| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 03/29/2006 | CN1754081A Method for the contactless measurement of an object |
| 03/29/2006 | CN1752714A Optical projection measurer for external diameter of large wheel diameter |
| 03/29/2006 | CN1752713A Method for monitoring thickness uniformity of optical film layer |
| 03/29/2006 | CN1752276A Optical film plating polarization spectrum monitoring system |
| 03/29/2006 | CN1248377C 气体激光器和光学系统 Gas laser and the optical system |
| 03/29/2006 | CN1248040C Raster code device and displacement measuring equipment using optical fibre receiver channel |
| 03/29/2006 | CN1247994C Textile surface analysis method and its system |
| 03/29/2006 | CN1247958C Device for measuring pipe wall thickness in pipe press |
| 03/29/2006 | CN1247957C Laser colimation system and method of automatic measuring light drift angle |
| 03/29/2006 | CN1247956C Parallel astigmatic three-dimensional focusing detecting method and apparatus thereof |
| 03/29/2006 | CN1247955C Method and apparatus for three-dimensional color scanning |
| 03/29/2006 | CN1247954C Tilt adjustment equipment, loop clamping equipment, interferometer for the above equipment |
| 03/28/2006 | US7020350 Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections |
| 03/28/2006 | US7020348 Device for exposure of a strip-shaped workpiece with a meander correction device |
| 03/28/2006 | US7020324 Precision measurement of tube wall thickness |
| 03/28/2006 | US7020323 Pattern defect inspection apparatus and method |
| 03/28/2006 | US7020306 Polishing pad surface condition evaluation method and an apparatus thereof and a method of producing a semiconductor device |
| 03/28/2006 | US7019850 Method and system for thin film characterization |
| 03/28/2006 | US7019849 Depth measuring apparatus |
| 03/28/2006 | US7019848 Three-dimensional measuring instrument, filter striped plate, and illuminating means |
| 03/28/2006 | US7019845 Measuring elastic moduli of dielectric thin films using an optical metrology system |
| 03/28/2006 | US7019844 Method for in-situ monitoring of patterned substrate processing using reflectometry. |
| 03/28/2006 | US7019843 Method and apparatus for stage mirror mapping |
| 03/28/2006 | US7019842 Position measuring device |
| 03/28/2006 | US7019841 System and method for inspecting a component using interferometry |
| 03/28/2006 | US7019840 Dual-beam interferometer for ultra-smooth surface topographical measurements |
| 03/28/2006 | US7019836 Position detection method and apparatus, and exposure method and apparatus |
| 03/28/2006 | US7019835 Method and system to measure characteristics of a film disposed on a substrate |
| 03/28/2006 | US7019825 Hand/eye calibration method using projective invariant shape descriptor of 2-dimensional image |
| 03/28/2006 | US7019824 Moire method and measuring system for measuring the distortion of an optical imaging system |
| 03/28/2006 | US7019815 Off-axis leveling in lithographic projection apparatus |
| 03/28/2006 | US7019814 Lithographic projection mask, device manufacturing method, and device manufactured thereby |
| 03/28/2006 | US7019771 Inspection device for components |
| 03/28/2006 | US7019282 Optical encoder |
| 03/28/2006 | US7019280 Apparatus for detecting the tilt of a light reflector relative to the optical axis of input light |
| 03/28/2006 | US7018271 Method for monitoring a substrate during chemical mechanical polishing |
| 03/28/2006 | US7017868 Fire sprinkler mount |
| 03/28/2006 | US7017421 Actuator and sensor system for composite structures |
| 03/28/2006 | US7017275 Portable coordinate measurement machine with improved handle assembly |
| 03/28/2006 | CA2368272C Apparatus for measuring physical properties of a sample |
| 03/28/2006 | CA2290033C Semiconductor dark image position sensitive device |
| 03/28/2006 | CA2255234C Anti-two block device using non-contact measuring and detecting devices |
| 03/23/2006 | WO2006031687A2 Automatic blocking and lens blank measuring apparatus and method |
| 03/23/2006 | WO2006030756A1 Measuring method and measuring equipment employing high frequency electromagnetic wave |
| 03/23/2006 | WO2006030664A1 Noncontact method for measuring pitch of gear teeth and screw |
| 03/23/2006 | WO2006030149A1 Method for measuring three-dimensional objects by single view backlit shadowgraphy using optical laws of light propagation |
| 03/23/2006 | US20060063262 Wafer characteristics via reflectometry |
| 03/23/2006 | US20060061775 Method and apparatus for measuring wafer thickness |
| 03/23/2006 | US20060061774 Optical measuring device for measuring curved surfaces |
| 03/23/2006 | US20060061773 Feature isolation for frequency-shifting interferometry |
| 03/23/2006 | US20060061772 Phase-resolved measurement for frequency-shifting interferometry |
| 03/23/2006 | US20060061771 Compensation for effects of beam misalignments in interferometer metrology systems |
| 03/23/2006 | US20060061767 Measurement instrument for inspecting painted bodywork parts, the instrument being provided with an anti-damage device |
| 03/23/2006 | US20060061752 Information sensing and sharing system for supporting rescue operations from burning buildings |
| 03/23/2006 | DE102005044032A1 Coordinate measuring process, involves measuring position of sample shaped unit together with image processing system, and recording image of sample shaped unit in short exposure time |
| 03/23/2006 | DE102004058655A1 Two dimensional coordinate geometry or structure measurement for object, uses image processing, combines partial images to produce results with equidistant pixels |
