| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 03/05/2009 | WO2009028811A1 Apparatus for measuring three-dimensional profile using lcd |
| 03/05/2009 | WO2009028494A1 Position detecting apparatus, position detecting method, exposure apparatus and device manufacturing method |
| 03/05/2009 | WO2009028489A1 Object detecting method, object detecting device, and robot system |
| 03/05/2009 | WO2009028377A1 Measurement apparatus and method for measuring surface shape and roughness |
| 03/05/2009 | WO2009028164A1 Method for detecting crack occurrence position |
| 03/05/2009 | US20090063093 Method and apparatus for surveying actual measurement data of a component |
| 03/05/2009 | US20090061361 Integrated Circuit Manufacturing Methods with Patterning Device Position Determination |
| 03/05/2009 | US20090059244 Web Measurement Device |
| 03/05/2009 | US20090059243 Method for determining the absolute thickness of non-transparent and transparent samples by means of confocal measurement technology |
| 03/05/2009 | US20090059242 Three-dimensional measurement method and three-dimensional measurement apparatus |
| 03/05/2009 | US20090059241 System and Method for Three-Dimensional Measurement of The Shape of Material Objects |
| 03/05/2009 | US20090059240 Incorporating film optical property measurements into scatterometry metrology |
| 03/05/2009 | US20090059239 Method of Determining the Depth Profile of a Surface Structure and System for Determining the Depth Profile of a Surface Structure |
| 03/05/2009 | US20090059229 Apparatus for detecting position of substrate, ellipsometer, and film thickness measuring apparatus |
| 03/05/2009 | US20090059213 Apparatus and method for wheel alignment |
| 03/05/2009 | US20090059212 Inclined detector |
| 03/05/2009 | US20090059208 Apparatus and method for a combined interferometric and image based geometric determination, particularly in the microsystem technology |
| 03/05/2009 | US20090059206 Optical Linear and Rotation Displacement Sensor |
| 03/05/2009 | US20090057837 Wafer with edge notches encoding wafer identification descriptor |
| 03/05/2009 | US20090056156 Web Measurement Device |
| 03/05/2009 | US20090056152 Vehicle wheel alignment system and methodology |
| 03/05/2009 | DE202007014435U1 Optischer Sensor für eine Messvorrichtung Optical sensor for a measuring device |
| 03/05/2009 | DE102008039322A1 Verfahren zum Ermitteln des Tiefenprofils einer Oberflächenstruktur und System zum Ermitteln des Tiefenprofils einer Oberflächenstruktur A method for determining the depth profile of a surface structure and system for determining the depth profile of a surface structure |
| 03/05/2009 | DE102007041375A1 Arrangement controlling device for free ends of pins i.e. plug pins in e.g. female connector, has mask with break-throughs in which pins are held by acquisition device, where light of lighting device is reflected at break-throughs |
| 03/05/2009 | DE102007041272A1 Measuring system for performing contact and contactless measurement at e.g. indexable insert, has electronics circuit receiving measuring signals from barrier and caliper arrangements and routing signals in transmission line to controller |
| 03/05/2009 | DE102007039077A1 Signalmarken und Verfahren zur photogrammetrischen Vermessung von geometrisch unregelmäßigen Objekten Signal trademarks and method for photogrammetric measurement of geometrically irregular objects |
| 03/05/2009 | DE102007032609A1 Kostengünstige Erfassung der inneren Raumform von Fußbekleidung und Körpern Cost-effective detection of the inner space form of footwear and bodies |
| 03/04/2009 | EP2031348A1 Device for a reflective metal strip with an inspection unit for detecting surface defects and/or charting the surface topography |
| 03/04/2009 | EP2031347A1 Method and apparatus for measuring coating thickness with a laser |
| 03/04/2009 | EP2030005A2 Glazing inspection method |
| 03/04/2009 | EP2029965A2 Laser-based alignment tool |
| 03/04/2009 | EP2029964A2 Systems and methods for illuminating materials |
| 03/04/2009 | EP2029963A1 Gap measuring method, imprint method, and imprint apparatus |
| 03/04/2009 | EP1926435B1 Apparatus for supporting a patient during radiation therapy |
| 03/04/2009 | EP1545866B1 An automatic control and monitoring system for splice overlapping tolerance in textile ply |
| 03/04/2009 | CN201203581Y Safety detection system for chassis of automobile |
| 03/04/2009 | CN201203484Y Multi-point high precision temperature real time automatic measuring device |
| 03/04/2009 | CN201203420Y Digital close view photogrammetric system |
| 03/04/2009 | CN201203408Y Assembling quality detection device of vacuum pump vane |
| 03/04/2009 | CN201203407Y Formwork clip fixture |
| 03/04/2009 | CN101379597A Semiconductor device manufacturing method and method for reducing microroughness of semiconductor surface |
| 03/04/2009 | CN101379380A Method for determining loads on/damage to a mechanical structure |
| 03/04/2009 | CN101379366A Optical translation of triangulation position measurement |
| 03/04/2009 | CN101377423A Device and method for correcting sensor temperature influence |
| 03/04/2009 | CN101377416A Method for lighting ultra-long shafting on marine vehicle to center |
