Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2010
10/13/2010CN101413988B MCM / HIC circuit total dose irradiation testing method based on low energy X ray
10/13/2010CN101398456B Test card and automatic test method thereof
10/13/2010CN101382573B Induction voltage testing method
10/13/2010CN101350530B Charger with illumination function
10/13/2010CN101349737B Method for detecting electric motor state and discriminating start-up course
10/13/2010CN101349726B Method and apparatus for malfunction detection of general-purpose input/output interface
10/13/2010CN101349724B Large-scale transformer differential protective system test method
10/13/2010CN101316037B Aftercurrent action protector with self-diagnostic function
10/13/2010CN101308185B Direct current supply line electrical leakage detection circuit
10/13/2010CN101299315B Test system for display panel
10/13/2010CN101299125B Array tester
10/13/2010CN101241160B Electronic components test seat detection device and its detection method
10/13/2010CN101236225B Electric network transformer monitoring device monitoring method
10/13/2010CN101231307B Test arrangement capable of preventing electromagnetic interference and test approach thereof
10/13/2010CN101158713B Compact type energy conserving lamp magnetic characteristic curve definitions and measurement method thereof
10/13/2010CN101156282B Contact for electronic devices
10/13/2010CN101149417B Screen performance test method for veneer with built-in electromagnetic layer
10/13/2010CN101126794B Integrated circuit
10/13/2010CN101082648B Method and apparatus for testing flying vehicle electric systemic
10/13/2010CN101082631B IC detecting machine capable of simultaneously multiple parallel built-in testing
10/13/2010CN101043277B Pulse synchronized method and unit in receptivity test of mobile communication terminal
10/12/2010US7814387 Circuit state scan-chain, data collection system and emulation and verification method
10/12/2010US7814386 Built in self test for input/output characterization
10/12/2010US7814385 Self programmable shared bist for testing multiple memories
10/12/2010US7814384 Electrical diagnostic circuit and method for the testing and/or the diagnostic analysis of an integrated circuit
10/12/2010US7814383 Compacting circuit responses
10/12/2010US7814381 Semiconductor memory device
10/12/2010US7814379 Memory module packaging test system
10/12/2010US7814377 Non-volatile memory system with self test capability
10/12/2010US7814339 Leakage power estimation
10/12/2010US7813815 Digital measuring system and method for integrated circuit chip operating parameters
10/12/2010US7813695 Mobile assisted relay selection in a telecommunications system
10/12/2010US7813360 Controlling device access fairness in switched fibre channel fabric loop attachment systems
10/12/2010US7813344 End user circuit diversity auditing methods
10/12/2010US7813290 Program, method and apparatus for collecting information
10/12/2010US7813288 Transaction detection in link based computing system
10/12/2010US7813279 System for rate management of aggregate-rate communication services
10/12/2010US7813278 Systems and methods for selectively performing explicit congestion notification
10/12/2010US7813274 Dynamic demultiplexing of network traffic
10/12/2010US7813271 Aggregated link traffic protection
10/12/2010US7813266 Self-healing chip-to-chip interface
10/12/2010US7813264 High capacity router having redundant components
10/12/2010US7813263 Method and apparatus providing rapid end-to-end failover in a packet switched communications network
10/12/2010US7812628 Method of on-chip current measurement and semiconductor IC
10/12/2010US7812627 Test device
10/12/2010US7812626 High density interconnect system for IC packages and interconnect assemblies
10/12/2010US7812625 Chip test apparatus and probe card circuit
10/12/2010US7812624 Testing method for LED module
10/12/2010US7812623 Transparent conductive film roll and production method thereof, touch panel using the same, and non-contact surface resistance measuring device
10/12/2010US7812621 Measuring apparatus and method for measuring a surface capacitance of an insulating film
10/12/2010US7812615 Method and device for fault detection in transformers or power lines
