| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/09/2009 | CN100568008C Test circuit of on-chip multicore processor and design method of testability |
| 12/09/2009 | CN100568007C Test method of RF mark |
| 12/09/2009 | CN100568006C Debug circuit |
| 12/09/2009 | CN100568005C Failsafe for differential circuit based on current sense scheme |
| 12/09/2009 | CN100568004C Thyristor switched capacitor high voltage valve test device and method |
| 12/09/2009 | CN100568003C Crosslinking polyethylene-insulated cable insulation diagnostic apparatus |
| 12/09/2009 | CN100568000C Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| 12/09/2009 | CN100567999C Cylindrical high Q resonant cavity for microwave test under high temperature |
| 12/09/2009 | CN100567995C Socket for inspection apparatus |
| 12/09/2009 | CN100567994C On-line test attachment |
| 12/09/2009 | CN100567920C Non-intrusive method for estimating inner temperature of stator |
| 12/09/2009 | CA2668343A1 Method of bi-directional thermal calibration of a circuit interrupter frame and circuit interrupter test system including the same |
| 12/08/2009 | US7631286 Automated metrology recipe generation |
| 12/08/2009 | US7631238 Method of testing a multichip |
| 12/08/2009 | US7631237 Multi-test method for using compare MISR |
| 12/08/2009 | US7631236 Hybrid built-in self test (BIST) architecture for embedded memory arrays and an associated method |
| 12/08/2009 | US7631235 Testing of integrated circuits using boundary scan |
| 12/08/2009 | US7631234 Test apparatus and test method |
| 12/08/2009 | US7631231 Method and apparatus for testing the connectivity of a flash memory chip |
| 12/08/2009 | US7631230 Method and apparatus for testing a transmission path |
| 12/08/2009 | US7631204 Power supply device having communication channels with different types of communication connections |
| 12/08/2009 | US7630854 Network-based system for configuring a system using software programs generated based on a user specification |
| 12/08/2009 | US7630842 Secondary battery charge/discharge electricity amount estimation method and device, secondary battery polarization voltage estimation method and device and secondary battery remaining capacity estimation method and device |
| 12/08/2009 | US7630840 Oxygen sensor readiness detection |
| 12/08/2009 | US7630800 Failure sensing device of vehicle control system |
| 12/08/2009 | US7630434 High-speed decoder for a multi-pair gigabit transceiver |
| 12/08/2009 | US7630377 Method for provisioning circuits on multiple parallel links with a single setup message |
| 12/08/2009 | US7630319 Method and system for decoding tokenized Session Initiated Protocol packets |
| 12/08/2009 | US7630302 Method and system for providing a failover circuit for rerouting logical circuit data in a data network |
| 12/08/2009 | US7630297 Trail/path protection for SDH/SONET networks |
| 12/08/2009 | US7630293 Redundant packet selection and manipulation in wireless communications systems |
| 12/08/2009 | US7629809 IC tester |
| 12/08/2009 | US7629808 Parallel scan distributors and collectors and process of testing integrated circuits |
| 12/08/2009 | US7629807 Electrical test probe |
| 12/08/2009 | US7629806 Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe card |
| 12/08/2009 | US7629805 Method and system to dynamically compensate for probe tip misalignement when testing integrated circuits |
| 12/08/2009 | US7629804 Probe head assembly for use in testing multiple wafer die |
| 12/08/2009 | US7629803 Probe card assembly and test probes therein |
| 12/08/2009 | US7629798 Wafer edge-defect detection and capacitive probe therefor |
| 12/08/2009 | US7629795 Vector impedance measurement system and method of using same |
| 12/08/2009 | US7629794 Leakage detection circuit and battery electronic control unit |
| 12/08/2009 | US7629788 Test carrier |
| 12/08/2009 | US7629774 Device for reducing the output current of a battery charger |
| 12/08/2009 | US7629186 System and method for identification of a reference integrated circuit for a pick-and-place equipment |
| 12/03/2009 | WO2009146048A1 Method for detecting cell state-of-charge and state-of-discharge divergence of a series string of batteries or capacitors |
| 12/03/2009 | WO2009145416A1 Socket for testing semiconductor chip |
| 12/03/2009 | WO2009145025A1 Partial discharge detector |
| 12/03/2009 | WO2009144948A1 Unit for testing and test system |
| 12/03/2009 | WO2009144844A1 Test device and test method |
| 12/03/2009 | WO2009144843A1 Communication system, test device, communication device, communication method, and test method |
