| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/06/2010 | US7750646 Detector for precursive detection of electrical arc |
| 07/06/2010 | US7750643 Process and system for detecting surface anomalies |
| 07/06/2010 | US7750622 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture |
| 07/06/2010 | US7750598 Battery charger user interface |
| 07/06/2010 | US7750501 System and method of over voltage control for a power system |
| 07/06/2010 | US7749566 coating the plate with a colorant and ablating colorant adjacent holes, which are either populated or empty, the difference being easy to spot |
| 07/06/2010 | US7748989 Conductive-contact holder and conductive-contact unit |
| 07/06/2010 | CA2375326C Test probe and connector |
| 07/01/2010 | WO2010075409A1 A system and method for recovery of packets in overlay networks |
| 07/01/2010 | WO2010075201A1 Packet aggregation and fragmentation at layer-2 over a managed network |
| 07/01/2010 | WO2010074968A2 Enabling a charge limited device to operate for a desired period of time |
| 07/01/2010 | WO2010074814A2 Radio frequency (rf) signal generator and method for providing test signals for testing multiple rf signal receivers |
| 07/01/2010 | WO2010074682A1 Polymeric structures and methods for producing and monitoring polymeric structures |
| 07/01/2010 | WO2010074290A1 Integrated circuit and battery monitoring device utilizing the same |
| 07/01/2010 | WO2010073919A1 Method for controlling testing device |
| 07/01/2010 | WO2010073624A1 Semiconductor device and method for testing the same |
| 07/01/2010 | WO2010073523A1 Semiconductor integrated circuit |
| 07/01/2010 | WO2010073489A1 Switch device and testing device |
| 07/01/2010 | WO2010073460A1 Electrically connecting device for semiconductor device and contact used in the electrically connecting device |
| 07/01/2010 | WO2010073458A1 Timing generator, test device, and test rate control method |
| 07/01/2010 | WO2010073359A1 Prober, testing apparatus, and method for inspecting semiconductor chip |
| 07/01/2010 | WO2010073245A1 System and methods for parametric testing |
| 07/01/2010 | WO2010072717A1 Method for detecting an electric arc in photovoltaic equipment |
| 07/01/2010 | WO2010042385A3 Storage device emulator and method of use thereof |
| 07/01/2010 | WO2010040161A3 Switching apparatus for electrical contact testing |
| 07/01/2010 | WO2010039500A3 Light soaking system and test method for solar cells |
| 07/01/2010 | WO2009130460A8 Method and system for detecting timing characteristics in a communications system |
| 07/01/2010 | WO2009058233A9 Equipment mounting systems and methods for identifying equipment |
| 07/01/2010 | US20100169856 Transparent test method and scan flip-flop |
| 07/01/2010 | US20100169728 Decoupled clocking in testing architecture and method of testing |
| 07/01/2010 | US20100169727 Eda tool, semiconductor device, and scan chain configuration method |
| 07/01/2010 | US20100169481 Test system for semiconductor devices based on network monitoring |
| 07/01/2010 | US20100169033 State Of Charge Determination |
| 07/01/2010 | US20100169030 Machine condition assessment through power distribution networks |
| 07/01/2010 | US20100169029 Diagnosis and position identification for remote capacitor banks |
| 07/01/2010 | US20100167430 Apparatus and method for testing a transducer and/or electronic circuitry associated with a transducer |
| 07/01/2010 | US20100165841 QUALITY OF SERVICE FOR iSCSI |
| 07/01/2010 | US20100165527 Protection for bi-directional switch |
| 07/01/2010 | US20100165520 Method and Apparatus For Tripping Circuit Breaker |
| 07/01/2010 | US20100164735 System And Method For Testing Power Transistors |
| 07/01/2010 | US20100164671 Integrated electronic device with transceiving antenna and magnetic interconnection |
| 07/01/2010 | US20100164535 Semiconductor device and semiconductor testing method |
| 07/01/2010 | US20100164534 Radiation Sensor and Dosimeter |
| 07/01/2010 | US20100164533 Method and apparatus for evaluating the effects of stress on an rf oscillator |
| 07/01/2010 | US20100164532 Apparatus and method for measuring characteristics of semiconductor device |
| 07/01/2010 | US20100164531 Tunable stress technique for reliability degradation measurement |
| 07/01/2010 | US20100164530 Adjusting configuration of a multiple gate transistor by controlling individual fins |
| 07/01/2010 | US20100164529 Semiconductor device test system |
| 07/01/2010 | US20100164528 Methods and Apparatus to Test Electronic Devices |
| 07/01/2010 | US20100164527 Test module with blocks of universal and specific resources |
| 07/01/2010 | US20100164526 mems probe for probe cards for integrated circuits |
| 07/01/2010 | US20100164525 Test socket, test apparatus with test socket |
