Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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03/11/1997 | US5610715 Displacement detecting system, an expose apparatus, and a device manufacturing method employing a scale whose displacement is detected by a selected detection head |
03/11/1997 | US5610712 Laser diffraction particle sizing method using a monomode optical fiber |
03/11/1997 | US5610407 Optical image scanning apparatus detecting sheet size and displacement |
03/11/1997 | US5610392 Method to observe film thickness and/or refractive index by color difference |
03/11/1997 | US5610391 Optical inspection of container finish dimensional parameters |
03/11/1997 | US5610326 Non-destructive process for characterizing the surface condition of a part |
03/11/1997 | US5609718 Method and apparatus for measuring a change in the thickness of polishing pads used in chemical-mechanical planarization of semiconductor wafers |
03/11/1997 | CA2008137C Light waveguide sensor for small or pressing forces |
03/06/1997 | WO1997008541A1 Method and apparatus for detecting optical thermal displacement image |
03/06/1997 | WO1997008510A1 High bandwith, dynamically rigid metrology system for the measurement and control of intelligent manufacturing processes |
03/06/1997 | WO1997008509A1 Target for laser leveling systems |
03/06/1997 | DE19634254A1 Optical-numerical determination of entire surface of solid object e.g. for motor vehicle mfr. |
03/05/1997 | EP0760459A2 System for measuring the thickness and index refraction of a film |
03/05/1997 | EP0760085A1 Improved phase shifting interferometer and method for surface topography measurement |
03/05/1997 | EP0759815A1 System and method for automatically feeding, inspecting and diverting tablets for continuous filling of tablet containers |
03/05/1997 | CN1144327A Direction detector |
03/04/1997 | US5608847 Vision target based assembly |
03/04/1997 | US5608820 Parallel processing method and system for identifying valid objects in a background of an image |
03/04/1997 | US5608817 Optical measuring method |
03/04/1997 | US5608815 Device for testing an image of a test object |
03/04/1997 | US5608664 Method for correlating image data of a range-finder |
03/04/1997 | US5608530 Inspection device for measuring a geometric dimension of a part |
03/04/1997 | US5608529 Optical three-dimensional shape measuring apparatus |
03/04/1997 | US5608528 Optical position detecting method using asynchronous modulation of light source |
03/04/1997 | US5608527 For non-contact measurement of surface roughness |
03/04/1997 | US5608523 Circuit and method for controlling glitches in low intensity signals |
03/04/1997 | US5608454 Eyewire inspection station |
03/04/1997 | US5608453 Automatic optical inspection system having a weighted transition database |
03/04/1997 | US5608211 Optical displacement detector for determining an object profile |
03/04/1997 | US5608209 Method and apparatus for measuring motion amount of a laboratory animal |
03/04/1997 | US5606802 Laser gradient setting device |
03/04/1997 | CA2085143C Method and apparatus for process control of material emitting radiation |
02/27/1997 | WO1997007386A2 Method adn apparatus for engine testing |
02/27/1997 | WO1997007380A2 Automated system for vehicle condition evaluation |
02/27/1997 | WO1997001111A3 Improved optical ranging camera |
02/26/1997 | EP0759536A1 Atomic force microscope and measuring head thereof |
02/26/1997 | CN1144000A Embedded optical sensor capable of strain and temp. measurement using single diffraction grating |
02/26/1997 | CN1143999A Fiber optical strain sensor and manufacture thereof |
02/26/1997 | CN1143744A Laser aiming measuring system and method for ID and OD of large workpiece |
02/25/1997 | US5606534 Laser-based dimensioning system |
02/25/1997 | US5606417 Achromatic optical interferometer, of the trilateral shift type for analyzing the wave surface of a light beam |
02/25/1997 | US5606410 Method for controlling the surface state of one face of a solid and the associated device |
02/25/1997 | US5606409 Laser ranging system calibration device |
02/25/1997 | US5606174 Method and device for detecting a shape of object with high resolution measurement of displacement of an object surface from a reference plane |
02/25/1997 | US5606171 Using a fluorescent detector |
02/25/1997 | US5605428 Device for indexing magazine compartments and wafer-shaped objects in the compartments |
02/25/1997 | US5605097 Method for producing a screen printing stencil with a laser |
02/20/1997 | WO1997006429A1 Bottle thread inspection system and method of operating same |
02/20/1997 | WO1997006409A1 Process and device for the rapid detection of the position of a target marking |
02/20/1997 | WO1997006406A1 Distance measuring apparatus and shape measuring apparatus |
02/20/1997 | CA2228381A1 Bottle thread inspection system and method of operating same |
02/19/1997 | EP0758742A2 Balanced focus system and method for achieving optimal focus of different areas of an object that are concurrently imaged |
02/19/1997 | EP0758690A1 Method and apparatus for determining the diameter of a growing single crystal |
