Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2009
10/21/2009CN101561478A Portable air-switch detector and control method thereof
10/21/2009CN101561477A Method and device for testing single event upset in in-field programmable logic gate array
10/21/2009CN101561476A Application method of chip selection switching on test tooling
10/21/2009CN101561475A Method and device for non-contact detection of LED luminescence properties
10/21/2009CN101561474A Testing method with dynamically changed test procedure
10/21/2009CN101561473A Method for precisely selecting single-phase earth faulty line for system with non-effectively earthed neutral point
10/21/2009CN101561472A Detection method for local discharge
10/21/2009CN101561471A Vehicle instrument circuit board combined detection table and detection method thereof
10/21/2009CN101561470A Three-phase alternating voltage sag generating circuit
10/21/2009CN101561469A Charger load simulator
10/21/2009CN101561468A Method for testing saturated inductance of switched reluctance motor
10/21/2009CN101561463A Power-on detection circuit for detecting minimum operational frequency
10/21/2009CN101561461A Low-voltage warning device
10/21/2009CN101561460A Compound signal detection circuit
10/21/2009CN101561452A Locating method
10/21/2009CN101561451A Spring-type test holder and a sorter with same
10/21/2009CN101561297A Vehicle instrument multifunction detection-test bed and detection method
10/21/2009CN100553170C Method, system and processor in the system for estimating length of DSL transmission medium
10/21/2009CN100553086C Power converter, inverter x-ray high voltage unit, fluoroscopic system, x-ray CT system, MRI system
10/21/2009CN100553065C Online monitoring and adjustment and control method for single phase earthing compensation status of arc-extinction coil system
10/21/2009CN100552468C Detection method for hard-disc state display lamp and detection system
10/21/2009CN100552467C Configurations and method for carrying out wafer level unclamped inductive switching tests
10/21/2009CN100552466C Superconductive cable dielectric strength test method
10/21/2009CN100552465C Method of detecting triphase asymmetry failure in low voltage line and comprehensive protection module
10/21/2009CN100552464C Conductive pattern check-up apparatus
10/21/2009CN100552463C Electric utility storm outage management
10/21/2009CN100552461C Method for measuring capacitance mismatch and circuit structure thereof
10/21/2009CN100552459C T-shaped transmission line zero-sequence resistance parameter live measurement method
10/21/2009CN100552457C Ignition device for loop of high voltage electric appliance experiment
10/21/2009CN100552456C Microcomputer electric detecting probe fasten with multiple layer elasticity
10/21/2009CN100552454C Probe card transfer assist apparatus, and inspection equipment and method using same
10/21/2009CN100552439C Printed circuit board checking device
10/21/2009CN100552411C Testing system of frequency changing outdoor air-conditioning
10/21/2009CN100552400C Physical quantity detection device with bridge circuit and temperature compensation method
10/20/2009US7607060 System and method for performing high speed memory diagnostics via built-in-self-test
10/20/2009US7607059 Systems and methods for improved scan testing fault coverage
10/20/2009US7607058 Removable and replaceable tap domain selection circuitry
10/20/2009US7607057 Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip
10/20/2009US7607056 Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
10/20/2009US7607055 Semiconductor memory device and method of testing the same
10/20/2009US7607054 Method of improving the interface efficiency in a communications network
10/20/2009US7607052 Physical coding sublayer for a multi-pair gigabit transceiver
10/20/2009US7606849 Method and apparatus for improving the frequency resolution of a direct digital synthesizer
10/20/2009US7606696 Programmable extended compression mask for dynamic trace
10/20/2009US7606164 Process of increasing source rate on acceptable side of threshold
10/20/2009US7606161 Distributing information across equal-cost paths in a network
10/20/2009US7606149 Method and system for alert throttling in media quality monitoring
10/20/2009US7606147 Application aware traffic shaping service node positioned between the access and core networks
10/20/2009US7605599 Organic electro luminescence display (OELD) to perform sheet unit test and testing method using the OELD
10/20/2009US7605598 Undercurrent sense arrangement and method
10/20/2009US7605597 Intra-chip power and test signal generation for use with test structures on wafers
10/20/2009US7605596 Probe card, apparatus and method for inspecting an object
10/20/2009US7605594 Automated electrical wiring inspection system