| 12/03/2009 | WO2009144842A1 Test equipment, testing method and system |
| 12/03/2009 | WO2009144839A1 Tester and information processing system |
| 12/03/2009 | WO2009144838A1 Tester, information processing system, and data transmission method |
| 12/03/2009 | WO2009144837A1 Tester and information processing system |
| 12/03/2009 | WO2009144834A1 Testing equipment and transmitter |
| 12/03/2009 | WO2009144828A1 Wafer unit for testing and testing system |
| 12/03/2009 | WO2009144806A1 Manufacturing equipment for substrate for testing, and method and program of manufacturing substrate for testing |
| 12/03/2009 | WO2009144791A1 Test system and write wafer |
| 12/03/2009 | WO2009144790A1 Electronic component handling apparatus, electronic component test apparatus and electronic component holding tray |
| 12/03/2009 | WO2009144669A1 Dll for period jitter measurement |
| 12/03/2009 | WO2009144608A1 Detection circuitry for detecting bonding conditions on bond pads |
| 12/03/2009 | WO2009144420A2 Burn-in sensor for implantation onto a microelectronic integrated circuit and integrated circuit thus obtained |
| 12/03/2009 | WO2009144083A1 Method and system for detecting residual secondary current in current transformer in high tension electrical network, and for detecting arc formation in circuit breaker |
| 12/03/2009 | WO2009144065A1 Determining degraded insulating ability in insulation provided between two objects of an inductively operating element |
| 12/03/2009 | WO2009143760A1 Method and device for correcting and obtaining reference voltage |
| 12/03/2009 | WO2009143544A2 Vlf test generator |
| 12/03/2009 | WO2009143543A2 Vlf test generator |
| 12/03/2009 | WO2009103086A3 An intelligent fault-tolerant battery management system |
| 12/03/2009 | WO2009072341A9 Probe apparatus |
| 12/03/2009 | US20090300448 Scan flip-flop device |
| 12/03/2009 | US20090300447 Scan testing using scan frames with embedded commands |
| 12/03/2009 | US20090300446 Selective Per-Cycle Masking Of Scan Chains For System Level Test |
| 12/03/2009 | US20090300445 Method and system for alternating between programs for execution by cells of an integrated circuit |
| 12/03/2009 | US20090300442 Field mounting-type test apparatus and method for testing memory component or module in actual PC environment |
| 12/03/2009 | US20090299716 Hot-Carrier Device Degradation Modeling and Extraction Methodologies |
| 12/03/2009 | US20090299679 Method of Adaptively Selecting Chips for Reducing In-line Testing in a Semiconductor Manufacturing Line |
| 12/03/2009 | US20090299678 Method and apparatus for determining a product loading plan for a testing system |
| 12/03/2009 | US20090299677 Circuit card assembly testing system for a missile and launcher test set |
| 12/03/2009 | US20090296933 Integrated circuit and a method for secure testing |
| 12/03/2009 | US20090296791 Multi-Pair Gigabit Ethernet Transceiver |
| 12/03/2009 | US20090296580 Cooperative Flow Locks Distributed Among Multiple Components |
| 12/03/2009 | US20090296577 Method and apparatus for end-to-end network congestion management |
| 12/03/2009 | US20090295425 Direct detect sensor for flat panel displays |
| 12/03/2009 | US20090295424 Test circuit and method for an electronic device |
| 12/03/2009 | US20090295423 Compensation scheme for multi-color electroluminescent display |
| 12/03/2009 | US20090295422 Compensation scheme for multi-color electroluminescent display |
| 12/03/2009 | US20090295421 Test pattern of semiconductor device, method of manufacturing the same, and method of testing device using test pattern |
| 12/03/2009 | US20090295420 Semiconductor device and testing method |
| 12/03/2009 | US20090295419 Memory chip and method for operating the same |
| 12/03/2009 | US20090295418 Test apparatus |
| 12/03/2009 | US20090295417 Test system, electronic device, and test apparatus |
| 12/03/2009 | US20090295415 Testing of multiple integrated circuits |
| 12/03/2009 | US20090295414 Transient emission scanning microscopy |
| 12/03/2009 | US20090295404 Test apparatus and test module |
| 12/03/2009 | US20090295403 Inter-device connection test circuit generating method, generation apparatus, and its storage medium |
| 12/03/2009 | US20090295402 Voltage island performance/leakage screen monitor for ip characterization |
| 12/03/2009 | US20090295401 Leak detecting circuit |
| 12/03/2009 | US20090295397 Systems and Methods for Determining Battery Parameters Following Active Operation of the Battery |
| 12/03/2009 | US20090294965 Method of Manufacturing A Semiconductor Device |
| 12/03/2009 | US20090294254 Device for Detecting Faulty Positioning of a Carrying Cable in a Cableway System |