Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2010
09/29/2010CN101846709A Short circuit test board for circuit of flexible circuit board and test method thereof
09/29/2010CN101846708A Method for detecting power-failure counting function of distribution transformer terminals in batch
09/29/2010CN101846707A Equipment and method for riding through testing platform at low voltage on low-voltage side
09/29/2010CN101846701A Unbalance vector tester and method for adjusting balance of H-bridge capacitor set
09/29/2010CN101846695A Test probe and probe base
09/29/2010CN101846665A Test device for simulation combustion of environment-friendly electric wire
09/29/2010CN101846635A Ultra-high vacuum multifunctional integrated test system
09/29/2010CN101846590A Press testing rod capable of finely adjusting error
09/29/2010CN101843442A Anti-dry heating soymilk machine and anhydrous anti-dry heating detecting method
09/29/2010CN101464921B Method and system for generating test vector of chip technology regulation
09/29/2010CN101458405B Liquid crystal display panel and test method thereof
09/29/2010CN101424705B Probe column, wafer testing seat and wafer testing system
09/29/2010CN101419345B Display driver and built-in test circuit thereof
09/29/2010CN101398539B Display module
09/29/2010CN101387676B Large-sized transformer core and on-line monitoring and protecting system for insulaiton fault of clamps
09/29/2010CN101387581B Automated verification system for automatic transfer switch electric appliance
09/29/2010CN101365146B Minimized embedded type broadcast television monitoring direction measuring station system
09/29/2010CN101364174B Test file generation system and method for printed circuit board
09/29/2010CN101349735B Method for testing light ionization cross section of deep energy level center in wide band cap semiconductor material
09/29/2010CN101344566B Test device and method for detecting winding deformation of power transformer
09/29/2010CN101339225B Test interface possessing hybrid signal processing apparatus
09/29/2010CN101324647B Method and apparatus for monitoring motorcycle electric appliance operation
09/29/2010CN101320542B Detecting device of organic electroluminescent device
09/29/2010CN101315415B Judgment method for quality of battery pole piece to be tested
09/29/2010CN101295002B Interconnection line failure detecting method
09/29/2010CN101285867B Electrical insulation electric heating ageing testing equipment
09/29/2010CN101283283B Plug-in piece, test bracket as well as semiconductor test device
09/29/2010CN101275895B Sample platform system for in-situ measuring Na electronic device property in transmission electron microscope
09/29/2010CN101267043B Method and apparatus for monitoring fuel cells
09/29/2010CN101261284B Wafer adsorption and unloading device capable of longitudinally elevating and horizontally rotating
09/29/2010CN101226220B Reference current source circuit and infrared signal processing circuit
09/29/2010CN101206249B Electronic load device
09/29/2010CN101199059B Monolithically integrated semiconductor assembly comprising a power component and method for producing a monolithically integrated semiconductor assembly
09/29/2010CN101166985B Site-aware objects
09/29/2010CN101162254B Cpu slot testing device
09/29/2010CN101159820B Multifunctional development design device for linear array CCD
09/29/2010CN101153894B Electricity quantity detecting method, electricity quantity detecting system and electronic equipment using the same method
09/29/2010CN101149416B Power cable insulation state monitoring and life span management system
09/29/2010CN101149413B Method for optimizing probe station pricking times
09/29/2010CN101147077B Simultaneous core testing in multi-core integrated circuits
09/29/2010CN101144848B Multifunctional integrative life experimental platform and its control method
09/29/2010CN101140301B Zero waiting current accurate excess voltage comparators
09/29/2010CN101131416B Method for appraising sphere nickel fast charging and discharging performance
09/29/2010CN101126796B Battery electric quantity detecting method and device
09/29/2010CN101120261B Circuitry and method for an AT-speed scan test
09/29/2010CN101109788B Intelligent brake switching test fixture of breaker
