| Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105) |
|---|
| 09/26/2006 | US7112972 Gauge calibration |
| 09/26/2006 | US7112970 Coaxial radio frequency adapter and method |
| 09/26/2006 | US7111490 Method for calibrating semiconductor test instruments |
| 09/21/2006 | US20060212247 Frequency control apparatus, information processing apparatus and program |
| 09/21/2006 | US20060208897 Capacitive RFID tag encoder |
| 09/21/2006 | US20060208748 Probe holder for testing of a test device |
| 09/21/2006 | DE112004002022T5 Messsonden-Prüfstruktur Measuring probe test structure |
| 09/20/2006 | CN1836170A Calibration of tester and testboard by golden sample |
| 09/19/2006 | US7109736 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
| 09/19/2006 | US7109728 Probe based information storage for probes used for opens detection in in-circuit testing |
| 09/19/2006 | US7108527 Sex changeable adapter for coaxial connectors |
| 09/19/2006 | US7107817 Method for calibrating semiconductor test instruments |
| 09/19/2006 | US7107816 Method for calibrating semiconductor test instruments |
| 09/19/2006 | US7107815 Method for calibrating semiconductor test instruments |
| 09/14/2006 | US20060206283 Measuring device with evaluation unit and external memory |
| 09/14/2006 | US20060206278 Apparatus and method for correcting for abberations |
| 09/14/2006 | DE102005018073A1 Multi-gate calibration matrix for calibration of multi-gate network analyzer has switching module having switching device connected with input gate, by which alternatively one-port calibration standards can be turned on at this input gate |
| 09/13/2006 | EP1700130A1 Energy metering system |
| 09/13/2006 | EP1700062A1 Sample device with turntable |
| 09/13/2006 | CN2817019Y Standard inductance box |
| 09/13/2006 | CN2817014Y Decimal high-frequency inductance box |
| 09/13/2006 | CN2816820Y Nulling instrument |
| 09/12/2006 | US7107170 Multiport network analyzer calibration employing reciprocity of a device |
| 09/12/2006 | US7106067 Calibration plug for invasive and non-invasive electrodeless conductivity sensors and methods of using the same calibration plug |
| 09/08/2006 | WO2006092055A1 Circuit calibration using voltage injection |
| 09/06/2006 | EP1698906A1 Electronic Metering Device Including Automatic Service Sensing |
| 09/06/2006 | EP1698857A1 Azimuth measurement device |
| 09/05/2006 | US7103492 Process independent delay chain |
| 09/05/2006 | US7102368 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture |
| 09/05/2006 | US7102361 Delay lock circuit having self-calibrating loop |
| 08/31/2006 | US20060195284 Signal processing device, use of the signal processing device and method for signal processing |
| 08/31/2006 | DE60025247T2 Schaltung und verfahren zum testen und kalibrieren To test and calibrate circuit and method |
| 08/30/2006 | CN2812025Y Electric energy meter detector |
| 08/30/2006 | CN2812024Y Remote automatic detection system for electric energy metering device |
| 08/29/2006 | US7098670 Method and system of characterizing a device under test |
| 08/29/2006 | US7098657 Method of stabilising a magnetometer signal, and stabilised magnetometers |
| 08/24/2006 | WO2006087782A1 Device and method for evaluating waveform measuring device and method for measuring jitter |
| 08/24/2006 | WO2006004569A3 Algorithm for estimation of multiple faults on a transmission line or waveguide |
| 08/24/2006 | US20060190203 Method for determining programmable coefficients to replicate frequency and supply voltage correlation in an integrated circuit |
| 08/24/2006 | US20060186910 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
| 08/23/2006 | EP0862746B1 Electronic metering device including automatic service sensing |
| 08/22/2006 | US7096137 Clock trim mechanism for onboard system clock |
| 08/22/2006 | US7094615 Method of controlling probe tip sanding in semiconductor device testing equipment |
| 08/17/2006 | US20060184333 Method and apparatus for autocalibrating a plurality of phase-delayed clock signal edges within a reference clock period |
| 08/17/2006 | US20060181286 Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path |
| 08/17/2006 | DE102005005350A1 Integrierter Multisensor Integrated multi-sensor |
| 08/16/2006 | CN2807274Y Broken line monitoring device of metering monitor |
| 08/16/2006 | CN1270188C Fictitious load source for in-situ checking electric energy meter |
| 08/15/2006 | US7091891 Calibration of analog to digital converter by means of multiplexed stages |
| 08/15/2006 | US7091796 Method and system for calibration of a voltage controlled oscillator (VCO) |
| 08/10/2006 | US20060178851 Method and apparatus for autocalibrating a plurality of phase-delayed clock signal edges within a reference clock period |
| 08/10/2006 | DE19922907B4 Kalibrierverfahren zum Kalibrieren einer Ausgabezeit eines Prüfsignals, Kalibrierverfahren zum Kalibrieren einer Zeitverschiebung und Halbleiterprüfeinrichtung Calibration method for calibrating an output time of a test signal calibration method for calibrating a time shift and Halbleiterprüfeinrichtung |
| 08/10/2006 | DE102005005887A1 Verfahren und Anordnung zur Korrektur der Rückwirkung elektrischer Messwandler auf das Messobjekt Method and apparatus for correcting the retroactivity electric transducer to the measuring object |
| 08/09/2006 | EP1642145A4 Apparatus and method for electromechanical testing and validation of probe cards |
| 08/08/2006 | US7089158 Real-time noise-suppression method and apparatus therefor |
| 08/08/2006 | US7088108 Method for detecting an offset drift in a wheatstone measuring bridge |
