| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/28/2010 | CN101788593A State monitoring and analysis system of power cable sheath grounding current and method thereof |
| 07/28/2010 | CN101788582A Interference suppression method and device for local discharge detection of equipment |
| 07/28/2010 | CN101788576A Electrical testing device and electrical testing method for electronic device |
| 07/28/2010 | CN101786574A Intelligent monitoring system of monorail hoist |
| 07/28/2010 | CN101443897B Image binarizing method, image processing device |
| 07/28/2010 | CN101420054B 电池充电方法及其装置 Battery charging method and device |
| 07/28/2010 | CN101344537B General scarf joint tool for positioning ball lattice array packaging member to be measured |
| 07/28/2010 | CN101339208B Voltage quality monitoring and perturb automatic classification method based on analysis in time-domain |
| 07/28/2010 | CN101303394B Device and method for testing hydroelectric generating set electricity generator stator core |
| 07/28/2010 | CN101285871B Scanning chain diagnosis vector generation method and device and scanning chain diagnosis method |
| 07/28/2010 | CN101191816B Chip test system |
| 07/28/2010 | CN101158711B Life test method of fuel battery accelerate starting and stopping |
| 07/28/2010 | CN101131410B Film electrode short detecting device for fuel batter with proton exchange film and detecting method thereof |
| 07/28/2010 | CN101078750B Vehicle mounted battery monitor system |
| 07/28/2010 | CN101055302B GPS clock signal based high voltage capacitive apparatus insulated on-line monitoring system and its implement method |
| 07/27/2010 | US7765448 Clock signal distributing circuit, information processing device and clock signal distributing method |
| 07/27/2010 | US7765447 Selectively accessing test access ports in a multiple test access port environment |
| 07/27/2010 | US7765446 Method for testing semiconductor integrated circuit and method for verifying design rules |
| 07/27/2010 | US7765445 Analog testing of ring oscillators using built-in self test apparatus |
| 07/27/2010 | US7765444 Failure diagnosis for logic circuits |
| 07/27/2010 | US7765443 Test systems and methods for integrated circuit devices |
| 07/27/2010 | US7765320 Configuration of filter for data stream organized in frames |
| 07/27/2010 | US7765080 System for testing smart cards and method for same |
| 07/27/2010 | US7764619 Signal routing error reporting |
| 07/27/2010 | US7764615 Distributing rate limits and tracking rate consumption across members of a cluster |
| 07/27/2010 | US7764611 Sharing of network security and services processing resources |
| 07/27/2010 | US7764605 Methods and systems for measurement-based call admission control in a media gateway |
| 07/27/2010 | US7764603 Method, apparatus, and computer product for switching ringlets |
| 07/27/2010 | US7764602 Method and system for protecting a communication network, said communication network including a transport network |
| 07/27/2010 | US7764599 Network routing device and network routing method |
| 07/27/2010 | US7764472 Method for checking electrical safety of a household appliance and corresponding household appliance |
| 07/27/2010 | US7764080 Methods of operating an electronic circuit for measurement of transistor variability and the like |
| 07/27/2010 | US7764079 Modular probe system |
| 07/27/2010 | US7764078 Test structure for monitoring leakage currents in a metallization layer |
| 07/27/2010 | US7764077 Semiconductor device including semiconductor evaluation element, and evaluation method using semiconductor device |
| 07/27/2010 | US7764075 High performance probe system |
| 07/27/2010 | US7764074 Probe of detector for testing pins of electronic component |
| 07/27/2010 | US7764073 Electrical connecting apparatus |
| 07/27/2010 | US7764072 Differential signal probing system |
| 07/27/2010 | US7764071 Testing and display of electrical system impedance |
| 07/27/2010 | US7764069 Process for measuring bond-line thickness |
| 07/27/2010 | US7764068 Test board for testing PCBS |
| 07/27/2010 | US7764067 High voltage cable testing method |
| 07/27/2010 | US7764066 Simulated battery logic testing device |
| 07/27/2010 | US7764062 Method and structure for variable pitch microwave probe assembly |
| 07/27/2010 | US7763557 heat and scratch resistance, cleanability |
| 07/27/2010 | US7763531 Method and structure to process thick and thin fins and variable fin to fin spacing |
| 07/27/2010 | US7763476 Test structure for determining characteristics of semiconductor alloys in SOI transistors by x-ray diffraction |
| 07/27/2010 | US7762152 Methods for accurately measuring the thickness of an epitaxial layer on a silicon wafer |
| 07/27/2010 | US7761983 Method of assembling a wafer probe |
| 07/22/2010 | WO2010083326A1 Current sensing mechanism |
| 07/22/2010 | WO2010083004A2 Systems and methods of implementing remote boundary scan features |
