| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/08/2010 | US7733917 Apparatus and method for transmitting control information in a mobile communication system |
| 06/08/2010 | US7733894 Dynamic queue management |
| 06/08/2010 | US7733846 Method and control channel for uplink signaling in a communication system |
| 06/08/2010 | US7733845 System and method for device registration replication in a communication network |
| 06/08/2010 | US7733791 Communication path monitoring system |
| 06/08/2010 | US7733788 Computer network control plane tampering monitor |
| 06/08/2010 | US7733787 Dependability measurement schema for communication networks |
| 06/08/2010 | US7733785 Method and system for dynamically adjusting packet size to decrease delays of streaming data transmissions on noisy transmission lines |
| 06/08/2010 | US7733783 Ethernet network availability |
| 06/08/2010 | US7733780 Method for managing service bandwidth by customer port and EPON system using the same |
| 06/08/2010 | US7733771 NoC semi-automatic communication architecture for “data flows” applications |
| 06/08/2010 | US7733770 Congestion control in a network |
| 06/08/2010 | US7733767 Service alarm correlation |
| 06/08/2010 | US7733766 System and method for providing quality of service provisions and congestion control in a wireless communication network |
| 06/08/2010 | US7733751 Verification method and apparatus |
| 06/08/2010 | US7733116 Method of testing a power supply controller and structure therefor |
| 06/08/2010 | US7733115 Substrate testing circuit |
| 06/08/2010 | US7733114 Test handler including gripper-type test contactor |
| 06/08/2010 | US7733113 Semiconductor test device |
| 06/08/2010 | US7733112 Semiconductor testing circuit and semiconductor testing method |
| 06/08/2010 | US7733111 Segmented optical and electrical testing for photovoltaic devices |
| 06/08/2010 | US7733110 Parallel scan distributors and collectors and process of testing integrated circuits |
| 06/08/2010 | US7733109 Test structure for resistive open detection using voltage contrast inspection and related methods |
| 06/08/2010 | US7733108 Method and arrangement for positioning a probe card |
| 06/08/2010 | US7733107 Charged device model contact plate |
| 06/08/2010 | US7733106 Apparatus and method of testing singulated dies |
| 06/08/2010 | US7733105 Voltage clamp circuit and semiconductor device, overcurrent protection circuit, voltage measurement probe, voltage measurement device and semiconductor evaluation device respectively using the same |
| 06/08/2010 | US7733104 Low force interconnects for probe cards |
| 06/08/2010 | US7733103 Probe card |
| 06/08/2010 | US7733102 Ultra-fine area array pitch probe card |
| 06/08/2010 | US7733101 Knee probe having increased scrub motion |
| 06/08/2010 | US7733100 System and method for modulation mapping |
| 06/08/2010 | US7733099 Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect |
| 06/08/2010 | US7733096 Methods of testing fuse elements for memory devices |
| 06/08/2010 | US7733094 Electrical instrument platform for mounting on and removal from an energized high voltage power conductor |
| 06/08/2010 | US7733081 Automated test equipment interface |
| 06/08/2010 | US7733078 Self-test probe design & method for non-contact voltage detectors |
| 06/08/2010 | US7732227 Method and apparatus for wall film monitoring |
| 06/03/2010 | WO2010062967A2 Test electronics to device under test interfaces, and methods and apparatus using same |
| 06/03/2010 | WO2010062431A1 Method and apparatus for synthesis of augmented multimode compactors |
| 06/03/2010 | WO2010062141A2 Apparatus and method for monitoring cell voltage of battery pack |
| 06/03/2010 | WO2010061888A1 Base member for probe unit, and probe unit |
| 06/03/2010 | WO2010061523A1 Testing method and program product used therein |
| 06/03/2010 | WO2010061055A1 Method and apparatus for detecting a phase-to-earth fault |
| 06/03/2010 | WO2010060638A1 Compensation of degradation of performance of semiconductor devices by clock duty cycle adaptation |
| 06/03/2010 | WO2010060458A1 Device and method for detecting a defective oled |
| 06/03/2010 | WO2010060253A1 The system and method for detecting the state of the transformer winding by utilizing excitation of the constant current sweep frequency power source |
| 06/03/2010 | WO2010032040A3 Arc fault location detection for aircraft wiring |
| 06/03/2010 | US20100138710 Logic verification apparatus |
| 06/03/2010 | US20100138709 Method and apparatus for delay fault coverage enhancement |
| 06/03/2010 | US20100138708 Decompressors for low power decompression of test patterns |
| 06/03/2010 | US20100138707 Processor and method for controlling storage-device test unit |
| 06/03/2010 | US20100138706 TAP sampling at double rate |
