Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2010
06/02/2010CN101236522B Hardware module test method and apparatus
06/02/2010CN101231328B Method for evaluating fuel cell durability of city carriage
06/02/2010CN101226228B compression device and method for determined self-testing data
06/02/2010CN101226227B Test carrier plate
06/02/2010CN101226218B Method for testing life of power condenser element
06/02/2010CN101221225B Calibration method and device for battery voltage sampling
06/02/2010CN101216533B Hot cutter automatic checkout equipment and its working method
06/02/2010CN101216528B On-chip test method for microwave power amplifier chip and its test system
06/02/2010CN101187690B DC converter valve restoration period transient forward voltage test method
06/02/2010CN101183141B Straight line motor multifunctional dynamic test-bed
06/02/2010CN101174712B Hybrid battery and full charge capacity calculation method
06/02/2010CN101169468B Board back insertion type circuit breaker characteristic detection and test device
06/02/2010CN101149421B Direct current converter valve low voltage parameter operation test method
06/02/2010CN101135718B Driver circuit
06/02/2010CN101071163B Current converter test circuit
06/02/2010CN101051069B Detection method and system for AC coupling differential circuit receiver connection state
06/02/2010CN101048780B A method and apparatus for calibrating and/or deskewing communications channels
06/01/2010US7730434 Contactless technique for evaluating a fabrication of a wafer
06/01/2010US7730376 Providing high availability in a PCI-Express™ link in the presence of lane faults
06/01/2010US7730375 Method and apparatus for controlling operating modes of an electronic device
06/01/2010US7730374 Self test circuit for a semiconductor intergrated circuit
06/01/2010US7730373 Test data compression method for system-on-chip using linear-feedback shift register reseeding
06/01/2010US7730372 Device and method for testing integrated circuit dice in an integrated circuit module
06/01/2010US7730371 Testing device, testing method, computer program product, and recording medium
06/01/2010US7730367 Method and system for testing devices using loop-back pseudo random data
06/01/2010US7730210 Virtual MAC address system and method
06/01/2010US7729877 Method and system for logic verification using mirror interface
06/01/2010US7729822 Bicycle provided with an on-board control system and automatic rental system comprising said bicycles
06/01/2010US7729692 Inspection apparatus, analysis display apparatus, inspection system and inspection method
06/01/2010US7729334 Apparatus and method for transmitting data blocks based on priority
06/01/2010US7729275 Method and apparatus for non-intrusive single-ended voice quality assessment in VoIP
06/01/2010US7729270 Method for supporting on-demand performance
06/01/2010US7729269 Method for identifying and estimating mean traffic for high traffic origin-destination node pairs in a network
06/01/2010US7729261 Forwarding of network traffic in respect of differentiated restricted transit network nodes
06/01/2010US7729256 Correlating packets
06/01/2010US7729254 Parasitic time synchronization for a centralized communications guardian
06/01/2010US7729253 Reduced available bandwidth updates
06/01/2010US7729246 System and method for supporting inter-network dispatch calls
06/01/2010US7729244 Dynamic resource allocation based on quality-of-service
06/01/2010US7729241 System and method of limiting communication rates within packet-based communication networks
06/01/2010US7729239 Packet switching network end point controller
06/01/2010US7728958 Condition assessment method for a structure including a semiconductor material
06/01/2010US7728616 Apparatus and method for testing picture quality of liquid crystal display
06/01/2010US7728615 Test apparatus that tests a device under test and connecting apparatus that connects a first apparatus and a second apparatus
06/01/2010US7728614 Operating characteristic measurement device and methods thereof
06/01/2010US7728613 Device under test pogo pin type contact element
06/01/2010US7728612 Probe card assembly and method of forming same
06/01/2010US7728611 Compressive conductors for semiconductor testing
06/01/2010US7728610 Test instrument probe with MEMS attenuator circuit
06/01/2010US7728609 Replaceable probe apparatus for probing semiconductor wafer
06/01/2010US7728608 Method for assembling electrical connecting apparatus
06/01/2010US7728607 Electrical probe
06/01/2010US7728605 Wireless portable automated harness scanner system and method therefor
