Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2010
07/07/2010CN201522531U Power-transmission slide contact line mounting defect and operation fault detection device of traveling cleaner
07/07/2010CN201522519U G.7032Mbps digital signal testing lamp
07/07/2010CN1987396B Detecting method for composite air conditioner error connection line and distributing tube temperature sensor imperfect
07/07/2010CN1885055B Battery check device
07/07/2010CN101772709A Lifetime estimating method and deterioration suppressing method for lithium secondary cell, lifetime estimator and deterioration suppressor, battery pack using the same, and charger
07/07/2010CN101772238A Light source drive circuit
07/07/2010CN101771281A Heating integrated module driven by battery
07/07/2010CN101771277A Method and system for apportioning and evaluating loss in shared control area in regional power grid accident
07/07/2010CN101771259A Combined on-off control system
07/07/2010CN101770967A Test method, device and system of common substrate integrated circuit
07/07/2010CN101770415A Signal testing device
07/07/2010CN101770007A Electric energy meter test system and method thereof
07/07/2010CN101769997A Apparatus, system, and method for precise early detection of AC power loss
07/07/2010CN101769996A High-voltage power supply debugging detector
07/07/2010CN101769995A Intelligent battery cycle charge-discharge testing device
07/07/2010CN101769994A 50 percent discharge capacity test method for valve-controlled type sealed lead acid storage battery
07/07/2010CN101769993A Multi-channel serially connected lithium battery detector
07/07/2010CN101769992A Motor simulation system
07/07/2010CN101769991A Motor insulation deterioration detection device
07/07/2010CN101769990A System and method for testing temperature rising characteristic of motor
07/07/2010CN101769989A Control device of thermal relay test bench
07/07/2010CN101769988A Chip debugging method, system and debugging module
07/07/2010CN101769987A Detector device
07/07/2010CN101769986A Test device and test method thereof
07/07/2010CN101769985A IC (integrated circuit) assembly burn-in equipment and IC heating device used by same
07/07/2010CN101769984A Test method of light emitting diode of storage device and test tool thereof
07/07/2010CN101769983A Solar battery IPCE curve measuring device and method
07/07/2010CN101769982A Voltage endurance tester
07/07/2010CN101769981A Phase searching detection method for permanent-magnet planar motor by adopting linear Hall array
07/07/2010CN101769980A Testing method simulating power transmission debugging
07/07/2010CN101769979A Connector test fixture
07/07/2010CN101769978A Open circuit/short circuit detector of signal wire
07/07/2010CN101769977A Connector detection system
07/07/2010CN101769976A Connector detection system
07/07/2010CN101769975A Interconnected line failure detection method
07/07/2010CN101769974A Chip testing processor
07/07/2010CN101769973A Method and device for transforming electric analog signals
07/07/2010CN101769972A Locomotive signal information detector
07/07/2010CN101769971A Insulator detecting robot
07/07/2010CN101769970A Method for producing touch control procedure
07/07/2010CN101769963A Line insulation testing system
07/07/2010CN101769961A Method for testing direct current resistance of large transformer without disconnecting lead
07/07/2010CN101769954A Voltage detecting circuit for multiple serial batteries
07/07/2010CN101769952A Voltage detecting device of secondary battery module
07/07/2010CN101769947A Detection impedance
07/07/2010CN101769945A Connection structure used for measuring DC resistance of transformer
07/07/2010CN101769944A Micro detection device used for detecting LED chip
07/07/2010CN101769943A Power absorption device and testing device with power absorption device
07/07/2010CN101769942A Electronic element overturning test device and method
07/07/2010CN101769876A Method for carrying out failure analysis in semiconductor device
07/07/2010CN101769797A Temperature rise analytical method for predicting temperature of permanent magnet in permanent magnet synchronous motor
07/07/2010CN101767095A Picking and placing device of test sorting machine
07/07/2010CN101349826B Display and method for measuring contraposition set vertical bias of the display
07/07/2010CN101344538B High/low-voltage isolation circuit
07/07/2010CN101339222B Current mutual inductor coil excitation characteristic test wire winding tool equipment
07/07/2010CN101339220B Panel test circuit structure
07/07/2010CN101315404B Automatic test system of electromagnetic interference power filter
07/07/2010CN101308190B Medium voltage-resistant condition test method before burn in of tank-type plasma display board
07/07/2010CN101281215B Active mode current detecting system
07/06/2010US7752518 System and method for increasing the extent of built-in self-testing of memory and circuitry
07/06/2010US7752517 Test device and method for circuit device and manufacturing method for the same
07/06/2010US7752516 Semiconductor device and scan test method
07/06/2010US7752515 Accelerated scan circuitry and method for reducing scan test data volume and execution time
07/06/2010US7752514 Methods and apparatus for testing a scan chain to isolate defects
07/06/2010US7752513 Method and circuit for LSSD testing
07/06/2010US7752512 Semiconductor integrated circuit
07/06/2010US7752511 Devices, systems, and methods regarding a PLC system fault
07/06/2010US7752510 Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit
07/06/2010US7752476 Fast transition from low-speed mode to high-speed mode in high-speed interfaces
07/06/2010US7752155 System and computer program for compressing multi-field classification rules
07/06/2010US7752004 Method and apparatus for configuring plurality of devices on printed circuit board into desired test port configuration
07/06/2010US7751994 Intelligent battery safety management system configured to compare collected operational data with reference operational data
07/06/2010US7751993 Technique for high-impedance ground fault detection at the common DC bus of multi-axis drives
07/06/2010US7751338 Establishment of multiple upstream DOCSIS logical channels based upon performance
07/06/2010US7751333 Method and apparatus to couple a module to a management controller on an interconnect
07/06/2010US7751331 Technique for policy conflict resolution using priority with variance
07/06/2010US7751329 Providing an abstraction layer in a cluster switch that includes plural switches
07/06/2010US7751325 Method and apparatus for sketch-based detection of changes in network traffic
07/06/2010US7751320 Admission control of sessions with preference lists
07/06/2010US7751314 Load distribution between nodes in communication networks
07/06/2010US7751313 Data transmission method and apparatus
07/06/2010US7751312 System and method for packet switch cards re-synchronization
07/06/2010US7751311 High availability transport protocol method and apparatus
07/06/2010US7751310 Fault tolerant duplex computer system and its control method
07/06/2010US7751307 Communication apparatus and a method of transmitting data therefor
07/06/2010US7751160 Protective device with separate end-of-life trip mechanism
07/06/2010US7751035 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures
07/06/2010US7750663 Method and apparatus for testing an electronic motor
07/06/2010US7750662 Electro-optical device and electronic apparatus
07/06/2010US7750661 Method of testing liquid crystal display
07/06/2010US7750660 Integrated circuit with improved test capability via reduced pin count
07/06/2010US7750659 Voltage detecting circuit and semiconductor device including the same
07/06/2010US7750658 Integrated circuit and testing circuit therein for testing and failure analysis
07/06/2010US7750657 Polishing head testing with movable pedestal
07/06/2010US7750656 Circuit for distributing a test signal applied to a pad of an electronic device
07/06/2010US7750655 Multilayer substrate and probe card
07/06/2010US7750654 Probe method, prober, and electrode reducing/plasma-etching processing mechanism
07/06/2010US7750653 Automated contact alignment tool
07/06/2010US7750652 Test structure and probe for differential signals
07/06/2010US7750651 Wafer level test probe card