| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 06/23/2010 | CN101097241B Semiconductor device and semiconductor testing device |
| 06/23/2010 | CN101095057B Probe head array |
| 06/23/2010 | CN101078746B Border scanning test structure of multiple chip package internal connection and test method |
| 06/23/2010 | CA2688905A1 Twisted-pair electrical cable testing |
| 06/22/2010 | US7743351 Checking the robustness of a model of a physical system |
| 06/22/2010 | US7743304 Test system and method for testing electronic devices using a pipelined testing architecture |
| 06/22/2010 | US7743303 Defective memory block remapping method and system, and memory device and processor-based system using same |
| 06/22/2010 | US7743302 Compressing test responses using a compactor |
| 06/22/2010 | US7743301 Semiconductor integrated circuit and method of testing same |
| 06/22/2010 | US7743300 Integrated circuit test using clock signal modification |
| 06/22/2010 | US7743299 Dynamically reconfigurable shared scan-in test architecture |
| 06/22/2010 | US7743298 Methods and apparatus for scan testing of integrated circuits with scan registers |
| 06/22/2010 | US7743297 Electronic circuit and integrated circuit including scan testing circuit, and power consumption reducing method used for integrated circuit |
| 06/22/2010 | US7743296 Logic analyzer systems and methods for programmable logic devices |
| 06/22/2010 | US7743295 System and method for testing an integrated circuit |
| 06/22/2010 | US7743294 Diagnostic mode switching |
| 06/22/2010 | US7743293 System-in-package and method of testing thereof |
| 06/22/2010 | US7743288 Built-in at-speed bit error ratio tester |
| 06/22/2010 | US7743199 Method and apparatus for obtaining trace information of multiple processors on an SoC using a segmented trace ring bus to enable a flexible trace output configuration |
| 06/22/2010 | US7743150 Apparatus and method for web service message correlation |
| 06/22/2010 | US7743021 Methods, systems, and computer program products for data processing control |
| 06/22/2010 | US7742887 Identifying process and temperature of silicon chips |
| 06/22/2010 | US7742885 Vehicle power supply device and its degradation judgment method |
| 06/22/2010 | US7742500 Method for transmitting data by a mobile station comprising a step of determining a Maximum Datagram Size (MDS) |
| 06/22/2010 | US7742426 System, method, and computer-readable medium for determining a layer 2 path trace in a heterogeneous network system |
| 06/22/2010 | US7742424 Communication-efficient distributed monitoring of thresholded counts |
| 06/22/2010 | US7742423 Method of heuristic determination of network interface transmission mode and apparatus implementing such method |
| 06/22/2010 | US7742416 Control of preemption-based beat-down effect |
| 06/22/2010 | US7742408 System and method for filtering packets in a switching environment |
| 06/22/2010 | US7742401 Network having switchover with no data loss |
| 06/22/2010 | US7742400 Method and system for detecting link failure between nodes in a hybrid network |
| 06/22/2010 | US7742398 Information redirection |
| 06/22/2010 | US7742396 Communication control method, address management node, and mobile node |
| 06/22/2010 | US7742395 Control of optical connections in an optical network |
| 06/22/2010 | US7742393 Locating endpoints in a power line communication system |
| 06/22/2010 | US7742359 Calibration circuit of a semiconductor memory device and method of operating the same |
| 06/22/2010 | US7742071 Methods and apparatus for inspecting centerplane connectors |
| 06/22/2010 | US7742051 Device control using data communication |
| 06/22/2010 | US7741863 Apparatus and methods for performing a test |
| 06/22/2010 | US7741862 Semiconductor device including a signal generator activated upon occurring of a timing signal |
| 06/22/2010 | US7741861 Test apparatus for the testing of electronic components |
| 06/22/2010 | US7741860 Prober for testing magnetically sensitive components |
| 06/22/2010 | US7741854 Method of in slot tightness measuring of stator coil |
| 06/22/2010 | US7741853 Differential-mode-current-sensing method and apparatus |
| 06/22/2010 | US7741849 Method for predicting the residual service life of an electric energy accumulator |
| 06/22/2010 | US7741837 Probe apparatus |
| 06/22/2010 | US7741836 Test tray transferring apparatus for a test handler, test handler, and method of transferring test trays for a test handler |
| 06/22/2010 | US7741835 Electric meter having a detachable measuring bar |
| 06/22/2010 | US7741834 Method to monitor substrate viability by a sensor mounted to a substrate |
| 06/22/2010 | US7741833 Non contact method and apparatus for measurement of sheet resistance of p-n junctions |