| 07/22/2010 | WO2010082576A1 Contactor, method of manufacturing contactor, and connection device with contactor |
| 07/22/2010 | WO2010082565A1 Delta-sigma ad converter circuit and battery pack |
| 07/22/2010 | WO2010082549A1 Battery pack, semiconductor integrated circuit, remaining capacity correcting method, and storage medium |
| 07/22/2010 | WO2010082502A1 Battery internal short-circuit evaluating device |
| 07/22/2010 | WO2010082451A1 Charged particle beam applied apparatus |
| 07/22/2010 | WO2010082330A1 Method and program for detecting characteristics of device under test (dut) and storage medium containing the program |
| 07/22/2010 | WO2010082238A1 Semiconductor integrated circuit and electronic information device |
| 07/22/2010 | WO2010081834A1 Method for testing printed circuit boards |
| 07/22/2010 | WO2010081725A2 Method and network analyser for measuring group runtime in a measuring object |
| 07/22/2010 | WO2010081617A1 Chuck and method for receiving and holding thin test substrates |
| 07/22/2010 | WO2010056431A3 Method and system for estimation of source impedence on electrical distribution lines |
| 07/22/2010 | WO2010034509A3 Method for the operation of illuminants |
| 07/22/2010 | US20100185909 Asynchronous Scan Chain Circuit |
| 07/22/2010 | US20100185908 Speed-Path Debug Using At-Speed Scan Test Patterns |
| 07/22/2010 | US20100185417 Remote Monitoring of SCADA Ready Field Test Switches |
| 07/22/2010 | US20100185405 Battery Control Device |
| 07/22/2010 | US20100185404 Method of predicting failures in components |
| 07/22/2010 | US20100185336 Integrated and optimized distributed generation and interconnect system controller |
| 07/22/2010 | US20100183224 Method and system for evaluating current spreading of light emitting device |
| 07/22/2010 | US20100182299 Semiconductor integrated circuit, liquid crystal driver circuit, and liquid crystal display apparatus |
| 07/22/2010 | US20100182038 Setup and method for testing a permanent magnet motor |
| 07/22/2010 | US20100182037 Diagnostic Method For Load-Testing Self-Excited Three-Phase Generators in a Motor Vehicle |
| 07/22/2010 | US20100182036 Electrostatic chuck power supply |
| 07/22/2010 | US20100182035 Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same |
| 07/22/2010 | US20100182034 Circuit for continuously measuring discontinuous metal insulator transition of mit element and mit sensor using the same |
| 07/22/2010 | US20100182033 Testable integrated circuit and test method |
| 07/22/2010 | US20100182032 Printed circuit board testing fixture |
| 07/22/2010 | US20100182031 Layered Probes With Core |
| 07/22/2010 | US20100182029 Electrical testing device and electrical testing method for electronic device |
| 07/22/2010 | US20100182027 Test lead probe with retractable insulative sleeve |
| 07/22/2010 | US20100182013 Probing apparatus with temperature-adjusting modules for testing semiconductor devices |
| 07/22/2010 | US20100182012 Wired Pipe Signal Transmission Testing Apparatus and Method |
| 07/22/2010 | US20100182011 Photodiode self-test |
| 07/22/2010 | US20100181925 Ballast/Line Detection Circuit for Fluorescent Replacement Lamps |
| 07/22/2010 | DE112008002591T5 Jitter-Erzeugungsvorrichtung, diese verwendendes Gerätetestsystem, und Jitter-Erzeugungsverfahren Jitter generation device, this device-use test system, and jitter generation method |
| 07/22/2010 | DE112008002282T5 Verfahren zur Inspektion von Leiterplatten durch Multispektralanalyse A method for inspection of printed circuit boards by multispectral |
| 07/22/2010 | DE102009000337A1 Verfahren zur Bestimmung eines Alterungszustandes einer Batteriezelle mittels Impedanzspektroskopie A process for determining the aging state of a battery cell by means of impedance spectroscopy |
| 07/22/2010 | DE102009000336A1 Impedanzmessung von elektrochemischen Energiespeichern in Fahrzeugen Impedance measurement of electrochemical energy storage devices in vehicles |
| 07/22/2010 | DE102008062929A1 Elektronische Vorrichtung und Verfahren zur Leitungsprüfung Electronic device and method for conducting examination |
| 07/22/2010 | DE102008029412B4 Verfahren zum Überwachen eines Anschlusses eines elektronischen Elementes an einem Hardwarenanschluß A method for monitoring a terminal of an electronic element to a goods terminal Hard |
| 07/22/2010 | DE102004057819B4 Eingangsschaltung für eine integrierte Schaltung Input circuit for an integrated circuit |
| 07/22/2010 | CA2825320A1 Distribution system analysis using meter data |
| 07/22/2010 | CA2749799A1 Systems and methods of implementing remote boundary scan features |
| 07/21/2010 | EP2209178A1 Diagnostic charger for LEAD-ACID batteries |
| 07/21/2010 | EP2209014A1 Partial corona discharge detection |
| 07/21/2010 | EP2208219A1 Automatic store and method for storing plates of electronic circuits |
| 07/21/2010 | EP2208080A2 Circuit arrangement having battery cascade |
| 07/21/2010 | EP2208079A2 Protocol aware digital channel apparatus |