| 03/04/2009 | CN101377415A Method for precisely measuring deflection angle |
| 03/04/2009 | CN101377414A Apparatus and method for measuring two-dimensional small angle based on light beam angle drift dynamic compensation |
| 03/04/2009 | CN101377413A Method for measuring photoresist mask slot-shaped structure parameter |
| 03/04/2009 | CN101377412A Cage conductor shape laser detector based on double-steel wire rope orientation and detecting method thereof |
| 03/04/2009 | CN101377411A Cage conductor shape laser detector based on photoelectric receiving array and detecting method thereof |
| 03/04/2009 | CN101377410A Large caliber aspheric surface measuring apparatus and method based on ultra-precise revolving scanning |
| 03/04/2009 | CN101377409A Method for detecting surface appearance of glasses lens |
| 03/04/2009 | CN101377408A Apparatus for indirectly measuring steel rail deformation parameter |
| 03/04/2009 | CN101377407A Drill edge detection device |
| 03/04/2009 | CN101377406A Apparatus and method for obtaining information related to terahertz waves |
| 03/04/2009 | CN101377405A Vision measuring method of space round gesture parameter and geometric parameter |
| 03/04/2009 | CN101377404A Method for disambiguating space round gesture recognition ambiguity based on angle restriction |
| 03/04/2009 | CN101377403A Apparatus and method for measuring position accuracy of part straight-line edge |
| 03/04/2009 | CN101377402A Three-dimensional measuring instrument |
| 03/04/2009 | CN101376433A Helicopter rotor operation method and system |
| 03/04/2009 | CN100465716C A substrate assembling device and a method thereof |
| 03/04/2009 | CN100465579C A laser plane coordinate calibrating device |
| 03/03/2009 | US7499829 Laser rangefinder and method thereof |
| 03/03/2009 | US7499812 Method for locating flaws, and a marking system |
| 03/03/2009 | US7499600 Method for characterizing a digital imaging system |
| 03/03/2009 | US7499581 Vision system to calculate a fluid volume in a container |
| 03/03/2009 | US7499186 Laser survey device |
| 03/03/2009 | US7499185 Measuring device for workpiece held on chuck table |
| 03/03/2009 | US7499184 Three-dimensional measuring apparatus and three-dimensional measuring method |
| 03/03/2009 | US7499183 Method of measuring sub-micron trench structures |
| 03/03/2009 | US7499180 Alignment stage, exposure apparatus, and semiconductor device manufacturing method |
| 03/03/2009 | US7499179 Measurement method and apparatus, exposure apparatus, exposure method, and adjusting method |
| 03/03/2009 | US7498621 Image sensing device and method of |
| 03/03/2009 | US7498106 Method and apparatus for controlling etch processes during fabrication of semiconductor devices |
| 03/03/2009 | US7497018 Laser-based alignment tool |
| 02/26/2009 | WO2009025771A2 Parameterized optical system and method |
| 02/26/2009 | WO2009025323A1 Three-dimensional image data creating system and creating method |
| 02/26/2009 | WO2009024904A2 Method and apparatus for the optical characterization of surfaces |
| 02/26/2009 | WO2009024758A1 Non-contact probe |
| 02/26/2009 | WO2009024757A1 Phase analysis measurement apparatus and method |
| 02/26/2009 | WO2009024756A1 Non-contact measurement apparatus and method |
| 02/26/2009 | WO2009024467A1 Organically based optical position sensor |
| 02/26/2009 | WO2009024344A1 Optical microprobe |
| 02/26/2009 | WO2009024129A1 Signal marks and method for the photogrammetric measurement of geometrically irregular objects |
| 02/26/2009 | WO2008157619A3 Total internal reflection displacement scale |
| 02/26/2009 | WO2008125605A3 Method and assembly for optical reproduction with depth discrimination |
| 02/26/2009 | WO2008122808A3 Rotation detection kit with intensity sensors receiving optical beams with discretely varying polarisation orientation |
| 02/26/2009 | US20090052843 Optical Multi-Fiber Plug Connection |
| 02/26/2009 | US20090051939 Substrate film thickness measurement method, substrate film thickness measurement apparatus and substrate processing apparatus |
| 02/26/2009 | US20090051938 Multi-beam optical probe and system for dimensional measurement |
| 02/26/2009 | US20090051937 Device and method for measuring profiles of electron beam and laser beam |
| 02/26/2009 | US20090051936 Method for measuring positions of structures on a substrate with a coordinate measuring machine |
| 02/26/2009 | US20090051935 Automatic Geometric Calibration Using Laser Scanning Reflectometry |
| 02/26/2009 | US20090051934 Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus |
| 02/26/2009 | US20090051933 Tool Detection |
| 02/26/2009 | US20090051932 Method for determining the position of a measurement objective in the z-coordinate direction of an optical measuring machine having maximum reproducibility of measured structure widths |
| 02/26/2009 | US20090051931 Systems and methods for measuring sample surface flatness of continuously moving samples |
| 02/26/2009 | US20090051930 Method for detecting surface defects on a substrate and device using said method |
| 02/26/2009 | US20090051929 Three-dimensional image measuring apparatus |
| 02/26/2009 | US20090051926 Multiple frequency optical mixer and demultiplexer and apparatus for remote sensing |