Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2010
05/26/2010CN101713803A Portable resistor-type current phase shifter
05/26/2010CN101713802A Fault on-line repairing method for satellite power supply and distribution test system
05/26/2010CN101713801A Electric energy quality monitoring system
05/26/2010CN101713800A Test method of digital substation relay protection device and special device thereof
05/26/2010CN101713794A Method for detecting poor contact of battery voltage testing terminals
05/26/2010CN101713791A Correction method of nonlinear output of DC low-voltage standard source
05/26/2010CN101713681A Mining material detection circuit and device
05/26/2010CN101713668A Device and method for detecting ice coating, short circuit and lightning strike faults on power lines in real time
05/26/2010CN101303385B Tester machine platform
05/26/2010CN101275970B Testing device and probe structure thereof
05/26/2010CN101271144B Circuit test device
05/26/2010CN101221524B Display equipment debugging system and method thereof
05/26/2010CN101191824B Power voltage detecting circuit
05/26/2010CN101183128B Testing method and apparatus of duplex device power capacity
05/26/2010CN101165751B Panel detector and its detection method
05/26/2010CN101122627B Semi-conducting material thermoelectricity performance test system
05/26/2010CN101084562B Method and device for the secure operation of a switching device
05/26/2010CN101084561B Method and device for the secure operation of a switching device
05/26/2010CN101073014B Relay connection member, inspection device and method of manufacturing relay connection member
05/26/2010CN101071160B Cell health state diagnosis method
05/26/2010CN101071141B Detecting unit and detecting device with same
05/26/2010CN101067644B Storage battery performance analytical expert diagnosing method
05/26/2010CN101042420B Method, system and device for line detection
05/26/2010CN101042412B Electric loading switching equipment
05/26/2010CN101034140B Data comparison and control method of intelligent type battery bag
05/25/2010US7725849 Feature failure correlation
05/25/2010US7725803 Programmable logic device programming verification systems and methods
05/25/2010US7725795 Load generating apparatus and load testing method
05/25/2010US7725793 Pattern generation for test apparatus and electronic device
05/25/2010US7725792 Dual-path, multimode sequential storage element
05/25/2010US7725791 Single lead alternating TDI/TMS DDR JTAG input
05/25/2010US7725790 Selectable dual mode test access port method and apparatus
05/25/2010US7725789 Apparatus for efficiently loading scan and non-scan memory elements
05/25/2010US7725788 Method and apparatus for secure scan testing
05/25/2010US7725787 Testing of a programmable device
05/25/2010US7725786 Protecting an integrated circuit test mode
05/25/2010US7725785 Film-type semiconductor package and method using test pads shared by output channels, and test device, semiconductor device and method using patterns shared by test channels
05/25/2010US7725784 Integrated circuit chip with communication means enabling remote control of testing means of IP cores of the integrated circuit
05/25/2010US7725778 Semiconductor integrated circuit and electronic device
05/25/2010US7725595 Embedded communications system and method
05/25/2010US7725586 Method for advance negotiation of computer settings
05/25/2010US7725434 Methods, systems, and computer program products for automatic creation of data tables and elements
05/25/2010US7725356 Network-based system for selecting or purchasing hardware products
05/25/2010US7725295 Cable fault detection
05/25/2010US7725276 Signal waveform analyzing device
05/25/2010US7725275 Telematics-based method and system of battery parasitic load validation for a vehicle fleet
05/25/2010US7724941 Defect analysis place specifying device and defect analysis place specifying method
05/25/2010US7724761 Systems and methods for reducing reflections and frequency dependent dispersions in redundant links
05/25/2010US7724741 Image forming apparatus connected to network
05/25/2010US7724686 Communication monitoring apparatus, communication monitoring method, communication monitoring program, and recording medium
05/25/2010US7724680 Method and technique for the processing and intelligent display of wideband direction-finding data