| 07/01/2010 | US20100164524 Zif connectors and semiconductor testing device and system using the same |
| 07/01/2010 | US20100164523 System for testing connections of two connectors |
| 07/01/2010 | US20100164522 Signal testing apparatus |
| 07/01/2010 | US20100164521 Parametric Testline with Increased Test Pattern Areas |
| 07/01/2010 | US20100164520 Method and apparatus for testing integrated circuit |
| 07/01/2010 | US20100164519 Testing of electronic circuits using an active probe integrated circuit |
| 07/01/2010 | US20100164518 Probe card |
| 07/01/2010 | US20100164517 Conductive film structure, fabrication method thereof, and conductive film type probe device for ics |
| 07/01/2010 | US20100164510 Liquid tim dispense and removal method and assembly |
| 07/01/2010 | US20100164509 Detecting system for detecting connection of connectors and connector assemblies having same |
| 07/01/2010 | US20100164508 System and method for test structure on a wafer |
| 07/01/2010 | US20100164507 Digital fault detection circuit and method |
| 07/01/2010 | US20100164506 Method for testing an electronics unit |
| 07/01/2010 | US20100164505 Cable diagnostics for base-T systems |
| 07/01/2010 | US20100164504 Passive intermodulation (pim) distance to fault analyzer with selectable harmonic level |
| 07/01/2010 | US20100164503 Directional zone select interlock method |
| 07/01/2010 | US20100164501 Alternating current switch device and method for the monitoring or diagnosis of the operability of an alternating current switch device |
| 07/01/2010 | US20100164482 Centering device for electronic components, particularly ics |
| 07/01/2010 | US20100164100 Bump-on-Lead Flip Chip Interconnection |
| 07/01/2010 | US20100163217 Advanced thermal control interface |
| 07/01/2010 | US20100162828 Testing system and method for motor |
| 07/01/2010 | DE10335809B4 Integrierte Schaltung mit einem zu testenden elektronischen Schaltkreis und Testsystem-Anordnung zum Testen der integrierten Schaltung Integrated circuit with a test circuit and test electronic assembly system for testing the integrated circuit |
| 07/01/2010 | DE102009060313A1 Ladeanzeigevorrichtung für Elektrofahrzeuge Charge indicator device for electric vehicles |
| 07/01/2010 | DE102009040613A1 Integrierte Halbleiterschaltungsvorrichtung und Testanschlussanordnungsverfahren Semiconductor integrated circuit device and test terminal assembly method |
| 07/01/2010 | DE10126800B4 Verfahren und Vorrichtung zum Testen der ESD-Festigkeit eines Halbleiter-Bauelements Method and device for testing the ESD immunity of a semiconductor device |
| 07/01/2010 | DE10045671B4 Testvorrichtung und Testverfahren für eine integrierte Halbleiterschaltung Test apparatus and test method for a semiconductor integrated circuit |
| 07/01/2010 | DE10000365B4 Spannungskontrastverfahren zum Nachweis von Defekten in einem strukturiertem Substrat Voltage contrast method for detecting defects in a textured substrate |
| 07/01/2010 | CA2746866A1 Method for detecting an electric arc in photovoltaic equipment |
| 06/30/2010 | EP2202836A1 Secondary battery state detecting device |
| 06/30/2010 | EP2202529A2 Twisted-pair electrical cable testing |
| 06/30/2010 | EP2202528A1 Method for calibrating a transmission line pulse test system |
| 06/30/2010 | EP2202147A1 Operations support systems and methods for power management |
| 06/30/2010 | EP2201397A1 Method and device for measuring cell voltages in a plurality of series-connected accumulator cells |
| 06/30/2010 | EP2201396A1 Method for monitoring and adjusting circuit performance |
| 06/30/2010 | EP2201395A2 Fully x-tolerant, very high scan compression scan test systems and techniques |
| 06/30/2010 | EP2201394A2 Semiconductor wafer metrology apparatus and method |
| 06/30/2010 | EP2201393A1 Method for fault location on series compensated power transmission lines with two-end unsynchronized measurement |
| 06/30/2010 | CN201518472U Parallel resonance oscillating wave generating device |
| 06/30/2010 | CN201518335U Distributed power supply, measurement and teleportation device of storage battery group |
| 06/30/2010 | CN201518054U PWM module testing device |
| 06/30/2010 | CN201518053U Portable power supply quality tester |
| 06/30/2010 | CN201518052U Portable all-digital relay protection transient closed-loop tester |
| 06/30/2010 | CN201518051U Device for quickly detecting assembling and wiring accuracy of a vacuum circuit breaker cart |
| 06/30/2010 | CN201518050U Enamelled wire stator brine spray test device |
| 06/30/2010 | CN201518049U Distribution transformer monitoring metering terminal |
| 06/30/2010 | CN201518044U Remote monitoring and recording unit of power supply lightning protection box |
| 06/30/2010 | CN201518035U Gas discharge lamp high-frequency reference device |
| 06/30/2010 | CN201518034U Test voltage testing clip |