| 06/22/2010 | US7741132 Display panel, display panel inspection method, and display panel manufacturing method |
| 06/22/2010 | CA2659706C A system for monitoring connection pattern of data ports |
| 06/22/2010 | CA2420903C Fan arrangement |
| 06/22/2010 | CA2381032C Assessing a parameter of cells in the batteries of uninterruptable power supplies |
| 06/17/2010 | WO2010068860A1 Scan chain circuit and method |
| 06/17/2010 | WO2010068858A2 System and method for detecting impaired electric power equipment |
| 06/17/2010 | WO2010068513A1 Mobile device power management prioritization |
| 06/17/2010 | WO2010068313A1 Intelligent battery warning system |
| 06/17/2010 | WO2010067476A1 Testing apparatus, conversion circuit and testing method |
| 06/17/2010 | WO2010067472A1 Testing device and testing method |
| 06/17/2010 | WO2010067468A1 Testing device and testing method |
| 06/17/2010 | WO2010067066A1 High frequency measurement system |
| 06/17/2010 | WO2010066573A1 Method for determining a state of at least one component of a control unit |
| 06/17/2010 | WO2010066207A1 Method for self-testing and self-repairing on chip |
| 06/17/2010 | WO2010066162A1 A thermal printhead detecting device and method and a thermal printer using the same |
| 06/17/2010 | WO2010047883A3 Fully x-tolerant, very high scan compression scan test systems and techniques |
| 06/17/2010 | WO2010046576A3 Method and device for detecting the end of life of a supercapacitor pack in the electric system of an automobile |
| 06/17/2010 | WO2010043651A3 Determination of properties of an electrical device |
| 06/17/2010 | WO2010032995A3 Apparatus and method for monitoring voltages of cells of battery pack |
| 06/17/2010 | WO2010024654A3 Apparatus and method for sensing a current leakage of a battery, and battery driving apparatus and battery pack including the apparatus |
| 06/17/2010 | WO2009115747A3 Methods, device and equipment for locating a defect in an electric link |
| 06/17/2010 | US20100153801 Method for at speed testing of devices |
| 06/17/2010 | US20100153800 Logic tester and method for simultaneously measuring delay periods of multiple tested devices |
| 06/17/2010 | US20100153798 Serial i/o using jtag tck and tms signals |
| 06/17/2010 | US20100153797 Apparatus and method of authenticating Joint Test Action Group (JTAG) |
| 06/17/2010 | US20100153796 Scan Chain Circuit and Method |
| 06/17/2010 | US20100153056 Method of generating a restricted inline resistive fault pattern and a test pattern generator |
| 06/17/2010 | US20100153054 Test apparatus and diagnosis method |
| 06/17/2010 | US20100153053 Stream Based Stimulus Definition and Delivery via Interworking |
| 06/17/2010 | US20100153039 Apparatus and Method for Testing a Power Source |
| 06/17/2010 | US20100153038 State estimating device of secondary battery |
| 06/17/2010 | US20100153037 Battery-capacity supervisory control device and method thereof |
| 06/17/2010 | US20100153034 Measurement equipment, serial transmission system, program, and recording medium |
| 06/17/2010 | US20100153033 Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor |
| 06/17/2010 | US20100150686 Handler for electronic components, in particular ic's, comprising a pneumatic cylinder displacement unit for moving plungers |
| 06/17/2010 | US20100150428 Method and apparatus for detecting mechanical defects in a semiconductor device, particularly in a solar cell arrangement |
| 06/17/2010 | US20100149964 System and Method to Mitigate Physical Cable Damage |
| 06/17/2010 | US20100148815 Test apparatus |
| 06/17/2010 | US20100148814 Compliance control methods and apparatuses |
| 06/17/2010 | US20100148813 Apparatus and method for combined micro-scale and nano-scale c-v, q-v, and i-v testing of semiconductor materials |
| 06/17/2010 | US20100148812 Semiconductor device including chip |
| 06/17/2010 | US20100148811 Probe card, and apparatus and method for testing semiconductor device using the probe card |
| 06/17/2010 | US20100148810 Probe device, processing device, and probe testing method |
| 06/17/2010 | US20100148809 Probe card for testing semiconductor device, probe card built-in probe system, and method for manufacturing probe card |
| 06/17/2010 | US20100148808 Methods and apparatus to analyze on-chip controlled integrated circuits |
| 06/17/2010 | US20100148796 Device for checking the attachment of a circuit board on a carrier |
| 06/17/2010 | US20100148795 Methods and apparatus for selecting settings for circuits |
| 06/17/2010 | US20100148794 Indicator arrangement |
| 06/17/2010 | US20100148793 Electronic device test apparatus for successively testing electronic devices |
| 06/17/2010 | US20100148792 Heat sink structure and test head with same |