05/25/2010US7724670 Method and apparatus for achieving dynamic capacity and high availability in multi-stage data networks using adaptive flow-based routing
05/25/2010US7724665 Common channel flow control method and system
05/25/2010US7724662 Dynamic rate limiting adjustment
05/25/2010US7724661 Scalable, high-resolution asynchronous transfer mode traffic shaper and method
05/25/2010US7724658 Protocol offload transmit traffic management
05/25/2010US7724657 Systems and methods for communicating a lossy protocol via a lossless protocol
05/25/2010US7724656 Uplink congestion detection and control between nodes in a radio access network
05/25/2010US7724654 Method for synchronized trunk failover and failback in a FC-AL switching environment
05/25/2010US7724488 Method for controlling an electronic overcurrent trip for low-voltage circuit breakers
05/25/2010US7724024 Semiconductor device with its test time reduced and a test method therefor
05/25/2010US7724023 Circuit apparatus including removable bond pad extension
05/25/2010US7724019 Active device array substrate
05/25/2010US7724018 Methods and apparatus for translated wafer stand-in tester
05/25/2010US7724017 Multi-channel pulse tester
05/25/2010US7724016 Characterizing circuit performance by separating device and interconnect impact on signal delay
05/25/2010US7724015 Data processing device and methods thereof
05/25/2010US7724014 On-chip servo loop integrated circuit system test circuitry and method
05/25/2010US7724013 On-chip self test circuit and self test method for signal distortion
05/25/2010US7724012 Contactless testing of wafer characteristics
05/25/2010US7724011 Semiconductor integrated circuit device with power lines improved
05/25/2010US7724009 Method of making high-frequency probe, probe card using the high-frequency probe
05/25/2010US7724008 Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrate
05/25/2010US7724007 Probe apparatus and probing method
05/25/2010US7724006 Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device
05/25/2010US7724005 High-frequency structures for nanoelectronics and molecular electronics
05/25/2010US7724004 Probing apparatus with guarded signal traces
05/25/2010US7724003 Substrate conditioning for corona charge control
05/25/2010US7723999 Calibration structures for differential signal probing
05/25/2010US7723997 Method and arrangement for the detection of a coil
05/25/2010US7723996 Inverter circuit and backlight assembly having the same
05/25/2010US7723995 Test switching circuit for a high speed data interface
05/25/2010US7723992 Detector for an ultraviolet lamp system and a corresponding method for monitoring microwave energy
05/25/2010US7723981 Method for transferring test trays in a side-docking type test handler
05/25/2010US7723980 Fully tested wafers having bond pads undamaged by probing and applications thereof
05/25/2010US7723977 Optical sensor arrangement for electrical switchgear
05/25/2010US7723975 Current detecting circuit
05/25/2010US7723958 Battery charge indication methods, battery charge monitoring devices, rechargeable batteries, and articles of manufacture
05/25/2010US7723724 System for using test structures to evaluate a fabrication of a wafer
05/25/2010US7723131 Manufacturing method of a semiconductor device, and paste applicator
05/25/2010US7722436 Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge model
05/25/2010US7722371 Electrical contactor, especially wafer level contactor, using fluid pressure
05/25/2010CA2352700C Method and device of fault location for distribution networks
05/20/2010WO2010057040A1 Probe card actuator
05/20/2010WO2010056950A1 Battery testing and charging system and method of operation thereof
05/20/2010WO2010056365A2 Method and apparatus for circuit simulation
05/20/2010WO2010056346A2 Method and apparatus for testing electrical connections on a printed circuit board
05/20/2010WO2010056343A2 Fast open circuit detection for open power and ground pins
05/20/2010WO2010056197A1 Method and apparatus for off-line testing of multi-phase alternating current machines
05/20/2010WO2010056152A1 System for checking the location of equipment
1 ... 624 625 626 627 628 629 630 631 632 633 634 635 636 637 638 639 640 641 642 643 644 ... 1523