| 08/03/2006 | US20060173643 Memory device with apparatus for recalibrating output signal of internal circuit and method thereof |
| 08/03/2006 | US20060170409 Test pulses for enabling revenue testable panel meters |
| 08/02/2006 | EP1685517A2 Methods for calibrating mass spectrometry (ms) and other instrument systems and for processing ms and other data |
| 08/02/2006 | CN1268194C Method for correcting measurement error and electronic component characteristic measurement apparatus |
| 08/01/2006 | US7085666 Magnetic head testing apparatus |
| 08/01/2006 | US7084639 Impedance standard substrate and method for calibrating vector network analyzer |
| 07/27/2006 | US20060167643 Calibration process management system and data structure |
| 07/27/2006 | US20060164103 Gauge calibration |
| 07/27/2006 | US20060164073 Device for calibration of magnetic sensors in three dimensions |
| 07/27/2006 | DE102005058443A1 Vektornetzwerkanalysatormischerkalibrierung unter Verwendung der Unbekannter-Durchgang-Kalibrierung Vektornetzwerkanalysatormischerkalibrierung using the unknown thru calibration |
| 07/27/2006 | DE102005058429A1 Verfahren zum Implementieren einer TRL-Kalibrierung bei einem VNA A method for implementing a TRL calibration with a VNA |
| 07/27/2006 | DE102005034607A1 Inkrementale Erzeugung von Kalibrierungsfaktoren für eine automatische Testausrüstung Incremental generation of calibration factors for automatic test equipment |
| 07/27/2006 | DE102005025144A1 Verfahren und Vorrichtung zum Durchführen einer Minimalverbindungs-Mehrfachtor-Durchgangs-Reflexions-Leitungs-Kalibrierung und -messung Method and apparatus for performing a minimal connection multiport Passage Reflections-line calibration and measurement |
| 07/27/2006 | DE102004031436B4 Einrichtung und Verfahren zum Kalibrieren eines Halbleiter-Bauelement-Test-Systems, insbesondere einer probecard bzw. eines Halbleiter-Bauelement-Testgeräts Apparatus and method for calibrating a semiconductor device test system, in particular a probe card and a semiconductor device tester |
| 07/20/2006 | US20060161384 Synchronization and calibration of clocks for a medical device and calibrated clock |
| 07/20/2006 | US20060161370 Pulse stretching architecture for phase alignment for high speed data acquisition |
| 07/20/2006 | US20060161369 Method for implementing trl calibration in vna |
| 07/20/2006 | US20060161367 System and method for calibrating the clock frequency of a clock generator unit over a data line |
| 07/20/2006 | US20060158198 Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit |
| 07/20/2006 | DE102005025108B3 Device for testing protection, measuring or counting devices as component of medium or high voltage equipment has pole strip which can be attached on this device, whereby pole strip exhibits several pole openings arranged one behind other |
| 07/19/2006 | EP1680813A2 Probe testing structure |
| 07/19/2006 | CN1804640A Electric energy metrical pulse generation method for ammeter |
| 07/18/2006 | US7078961 Device and method for calibrating R/C filter circuits |
| 07/18/2006 | US7078940 Current comb generator |
| 07/13/2006 | WO2006074092A1 High precision voltage source for electrical impedance tomography |
| 07/13/2006 | US20060155498 Correcting test system calibration and transforming device measurements when using multiple test fixtures |
| 07/13/2006 | US20060155497 Method for correcting a characteristic curve derived from a magnetoresistive sensor signal |
| 07/13/2006 | US20060155495 Synchronization and calibration of clocks for a medical device and calibrated clock |
| 07/13/2006 | US20060154387 Method for calibration of a photodiode, semiconductor chip and operating method |
| 07/13/2006 | DE102005058482A1 Mehrtorkalibrierungsvereinfachung unter Verwendung des "Unbekannter-Durchgang"-Verfahrens Mehrtorkalibrierungsvereinfachung using the "unknown thru" method |
| 07/13/2006 | DE102005034208A1 Imitier-Wafer, System, das unter Verwendung des Imitier-Wafers kalibriert wird, und Verfahren zum Kalibrieren einer automatisierten Testausrüstung Imitier wafer system which is calibrated using the Imitier wafer, and method of calibrating an automatic test equipment |
| 07/11/2006 | US7076384 Method and apparatus for calibrating a current-based circuit |
| 07/11/2006 | US7076382 Method of measuring the effective directivity and/or residual system port impedance match of a system-calibrated vector network analyser |
| 07/11/2006 | US7075448 Method and circuit arrangement for offset correction of a measurement bridge |
| 07/11/2006 | US7075312 Method for correcting errors by de-embedding dispersion parameters network analyst and switching module |
| 07/06/2006 | US20060145706 Calibration circuit and method thereof |
| 07/04/2006 | US7072780 Impedance standard substrate and correction method for vector network analyzer |
| 07/04/2006 | US7071723 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
| 07/04/2006 | US7071707 Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer |
| 06/29/2006 | WO2005103740A3 Intelligent probe card architecture |
| 06/29/2006 | US20060142965 Recursive calibration |
| 06/29/2006 | US20060140466 Method for setting operating condition of measuring apparatus, method for managing measurement result of measuring apparatus, measuring system, data processing apparatus for measuring apparatus, and storage medium |
| 06/29/2006 | US20060140349 Apparatus and method for processing acquired signals for arbitrary impedance loads |
| 06/27/2006 | US7068049 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration |