| Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105) |
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| 02/26/2003 | EP0888558B1 Method of calibrating the trip point of an overload relay |
| 02/20/2003 | WO2003014755A1 Device for measuring characteristics of probe cards and probing method |
| 02/20/2003 | US20030034789 Probe holder for testing of a test device |
| 02/19/2003 | EP1234191A4 Method and apparatus for testing a capacitive sensor |
| 02/18/2003 | US6522984 Instant pole-zero corrector for digital radiation spectrometers and the same with automatic attenuator calibration |
| 02/18/2003 | US6522983 Timebase calibration method for an equivalent time sampling digitizing instrument |
| 02/13/2003 | US20030030453 Timing calibration and timing calibration verification of electronic circuit testers |
| 02/12/2003 | EP1283423A1 Timing calibration and timing calibration verification of electronic circuit testers |
| 02/12/2003 | CN2535810Y Electric-energy meter monitoring device |
| 02/06/2003 | WO2002015109A9 Pda instrument/process calibrator |
| 02/04/2003 | CA2239369C Electronic measurement device |
| 01/30/2003 | US20030020488 Electronic component, tester device and method for calibrating a tester device |
| 01/23/2003 | US20030018441 Impulsive transient detection and data acquisition coprocessor |
| 01/23/2003 | DE20121567U1 Dispersion parameter error correction method for vectorial network analyzer uses 2-tier calibration for error correction of measured values |
| 01/22/2003 | EP1278073A1 Device for measuring the electrical current flowing through at least an electrical conductor and method for error correction in such a device |
| 01/22/2003 | EP1278071A2 Apparatus for measuring the electrical current circulating in at least one electrical conductor and method of correcting faults in such apparatus |
| 01/14/2003 | US6507185 Device, assembly and method for testing electronic components, and calibrating method therefor |
| 01/08/2003 | EP1123514B1 Remote test module for automatic test equipment |
| 01/07/2003 | US6505136 Method of testing an evaluation circuit |
| 01/07/2003 | US6504395 Method and apparatus for calibration and validation of high performance DUT power supplies |
| 01/07/2003 | US6504357 Apparatus for metering electrical power and electronically communicating electrical power information |
| 01/02/2003 | US20030004661 Automatic calibration of time keeping for utility meters |
| 12/31/2002 | US6501257 High speed multifunction testing and calibration of electronic electricity meters |
| 12/26/2002 | US20020198672 Random sampling with phase measurement |
| 12/26/2002 | US20020196055 Quasi-periodic optical sampling |
| 12/25/2002 | CN2528026Y Electric energy meter slot checking analogue load source |
| 12/25/2002 | CN1387691A Apparatus for battery capacity measurement and for remaining capacity calculation |
| 12/19/2002 | US20020193980 Semiconductor test program debugging apparatus |
| 12/19/2002 | US20020193961 Impulsive transient hardware simulation |
| 12/19/2002 | US20020193955 Battery test module |
| 12/19/2002 | DE10225190A1 Qualitätsüberwachung und Wartung für Produkte, die benutzerwartungsfähige Komponenten verwenden Quality monitoring and maintenance for products that use user-serviceable components |
| 12/19/2002 | DE10127054A1 Monitoring method for automobile control unit power supply incorporates testing of RESET line after restarting of control unit |
| 12/18/2002 | CN1385712A Phase information recoverable sweep frequency source method |
| 12/17/2002 | US6496953 Calibration method and apparatus for correcting pulse width timing errors in integrated circuit testing |
| 12/17/2002 | US6496024 Probe holder for testing of a test device |
| 12/12/2002 | WO2002099444A1 Method for monitoring a power supply of a control unit in a motor vehicle |
| 12/12/2002 | US20020188413 Quality monitoring and maintenance for products employing end user serviceable components |
| 12/12/2002 | US20020186000 Electronic revenue meter with automatic service sensing |
| 12/10/2002 | US6492797 Socket calibration method and apparatus |
| 12/10/2002 | CA2256601C Method for testing electronic components |
| 12/05/2002 | US20020182589 Calibrating optical fibers for accuracy; obtain optical fibers, electrify, monitor electrical resistance compare to control |
| 12/04/2002 | CN1383491A Semiconductor testing appts. and its monitor device |
| 12/03/2002 | US6490535 Method and apparatus for calibrating an instrument |
| 11/27/2002 | CN2522872Y Electric load detection instrument |
| 11/26/2002 | US6486654 Calibration of magnetic force or scanning hall probe microscopes by measuring sample images and calculating instrument response functions |
| 11/21/2002 | US20020171414 Method for optimizing probe card analysis and scrub mark analysis data |
| 11/20/2002 | EP0901637B1 Method for testing electronic components |
| 11/20/2002 | CN2521625Y Binding post for three-phase electric meter checking |
| 11/19/2002 | US6483290 Apparatus for metering electrical power that determines energy usage data based on downloaded information |