10/20/2009US7605592 Laminated core testing device
10/20/2009US7605584 Voltage generating apparatus, current generating apparatus, and test apparatus
10/20/2009US7605583 Modular interface
10/20/2009US7605582 Modular interface
10/15/2009WO2009126964A1 Clamp with a non-linear biasing member
10/15/2009WO2009125901A1 Test socket
10/15/2009WO2009125491A1 Driver circuit and testing apparatus
10/15/2009WO2009125095A1 Equipment for logging and transmitting measured values of physical quantities, and measurement sensor for such equipment
10/15/2009WO2009124958A1 Analysis of a substation automation system
10/15/2009WO2009124826A1 Battery module
10/15/2009WO2009124598A1 Method, apparatus, and computer program product for use of lcd display in a cordless tool
10/15/2009WO2009124549A1 Method for detecting an error in an induction machine
10/15/2009WO2009098373A3 Assembly for detecting electric discontinuity between an electric contact and an electrically conducting member
10/15/2009WO2009097207A3 System and method for ground fault detection and interruption
10/15/2009WO2009073593A3 Networked battery monitors
10/15/2009US20090259903 Wafer scale testing using a 2 signal jtag interface
10/15/2009US20090259902 Semiconductor device
10/15/2009US20090259901 Boundary scan path method and system with functional and non-functional scan cell memories
10/15/2009US20090259900 Test pattern compression for an integrated circuit test environment
10/15/2009US20090259899 Method and apparatus for automatic scan completion in the event of a system checkstop
10/15/2009US20090259898 Test vector generating method and test vector generating program of semiconductor logic circuit device
10/15/2009US20090259897 Logic circuit protected against transient disturbances
10/15/2009US20090259430 Method and Apparatus for Synchronizing Signals in a Testing System
10/15/2009US20090259421 System and method for estimating remaining run-time of autonomous systems by indirect measurement
10/15/2009US20090259420 Adaptive surface concentration battery charging
10/15/2009US20090259419 Battery condition diagnosis apparatus
10/15/2009US20090259416 Device for inspecting an electrial line's protection element and for verifying said electrical line
10/15/2009US20090258468 Minimizing transistor variations due to shallow trench isolation stress
10/15/2009US20090256584 Gap inspection apparatus
10/15/2009US20090256583 Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes
10/15/2009US20090256582 Test circuit board
10/15/2009US20090256576 Apparatus and method for ground fault detection and location in electrical systems
10/15/2009US20090256493 Driving circuit for display device, and test circuit and test method for driving circuits
10/15/2009US20090255915 Automated loading/unloading of devices for burn-in testing
10/15/2009DE202009010201U1 Einrichtung zur Identifikation der Kabelsadern Means for identification of the cable cores
10/15/2009DE10216786C5 Verfahren und Vorrichtung zur Konditionierung von Halbleiterwafern und/oder Hybriden Method and device for conditioning semiconductor wafers and / or hybrids
10/15/2009DE102009014649A1 Stromversorgungschaltung und Prüfvorrichtung Power supply circuit and testing device
10/15/2009DE102009013857A1 Verfahren zur Bewertung einer Batterie und Bewertungsvorrichtung dafür Method for evaluating a battery and evaluation apparatus therefor
10/15/2009DE102009007482A1 Jitterinjektionsschaltung, Mustergenerator, Prüfvorrichtung und elektronische Vorrichtung Jitter, pattern generator, test device and electronic apparatus
10/15/2009DE102009007480A1 Jitterinjektionsschaltung, Mustergenerator, Prüfvorrichtung und elektronische Vorrichtung Jitter, pattern generator, test device and electronic apparatus
10/15/2009DE102008054532A1 Batteriemodul Battery Module
10/15/2009DE102008054354A1 Sichere Codierung von Spannungsdaten vieler Zellen bei Hybridfahrzeugen Secure Coding of voltage data of many cells in hybrid vehicles
10/15/2009DE102008017900A1 Verfahren zum Erfassen eines Fehlers in einer Drehfeldmaschine A method for detecting a fault in a polyphase machine
10/15/2009DE102007027070B4 Elektronische Vorrichtung und Verfahren zur chipintegrierten Messung von Jitter Electronic device and method for on-chip measurement of the jitter
10/15/2009DE102004029301B4 Diagnosevorrichtungen zur Verwendung in einer Steuereinheit für Kraftfahrzeuge und Verfahren zum Diagnostizieren eines Fehlers Diagnostic devices for use in a control unit for motor vehicles and method for diagnosing a fault
10/15/2009CA2720216A1 Equipment for logging and transmitting measured values of physical quantitiesm, and measurement sensor for such equipment
10/14/2009EP2109221A1 Analog multiplexer with insulation power supply
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