Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2010
10/05/2010US7810004 Integrated circuit having a subordinate test interface
10/05/2010US7810003 Method of generating test clock signal and test clock signal generator for testing semiconductor devices
10/05/2010US7810002 Providing trusted access to a JTAG scan interface in a microprocessor
10/05/2010US7810001 Parallel test system
10/05/2010US7810000 Circuit timing monitor having a selectable-path ring oscillator
10/05/2010US7809999 Ternary search process
10/05/2010US7809997 Semiconductor device, unique ID of semiconductor device and method for verifying unique ID
10/05/2010US7809520 Test equipment, method for loading test plan and program product
10/05/2010US7809461 Working apparatus and working method for circuit board
10/05/2010US7808961 Radio communication system and radio communication method
10/05/2010US7808914 Method and apparatus for realizing the interworking of OAM function between the Ethernet and the MPLS network
10/05/2010US7808911 Dynamic firewall for NSP networks
10/05/2010US7808909 Method and a system for matching between network nodes
10/05/2010US7808904 Method and apparatus for managing subscriber profiles
10/05/2010US7808903 System and method of forecasting usage of network links
10/05/2010US7808900 Method, apparatus, and medium for providing multimedia service considering terminal capability
10/05/2010US7808894 Managing bursts of traffic in such a manner as to improve the effective utilization of session servers
10/05/2010US7808892 Redundant data distribution systems and methods
10/05/2010US7808890 Forwarding data in a data communications network
10/05/2010US7808888 Network fault correlation in multi-route configuration scenarios
10/05/2010US7808267 Module and method for detecting defect of thin film transistor substrate
10/05/2010US7808266 Method and apparatus for evaluating the effects of stress on an RF oscillator
10/05/2010US7808265 Differential voltage defectivity monitoring circuit
10/05/2010US7808264 Isolated conductive leads extending across to opposite sides of IC
10/05/2010US7808263 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions
10/05/2010US7808262 Integrated systems testing
10/05/2010US7808261 Contact with plural beams
10/05/2010US7808260 Probes for a wafer test apparatus
10/05/2010US7808259 Component assembly and alignment
10/05/2010US7808258 Test interposer having active circuit component and method therefor
10/05/2010US7808257 Ionization test for electrical verification
10/05/2010US7808253 Test method of microstructure body and micromachine
10/05/2010US7808252 Measurement apparatus and measurement method
10/05/2010US7808249 Methods and apparatus for measuring a length of a cable
10/05/2010US7808248 Radio frequency test key structure
10/05/2010US7808247 Fast cable tester
10/05/2010US7808246 Apparatus and method for verifying a seal between multiple chambers
10/05/2010US7808245 Testing method for a ground fault detector
10/05/2010US7808226 Line tracing method and apparatus utilizing non-linear junction detecting locator probe
10/05/2010US7808210 Battery charge indication methods, battery charge monitoring devices, rechargeable batteries, and articles of manufacture
10/05/2010US7808128 Remote monitoring of control decisions for network protectors
10/05/2010US7808092 Semiconductor device with a plurality of ground planes
10/05/2010US7807998 Evaluation pattern suitable for evaluation of lateral hillock formation
10/05/2010US7807997 Test element group (TEG) system for measurement of SOI-MOSFET without a body contact comprising first and second TEGs of unequal gate electrode areas
10/05/2010US7807933 Radio frequency isolation container
10/05/2010US7807494 Method for producing a chalcogenide-semiconductor layer of the ABC2 type with optical process monitoring
10/05/2010US7807481 Method of semiconductor device protection, package of semiconductor device
10/01/2010CA2698848A1 An efficient method for calculating the dot product in fault detection algorithms
10/01/2010CA2697991A1 System for monitoring the energy efficiency of technology components
09/2010
09/30/2010WO2010111590A2 System and method for improved testing of electronic devices
09/30/2010WO2010111532A1 Scrub inducing compliant electrical contact
09/30/2010WO2010111526A1 System for testing an integrated circuit of a device and its method of use
09/30/2010WO2010111293A2 Battery life estimation
09/30/2010WO2010110699A1 Patch panel port identification system
09/30/2010WO2010110589A2 Insulation resistance measuring circuit free from influence of battery voltage
09/30/2010WO2010110377A1 Secondary battery device and vehicle
09/30/2010WO2010109990A1 Battery system for vehicle
09/30/2010WO2010109977A1 Method for calculating residual capacity of sodium-sulfur battery
09/30/2010WO2010109847A1 Testing device, calibration method, and program
09/30/2010WO2010109784A1 Cell abnormality detection circuit and power supply device
09/30/2010WO2010109740A1 Test device, test method, and production method
09/30/2010WO2010109739A1 Manufacturing apparatus, manufacturing method and package device
09/30/2010WO2010109678A1 Handler having position correction function
09/30/2010WO2010109413A1 Device and method for locating partial discharges
09/30/2010WO2010109382A1 Device and method for locating partial discharges
09/30/2010WO2010109308A2 Zero current transformer and electric leak detector
09/30/2010WO2010109211A1 Apparatuses and methods for coupling a signal to and/or from a cable
09/30/2010WO2010108789A1 Remote identification device associated with a vehicle including means for remotely communicating with the associated vehicle
09/30/2010US20100251048 Bdx data in stable states
09/30/2010US20100251047 Circuit module, semiconductor integrated circuit, and inspection apparatus and method thereof
09/30/2010US20100251046 Failure prediction circuit and method, and semiconductor integrated circuit
09/30/2010US20100251045 High Speed Clock Control
09/30/2010US20100251040 Method and apparatus for evaluating and optimizing a signaling system
09/30/2010US20100251001 Enabling Resynchronization Of A Logic Analyzer
09/30/2010US20100250194 Electrical system integrity testing methods and apparatus
09/30/2010US20100250164 Battery End of Life Determination
09/30/2010US20100250163 Control device of secondary battery and map correction method
09/30/2010US20100250162 Battery life estimation
09/30/2010US20100250158 Enhanced characterization of electrical connection degradation
09/30/2010US20100246933 Pattern Inspection Method And Apparatus
09/30/2010US20100246389 Transmission system, repeater and receiver
09/30/2010US20100244887 Method for detecting a step loss condition
09/30/2010US20100244886 State Detection Device for Power Supply System
09/30/2010US20100244885 Under-voltage and over-voltage detection circuit and driving method thereof
09/30/2010US20100244884 Test apparatus and driver circuit
09/30/2010US20100244883 Compensation for voltage drop in automatic test equipment
09/30/2010US20100244882 Burn-In Test Method and System
09/30/2010US20100244881 Transmission characteristics measurement apparatus, transmission characteristics measurement method, and electronic device
09/30/2010US20100244880 Test apparatus and driver circuit
09/30/2010US20100244879 Apparatus for mass die testing
09/30/2010US20100244878 Pll burn-in circuit and semiconductor integrated circuit
09/30/2010US20100244877 Method and apparatus for controlling position of z-axis for wafer prober
09/30/2010US20100244876 Method for setting contact parameter and recording medium having program for setting contact parameter recorded thereon
09/30/2010US20100244874 test structure and probe for differential signals
09/30/2010US20100244873 Apparatus and method of testing singulated dies
09/30/2010US20100244872 Inspection socket and method of producing the same
09/30/2010US20100244871 Space transformer connector printed circuit board assembly
09/30/2010US20100244870 Dopant profile measurement module, method and apparatus
09/30/2010US20100244869 Probe for electrical inspection, method for fabricating the same, and method for fabricating a semiconductor device
09/30/2010US20100244868 Wireless Clamp-on Current Probe
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