| 11/12/2002 | US6480013 Method for the calibration of an RF integrated circuit probe |
| 11/07/2002 | US20020165692 Semiconductor test system monitor apparatus thereof |
| 11/07/2002 | DE10116823A1 Calibration of test cards that form part of a test system for carrying out of wafer tests, using a device that is suitable for calibrating test cards with unsprung contact elements |
| 11/06/2002 | CN1093940C Automated communication of electricity meter data |
| 11/05/2002 | US6476522 Method and apparatus to control power drawn by a measurement device |
| 10/31/2002 | US20020160717 Chamber for and a method of processing electronic devices and the use of such a chamber |
| 10/31/2002 | US20020158637 Method and apparatus for self-calibration of capacitive sensors |
| 10/31/2002 | US20020158583 Automotive information systems |
| 10/24/2002 | US20020153903 Device and method for testing and calibrating multi-meters in a cathode ray tube production line |
| 10/22/2002 | US6469527 Method of calibrating a potentiometer |
| 10/22/2002 | US6469514 Timing calibration apparatus and method in a semiconductor integrated circuit tester |
| 10/17/2002 | US20020152045 Information systems |
| 10/17/2002 | US20020149359 Method for measuring the wall thickness of an electrically conductive object |
| 10/10/2002 | WO2002079787A1 Impulsive transient detection and data acquisition coprocessor |
| 10/10/2002 | DE10116388A1 Calibration method for vectorial network analyzer uses calibration circuits each provided by line element and symmetrical reciprocal obstacle network |
| 10/09/2002 | CN2515686Y Portable photoelectric sampler hanging device |
| 10/08/2002 | US6462558 Electronic circuit for monitoring voltage variation |
| 10/03/2002 | US20020144197 Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement |
| 09/26/2002 | US20020135357 Method and apparatus for socket calibration of integrated circuit testers |
| 09/25/2002 | CN1371479A Method and apparatus for testing magnetic head elements |
| 09/24/2002 | US6456061 Calibrated current sensor |
| 09/19/2002 | WO2002073221A2 Measured value acquisition and processing unit for small measuring signals |
| 09/19/2002 | US20020130665 Electronic battery tester |
| 09/19/2002 | CA2440774A1 Measurement value detection and processing unit for small measurement signals |
| 09/17/2002 | US6452405 Method and apparatus for calibrating a current sensing system |
| 09/12/2002 | WO2002071083A2 Circuit for improved test and calibration in automated test equipment. |
| 09/12/2002 | DE10106254A1 Verfahren zur Fehlerkorrektur durch De-embedding von Streuparametern, Netzwerkanalysator und Schaltmodul The error correction method by de-embedding of scattering parameters, network analyzer and switching module |
| 09/05/2002 | US20020121904 Curcuit for improved test and calibration in automated test equipment |
| 09/04/2002 | CN1090326C Meter testing circuit |
| 09/04/2002 | CN1090325C Method for testing electronic components |
| 08/28/2002 | EP1234191A1 Method and apparatus for testing a capacitive sensor |
| 08/28/2002 | CN1366185A Sensitive detector for automatically regulating band width of oscillograph and method of detecting |
| 08/27/2002 | US6441634 Apparatus for testing emissive cathodes in matrix addressable displays |
| 08/22/2002 | WO2002065150A1 Method for correcting errors by de-embedding dispersion parameters, network analyst and switching module |
| 08/15/2002 | WO2002063381A1 Calibrating voltage controllable optical components in communication systems |
| 08/15/2002 | CA2437125A1 Calibrating voltage controllable optical components in communication systems |
| 08/14/2002 | EP1231474A2 Method and apparatus for locating faulty pins in a test adapter and pin drawing tool |
| 08/07/2002 | EP1228381A1 Method of characterizing a device under test |
| 08/07/2002 | CN1088843C Electronic metering device with automatic service sensor |
| 08/06/2002 | US6429835 Method and apparatus for testing emissive cathodes |
| 08/06/2002 | US6429696 Peak hold and calibration circuit |
| 08/06/2002 | US6429645 Verification gauge for an electronic package lead inspection apparatus |
| 07/25/2002 | US20020097062 Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture |
| 07/24/2002 | EP1224487A1 Circuit and method for improved test and calibration in automated test equipment |
| 07/23/2002 | US6424277 AC calibration apparatus |
| 07/23/2002 | US6423981 Low-loss elementary standard structure for the calibration of an integrated circuit probe |
| 07/18/2002 | WO2002056041A1 A chamber for and a method of processing electronic devices and the use of such a chamber |
| 07/18/2002 | DE10112304C1 Measured value detection and processing unit for small measuring signals uses digital signal processor for compensation of detected background noise |
| 07/17/2002 | EP1223432A1 A chamber for and a method of processing electronic devices and the use of such a chamber |
| 07/16/2002 | US6421624 Multi-port device analysis apparatus and method and calibration method thereof |
| 07/16/2002 | US6420892 Calibration target for calibrating semiconductor wafer test systems |