10/12/2010US7812612 Method and apparatus for monitoring the operation of a gas discharge lamp
10/12/2010US7812595 Electronic device identifying method
10/12/2010US7812589 Modified current source (MCS) with seamless range switching
10/12/2010US7812347 Integrated circuit and methods of measurement and preparation of measurement structure
10/12/2010US7811893 Shallow trench isolation stress adjuster for MOS transistor
10/12/2010US7811842 LED array
10/12/2010CA2522902C Method and system for improved single-ended loop make-up identification
10/12/2010CA2481260C Method and device for conditioning semiconductor wafers and/or hybrids
10/12/2010CA2435333C Method of an apparatus for testing wiring
10/07/2010WO2010115151A1 Fault tolerant time synchronization
10/07/2010WO2010114281A2 Voltage-detecting member, and battery module including same
10/07/2010WO2010114164A1 Spring wire, contact probe, and probe unit
10/07/2010WO2010113763A1 Solar power generation system and power line for solar power generation system
10/07/2010WO2010113500A1 Switch operation device and switch for three-phase system
10/07/2010WO2010113263A1 Semiconductor integrated circuit and power source voltage control method
10/07/2010WO2010113223A1 Hybrid operating machinery
10/07/2010WO2010113066A1 A method of monitoring the performance of a semiconductor laser diode arrangement
10/07/2010WO2010113059A1 Device for characterizing current transients produced by ionizing particles interacting with a block of transistors in a logic gate
10/07/2010WO2010112989A1 Wide-band electromagnetic field detector and analysis system for aircraft
10/07/2010WO2010112763A1 Method of checking the directivity and polarization of coherent field distributions in a reverberant medium
10/07/2010WO2010112207A1 Optical cable, having encoded information on length and type of cable
10/07/2010WO2010112181A1 Device for diagnosing measurement objects using a measurement voltage
10/07/2010WO2010112131A1 Monitoring a microgenerator circuit of a rotary encoder device
10/07/2010WO2010111979A1 Electronic circuit for the evaluation of information from variable electric resistance sensors
10/07/2010WO2010078119A3 Immersion sensor to protect battery
10/07/2010WO2010069989A3 Method and system for testing wind turbine plants
10/07/2010WO2010068858A3 System and method for detecting impaired electric power equipment
10/07/2010WO2010056343A8 Fast open circuit detection for open power and ground pins
10/07/2010WO2009118239A3 Method for checking the operability of a switching unit
10/07/2010US20100257418 Selectively accessing test access ports in a multiple test access port environment
10/07/2010US20100257417 Compressing test responses using a compactor
10/07/2010US20100256942 Sensor with subassemblies featuring storage devices
10/07/2010US20100256937 Method using time to digital converter for direct measurement of set pulse widths
10/07/2010US20100256936 Monitoring State of Charge of a Battery
10/07/2010US20100256935 Secondary cell degradation state judgment system
10/07/2010US20100256933 Method of detecting changes in integrated circuits using thermally imaged test patterns
10/07/2010US20100254264 Methods, systems, and computer readable media for dynamically rate limiting slowpath processing of exception packets
10/07/2010US20100254056 Efficient method for calculating the dot product in fault detection algorithms
10/07/2010US20100253382 System and Method for Observing Threshold Voltage Variations
10/07/2010US20100253381 On-Chip Logic To Support In-Field Or Post-Tape-Out X-Masking In BIST Designs
10/07/2010US20100253380 Dielectric film and layer testing
10/07/2010US20100253379 Method and Apparatus for Probing a Wafer
10/07/2010US20100253378 Probe for high frequency signal transmission
10/07/2010US20100253377 Active wafer probe
10/07/2010US20100253376 Leak detector comprising a position determining system for the hand-operated probe
10/07/2010US20100253375 Anchoring carbon nanotube columns
10/07/2010US20100253374 Method and apparatus for Terminating A Test Signal Applied To Multiple Semiconductor Loads Under Test
10/07/2010US20100253364 Method and system for passively detecting and locating wire harness defects
10/07/2010US20100253363 Method and system for cable detection
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