Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2010
06/16/2010CN101738564A Memory slot detector
06/16/2010CN101738563A Signal measuring device of front end bus of central processor
06/16/2010CN101738562A Electric detection system for interface card
06/16/2010CN101738561A Anti-creeping detection control circuit
06/16/2010CN101738560A Unbalanced electric bridge-based grounding detection circuit for locomotive control loop
06/16/2010CN101738559A Open circuit detector using depletion type transistor and using method thereof
06/16/2010CN101738558A Method for testing radiation electromagnetic interference noise by using GTEM chamber
06/16/2010CN101738557A Method for diagnosing radiation noise type by using GTEM chamber
06/16/2010CN101738556A Novel fault message display processing system
06/16/2010CN101738555A Method for detecting electric performance of wire holder for compressor and detection system thereof
06/16/2010CN101738554A Cross-linked polyethylene insulated cable and method for testing cable insulation and sheath aging
06/16/2010CN101738553A Universal testing system of frequency transformer and current transformer
06/16/2010CN101738552A High-elevation correction method for lead critical coronal voltage of 750kV transmission line
06/16/2010CN101738551A Method for intelligent analysis of transient power quality disturbance based on networking
06/16/2010CN101738550A Electronic device test device and test method
06/16/2010CN101738549A Method and device for testing touch screen
06/16/2010CN101738548A Clock pulse detecting circuit and clock pulse supply device
06/16/2010CN101738547A Electronic device test method
06/16/2010CN101738545A Electromagnetic wave measuring apparatus
06/16/2010CN101738539A Electronic electric energy meter and detection method of signal indicator lights thereof
06/16/2010CN101738534A Voltage test device and voltage test method
06/16/2010CN101738525A Voltage test module
06/16/2010CN101738523A Device for detecting voltage of serially-connected cells
06/16/2010CN101738508A Probe tower and manufacturing method thereof
06/16/2010CN101738507A Test connecting wire for direct-current resistance, action waveforms and low-voltage impedance test
06/16/2010CN101738506A Push pole for match plate of test sorting machine
06/16/2010CN101738505A Test pallet
06/16/2010CN101738504A Medium optical sensing apparatus and high-precision semiconductor component detecting machine platform
06/16/2010CN101738503A Interface device and control method and aging test system thereof
06/16/2010CN101738502A Connection structure for reducing phase change of 35kV transformer in motion waveform test
06/16/2010CN101738501A Connection structure for reducing phase change of 35kV transformer in motion waveform test
06/16/2010CN101738500A Equipment for correcting user tray position and test processor
06/16/2010CN101738345A Clamp capable of detecting bending force and electric property
06/16/2010CN101737381A Testing structure and air pipe thereof
06/16/2010CN101734262A Thermal fuse type sensor and lead-off detection method thereof
06/16/2010CN101459089B Transistor encapsulation method and construction, jumper wire board for tester table
06/16/2010CN101409462B Multilevel monitor-control method for monitoring and controlling hyposynchronous oscillation of synthesis power generating plant and electric network information
06/16/2010CN101408681B Display panel
06/16/2010CN101339302B ITO test board and test method
06/16/2010CN101281229B Power distribution network distribution circuit fault location system
06/16/2010CN101281211B Making tool for package test
06/16/2010CN101276944B Accumulator repairing system and method with function of recovering electric energy
06/16/2010CN101275987B Equipment test system and method
06/16/2010CN101273447B Semiconductor analyzing device
06/16/2010CN101266277B DC switch protective circuit on/off detection device and method
06/16/2010CN101266170B Method and apparatus for measuring multi-junction photovoltaic battery quantum efficiency
06/16/2010CN101241162B Cable tester
06/16/2010CN101226712B Apparatus and method for testing substrate
06/16/2010CN101216526B Feedforward loop circuit synchronous detection device
06/16/2010CN101216523B Substation grounding net defect diagnostic method and apparatus
06/16/2010CN101208644B Voltage sag generator device
06/16/2010CN101207272B Turn space protection for reactor sequence component direction