09/29/2010CN101109787B Intelligent detecting device for under-voltage releasing equipment of breaker
09/29/2010CN101084447B System for testing and burning in of integrated circuits
09/29/2010CN101083507B IEEE1149.1 protocol based universal test IP method
09/29/2010CN101082633B IC detecting machine capable of simultaneously multiple parallel built-in testing
09/29/2010CN101057154B System and method for on-chip jitter injection
09/29/2010CN101055305B Circuit diagnostics switch system
09/29/2010CN101044728B Fast reroute (frr) protection at the edge of a rfc 2547 network
09/29/2010CN101031807B Test device, configuration method, and device interface
09/29/2010CN101025426B Probe assembly
09/29/2010CN101000881B Image sensor testing method and apparatus
09/28/2010US7805651 Phase shifter with reduced linear dependency
09/28/2010US7805650 Semiconductor integrated circuit and debug mode determination method
09/28/2010US7805649 Method and apparatus for selectively compacting test responses
09/28/2010US7805648 Shift-frequency scaling
09/28/2010US7805647 System and method for testing a plurality of circuits
09/28/2010US7805646 LSI internal signal observing circuit
09/28/2010US7805644 Multiple pBIST controllers
09/28/2010US7805264 Method of calculating internal resistance of secondary battery for vehicle
09/28/2010US7804837 Changing of channel capabilities
09/28/2010US7804786 Method and apparatus for determining path loss by combining geolocation with interference suppression
09/28/2010US7804782 Method and apparatus for programmable generation of traffic streams
09/28/2010US7804781 Methods and apparatus to detect border gateway protocol session failures
09/28/2010US7804780 Receiving and transmitting devices for providing fragmentation at a transport level along a transmission path
09/28/2010US7804773 System and method of managing data flow in a network
09/28/2010US7804767 Protection/restoration of MPLS networks
09/28/2010US7804318 Burning system having optic-electric transformer and comparator circuit and method for burning liquid crystal display
09/28/2010US7804317 Test device for determining charge damage to a transistor
09/28/2010US7804316 Pusher, pusher unit and semiconductor testing apparatus
09/28/2010US7804315 Probe card
09/28/2010US7804314 Adjustable electrical probes for circuit breaker tester
09/28/2010US7804313 Semiconductor device
09/28/2010US7804312 Silicon wafer for probe bonding and probe bonding method using thereof
09/28/2010US7804310 Current detection circuit and current detection method
09/28/2010US7804303 Apparatus and method for detecting a brush liftoff in a synchronous generator rotor circuit
09/28/2010US7804294 Non contact method and apparatus for measurement of sheet resistance of P-N junctions
09/28/2010US7804293 Power supply and stabilizer
09/28/2010US7804292 Method for testing integrated circuits mounted on a carrier
09/28/2010US7804291 Semiconductor test device with heating circuit
09/28/2010US7804209 Arrangement in an electrical machine
09/28/2010US7803642 Evaluation method of semiconductor device
09/23/2010WO2010108089A2 Display device for measurement tool
09/23/2010WO2010108011A2 Planar contact with solder
09/23/2010WO2010107540A1 Presence network agent in ims networks
09/23/2010WO2010107199A2 Apparatus for measuring ground leakage current in an ungrounded direct current power system, and method for same
09/23/2010WO2010106588A1 Electrical storage device and electronic circuit device used for same
09/23/2010WO2010106141A1 A power cell system with means for detecting a discontinuity
09/23/2010WO2010106059A1 Method and device for the isolation monitoring of an it network
09/23/2010WO2010088302A3 A circuit for detecting tier-to-tier couplings in stacked integrated circuit devices
09/23/2010WO2010085381A3 Reducing far-end crosstalk in chip-to-chip communication systems and components
09/23/2010US20100241917 Gating tap register control bus and auxiliary/wrapper test bus
09/23/2010US20100241916 Scan test circuit and method for changing circuit to scan test circuit
09/23/2010US20100241915 Ieee 1149.1 and p1500 test interfaces combined circuits and processes
09/23/2010US20100241900 System to determine fault tolerance in an integrated circuit and associated methods
09/23/2010US20100241377 Battery management system and charger
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