02/19/1997 | EP0758446A1 Fluorescence method for determining properties of a polymer coating or film |
02/19/1997 | EP0662036B1 Device and process for controlling the bead size in the glazing rolls |
02/19/1997 | CN2247795Y Precision slant angle meter |
02/19/1997 | CN1143179A Medium detector |
02/18/1997 | US5604593 Interferometer position measurement system with extensible legs |
02/18/1997 | US5604581 Film thickness and free carrier concentration analysis method and apparatus |
02/18/1997 | US5604529 Three-dimensional vision camera |
02/13/1997 | WO1997005457A1 Photo-electric distance- and angle-measurement system for measuring the displacement of two objects with respect to each other |
02/13/1997 | WO1997005449A1 Scanning apparatus and method |
02/13/1997 | WO1997005448A1 Interferometer with compound optics |
02/13/1997 | WO1996017258A3 Optical position sensing system |
02/12/1997 | EP0757779A1 System for measuring wheel angles and chassis units positions of a vehicle |
02/12/1997 | CN1142685A Apparatus and method for semiconductor wafer edge inspection |
02/11/1997 | US5602967 Vision target based assembly |
02/11/1997 | US5602946 Fiber optic sensor system for detecting movement or position of a rotating wheel bearing |
02/11/1997 | US5602648 Process and device for measuring optical quality of the surface of a transparent object by contact with a wetted flexible surface |
02/11/1997 | US5602643 Method and apparatus for correcting surface profiles determined by phase-shifting interferometry according to optical parameters of test surface |
02/11/1997 | US5602639 Surface-condition inspection method and apparatus including a plurality of detecting elements located substantially at a pupil plane of a detection optical system |
02/11/1997 | US5602375 Automatic debiting system suitable for free lane traveling |
02/11/1997 | US5601364 Method and apparatus for measuring thermal warpage |
02/11/1997 | US5600893 Process and system for measuring alignment of automotive vehicle suspension |
02/11/1997 | US5600878 Mandrel stem length measurement system for use with blind rivet setting tool |
02/06/1997 | WO1997004285A1 Moire interferometry system and method with extended imaging depth |
02/06/1997 | DE19528465A1 Verfahren und Vorrichtung zur Erfassung der Lage einer Zielmarke Method and apparatus for detecting the position of a target mark |
02/06/1997 | CA2227183A1 Moire interferometry system and method with extended imaging depth |
02/05/1997 | EP0757245A2 Apparatus for detecting streaky surface defects |
02/05/1997 | EP0757231A1 Device for measurement and geometric control of wheeled vehicles |
02/05/1997 | EP0757230A1 Surface sensor device |
02/05/1997 | EP0757229A2 Device to determine without contact the height position of a motor vehicle |
02/05/1997 | EP0757228A2 Automatic inspection system for contactlessly measuring an offset of a central feature of an object |
02/05/1997 | EP0757227A2 Alignment and lighting system and method for aligning and lighting an object for an inspection system that contactlessly measures an offset of a central feature of the object |
02/05/1997 | EP0757226A2 Automatic inspection method for contactlessly measuring an offset of a central feature of an object |
02/05/1997 | EP0757225A2 Eccentricity determination system and method for accurately computing an offset of a central feature of an object |
02/05/1997 | EP0745211A4 Grating-grating interferometric alignment system |
02/05/1997 | EP0713590A4 Automatic garment inspection and measurement system |
02/05/1997 | CN1142205A Method and apparatus for detecting surface features of translucent objects |
02/05/1997 | CN1142046A Apparatus for checking laminated article |
02/04/1997 | US5600442 Position detecting apparatus based on before and after mode-hop signals |
02/04/1997 | US5600441 Interferometer and method for measuring the distance of an object surface with respect to the surface of a rotating disk |
02/04/1997 | US5600439 Self-calibration system and method for determining the adequacy of an interferometer angle and surface curvatures in an inspection system for determining disparity between two surfaces |
02/04/1997 | US5600435 Intelligent sensor method and apparatus for an optical wheel alignment machine |
02/04/1997 | US5600150 Method for obtaining three-dimensional data from semiconductor devices in a row/column array and control of manufacturing of same with data to eliminate manufacturing errors |
02/04/1997 | US5599464 Formation of atomic scale vertical features for topographic instrument calibration |
02/03/1997 | CA2179443A1 Eccentricity determination system and method for accurately computing an offset of a central feature of an object |
02/03/1997 | CA2179441A1 Balanced focus system and method for achieving optimal focus of different areas of an object that are concurrently imaged |
02/03/1997 | CA2179079A1 Automatic inspection system for contactlessly measuring an offset of a central feature of an object |
02/03/1997 | CA2179078A1 Alignment and lighting system and method for aligning and lighting an object for an inspection system that contactlessly measures an offset of a central feature of the object |