| 03/23/2006 | DE102004045729A1 Optical device for measuring positions has a transparent scale with a measurable scale division to be scanned by a source of light and photodetectors |
| 03/23/2006 | DE102004045724A1 Sensor unit for agricultural machine e.g. seed drill, has display unit displaying relative position of machine with respect to border line, where unit is designed, such that line is detected between machined and unmachined bases of machine |
| 03/23/2006 | DE102004043209A1 Instrument for optical examination of curved internal surfaces, projects annular beam onto internal surface and returns reflected light to camera |
| 03/23/2006 | DE102004037424A1 Empty goods e.g. boxes, volume measurement arrangement, has cameras arranged with defined base distance to each other, where camera has dark field top illumination lighting over beverage box that is arranged on transport device |
| 03/23/2006 | DE102004035847A1 Verfahren zur Erkennung der Spülgutbeladung und Geschirrspülmaschine Method for detecting the Spülgutbeladung and dishwasher |
| 03/23/2006 | DE102004028736A1 Outdoor stationary object automatic detection and determination method for vehicle, involves determining space coordinates of measuring points, and determining type of object identified in outdoor by summarizing coordinates |
| 03/23/2006 | DE10130227B4 Optischer Sensor Optical sensor |
| 03/23/2006 | DE10009074B4 Verfahren zum Frei- oder Schwenkbiegen eines Werkstückes sowie Vorrichtung zur Ermittlung der Lage eines Werkstückschenkels beim Biegen A method for indoor or outdoor swing bending a workpiece and apparatus for determining the position of a workpiece leg while bending |
| 03/23/2006 | CA2615335A1 Device for biometrically controlling a face surface |
| 03/23/2006 | CA2615316A1 Device for contactlessly controlling the surface profile of objects |
| 03/23/2006 | CA2579483A1 Method for measuring three-dimensional objects by single-view optical shadowgraphy, using the optical laws of light propagation |
| 03/22/2006 | EP1637836A1 Device and method of supporting stereo camera, device and method of detecting calibration, and stereo camera system |
| 03/22/2006 | EP1637834A2 Apparatus and method of heterodyne interferometry for imaging |
| 03/22/2006 | EP1636543A2 Method of determining a dimension of a sample of a construction material and associated apparatus |
| 03/22/2006 | EP1636542A1 Method and measuring device for the contactless measurement of angles or angle modifications in objects |
| 03/22/2006 | EP1636541A1 Method for measuring thickness of an optical disc |
| 03/22/2006 | EP1636540A1 Wheel alignment with surface-oriented runout determination |
| 03/22/2006 | EP1636013A1 Container manufacturing inspection and control system |
| 03/22/2006 | EP1540271B1 Method for measuring contour variations |
| 03/22/2006 | EP1330790A4 Accurately aligning images in digital imaging systems by matching points in the images |
| 03/22/2006 | EP1181510B1 Position sensitive light spot detector |
| 03/22/2006 | EP1176631B1 Method and apparatus for monitoring polishing state, polishing device, process wafer, semiconductor device, and method of manufacturing semiconductor device |
| 03/22/2006 | CN2766224Y Laser positioning and digital displaying rule for measuring vehicle hook center height |
| 03/22/2006 | CN2766223Y Integrated image measurer |
| 03/22/2006 | CN1751378A Detection method for optimum position detection formula, alignment method, exposure method, device production method, device, and measurement and/or inspection apparatus |
| 03/22/2006 | CN1751221A Imaging device |
| 03/22/2006 | CN1750247A Direct evaluating method and device for metal fine wire |
| 03/22/2006 | CN1749700A Counter-type lattice belt for switch type digital displacement sensor |
| 03/22/2006 | CN1749691A Research and use of infrared inductor new type judging principle |
| 03/22/2006 | CN1749689A Grading quick positioning method for automatic manless stack field lifting slings-and container in truck |
| 03/22/2006 | CN1246667C 3D machine vision measuring system with vehicle position adjustment mechanism for positioning vehicle |
| 03/22/2006 | CN1246666C Sampler inclination measuring method |
| 03/22/2006 | CN1246665C Optical axis automatic adjusting of measuring unit |
| 03/22/2006 | CN1246664C Instruments and method for determining tested sample film thickness loaded by matrix |
| 03/22/2006 | CN1246116C Method for the calibration of the optical system on a laser machine for machining electrical circuit substrates |
| 03/21/2006 | US7016525 Systems and methods for continuously varying wavelength illumination |
| 03/21/2006 | US7016519 Method and device for detecting three-dimensional information |
| 03/21/2006 | US7016517 Travel road detector |
| 03/21/2006 | US7016054 Lithography line width monitor reflecting chip-wide average feature size |
| 03/21/2006 | US7016053 Image processing type of measuring device, lighting system for the same, lighting system control method, lighting system control program, and a recording medium with the lighting system control program recorded therein |
| 03/21/2006 | US7016052 Apparatus for measuring characteristics of a hole and associated method |
| 03/21/2006 | US7016050 Microscope with fixed-element autocollimator for tilt adjustment |
| 03/21/2006 | US7016049 Alignment apparatus, control method therefor, exposure apparatus, device manufacturing method, semiconductor manufacturing factory, and exposure apparatus maintenance method |
| 03/21/2006 | US7016046 Interferometer arrangement and interferometric measuring method |