06/01/2010US7728604 Testing differential signal standards using device under test's built in resistors
06/01/2010US7728603 Test method for a variable capacitance measuring system
06/01/2010US7728602 Harmonic derived arc detector
06/01/2010US7728601 Method of inspecting electronic circuit
06/01/2010US7728600 System and method for determining location of phase-to-earth fault
06/01/2010US7728598 Method and apparatus for estimating the charge/discharge electricity amount of secondary batteries
06/01/2010US7728597 Electronic battery tester with databus
06/01/2010US7728580 Connecting device for electronic testing system
06/01/2010US7728579 Test head positioning system and method
06/01/2010US7728552 Battery management system and method
06/01/2010US7727780 Substrate processing method and semiconductor manufacturing apparatus
05/2010
05/27/2010WO2010060012A1 On-chip logic to support in-field or post-tape-out x-masking in bist designs
05/27/2010WO2010059651A1 Methods of screening cathode active materials
05/27/2010WO2010059247A2 Replaceable coupon for a probing apparatus
05/27/2010WO2010058839A1 Charge control device
05/27/2010WO2010058441A1 Test equipment, test method, and program
05/27/2010WO2010058410A1 Mobile powering device
05/27/2010WO2010058248A1 Logic built-in self-test system and method for applying a logic built-in self-test to a device under test
05/27/2010WO2010057954A1 Device for synchronized cell voltage measurements in several electric storage cells
05/27/2010WO2010057935A1 Method of testing solar cells
05/27/2010WO2010057429A1 Apparatus for monitoring battery voltage and temperature
05/27/2010WO2010057364A1 Apparatus for estimating the remaining life of a power converter and its method
05/27/2010WO2010008257A3 A spring assembly and a test socket using the same
05/27/2010WO2009147518A3 Test of electronic devices with boards without sockets based on independent mechanical clipping
05/27/2010US20100131218 Method of Performance Analysis for VRLA Battery
05/27/2010US20100131217 Vehicle power supply device and method of estimating state of charge of power storage device in vehicle power supply device
05/27/2010US20100131215 Insulation monitoring system & insulation detecting method for electric power supply system
05/27/2010US20100130345 Silicon nitride-melilite composite sintered body and device utilizing the same
05/27/2010US20100127861 Method, system and apparatus for monitoring in a cab signal system
05/27/2010US20100127771 Driving circuit including testing function
05/27/2010US20100127729 Ic testing methods and apparatus
05/27/2010US20100127728 Cantilever-type micro contact probe with hinge structure
05/27/2010US20100127727 Protection layers for media protection during fabrication of probe memory device
05/27/2010US20100127726 Fixing apparatus for a probe card
05/27/2010US20100127725 Replaceable coupon for a probing apparatus
05/27/2010US20100127724 Anisotropic conductive connector, probe member and wafer inspection system
05/27/2010US20100127722 CIS Circuit Test Probe Card
05/27/2010US20100127713 Testing apparatus for testing electronic system with 5-wire resistive touch panel and the method therefor
05/27/2010US20100127712 Electronic component tester
05/27/2010US20100127711 Testing apparatus for testing electronic system with 4-wires resistive touch panel and the method therefor
05/27/2010DE202010002527U1 Messanordnung zur Messung elektronischer Bauelemente mit Kontaktanordnung und Kalibriersubstrat Measuring device for measuring electronic components with contact assembly and calibration substrate
05/27/2010DE102009038251A1 Verfahren zum Bewerten von Permanentmagnetmotoren nach der Herstellung und während der Wartung A method for evaluating of permanent magnet motors after manufacture and during maintenance
05/27/2010DE102008059052A1 Verfahren und Vorrichtung zur wiederholten Bestimmung dynamischer Größen eines n-phasigen Synchronmotors mittels analoger EMK-Messung Method and device for the repeated determination of dynamic variables of a n-phase synchronous motor by means of analog EMF measurement
05/27/2010DE102008043921A1 Vorrichtung für elektrische Zellenspannungsmessungen An electrical cell voltage measurements
05/27/2010DE10132241B4 Verfahren und Vorrichtung zum Testen von Halbleiterbauelementen A method and apparatus for testing semiconductor devices
05/26/2010EP2189921A2 Diagnosis device for connection to a motor vehicle
05/26/2010EP2189800A1 Test system and daughter unit
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