403A1 Automated method for controlling and testing products
11/05/2009WO2009096675A3 Carrier board transfer system for handler that supports testing of electronic devices and method for transferring carrier board in chamber of handler
11/05/2009WO2007122546A3 Method and device for monitoring the condition of halogen bulbs in vehicle headlights
11/05/2009US20090276668 Scan driver
11/05/2009US20090276175 Automatic selective retest for multi-site testers
11/05/2009US20090276172 Internal state estimating device for secondary battery and method for estimating internal state of secondary battery
11/05/2009US20090276170 Automated voltage analysis in an electrical system using contextual data
11/05/2009US20090274051 Dynamic Switch Contact Protection
11/05/2009US20090273872 Fault detection for battery chargers
11/05/2009US20090273720 Display Apparatus, and Methods for Inspecting and Manufacturing the Same, and Methods for Inspecting and Manufacturing Display Panel
11/05/2009US20090273550 Display Having A Transistor-Degradation Circuit
11/05/2009US20090273360 SYSTEM FOR ISOLATING A SHORT-CIRCUITED INTEGRATED CIRCUIT (IC) FROM OTHER ICs ON A SEMICONDUCTOR WAFER
11/05/2009US20090273357 Contact for electrical test of electronic devices, method for manufacturing the same, and probe assembly
11/05/2009US20090273351 Electronic element testing and supporting apparatus
11/05/2009US20090273350 Systems and Methods for Detecting Wire Breaks
11/05/2009US20090273337 Electric field sensor with electrode interleaving vibration
11/05/2009US20090273336 Upgradable Test Set
11/05/2009US20090273315 Method and apparatus for battery pre-check at system power-on
11/05/2009DE102008020929A1 Defective circuit-breaker diagnosing device for converter of e.g. hybrid vehicle, has voltage evaluation unit comparing voltage potentials lying at respective inputs, where one of inputs is connected with output of voltage source
11/05/2009CA2723142A1 Fault detection for battery chargers
11/04/2009EP2113780A1 Squirrel-cage asynchronous motor and fault-detection method therefor
11/04/2009EP2113779A1 Testable integrated circuit and integrated circuit test method
11/04/2009EP2113778A1 System and method for determining location of phase-to-phase fault or three-phase fault
11/04/2009EP2113087A1 System, computer program product and method for testing a logic circuit
11/04/2009EP2113086A2 Traffic routing
11/04/2009EP2113085A1 Arc recovery without over-voltage plasma chamber power supplies using a shunt switch
11/04/2009EP1986935B1 Apparatus for checking an electrical printed circuit board having a conductor track
11/04/2009EP1261022B1 Apparatus for detecting defect in device and method of detecting defect
11/04/2009CN201341170Y Household security protection device for dealing the power failure or telephone circuit abnormal situation
11/04/2009CN201341028Y Mobile power supply
11/04/2009CN201340453Y Novel heavy-current detection tool
11/04/2009CN201340452Y Detecting device of voltage and internal resistance of batteries
11/04/2009CN201340451Y Novel automatic testing tool for square lithium batteries
11/04/2009CN201340450Y Novel motor loading sampling circuit
11/04/2009CN201340449Y Solar cell detector of improved mobile light source vehicle
11/04/2009CN201340448Y Aging circuit arrangement for switch triode
11/04/2009CN201340447Y Electric power equipment abnormal heating defect grade recognition apparatus
11/04/2009CN201340446Y Handheld vehicle station performance index detection device
11/04/2009CN201340445Y Automatic testing system for electronic products
11/04/2009CN201340441Y Composite insulator leakage current sensor
11/04/2009CN201340432Y Support for production, development and testing of universal electronic product
11/04/2009CN201340431Y Aging board used in mounting type packaged semiconductor power device
11/04/2009CN101573592A Compensating for harmonic distortion in an instrument channel
11/03/2009US7613990 Method and system for a multi-channel add-compare-select unit
11/03/2009US7613974 Fault detection method and apparatus
11/03/2009US7613973 Method for providing bitwise constraints for test generation
11/03/2009US7613972 Semiconductor integrated circuit, and designing method and testing method thereof
11/03/2009US7613971 Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit
11/03/2009US7613970 TAP domain selection circuit with AUXI/O1 or TDI lead
11/03/2009US7613969 Method and system for clock skew independent scan register chains
11/03/2009US7613968 Device and method for JTAG test
11/03/2009US7613967 Inversion of scan clock for scan cells
11/03/2009US7613966 Hyperjtag system including debug probe, on-chip instrumentation, and protocol
11/03/2009US7613965 Apparatus and method for high-speed SAS link protocol testing
11/03/2009US7613964 Relay device and corresponding method
11/03/2009US7613963 Wireless method and apparatus for testing armament circuits
11/03/2009US7613960 Semiconductor device test apparatus and method
11/03/2009US7613934 Method and apparatus for monitoring the power state of computer system
11/03/2009US7613788 Apparatus and method for data transmission
11/03/2009US7613591 Remote test facility with wireless interface to local facilities
11/03/2009US7613577 Onboard battery monitoring apparatus and method for correcting offset value of current sensor thereof
11/03/2009US7613163 Method for transmission of digital information packets in a data network
11/03/2009US7613127 Verifying packets received over a physical link