06/16/2010CN101187676B Selection circuit of multi-path input and double-path output
06/16/2010CN101170791B An industrial installation device for testing power on and off automatically
06/16/2010CN101145686B Power tool
06/16/2010CN101128743B Accumulator state monitoring device
06/16/2010CN101122624B Method for detecting fixture and capacitor
06/16/2010CN101093243B Semiconductor integrated circuit
06/15/2010US7739698 Multiplatform API usage tool
06/15/2010US7739638 Circuit analyzing device, circuit analyzing method, program, and computer readable information recording medium considering influence of signal input to peripheral circuit which does not have logical influence
06/15/2010US7739631 Testing method and method for manufacturing an electronic device
06/15/2010US7739573 Voltage identifier sorting
06/15/2010US7739570 System and method for increasing error checking performance by calculating CRC calculations after multiple test patterns for processor design verification and validation
06/15/2010US7739569 Boundary scan path method and system with functional and non-functional scan cell memories
06/15/2010US7739568 Scan testing system for circuits under test
06/15/2010US7739567 Utilizing serializer-deserializer transmit and receive pads for parallel scan test data
06/15/2010US7739566 Scan test circuitry using a state machine and a limited number of dedicated pins
06/15/2010US7739565 Detecting corruption of configuration data of a programmable logic device
06/15/2010US7739564 Testing an integrated circuit using dedicated function pins
06/15/2010US7739561 Method and apparatus for monitoring an optical network signal
06/15/2010US7739557 Method, system and program product for autonomous error recovery for memory devices
06/15/2010US7739536 Intelligent frequency and voltage margining
06/15/2010US7739135 Asynchronous fault handling in process-centric programs
06/15/2010US7739098 System and method for providing distributed static timing analysis with merged results
06/15/2010US7739097 Emulation system with time-multiplexed interconnect
06/15/2010US7739069 Test prepared RF integrated circuit
06/15/2010US7739064 Inline clustered defect reduction
06/15/2010US7738664 Apparatus for fault detection for parallelly transmitted audio signals and apparatus for delay difference detection and adjustment for parallelly transmitted audio signals
06/15/2010US7738588 Arrangement comprising a first semiconductor chip and a second semiconductor chip connected thereto
06/15/2010US7738478 Apparatus and method for determining downstream topology in hybrid-fiber coaxial network
06/15/2010US7738420 Apparatus and method for allocating subchannel and power in communication system, and transmitting apparatus
06/15/2010US7738395 Communication system for improving data transmission efficiency of TCP in a wireless network environment and a method thereof
06/15/2010US7738389 System and method for multiple test access in a communication network
06/15/2010US7738387 System and method for diagnosing a cabling infrastructure using a PHY
06/15/2010US7738378 RSVP/SBM based side-stream session setup, modification, and teardown for QoS-driven wireless LANs
06/15/2010US7738377 Method and apparatus for volumetric thresholding and alarming on internet protocol traffic
06/15/2010US7738374 Channel allocation for access point in mesh network
06/15/2010US7738367 Performing non-revertive failover with network devices
06/15/2010US7738364 Scalable, highly available cluster membership architecture
06/15/2010US7738351 Signal processing circuit and reproducing apparatus
06/15/2010US7737718 Power supply assembly and semiconductor testing system using same
06/15/2010US7737717 Current-voltage-based method for evaluating thin dielectrics based on interface traps
06/15/2010US7737716 Methods and systems for semiconductor testing using reference dice
06/15/2010US7737715 Compensation for voltage drop in automatic test equipment
06/15/2010US7737714 Probe assembly arrangement
06/15/2010US7737713 Apparatus for hot-probing integrated semiconductor circuits on wafers
06/15/2010US7737712 Probe-testing device and method of semiconductor device
06/15/2010US7737710 Socket, and test apparatus and method using the socket
06/15/2010US7737709 Methods for planarizing a semiconductor contactor
06/15/2010US7737708 Contact for use in testing integrated circuits