| 06/03/2010 | US20100138705 Standalone data storage device electromagnetic interference test setup and procedure |
| 06/03/2010 | US20100138179 Diagnostic system for monitoring internal conditions inside a fuel cell |
| 06/03/2010 | US20100138178 Battery capacity estimating method and apparatus |
| 06/03/2010 | US20100138177 Method for accurate battery run time estimation utilizing adaptive offset values |
| 06/03/2010 | US20100138176 System for accurate battery run time estimation utilizing voltage capture and coulomb counting |
| 06/03/2010 | US20100138175 Method for accurate battery run time estimation utilizing load-condition voltage |
| 06/03/2010 | US20100135372 Demodulator for a Multi-Pair Gigabit Transceiver |
| 06/03/2010 | US20100135371 Dynamic regulation of power consumption of a high-speed communication system |
| 06/03/2010 | US20100134137 Liquid crystal display panel and its inspecting method |
| 06/03/2010 | US20100134136 Operating method of test handler |
| 06/03/2010 | US20100134135 Semiconductor device test apparatus |
| 06/03/2010 | US20100134134 Test electronics to device under test interfaces, and methods and apparatus using same |
| 06/03/2010 | US20100134133 Method for performing an electrical testing of electronic devices |
| 06/03/2010 | US20100134132 Monitoring circuit having a self test function |
| 06/03/2010 | US20100134131 Electrochemically Fabricated Microprobes |
| 06/03/2010 | US20100134130 Integrated circuit probing apparatus having a temperature-adjusting mechanism |
| 06/03/2010 | US20100134129 Mechanical decoupling of a probe card assembly to improve thermal response |
| 06/03/2010 | US20100134127 Mechanical decoupling of a probe card assembly to improve thermal response |
| 06/03/2010 | US20100134126 Probe and method for manufacturing the same |
| 06/03/2010 | US20100134125 Built-in compliance in test structures for leakage and dielectric breakdown of dielectric materials of metallization systems of semiconductor devices |
| 06/03/2010 | US20100134121 Electrical connecting apparatus |
| 06/03/2010 | US20100134120 Procedure for checking the functionality of an electric heating device |
| 06/03/2010 | US20100134119 Microcircuit testing interface having kelvin and signal contacts within a single slot |
| 06/03/2010 | US20100134118 Testing apparatus for hard disk drive |
| 06/03/2010 | US20100134117 Method and Device for Capturing a Fault in an Electrical Supply Grid |
| 06/03/2010 | US20100134090 Stun Device Testing Apparatus and Methods |
| 06/02/2010 | EP2192416A1 Method and apparatus for detecting a phase-to-earth fault |
| 06/02/2010 | EP2191611A1 Designing a network |
| 06/02/2010 | EP2191606A1 Method and device for recording jitter data |
| 06/02/2010 | EP2191285A1 Testable integrated circuit and test method |
| 06/02/2010 | EP2191284A1 Semiconductor device test system having reduced current leakage |
| 06/02/2010 | EP2191127A2 Method and device for controlling an engine stop/restart system to be mounted on an automobile |
| 06/02/2010 | EP1306826B1 Drive circuit of display and display |
| 06/02/2010 | EP1084419B1 Method of and device for determining the charge condition of a battery |
| 06/02/2010 | DE202010002560U1 Flexibler Messadapter zur Rastererweiterung der Anschlusspins von elektronischen Bauteilen (Pinarrays) Flexible measuring adapter for grid extension of the connector pins of electronic components (Pinarrays) |
| 06/02/2010 | DE112008001172T5 Prüfgerät und Prüfverfahren Tester and test methods |
| 06/02/2010 | DE102009044475A1 Prüfbaugruppe und Prüfsystem Test board and test system |
| 06/02/2010 | DE102008044115A1 Method for detecting switching positions of switch of switching element in single wire-bus system of motor vehicle, involves determining switching position of switches on basis of detected voltage- and current values |
| 06/02/2010 | DE102008026901B4 Datenübertragungssystem mit Ortungs-, Identifikations- und Messfunktion sowie ein Verfahren hierzu Data transmission system with detection, identification and measurement function and a method therefor |
| 06/02/2010 | CN201499101U Three-phase reversible converter based on DSP and single chip and fault diagnosis system thereof |
| 06/02/2010 | CN201498981U 10KV Low-current grounding wire selection system |
| 06/02/2010 | CN201498183U Plane liquid crystal control display assembly automatic test system |
| 06/02/2010 | CN201498044U Hardware fault detection device for delivery mechanism of vending machine |
| 06/02/2010 | CN201497843U Panel measuring tool and relevant panel measuring module |
| 06/02/2010 | CN201497800U Automatic testing device for meter reading system |
| 06/02/2010 | CN201497799U Fluorescent lamp characteristic detector |
| 06/02/2010 | CN201497798U Full-automatic battery performance testing device |